Pub Date : 1992-01-01DOI: 10.1109/ISEMC.1992.626108
M. Radojicic, J. Rollin, L. Macleod, J. Drayton
A new gasket technology has been developed for ElectroMagnetic Interference (EMI) containment which has proven to be superior to conventional pressurefit gaskets for both performance and reliability in marry applications. The gasket consists of a flexible, conductive diaphragm which is held to a cavity opening by means of a magnetic strip. This technology results in a high shielding effectiveness (SE) over a wide frequency range with almost no degradation in performance over life. Testing has demonstrated an average SE 20 to 30 dB superior to that possible from conventional gaskets between 20 MHz and 5 GHz.
{"title":"A new gasket providing high shielding effectiveness at low cost: The \"magnetic\" gasket","authors":"M. Radojicic, J. Rollin, L. Macleod, J. Drayton","doi":"10.1109/ISEMC.1992.626108","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626108","url":null,"abstract":"A new gasket technology has been developed for ElectroMagnetic Interference (EMI) containment which has proven to be superior to conventional pressurefit gaskets for both performance and reliability in marry applications. The gasket consists of a flexible, conductive diaphragm which is held to a cavity opening by means of a magnetic strip. This technology results in a high shielding effectiveness (SE) over a wide frequency range with almost no degradation in performance over life. Testing has demonstrated an average SE 20 to 30 dB superior to that possible from conventional gaskets between 20 MHz and 5 GHz.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"20 1","pages":"356-360"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82444207","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-01-01DOI: 10.1109/ISEMC.1992.626051
B. Kuhlman
Procedures from the Federal Aviation Administration (FAA) establish a margin between lightning induced transient levels, and equipment transient qualification levels, as a basis for certification of aircraft electrical/electronic equipment. The electromagnetic environment applied to equipment by existing qualification standards is an approximation of the aircraft environment, complicating analysis of the margin. A circuit model of aircraft transient behavior is used to compare the aircraft and equipment qualification environments, with elements extracted from data from aircraft lightning simulation tests. Margins are plotted as a function of equipment load impedance and transient source impedance on the basis of peak voltage, power, and energy. The range of validity for margin values is shown to be restricted by the characteristics of the generator source impedance. Introduction Lightning research over the last decade has defined the repetitive current pulses encountered by aircraft. The spread of electronics in aircraft systems from the faucet control to critical flight systems has prompted new aviation regulations to insure electromagnetic compatibility with lightning. Procedures have been developed by the FAA through the work of SAE and RTCA comittees and their counterparts in Europe, to address lightning effects on aircraft electrical/ electronic equipment. These are outlined in Advisory Circular AC 20-136 (1). The external aircraft lightning environment has been defined by waveforms of current such as the single stroke, multiple stroke, and multiple burst waveforms. The steps in the procedure provide that lightning induced transient levels are limited to the transient control level (TCL), and that aircraft equipment tolerate transients up to the equipment transient design level (ETDL). The ratio of ETDL to TCL is defined as the margin (Figure 1). The TCL and ETDL encompass a wide range of circuit responses with differing waveforms. The margin must be based on one or more waveform characteristic. Procedures for qualification of airborne equipment contained in DO-160C section 22 (2) were adopted to verify the ETDL. The induced transients were represented as Thevenin equivalent sources, with short wave, long wave, and oscillatory waveforms, and five ohm or twenty ohm source resistances. The procedures did not address all of the new requirements and have been under revision by the SAE and RTCA committees. The recent approach has been to EQUIPMENT TRANSIENT DESIGN
{"title":"Lightning Transient Response And Margin Analysis Of Aircraft Circuits","authors":"B. Kuhlman","doi":"10.1109/ISEMC.1992.626051","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626051","url":null,"abstract":"Procedures from the Federal Aviation Administration (FAA) establish a margin between lightning induced transient levels, and equipment transient qualification levels, as a basis for certification of aircraft electrical/electronic equipment. The electromagnetic environment applied to equipment by existing qualification standards is an approximation of the aircraft environment, complicating analysis of the margin. A circuit model of aircraft transient behavior is used to compare the aircraft and equipment qualification environments, with elements extracted from data from aircraft lightning simulation tests. Margins are plotted as a function of equipment load impedance and transient source impedance on the basis of peak voltage, power, and energy. The range of validity for margin values is shown to be restricted by the characteristics of the generator source impedance. Introduction Lightning research over the last decade has defined the repetitive current pulses encountered by aircraft. The spread of electronics in aircraft systems from the faucet control to critical flight systems has prompted new aviation regulations to insure electromagnetic compatibility with lightning. Procedures have been developed by the FAA through the work of SAE and RTCA comittees and their counterparts in Europe, to address lightning effects on aircraft electrical/ electronic equipment. These are outlined in Advisory Circular AC 20-136 (1). The external aircraft lightning environment has been defined by waveforms of current such as the single stroke, multiple stroke, and multiple burst waveforms. The steps in the procedure provide that lightning induced transient levels are limited to the transient control level (TCL), and that aircraft equipment tolerate transients up to the equipment transient design level (ETDL). The ratio of ETDL to TCL is defined as the margin (Figure 1). The TCL and ETDL encompass a wide range of circuit responses with differing waveforms. The margin must be based on one or more waveform characteristic. Procedures for qualification of airborne equipment contained in DO-160C section 22 (2) were adopted to verify the ETDL. The induced transients were represented as Thevenin equivalent sources, with short wave, long wave, and oscillatory waveforms, and five ohm or twenty ohm source resistances. The procedures did not address all of the new requirements and have been under revision by the SAE and RTCA committees. The recent approach has been to EQUIPMENT TRANSIENT DESIGN","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"5 1","pages":"72-76"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"72638085","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-01-01DOI: 10.1109/ISEMC.1992.626157
H. Zaghloul
This paper shows that there is a solution for the vector Helmholtz equation in spherical coordinates that does not fit in the: general expression given by Hansen [l], Stratton [5] and Chandrasekhar and Kendall [2]. This paper finds a more general solution of the vector Helmholtz equation in spherical coordinates. This is applied to force-free magnetic fields in spherical coordinates.
本文证明了矢量亥姆霍兹方程在球坐标下存在不符合Hansen[1]、Stratton[5]和Chandrasekhar and Kendall[2]给出的一般表达式的解。本文给出了矢量亥姆霍兹方程在球坐标下的一种更一般的解。这适用于球坐标下的无力磁场。
{"title":"A general solution for force-free magnetic fields in spherical coordinates","authors":"H. Zaghloul","doi":"10.1109/ISEMC.1992.626157","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626157","url":null,"abstract":"This paper shows that there is a solution for the vector Helmholtz equation in spherical coordinates that does not fit in the: general expression given by Hansen [l], Stratton [5] and Chandrasekhar and Kendall [2]. This paper finds a more general solution of the vector Helmholtz equation in spherical coordinates. This is applied to force-free magnetic fields in spherical coordinates.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"1 1","pages":"513-514"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73542060","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-01-01DOI: 10.1109/ISEMC.1992.626124
W.B. Halaberda, J. Rivers
{"title":"Measurement comparisons of radiated test facilities","authors":"W.B. Halaberda, J. Rivers","doi":"10.1109/ISEMC.1992.626124","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626124","url":null,"abstract":"","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"299 1","pages":"401-406"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73166549","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-01-01DOI: 10.1109/ISEMC.1992.626075
M. Lutz, J-P. Lecury
This paper explains, how the burst "EFT' will be generated, what compromises have been madle to the standard 801-4 and the consequences of testing ielectronic equipment using these compromises. To avoid operational failure of some electronic equipment, the "real EFY must be simulated. In this paper the results of ElT testing on an electronic system will be presented. The test was conducted with spike frequencies up to 500k.H~ and voltage amplitudes higher than 4 kV.
本文解释了如何产生突发“EFT”，对标准801-4进行了哪些妥协，以及使用这些妥协测试电子设备的后果。为了避免某些电子设备出现运行故障，必须对“真实飞行”进行模拟。本文将介绍在一个电子系统上进行英语测试的结果。试验在峰值频率高达500k h ~，电压幅值高于4kv的条件下进行。
{"title":"Electric Fast Transient IEC 801-4. Susceptibility Of Electronic Equipment And Systems At Higher Frequencies And Voltages.","authors":"M. Lutz, J-P. Lecury","doi":"10.1109/ISEMC.1992.626075","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626075","url":null,"abstract":"This paper explains, how the burst \"EFT' will be generated, what compromises have been madle to the standard 801-4 and the consequences of testing ielectronic equipment using these compromises. To avoid operational failure of some electronic equipment, the \"real EFY must be simulated. In this paper the results of ElT testing on an electronic system will be presented. The test was conducted with spike frequencies up to 500k.H~ and voltage amplitudes higher than 4 kV.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"86 1","pages":"189-194"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89439192","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-01-01DOI: 10.1109/ISEMC.1992.626148
R. Keenan
{"title":"Some Fundamental Aspects Of ESD Testing, Part II","authors":"R. Keenan","doi":"10.1109/ISEMC.1992.626148","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626148","url":null,"abstract":"","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"54 1","pages":"469-473"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74045189","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-01-01DOI: 10.1109/ISEMC.1992.626086
R. C. Pritchard, D.C. Smith
In the past, arguments have been made that Shielded Twisted pair cable, STP, should have better susceptibility performance than Unshielded Twisted pair cable, UTP, in an environment where the cable is subjected to significant external noise. This paper shows that currently available UTP has susceptibility performance that is similar to STP when tested according to 1EC 801-4, Electrical Fast Transient, one of the most severe forms of interference to data signals. This result holds the possibility of substantial savings for building wiring installations.
{"title":"A comparison of the susceptibility performance of shielded and unshielded twisted pair cable for data transmission","authors":"R. C. Pritchard, D.C. Smith","doi":"10.1109/ISEMC.1992.626086","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626086","url":null,"abstract":"In the past, arguments have been made that Shielded Twisted pair cable, STP, should have better susceptibility performance than Unshielded Twisted pair cable, UTP, in an environment where the cable is subjected to significant external noise. This paper shows that currently available UTP has susceptibility performance that is similar to STP when tested according to 1EC 801-4, Electrical Fast Transient, one of the most severe forms of interference to data signals. This result holds the possibility of substantial savings for building wiring installations.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"50 1","pages":"236-242"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76253955","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-01-01DOI: 10.1109/ISEMC.1992.626142
K. Balmain, F. Rayal
Human electrostatic discharge is discussed as a travellingwave process, with the objective of simulating the initial nanosecond-scale current impulse. The approach presented uses swept-frequency impedance measurements at the "fingertip" to establish equivalence between the human subject and the simulator which is a lossy dielectric strip. The impedance measurements at the fingertip are used for approximate FFT calculation of transient discharge current. Time-domain arc discharge current measurements for the human subject and the simulator are presented for comparison. Also presented are method-of-moments calculations of time-domain discharge currents, using a loaded wire grid representation for the lossy dielectric strip simulator.
{"title":"Travelling-wave Fast-transient ESD Simulation","authors":"K. Balmain, F. Rayal","doi":"10.1109/ISEMC.1992.626142","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626142","url":null,"abstract":"Human electrostatic discharge is discussed as a travellingwave process, with the objective of simulating the initial nanosecond-scale current impulse. The approach presented uses swept-frequency impedance measurements at the \"fingertip\" to establish equivalence between the human subject and the simulator which is a lossy dielectric strip. The impedance measurements at the fingertip are used for approximate FFT calculation of transient discharge current. Time-domain arc discharge current measurements for the human subject and the simulator are presented for comparison. Also presented are method-of-moments calculations of time-domain discharge currents, using a loaded wire grid representation for the lossy dielectric strip simulator.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"18 1","pages":"455-459"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76848131","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-01-01DOI: 10.1109/ISEMC.1992.626039
A. Raahid
Certain apparent anomalies in the present electromagnetic shielding theory of a conductive barrier tal radiations from an antenna are described. The rereflection loss paranneter of the present theory is reviewed and the question of its existence is resolved. By using both transmission line and electromagnetic wave propagation theories, it is shown that the rereflection loss occurs in both transmission lines and conductive barriers. The limited applicability of the present theory only to plane wave radiations from antennas is discussed.
{"title":"Introduction to shielding boundary conditions and anomalies","authors":"A. Raahid","doi":"10.1109/ISEMC.1992.626039","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626039","url":null,"abstract":"Certain apparent anomalies in the present electromagnetic shielding theory of a conductive barrier tal radiations from an antenna are described. The rereflection loss paranneter of the present theory is reviewed and the question of its existence is resolved. By using both transmission line and electromagnetic wave propagation theories, it is shown that the rereflection loss occurs in both transmission lines and conductive barriers. The limited applicability of the present theory only to plane wave radiations from antennas is discussed.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"28 1","pages":"1-5"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78113145","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-01-01DOI: 10.1109/ISEMC.1992.626102
L. Halme
IEC has in the Working Groups on Screening Effectiveness of the sub-committees on RF cables and RF connectors developed shielding effectiveness measurement standards during the past twenty years. The preparatory work is now about completed and new standards for measuring methods and limits are on their way. In this paper the adopted shielding effectiveness quantities and their definitions and background are explained.
{"title":"Development Of IEC Cable Shielding Effectiveness Standards","authors":"L. Halme","doi":"10.1109/ISEMC.1992.626102","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626102","url":null,"abstract":"IEC has in the Working Groups on Screening Effectiveness of the sub-committees on RF cables and RF connectors developed shielding effectiveness measurement standards during the past twenty years. The preparatory work is now about completed and new standards for measuring methods and limits are on their way. In this paper the adopted shielding effectiveness quantities and their definitions and background are explained.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"168 1","pages":"321-328"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79516274","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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