In this article, we have investigated the electronic structure and magnetic properties of Sm2MgMnO6 prepared through auto-combustion method. The first principles of the density-functional theory have been applied to study of the electronic structure. The oxidation states of Mn and Mg are Mn3+/Mn4+ and Mg2+, respectively. The existence of Mn3+ is higher than Mn4+. The magnetic study reveals the sample shows ferromagnetic to paramagnetic transition at around 13.5 K which is followed by an antiferromagnetic ordering at 8.3 K. Antiferromagnetic and ferromagnetic ordering have been identified at 8.3 K and higher temperature, respectively. Sm2MgMnO6 shows a maximum magnetic entropy change of 1.25 J kg-1K-1 and relative cooling power of 86.9 J/kg for a field variation of 70 kOe near 25 K. The values are comparable to many double perovskites reported previously. This study highlights that Sm2MgMnO6 is a potential material for magnetocaloric refrigerant at low temperature.
Graphical Abstract
本文研究了自燃法制备的 Sm2MgMnO6 的电子结构和磁性能。电子结构的研究应用了密度泛函理论的第一性原理。锰和镁的氧化态分别为 Mn3+/Mn4+ 和 Mg2+。Mn3+ 的存在高于 Mn4+。磁性研究显示,样品在 13.5 K 左右出现铁磁向顺磁转变,随后在 8.3 K 出现反铁磁有序。Sm2MgMnO6 在 25 K 附近的 70 kOe 磁场变化中显示出 1.25 J kg-1K-1 的最大磁熵变化和 86.9 J/kg 的相对冷却功率。这项研究表明,Sm2MgMnO6 是一种潜在的低温磁致制冷剂材料。
{"title":"Exploring the Electronic Structure and Magnetic Properties of Sm2MgMnO6 Double Perovskite","authors":"Samarendra Nath Saha, Purna Chandra Barman, N. Bedamani Singh, Rajkumar Mondal, Sk. Anirban","doi":"10.1007/s13391-024-00512-0","DOIUrl":"10.1007/s13391-024-00512-0","url":null,"abstract":"<div><p>In this article, we have investigated the electronic structure and magnetic properties of Sm<sub>2</sub>MgMnO<sub>6</sub> prepared through auto-combustion method. The first principles of the density-functional theory have been applied to study of the electronic structure. The oxidation states of Mn and Mg are Mn<sup>3+</sup>/Mn<sup>4+</sup> and Mg<sup>2+</sup>, respectively. The existence of Mn<sup>3+</sup> is higher than Mn<sup>4+</sup>. The magnetic study reveals the sample shows ferromagnetic to paramagnetic transition at around 13.5 K which is followed by an antiferromagnetic ordering at 8.3 K. Antiferromagnetic and ferromagnetic ordering have been identified at 8.3 K and higher temperature, respectively. Sm<sub>2</sub>MgMnO<sub>6</sub> shows a maximum magnetic entropy change of 1.25 J kg<sup>-1</sup>K<sup>-1</sup> and relative cooling power of 86.9 J/kg for a field variation of 70 kOe near 25 K. The values are comparable to many double perovskites reported previously. This study highlights that Sm<sub>2</sub>MgMnO<sub>6</sub> is a potential material for magnetocaloric refrigerant at low temperature.</p><h3>Graphical Abstract</h3><div><figure><div><div><picture><source><img></source></picture></div></div></figure></div></div>","PeriodicalId":536,"journal":{"name":"Electronic Materials Letters","volume":"20 6","pages":"745 - 755"},"PeriodicalIF":2.1,"publicationDate":"2024-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141863940","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The asymmetrical gate-drain bias stress (GDBS) stability of a mesa-shaped vertical-channel thin-film transistors (VTFTs) was investigated using an In-Ga-Zn–O (IGZO) active layer prepared by atomic-layer deposition. The GDBS measurements were conducted with variations in electrode configurations and overlapped areas between the active and bottom electrode regions. The GDBS stability of the IGZO VTFTs was found to be significantly degraded, when a plasma-damaged electrode was used as the drain electrode, due to the formation of defective channel regions that are more susceptible to the hot carrier effect. To address the effect of plasma-damaged electrode, an ultrathin passivation layer was introduced, resulting in the achievement of VTFTs with excellent and uniform GDBS stability.