Pub Date : 2019-06-16DOI: 10.1109/PVSC40753.2019.9198990
L. Simpson, Ryo Huntamer, C. Weston, P. Ndione, Byron McDanold, S. Toth, C. Jiang, M. Muller, H. Moutinho, David C. Miller, L. Micheli, Greg Perrin, A. Martinez-Morales
Natural soiling has reduced the energy output of PV systems since the technology was first used, and viable mitigation strategies have remained elusive ever since. With the ever-increasing deployments around the world, especially in dusty environments, soiling is becoming a billion-dollar problem, worldwide. Furthermore, as plant operators continue to look for ways to increase revenue, the PV operating voltages have increased to between 1000 V and 1500 V when the sun is shining. This has resulted in some unforeseen consequences nominally combined into what is termed “Potential Induced Degradation.”1 Recent work by Jiang et. al., 2 at NREL using Atomic Force Microscopy has demonstrated that these large potentials also affect soiling by substantially increasing the attraction of dust to the surface, but also by increasing the adhesion force. Jiang et. al., have also shown that these higher soiling attraction and adhesion forces continue long into the night when the PV is no longer producing power. In this paper, we present a set of field results that demonstrate enhanced soiling rates that is due to the strong electric fields induced by these high voltage PV arrays. This includes observation of enhanced soiling rates measured in the field when a module is held at ±1000 V. This is critical information for installation operators because soiling losses may be higher on some panels than what is measured by typical soiling stations, and because the high voltages are not uniform across an array, some modules may have more soiling than others, leading to potential issues with non-uniform soiling problems at the array level. We present this set of compelling electric field induced soiling results in this paper.
{"title":"Increased PV Soiling from High Module Voltages","authors":"L. Simpson, Ryo Huntamer, C. Weston, P. Ndione, Byron McDanold, S. Toth, C. Jiang, M. Muller, H. Moutinho, David C. Miller, L. Micheli, Greg Perrin, A. Martinez-Morales","doi":"10.1109/PVSC40753.2019.9198990","DOIUrl":"https://doi.org/10.1109/PVSC40753.2019.9198990","url":null,"abstract":"Natural soiling has reduced the energy output of PV systems since the technology was first used, and viable mitigation strategies have remained elusive ever since. With the ever-increasing deployments around the world, especially in dusty environments, soiling is becoming a billion-dollar problem, worldwide. Furthermore, as plant operators continue to look for ways to increase revenue, the PV operating voltages have increased to between 1000 V and 1500 V when the sun is shining. This has resulted in some unforeseen consequences nominally combined into what is termed “Potential Induced Degradation.”1 Recent work by Jiang et. al., 2 at NREL using Atomic Force Microscopy has demonstrated that these large potentials also affect soiling by substantially increasing the attraction of dust to the surface, but also by increasing the adhesion force. Jiang et. al., have also shown that these higher soiling attraction and adhesion forces continue long into the night when the PV is no longer producing power. In this paper, we present a set of field results that demonstrate enhanced soiling rates that is due to the strong electric fields induced by these high voltage PV arrays. This includes observation of enhanced soiling rates measured in the field when a module is held at ±1000 V. This is critical information for installation operators because soiling losses may be higher on some panels than what is measured by typical soiling stations, and because the high voltages are not uniform across an array, some modules may have more soiling than others, leading to potential issues with non-uniform soiling problems at the array level. We present this set of compelling electric field induced soiling results in this paper.","PeriodicalId":6749,"journal":{"name":"2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)","volume":"120 3 Suppl 1","pages":"1-4"},"PeriodicalIF":0.0,"publicationDate":"2019-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88757637","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-06-16DOI: 10.1109/PVSC40753.2019.9198970
Anand Kumar, S. Grijalva, J. Deboever, J. Peppanen, M. Rylander
Accurate representation of the impact of voltage regulation equipment (VRE) on distribution feeders is fundamental for assessing photovoltaic (PV) impacts and for many other applications in distribution planning and operations. VRE are frequently controlled based on the voltage observed at the VRE terminals. Conventionally, the operation of VRE is assessed by solving three-phase unbalanced power flows. Using conventional modeling approaches for applications such as PV hosting capacity can require solving prohibitively large number of power flows in order to capture the impact that VRE have on the network. In this paper, we explore the applicability of sensitivitybased modelling to estimate the controller voltages of tap changing transformers, line voltage regulators and capacitor banks on large-scale, complex three-phase unbalanced, radial distribution systems. The sensitivity-based model can estimate the VRE controller voltage based on the load and current state of discrete controllable elements in the circuit. The proposed model is shown to accurately estimate VRE controller voltages on both a modified IEEE-123 bus test feeder with 3 voltage regulating devices and on a realistic large-scale utility feeder with 12 voltage regulating devices. The proposed mathematical representation can be leveraged for fast determination of voltage in distribution application such as PV hosting capacity.
{"title":"Mathematical Representation of Voltage Regulation Impact on Distribution Feeder Voltages","authors":"Anand Kumar, S. Grijalva, J. Deboever, J. Peppanen, M. Rylander","doi":"10.1109/PVSC40753.2019.9198970","DOIUrl":"https://doi.org/10.1109/PVSC40753.2019.9198970","url":null,"abstract":"Accurate representation of the impact of voltage regulation equipment (VRE) on distribution feeders is fundamental for assessing photovoltaic (PV) impacts and for many other applications in distribution planning and operations. VRE are frequently controlled based on the voltage observed at the VRE terminals. Conventionally, the operation of VRE is assessed by solving three-phase unbalanced power flows. Using conventional modeling approaches for applications such as PV hosting capacity can require solving prohibitively large number of power flows in order to capture the impact that VRE have on the network. In this paper, we explore the applicability of sensitivitybased modelling to estimate the controller voltages of tap changing transformers, line voltage regulators and capacitor banks on large-scale, complex three-phase unbalanced, radial distribution systems. The sensitivity-based model can estimate the VRE controller voltage based on the load and current state of discrete controllable elements in the circuit. The proposed model is shown to accurately estimate VRE controller voltages on both a modified IEEE-123 bus test feeder with 3 voltage regulating devices and on a realistic large-scale utility feeder with 12 voltage regulating devices. The proposed mathematical representation can be leveraged for fast determination of voltage in distribution application such as PV hosting capacity.","PeriodicalId":6749,"journal":{"name":"2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)","volume":"28 1","pages":"1-5"},"PeriodicalIF":0.0,"publicationDate":"2019-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84978324","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-06-16DOI: 10.1109/PVSC40753.2019.9198959
Jingna Jiang, Jianxiong Ni, Y. Zhang, Dandan Rong, Yabin Li, Tianshun Feng, Y. Geng, Jiong Zheng, Fan Bo, Yi He
In this work, we demonstrate that modules with halfhalf-cell layout show an increased power by using the triangular ribbon. Firstly, we have studied the impact on power of different triangular ribbon structures by a SunSolve simulation tool. Secondly, on basis of the rectangular and optimizing triangular ribbon structures, we have performed simulation and experimental results for full full-cell modules and half half-cell modules respectively. Both simulation and experimental results agree to a good extent and they show that the power output of half half-cell module with triangular ribbon increase s to about 4.74% than full cell module with rectangular ribbon.
{"title":"Optimizing Ribbons Structure For Power Gain In Half-Cell Modules","authors":"Jingna Jiang, Jianxiong Ni, Y. Zhang, Dandan Rong, Yabin Li, Tianshun Feng, Y. Geng, Jiong Zheng, Fan Bo, Yi He","doi":"10.1109/PVSC40753.2019.9198959","DOIUrl":"https://doi.org/10.1109/PVSC40753.2019.9198959","url":null,"abstract":"In this work, we demonstrate that modules with halfhalf-cell layout show an increased power by using the triangular ribbon. Firstly, we have studied the impact on power of different triangular ribbon structures by a SunSolve simulation tool. Secondly, on basis of the rectangular and optimizing triangular ribbon structures, we have performed simulation and experimental results for full full-cell modules and half half-cell modules respectively. Both simulation and experimental results agree to a good extent and they show that the power output of half half-cell module with triangular ribbon increase s to about 4.74% than full cell module with rectangular ribbon.","PeriodicalId":6749,"journal":{"name":"2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)","volume":"67 1","pages":"1-4"},"PeriodicalIF":0.0,"publicationDate":"2019-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84353193","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-06-16DOI: 10.1109/PVSC40753.2019.9198981
Cassidy Sainsbury, Harrison W. Wilterdink, R. Sinton
Only the reproducibility part of uncertainty is under the control of a production facility; making it in their favor to monitor, maintain, and improve production reproducibility. However, it is disturbingly common to find production facilities, and sometimes research organizations, making qualification decisions based on the statistically weak metric of maximum-minimum (range). Although range is easily computed and comprehended, it is not a good statistical measure. We show that reproducibility can be calculated easily with sound statistics that can be used by production facilities. Using a statistically strong metric like standard deviation provides more insight into the quality of data and potential contributors to the reproducibility than the often-used range metric (maximum and minimum). Range uses two points of many collected and does not give an accurate value for tester reproducibility.
{"title":"Measurement Uncertainty in Production Solar Cell and Module Power","authors":"Cassidy Sainsbury, Harrison W. Wilterdink, R. Sinton","doi":"10.1109/PVSC40753.2019.9198981","DOIUrl":"https://doi.org/10.1109/PVSC40753.2019.9198981","url":null,"abstract":"Only the reproducibility part of uncertainty is under the control of a production facility; making it in their favor to monitor, maintain, and improve production reproducibility. However, it is disturbingly common to find production facilities, and sometimes research organizations, making qualification decisions based on the statistically weak metric of maximum-minimum (range). Although range is easily computed and comprehended, it is not a good statistical measure. We show that reproducibility can be calculated easily with sound statistics that can be used by production facilities. Using a statistically strong metric like standard deviation provides more insight into the quality of data and potential contributors to the reproducibility than the often-used range metric (maximum and minimum). Range uses two points of many collected and does not give an accurate value for tester reproducibility.","PeriodicalId":6749,"journal":{"name":"2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)","volume":"30 1","pages":"1-5"},"PeriodicalIF":0.0,"publicationDate":"2019-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88092156","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-06-16DOI: 10.1109/PVSC40753.2019.9198965
Colin D. Bailie, C. Eberspacher, Timothy S. Gehan, R. Bramante, M. Van Hest
This work evaluates the critical issues surrounding P1, P2, and P3 scribing for semi-transparent perovskite module integration. We find that P1 scribing procedures are well-translated from other thin-film technologies. P2 scribing is best performed with a mechanical scribe, but remains a source of series resistance. P3 scribing is found to cause an increase in scribing dead area and a potential degradation source.
{"title":"Evaluating Interconnection Schemes for Semi-transparent Perovskite Mini-modules","authors":"Colin D. Bailie, C. Eberspacher, Timothy S. Gehan, R. Bramante, M. Van Hest","doi":"10.1109/PVSC40753.2019.9198965","DOIUrl":"https://doi.org/10.1109/PVSC40753.2019.9198965","url":null,"abstract":"This work evaluates the critical issues surrounding P1, P2, and P3 scribing for semi-transparent perovskite module integration. We find that P1 scribing procedures are well-translated from other thin-film technologies. P2 scribing is best performed with a mechanical scribe, but remains a source of series resistance. P3 scribing is found to cause an increase in scribing dead area and a potential degradation source.","PeriodicalId":6749,"journal":{"name":"2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)","volume":"9 1","pages":"1-5"},"PeriodicalIF":0.0,"publicationDate":"2019-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82502151","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-06-16DOI: 10.1109/PVSC40753.2019.9198973
R. Perez, Marc J. R. Perez, Marco Pierro, J. Schlemmer, Sergery Kivalov, J. Dise, P. Keelin, M. Grammatico, A. Świerc, Jorge Ferreira, Andrew Foster, Morgan Putnam, T. Hoff
The SUNY solar irradiance forecast model is implemented in the SolarAnywhere platform. In this article, we evaluate its latest version and present a fully independent validation for climatically distinct individual US locations as well as one extended region. In addition to standard performance metrics such as mean absolute error or forecast skill, we apply a new operational metric that quantifies the lowest cost of operationally achieving perfect forecasts. This cost represents the amount of solar production curtailment and backup storage necessary to correct all over/under-prediction situations. This perfect forecast metric applies a recently developed algorithm to optimally transform intermittent renewable power generation into firm power generation with the optimal - least-cost – amount of curtailment and energy storage. We discuss how perfect forecast logistics can gradually evolve and scale up into firm solar power generation logistics, with the objective of cost-optimally displacing conventional [dispatchable] power generation.
{"title":"Operationally Perfect Solar Power Forecasts: A Scalable Strategy to Lowest-Cost Firm Solar Power Generation","authors":"R. Perez, Marc J. R. Perez, Marco Pierro, J. Schlemmer, Sergery Kivalov, J. Dise, P. Keelin, M. Grammatico, A. Świerc, Jorge Ferreira, Andrew Foster, Morgan Putnam, T. Hoff","doi":"10.1109/PVSC40753.2019.9198973","DOIUrl":"https://doi.org/10.1109/PVSC40753.2019.9198973","url":null,"abstract":"The SUNY solar irradiance forecast model is implemented in the SolarAnywhere platform. In this article, we evaluate its latest version and present a fully independent validation for climatically distinct individual US locations as well as one extended region. In addition to standard performance metrics such as mean absolute error or forecast skill, we apply a new operational metric that quantifies the lowest cost of operationally achieving perfect forecasts. This cost represents the amount of solar production curtailment and backup storage necessary to correct all over/under-prediction situations. This perfect forecast metric applies a recently developed algorithm to optimally transform intermittent renewable power generation into firm power generation with the optimal - least-cost – amount of curtailment and energy storage. We discuss how perfect forecast logistics can gradually evolve and scale up into firm solar power generation logistics, with the objective of cost-optimally displacing conventional [dispatchable] power generation.","PeriodicalId":6749,"journal":{"name":"2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)","volume":"113 1","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2019-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80558593","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-06-16DOI: 10.1109/PVSC40753.2019.9198985
Christian J. Ruud, Brent Fisher, J. Gordon, N. Giebink
Microscale concentrating photovoltaics can improve the efficiency and reduce the cost of photovoltaic power in space. We report progress on a lightweight, monolithic, and ultrathin reflective concentrator for space based on triple-junction transfer printed microscale photovoltaic cells. The ~1 mm-thick first-generation prototype validates optical modeling and delivers 24% efficiency with a ± 9° acceptance angle. These results provide the foundation for a second-generation prototype based on an optimal paraboloidal reflector that is predicted to achieve a specific power >350 W/kg over an acceptance angle of ± 7°.
{"title":"Recent Advances in Microcell Concentrating Photovoltaics for Space","authors":"Christian J. Ruud, Brent Fisher, J. Gordon, N. Giebink","doi":"10.1109/PVSC40753.2019.9198985","DOIUrl":"https://doi.org/10.1109/PVSC40753.2019.9198985","url":null,"abstract":"Microscale concentrating photovoltaics can improve the efficiency and reduce the cost of photovoltaic power in space. We report progress on a lightweight, monolithic, and ultrathin reflective concentrator for space based on triple-junction transfer printed microscale photovoltaic cells. The ~1 mm-thick first-generation prototype validates optical modeling and delivers 24% efficiency with a ± 9° acceptance angle. These results provide the foundation for a second-generation prototype based on an optimal paraboloidal reflector that is predicted to achieve a specific power >350 W/kg over an acceptance angle of ± 7°.","PeriodicalId":6749,"journal":{"name":"2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)","volume":"17 1","pages":"1-3"},"PeriodicalIF":0.0,"publicationDate":"2019-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91245879","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-06-16DOI: 10.1109/PVSC40753.2019.9198963
Pablo Guimerá Coll, R. Meier, M. Bertoni
Spalling has been proposed as a promising kerfless technique for slicing thinner wafers (down to 5 μm) and thus enhance the wafer yield from an ingot. The main challenge of spalling is to control the roughness and thickness variation of the spalled wafers that can be as high as 100% of the wafer thickness. The roughness affects the mechanical stability (due to surface defects) as well as the effective minority carrier lifetime (surface recombination velocity). In this paper, we have developed a dynamic finite element analysis to correlate the surface roughness of a spalled silicon wafer with the stress applied at the crack tip. These predictions were experimentally validated with crack velocity measurements and surface roughness analysis for different applied stresses. By controlling the stress applied, we were able to reduce the surface roughness in silicon by 62%.
{"title":"Understanding the Effect of Stress on Surface Roughening during Silicon Spalling: A Theoretical and Experimental Study","authors":"Pablo Guimerá Coll, R. Meier, M. Bertoni","doi":"10.1109/PVSC40753.2019.9198963","DOIUrl":"https://doi.org/10.1109/PVSC40753.2019.9198963","url":null,"abstract":"Spalling has been proposed as a promising kerfless technique for slicing thinner wafers (down to 5 μm) and thus enhance the wafer yield from an ingot. The main challenge of spalling is to control the roughness and thickness variation of the spalled wafers that can be as high as 100% of the wafer thickness. The roughness affects the mechanical stability (due to surface defects) as well as the effective minority carrier lifetime (surface recombination velocity). In this paper, we have developed a dynamic finite element analysis to correlate the surface roughness of a spalled silicon wafer with the stress applied at the crack tip. These predictions were experimentally validated with crack velocity measurements and surface roughness analysis for different applied stresses. By controlling the stress applied, we were able to reduce the surface roughness in silicon by 62%.","PeriodicalId":6749,"journal":{"name":"2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)","volume":"11 1","pages":"1-3"},"PeriodicalIF":0.0,"publicationDate":"2019-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87371052","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-06-16DOI: 10.1109/PVSC40753.2019.9198984
Takeya Mochizuki, K. Gotoh, Y. Kurokawa, N. Usami
The conversion efficiency of crystalline silicon heterojunction solar cells is increased by carrier selective contacts (CSCs) thanks to the combination of conductive and passivating layers. In this work, we propose the titanium oxide (TiO TiOx) bilayer to consist of TiO TiOx layerlayers prepared at 100 and 150°C by atomic layer deposition ALD). The TiO TiOx bi layer shows higher electrical properties in comparison with a single TiO TiOx layer. The enhanced electrical properties are origin ated from high passivation performance and low contact resist resistivity of TiO TiOx layerlayers prepared at 150 and 100 °C, respectively respectively, suggesting modulation of the deposition temperature can improve the functionality of ALD ALD-materials.
{"title":"Electrical properties of TiO TiOx bilayer prepared by atomic layer deposition at different temperatures","authors":"Takeya Mochizuki, K. Gotoh, Y. Kurokawa, N. Usami","doi":"10.1109/PVSC40753.2019.9198984","DOIUrl":"https://doi.org/10.1109/PVSC40753.2019.9198984","url":null,"abstract":"The conversion efficiency of crystalline silicon heterojunction solar cells is increased by carrier selective contacts (CSCs) thanks to the combination of conductive and passivating layers. In this work, we propose the titanium oxide (TiO TiOx) bilayer to consist of TiO TiOx layerlayers prepared at 100 and 150°C by atomic layer deposition ALD). The TiO TiOx bi layer shows higher electrical properties in comparison with a single TiO TiOx layer. The enhanced electrical properties are origin ated from high passivation performance and low contact resist resistivity of TiO TiOx layerlayers prepared at 150 and 100 °C, respectively respectively, suggesting modulation of the deposition temperature can improve the functionality of ALD ALD-materials.","PeriodicalId":6749,"journal":{"name":"2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)","volume":"156 1","pages":"1-3"},"PeriodicalIF":0.0,"publicationDate":"2019-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86325671","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-06-16DOI: 10.1109/PVSC40753.2019.9198952
Juan‐Pablo Correa‐Baena, Yanqi Luo, Thomas M. Brenner, Jordan M. Snaider, Shijing Sun, Xueying Li, M. Jensen, Noor Titan Putri Hartono, L. Nienhaus, S. Wieghold, Jeremy R. Poindexter, Shen Wang, Y. Meng, Ti Wang, B. Lai, M. Holt, Z. Cai, M. Bawendi, Libai Huang, T. Buonassisi, D. Fenning
Compositional engineering related to the organic and inorganic cations (A-site) in halide perovskites solar cells has helped improve efficiency and long-term durability. However, this compositional complexity can lead to phase segregation that weakens the optoelectronic performance. Here, we show the halide distribution and cation distribution by means of synchrotron-based nanoprobe x-ray fluorescence. We find that the halide distribution homogenizes upon the addition of CsI and RbI precursors. The halide homogenization coincides with long-lived charge carrier decays. Additionally, we observe Rb-rich areas that phase segregate within the film and the Rb aggregates are identified to be recombination active using X-ray and E-beam induced current microscopy.
{"title":"Halide Homogenization and Cation Segregation in High Performance Perovskite Solar Cells","authors":"Juan‐Pablo Correa‐Baena, Yanqi Luo, Thomas M. Brenner, Jordan M. Snaider, Shijing Sun, Xueying Li, M. Jensen, Noor Titan Putri Hartono, L. Nienhaus, S. Wieghold, Jeremy R. Poindexter, Shen Wang, Y. Meng, Ti Wang, B. Lai, M. Holt, Z. Cai, M. Bawendi, Libai Huang, T. Buonassisi, D. Fenning","doi":"10.1109/PVSC40753.2019.9198952","DOIUrl":"https://doi.org/10.1109/PVSC40753.2019.9198952","url":null,"abstract":"Compositional engineering related to the organic and inorganic cations (A-site) in halide perovskites solar cells has helped improve efficiency and long-term durability. However, this compositional complexity can lead to phase segregation that weakens the optoelectronic performance. Here, we show the halide distribution and cation distribution by means of synchrotron-based nanoprobe x-ray fluorescence. We find that the halide distribution homogenizes upon the addition of CsI and RbI precursors. The halide homogenization coincides with long-lived charge carrier decays. Additionally, we observe Rb-rich areas that phase segregate within the film and the Rb aggregates are identified to be recombination active using X-ray and E-beam induced current microscopy.","PeriodicalId":6749,"journal":{"name":"2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)","volume":"7 1","pages":"1-2"},"PeriodicalIF":0.0,"publicationDate":"2019-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87810723","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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