Pub Date : 1992-01-01DOI: 10.1109/ISEMC.1992.626108
M. Radojicic, J. Rollin, L. Macleod, J. Drayton
A new gasket technology has been developed for ElectroMagnetic Interference (EMI) containment which has proven to be superior to conventional pressurefit gaskets for both performance and reliability in marry applications. The gasket consists of a flexible, conductive diaphragm which is held to a cavity opening by means of a magnetic strip. This technology results in a high shielding effectiveness (SE) over a wide frequency range with almost no degradation in performance over life. Testing has demonstrated an average SE 20 to 30 dB superior to that possible from conventional gaskets between 20 MHz and 5 GHz.
{"title":"A new gasket providing high shielding effectiveness at low cost: The \"magnetic\" gasket","authors":"M. Radojicic, J. Rollin, L. Macleod, J. Drayton","doi":"10.1109/ISEMC.1992.626108","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626108","url":null,"abstract":"A new gasket technology has been developed for ElectroMagnetic Interference (EMI) containment which has proven to be superior to conventional pressurefit gaskets for both performance and reliability in marry applications. The gasket consists of a flexible, conductive diaphragm which is held to a cavity opening by means of a magnetic strip. This technology results in a high shielding effectiveness (SE) over a wide frequency range with almost no degradation in performance over life. Testing has demonstrated an average SE 20 to 30 dB superior to that possible from conventional gaskets between 20 MHz and 5 GHz.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"20 1","pages":"356-360"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82444207","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-01-01DOI: 10.1109/ISEMC.1992.626070
D. Weiner
ELECTROMAGNETIC COMPATIBILITY is proposed as a new 500-level course in Electrical Engineering. This course will augment the relatively few design courses available to students in Electrical and Computer Engineering. It will also satisfy the need by industry for students who understand problems associated with designing electromagnetically compatible products. To enhance the design aspect of the course, demonstrations and experiments will be included. A) PROBLEM STATEMENT The accreditation board for Electrical and Computer Engineering undergraduate programs requires that undergraduate students take a minimum of 16 design credits. Currently, Electrical and Computer Engineering students at Syracuse University have little flexibility in selection of their design courses. To alleviate this situation, it is proposed to develop a new 500-level design course to be taught for senior and first-year graduate students. In selecting the topic area for such a course, consideration was given to industrial requirements. Manufacturers of electrical products and electronic systems are keenly aware of the importance of electromagnetic compatibility (EMC). For example, it is important that the electromagnetic radiation from a home computer not interfere with television reception. As a rule, industry cannot afford an in house program to train their beginning engineers to the necessary level of EMC design competence. Consequently, industry today considers a basic knowledge of EMC to be as important a part of an Electrical or Computer Engineer’s education as is circuits, digital design, signal theory, electromagnetics, etc. Nevertheless, according to a survey in 1985 by the Education Committee of the IEEE Electromagnetic Compatibility Society, only a few colleges and universities offer courses dealing with EMC. In spite of this, most respondents felt that there was a need to include this material in the Electrical Engineering curriculum. To satisfy this need, ELECTROMAGNETIC COMPATIBILITY was selected as the subject matter for the new design course. B) OBJECTIVES The course material will be based on the text, INTRODUCTION TO ELECTROMAGNETIC COMPATIBILITY, by C.R. Paul. The manuscript has only recently been accepted for publication by John Wiley and Sons, Inc. (I served as one of the reviewers for John Wiley.) A course outline, based on this text, is included with the supporting documents. In a design course of this nature, it is important that the student observe demonstrations and have an opportunity to conduct experiments. Not only will this help the student to understand and retain the course material, it will also provide the student with an opportunity to see and use modern measurement equipments and to CH3169-0/92/0000-0032 $3.00 01992 IEEE 166 obtain an appreciation for realistic "numbers" to be observed in practice. The objective of the proposed project is to develop a minimum of two demonstrations and four experiments for the new course which will first be tau
《电磁兼容性》是电气工程专业500级新开设的一门课程。本课程将为电气和计算机工程专业学生提供相对较少的设计课程。它也将满足行业对了解设计电磁兼容产品相关问题的学生的需求。为了加强课程的设计方面，将包括演示和实验。A)问题说明电子与计算机工程本科专业认证委员会要求本科学生至少修满16个设计学分。目前，雪城大学(Syracuse University)电气和计算机工程专业的学生在选择设计课程时几乎没有灵活性。为了缓解这种情况，建议开发一门新的500级设计课程，面向大四和研究生一年级的学生。在为这门课程选择主题领域时，考虑到了工业要求。电气产品和电子系统的制造商都敏锐地意识到电磁兼容性(EMC)的重要性。例如，重要的是，来自家用电脑的电磁辐射不干扰电视接收。作为一个规则，行业不能负担一个内部程序来培训他们的初级工程师到必要水平的EMC设计能力。因此，当今业界认为EMC的基本知识与电路，数字设计，信号理论，电磁学等一样，是电气或计算机工程师教育的重要组成部分。然而，根据1985年IEEE电磁兼容协会教育委员会的一项调查，只有少数学院和大学提供有关电磁兼容的课程。尽管如此，大多数受访者认为有必要将这些材料纳入电气工程课程。为了满足这一需求，我们选择了电磁兼容性作为新设计课程的主题。本课程材料将基于C.R. Paul所著的《电磁兼容性导论》。手稿直到最近才被约翰·威利父子公司(John Wiley and Sons, Inc.)接受出版(我是约翰·威利的审稿人之一)。课程大纲，基于这一文本，包括在支持文件。在这种性质的设计课程中，学生观察演示并有机会进行实验是很重要的。这不仅有助于学生理解和记住课程材料，还将为学生提供一个看到和使用现代测量设备的机会，并使他们能够在实践中观察到真实的“数字”。该计划的目标是为新课程开发至少两个演示和四个实验，该课程将于1992年春季学期首次教授。如有可能，还将安排学生到当地通用电气公司的EMC实验室进行实地考察。课程介绍7.2屏蔽线7.3绞合线
{"title":"EMC Education At Syracuse University","authors":"D. Weiner","doi":"10.1109/ISEMC.1992.626070","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626070","url":null,"abstract":"ELECTROMAGNETIC COMPATIBILITY is proposed as a new 500-level course in Electrical Engineering. This course will augment the relatively few design courses available to students in Electrical and Computer Engineering. It will also satisfy the need by industry for students who understand problems associated with designing electromagnetically compatible products. To enhance the design aspect of the course, demonstrations and experiments will be included. A) PROBLEM STATEMENT The accreditation board for Electrical and Computer Engineering undergraduate programs requires that undergraduate students take a minimum of 16 design credits. Currently, Electrical and Computer Engineering students at Syracuse University have little flexibility in selection of their design courses. To alleviate this situation, it is proposed to develop a new 500-level design course to be taught for senior and first-year graduate students. In selecting the topic area for such a course, consideration was given to industrial requirements. Manufacturers of electrical products and electronic systems are keenly aware of the importance of electromagnetic compatibility (EMC). For example, it is important that the electromagnetic radiation from a home computer not interfere with television reception. As a rule, industry cannot afford an in house program to train their beginning engineers to the necessary level of EMC design competence. Consequently, industry today considers a basic knowledge of EMC to be as important a part of an Electrical or Computer Engineer’s education as is circuits, digital design, signal theory, electromagnetics, etc. Nevertheless, according to a survey in 1985 by the Education Committee of the IEEE Electromagnetic Compatibility Society, only a few colleges and universities offer courses dealing with EMC. In spite of this, most respondents felt that there was a need to include this material in the Electrical Engineering curriculum. To satisfy this need, ELECTROMAGNETIC COMPATIBILITY was selected as the subject matter for the new design course. B) OBJECTIVES The course material will be based on the text, INTRODUCTION TO ELECTROMAGNETIC COMPATIBILITY, by C.R. Paul. The manuscript has only recently been accepted for publication by John Wiley and Sons, Inc. (I served as one of the reviewers for John Wiley.) A course outline, based on this text, is included with the supporting documents. In a design course of this nature, it is important that the student observe demonstrations and have an opportunity to conduct experiments. Not only will this help the student to understand and retain the course material, it will also provide the student with an opportunity to see and use modern measurement equipments and to CH3169-0/92/0000-0032 $3.00 01992 IEEE 166 obtain an appreciation for realistic \"numbers\" to be observed in practice. The objective of the proposed project is to develop a minimum of two demonstrations and four experiments for the new course which will first be tau","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"30 1","pages":"168-170"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75615359","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-01-01DOI: 10.1109/ISEMC.1992.626075
M. Lutz, J-P. Lecury
This paper explains, how the burst "EFT' will be generated, what compromises have been madle to the standard 801-4 and the consequences of testing ielectronic equipment using these compromises. To avoid operational failure of some electronic equipment, the "real EFY must be simulated. In this paper the results of ElT testing on an electronic system will be presented. The test was conducted with spike frequencies up to 500k.H~ and voltage amplitudes higher than 4 kV.
本文解释了如何产生突发“EFT”，对标准801-4进行了哪些妥协，以及使用这些妥协测试电子设备的后果。为了避免某些电子设备出现运行故障，必须对“真实飞行”进行模拟。本文将介绍在一个电子系统上进行英语测试的结果。试验在峰值频率高达500k h ~，电压幅值高于4kv的条件下进行。
{"title":"Electric Fast Transient IEC 801-4. Susceptibility Of Electronic Equipment And Systems At Higher Frequencies And Voltages.","authors":"M. Lutz, J-P. Lecury","doi":"10.1109/ISEMC.1992.626075","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626075","url":null,"abstract":"This paper explains, how the burst \"EFT' will be generated, what compromises have been madle to the standard 801-4 and the consequences of testing ielectronic equipment using these compromises. To avoid operational failure of some electronic equipment, the \"real EFY must be simulated. In this paper the results of ElT testing on an electronic system will be presented. The test was conducted with spike frequencies up to 500k.H~ and voltage amplitudes higher than 4 kV.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"86 1","pages":"189-194"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89439192","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-01-01DOI: 10.1109/ISEMC.1992.626124
W.B. Halaberda, J. Rivers
{"title":"Measurement comparisons of radiated test facilities","authors":"W.B. Halaberda, J. Rivers","doi":"10.1109/ISEMC.1992.626124","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626124","url":null,"abstract":"","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"299 1","pages":"401-406"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73166549","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-01-01DOI: 10.1109/ISEMC.1992.626051
B. Kuhlman
Procedures from the Federal Aviation Administration (FAA) establish a margin between lightning induced transient levels, and equipment transient qualification levels, as a basis for certification of aircraft electrical/electronic equipment. The electromagnetic environment applied to equipment by existing qualification standards is an approximation of the aircraft environment, complicating analysis of the margin. A circuit model of aircraft transient behavior is used to compare the aircraft and equipment qualification environments, with elements extracted from data from aircraft lightning simulation tests. Margins are plotted as a function of equipment load impedance and transient source impedance on the basis of peak voltage, power, and energy. The range of validity for margin values is shown to be restricted by the characteristics of the generator source impedance. Introduction Lightning research over the last decade has defined the repetitive current pulses encountered by aircraft. The spread of electronics in aircraft systems from the faucet control to critical flight systems has prompted new aviation regulations to insure electromagnetic compatibility with lightning. Procedures have been developed by the FAA through the work of SAE and RTCA comittees and their counterparts in Europe, to address lightning effects on aircraft electrical/ electronic equipment. These are outlined in Advisory Circular AC 20-136 (1). The external aircraft lightning environment has been defined by waveforms of current such as the single stroke, multiple stroke, and multiple burst waveforms. The steps in the procedure provide that lightning induced transient levels are limited to the transient control level (TCL), and that aircraft equipment tolerate transients up to the equipment transient design level (ETDL). The ratio of ETDL to TCL is defined as the margin (Figure 1). The TCL and ETDL encompass a wide range of circuit responses with differing waveforms. The margin must be based on one or more waveform characteristic. Procedures for qualification of airborne equipment contained in DO-160C section 22 (2) were adopted to verify the ETDL. The induced transients were represented as Thevenin equivalent sources, with short wave, long wave, and oscillatory waveforms, and five ohm or twenty ohm source resistances. The procedures did not address all of the new requirements and have been under revision by the SAE and RTCA committees. The recent approach has been to EQUIPMENT TRANSIENT DESIGN
{"title":"Lightning Transient Response And Margin Analysis Of Aircraft Circuits","authors":"B. Kuhlman","doi":"10.1109/ISEMC.1992.626051","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626051","url":null,"abstract":"Procedures from the Federal Aviation Administration (FAA) establish a margin between lightning induced transient levels, and equipment transient qualification levels, as a basis for certification of aircraft electrical/electronic equipment. The electromagnetic environment applied to equipment by existing qualification standards is an approximation of the aircraft environment, complicating analysis of the margin. A circuit model of aircraft transient behavior is used to compare the aircraft and equipment qualification environments, with elements extracted from data from aircraft lightning simulation tests. Margins are plotted as a function of equipment load impedance and transient source impedance on the basis of peak voltage, power, and energy. The range of validity for margin values is shown to be restricted by the characteristics of the generator source impedance. Introduction Lightning research over the last decade has defined the repetitive current pulses encountered by aircraft. The spread of electronics in aircraft systems from the faucet control to critical flight systems has prompted new aviation regulations to insure electromagnetic compatibility with lightning. Procedures have been developed by the FAA through the work of SAE and RTCA comittees and their counterparts in Europe, to address lightning effects on aircraft electrical/ electronic equipment. These are outlined in Advisory Circular AC 20-136 (1). The external aircraft lightning environment has been defined by waveforms of current such as the single stroke, multiple stroke, and multiple burst waveforms. The steps in the procedure provide that lightning induced transient levels are limited to the transient control level (TCL), and that aircraft equipment tolerate transients up to the equipment transient design level (ETDL). The ratio of ETDL to TCL is defined as the margin (Figure 1). The TCL and ETDL encompass a wide range of circuit responses with differing waveforms. The margin must be based on one or more waveform characteristic. Procedures for qualification of airborne equipment contained in DO-160C section 22 (2) were adopted to verify the ETDL. The induced transients were represented as Thevenin equivalent sources, with short wave, long wave, and oscillatory waveforms, and five ohm or twenty ohm source resistances. The procedures did not address all of the new requirements and have been under revision by the SAE and RTCA committees. The recent approach has been to EQUIPMENT TRANSIENT DESIGN","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"5 1","pages":"72-76"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"72638085","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-01-01DOI: 10.1109/ISEMC.1992.626086
R. C. Pritchard, D.C. Smith
In the past, arguments have been made that Shielded Twisted pair cable, STP, should have better susceptibility performance than Unshielded Twisted pair cable, UTP, in an environment where the cable is subjected to significant external noise. This paper shows that currently available UTP has susceptibility performance that is similar to STP when tested according to 1EC 801-4, Electrical Fast Transient, one of the most severe forms of interference to data signals. This result holds the possibility of substantial savings for building wiring installations.
{"title":"A comparison of the susceptibility performance of shielded and unshielded twisted pair cable for data transmission","authors":"R. C. Pritchard, D.C. Smith","doi":"10.1109/ISEMC.1992.626086","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626086","url":null,"abstract":"In the past, arguments have been made that Shielded Twisted pair cable, STP, should have better susceptibility performance than Unshielded Twisted pair cable, UTP, in an environment where the cable is subjected to significant external noise. This paper shows that currently available UTP has susceptibility performance that is similar to STP when tested according to 1EC 801-4, Electrical Fast Transient, one of the most severe forms of interference to data signals. This result holds the possibility of substantial savings for building wiring installations.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"50 1","pages":"236-242"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76253955","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-01-01DOI: 10.1109/ISEMC.1992.626148
R. Keenan
{"title":"Some Fundamental Aspects Of ESD Testing, Part II","authors":"R. Keenan","doi":"10.1109/ISEMC.1992.626148","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626148","url":null,"abstract":"","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"54 1","pages":"469-473"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74045189","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-01-01DOI: 10.1109/ISEMC.1992.626161
A. Whittlesey, H. Garrett, P. Robinson
The phenomenon of spacecraft charging in space plasmas and the resultant discharges (electrostatic discharges, or space ESDs) has been known for some time. The charging process requires the presence of ionized gases (plasmas) of high (10 keV or higher) thermal energies, which are caused by solar magnetic storms. Reference [l] presents a brief description; [2] and [3] are more extensive descriptions of the space charging process.
{"title":"The Satellite Space Charging Phenomenon, And Design And Test Considerations","authors":"A. Whittlesey, H. Garrett, P. Robinson","doi":"10.1109/ISEMC.1992.626161","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626161","url":null,"abstract":"The phenomenon of spacecraft charging in space plasmas and the resultant discharges (electrostatic discharges, or space ESDs) has been known for some time. The charging process requires the presence of ionized gases (plasmas) of high (10 keV or higher) thermal energies, which are caused by solar magnetic storms. Reference [l] presents a brief description; [2] and [3] are more extensive descriptions of the space charging process.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"41 1","pages":"526-527"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85458202","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-01-01DOI: 10.1109/ISEMC.1992.626088
Y. Kami, R. Sato
Transmission lines in the proximity are not always in parallel directions but in arbitrary directions. In this paper, crosstalk or coupling between transmission lines in the arbitrary directions is studied by using a circuit concept. Under the condition of weak coupling, self-capacitances and self-inductances of the transmission lines can be approximated to be invariant in spite of existence of a proximate line. Mutual-capacitances and mutual-inductance is estimated by considering the coupling mechanism for an external electromagnetic field to a transmissicin line. To generalize our mode, a four-port network is also studied.
{"title":"Crosstalk Of Finite-length Transmission Lines In Arbitrary Directions On The Same Ground Plane","authors":"Y. Kami, R. Sato","doi":"10.1109/ISEMC.1992.626088","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626088","url":null,"abstract":"Transmission lines in the proximity are not always in parallel directions but in arbitrary directions. In this paper, crosstalk or coupling between transmission lines in the arbitrary directions is studied by using a circuit concept. Under the condition of weak coupling, self-capacitances and self-inductances of the transmission lines can be approximated to be invariant in spite of existence of a proximate line. Mutual-capacitances and mutual-inductance is estimated by considering the coupling mechanism for an external electromagnetic field to a transmissicin line. To generalize our mode, a four-port network is also studied.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"60 1","pages":"247-250"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84567374","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-01-01DOI: 10.1109/ISEMC.1992.626123
L. Grcev
A h s t r a c t : S p a c i o u s and complex grounding s y s t e m s are o f t e n p a r t of a l i g h t n i n g p r o t e c t i o n sys tem i n i n d u s t r i a l and power p l a n t s . Large l i g h t n i n g c u r r e n t i m p u l s e s can c a u s e l a r g e t r a n s i e n t v o l t a g e s c o u p l e d t o c o n t r o l and s i g n a l c i r c u i t s i n n e a r v i c i n i t y t o t h e grounding sys tems. Two d i f f e r e n t computer programs are developed for numer ica l e v a l u a t i o n o f such t r a n s i e n t v o l t a g e s . I t is shown t h a t s i m p l i f i c a t i o n s u s e d i n p r e v i o u s computer models Lead t o e r r o n e o u s r e s u l t s .
{"title":"Computation of transient voltages near complex caused by ligntning currents","authors":"L. Grcev","doi":"10.1109/ISEMC.1992.626123","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626123","url":null,"abstract":"A h s t r a c t : S p a c i o u s and complex grounding s y s t e m s are o f t e n p a r t of a l i g h t n i n g p r o t e c t i o n sys tem i n i n d u s t r i a l and power p l a n t s . Large l i g h t n i n g c u r r e n t i m p u l s e s can c a u s e l a r g e t r a n s i e n t v o l t a g e s c o u p l e d t o c o n t r o l and s i g n a l c i r c u i t s i n n e a r v i c i n i t y t o t h e grounding sys tems. Two d i f f e r e n t computer programs are developed for numer ica l e v a l u a t i o n o f such t r a n s i e n t v o l t a g e s . I t is shown t h a t s i m p l i f i c a t i o n s u s e d i n p r e v i o u s computer models Lead t o e r r o n e o u s r e s u l t s .","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"14 1 1","pages":"393-400"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88727611","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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