Pub Date : 1992-01-01DOI: 10.1109/ISEMC.1992.626143
R. Wallace
Very wideband (6 GHz) measurements of the discharge current produced by a commercially available electrostatic discharge (ESD) generator are presented. The results are compared to similar measurements obtained using the IEC 801-2 measurement method (1GHz bandwidth). Under contact discharge conditions, the wideband results indicate a risetime seven times faster than that reported using the IEC method and a peak current amplitude at least four times greater. EM1 generated by a contact discharge is shown to be a more severe threat to high speed telecommunications equipment than is the EM1 generated by an air discharge.
{"title":"6 GHz time domain measurement of fast-transient events","authors":"R. Wallace","doi":"10.1109/ISEMC.1992.626143","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626143","url":null,"abstract":"Very wideband (6 GHz) measurements of the discharge current produced by a commercially available electrostatic discharge (ESD) generator are presented. The results are compared to similar measurements obtained using the IEC 801-2 measurement method (1GHz bandwidth). Under contact discharge conditions, the wideband results indicate a risetime seven times faster than that reported using the IEC method and a peak current amplitude at least four times greater. EM1 generated by a contact discharge is shown to be a more severe threat to high speed telecommunications equipment than is the EM1 generated by an air discharge.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"40 1","pages":"460-463"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85272895","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-01-01DOI: 10.1109/ISEMC.1992.626084
E. Bronaugh, J. Osburn
As ule precision of EMC ueasuremeuts his improved, so has their accuracy. With impmved meawrement acciiracy, one of the major concerns of the EMC Community is the absolute accuracy of the field strength data that is compared to field strength specification limits for determination of equipment under test (EUT} compliance. Majab elements of the field strength value calculations are the anterm factors used in the computation of field strength. There is dependence for these values on traditional antenna calibration methods to adequately measure the antenna factor of EMC antennas. While each of the standard calibration procedures will produce adequate calibration results, any new method that provides separate verification or is a precise, accurate alternative method of measurement provides a new optinn for efficient determination of anteiuui factors. This pqer explores a new measurement methcl for antenna factors, provides comparative data and presents conclusions as to its adequacy.
{"title":"Measuring EMC Antenna Factors In The GHz Transverse Electromagnetic Cell","authors":"E. Bronaugh, J. Osburn","doi":"10.1109/ISEMC.1992.626084","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626084","url":null,"abstract":"As ule precision of EMC ueasuremeuts his improved, so has their accuracy. With impmved meawrement acciiracy, one of the major concerns of the EMC Community is the absolute accuracy of the field strength data that is compared to field strength specification limits for determination of equipment under test (EUT} compliance. Majab elements of the field strength value calculations are the anterm factors used in the computation of field strength. There is dependence for these values on traditional antenna calibration methods to adequately measure the antenna factor of EMC antennas. While each of the standard calibration procedures will produce adequate calibration results, any new method that provides separate verification or is a precise, accurate alternative method of measurement provides a new optinn for efficient determination of anteiuui factors. This pqer explores a new measurement methcl for antenna factors, provides comparative data and presents conclusions as to its adequacy.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"19 1","pages":"229-231"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81804146","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-01-01DOI: 10.1109/ISEMC.1992.626074
T. Braxton
Fast-transient immunity testing is defined in a number of ways. International Electrotechnical Commission document 801 -4 calls for EquipmentUnder-Test (EUT) cables to be induced with repetitive, well-defined pulses, This paper describes a large-system application in which a single circuit pack within the system was identified as being sensitive to random transients, and discusses the difjculty in repeatably testing for that sensitivity using 1EC 801-4 techniques. A successjiul alternative test was found using a chattering relay configuration, similar to that described in SAE standard Jlll3I12. This paper discusses the experience of those tests, and the insights that were gained in performing theam on this ELT.
{"title":"Inductive-transient testing in large system applications","authors":"T. Braxton","doi":"10.1109/ISEMC.1992.626074","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626074","url":null,"abstract":"Fast-transient immunity testing is defined in a number of ways. International Electrotechnical Commission document 801 -4 calls for EquipmentUnder-Test (EUT) cables to be induced with repetitive, well-defined pulses, This paper describes a large-system application in which a single circuit pack within the system was identified as being sensitive to random transients, and discusses the difjculty in repeatably testing for that sensitivity using 1EC 801-4 techniques. A successjiul alternative test was found using a chattering relay configuration, similar to that described in SAE standard Jlll3I12. This paper discusses the experience of those tests, and the insights that were gained in performing theam on this ELT.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"63 1","pages":"183-188"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83270733","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-01-01DOI: 10.1109/ISEMC.1992.626161
A. Whittlesey, H. Garrett, P. Robinson
The phenomenon of spacecraft charging in space plasmas and the resultant discharges (electrostatic discharges, or space ESDs) has been known for some time. The charging process requires the presence of ionized gases (plasmas) of high (10 keV or higher) thermal energies, which are caused by solar magnetic storms. Reference [l] presents a brief description; [2] and [3] are more extensive descriptions of the space charging process.
{"title":"The Satellite Space Charging Phenomenon, And Design And Test Considerations","authors":"A. Whittlesey, H. Garrett, P. Robinson","doi":"10.1109/ISEMC.1992.626161","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626161","url":null,"abstract":"The phenomenon of spacecraft charging in space plasmas and the resultant discharges (electrostatic discharges, or space ESDs) has been known for some time. The charging process requires the presence of ionized gases (plasmas) of high (10 keV or higher) thermal energies, which are caused by solar magnetic storms. Reference [l] presents a brief description; [2] and [3] are more extensive descriptions of the space charging process.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"41 1","pages":"526-527"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85458202","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-01-01DOI: 10.1109/ISEMC.1992.626123
L. Grcev
A h s t r a c t : S p a c i o u s and complex grounding s y s t e m s are o f t e n p a r t of a l i g h t n i n g p r o t e c t i o n sys tem i n i n d u s t r i a l and power p l a n t s . Large l i g h t n i n g c u r r e n t i m p u l s e s can c a u s e l a r g e t r a n s i e n t v o l t a g e s c o u p l e d t o c o n t r o l and s i g n a l c i r c u i t s i n n e a r v i c i n i t y t o t h e grounding sys tems. Two d i f f e r e n t computer programs are developed for numer ica l e v a l u a t i o n o f such t r a n s i e n t v o l t a g e s . I t is shown t h a t s i m p l i f i c a t i o n s u s e d i n p r e v i o u s computer models Lead t o e r r o n e o u s r e s u l t s .
{"title":"Computation of transient voltages near complex caused by ligntning currents","authors":"L. Grcev","doi":"10.1109/ISEMC.1992.626123","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626123","url":null,"abstract":"A h s t r a c t : S p a c i o u s and complex grounding s y s t e m s are o f t e n p a r t of a l i g h t n i n g p r o t e c t i o n sys tem i n i n d u s t r i a l and power p l a n t s . Large l i g h t n i n g c u r r e n t i m p u l s e s can c a u s e l a r g e t r a n s i e n t v o l t a g e s c o u p l e d t o c o n t r o l and s i g n a l c i r c u i t s i n n e a r v i c i n i t y t o t h e grounding sys tems. Two d i f f e r e n t computer programs are developed for numer ica l e v a l u a t i o n o f such t r a n s i e n t v o l t a g e s . I t is shown t h a t s i m p l i f i c a t i o n s u s e d i n p r e v i o u s computer models Lead t o e r r o n e o u s r e s u l t s .","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"14 1 1","pages":"393-400"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88727611","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-01-01DOI: 10.1109/ISEMC.1992.626088
Y. Kami, R. Sato
Transmission lines in the proximity are not always in parallel directions but in arbitrary directions. In this paper, crosstalk or coupling between transmission lines in the arbitrary directions is studied by using a circuit concept. Under the condition of weak coupling, self-capacitances and self-inductances of the transmission lines can be approximated to be invariant in spite of existence of a proximate line. Mutual-capacitances and mutual-inductance is estimated by considering the coupling mechanism for an external electromagnetic field to a transmissicin line. To generalize our mode, a four-port network is also studied.
{"title":"Crosstalk Of Finite-length Transmission Lines In Arbitrary Directions On The Same Ground Plane","authors":"Y. Kami, R. Sato","doi":"10.1109/ISEMC.1992.626088","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626088","url":null,"abstract":"Transmission lines in the proximity are not always in parallel directions but in arbitrary directions. In this paper, crosstalk or coupling between transmission lines in the arbitrary directions is studied by using a circuit concept. Under the condition of weak coupling, self-capacitances and self-inductances of the transmission lines can be approximated to be invariant in spite of existence of a proximate line. Mutual-capacitances and mutual-inductance is estimated by considering the coupling mechanism for an external electromagnetic field to a transmissicin line. To generalize our mode, a four-port network is also studied.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"60 1","pages":"247-250"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84567374","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-01-01DOI: 10.1109/ISEMC.1992.626135
M. Forti, L. Millanta, G. Pellicci
At the connection of a load (typ. a capacitor) across the power-mains live wires a transient disturbance is excited, containing both a low-frequency waveshape (lumpedparameter analysis) and a high-frequency waveshape (wavepropagation analysis). The role of dispersion due to a nonideal dielectric is pointed out, in relation to the high-frequency component.
{"title":"High-frequency and low-frequency components of the capacitive switching transients in power mains","authors":"M. Forti, L. Millanta, G. Pellicci","doi":"10.1109/ISEMC.1992.626135","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626135","url":null,"abstract":"At the connection of a load (typ. a capacitor) across the power-mains live wires a transient disturbance is excited, containing both a low-frequency waveshape (lumpedparameter analysis) and a high-frequency waveshape (wavepropagation analysis). The role of dispersion due to a nonideal dielectric is pointed out, in relation to the high-frequency component.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"53 1","pages":"431-434"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73120924","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-01-01DOI: 10.1109/ISEMC.1992.626047
B. Archambeault
Author: Bruce Archambeault Digital Equipment Corporation This paper describes the development of a modeling tool to predict EM1 radiation from air vent panels, slots, and other openings in shielded devices. The model uses a conducting wire behind the openings rather than a farfield plane wave and predicts the received EM1 strength at typical FCC distances from these openings. The model allows overall dimensions of the vent, thickness of the vent, as well as number, spacing, and orientation of the holes to be varied. Rapid comparisons between existing and proposed slot lengths, air vent openings, and tolerance analysis are possible.
{"title":"EMI Modeling Of Air Vents And Slots In Shielded Cabinets","authors":"B. Archambeault","doi":"10.1109/ISEMC.1992.626047","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626047","url":null,"abstract":"Author: Bruce Archambeault Digital Equipment Corporation This paper describes the development of a modeling tool to predict EM1 radiation from air vent panels, slots, and other openings in shielded devices. The model uses a conducting wire behind the openings rather than a farfield plane wave and predicts the received EM1 strength at typical FCC distances from these openings. The model allows overall dimensions of the vent, thickness of the vent, as well as number, spacing, and orientation of the holes to be varied. Rapid comparisons between existing and proposed slot lengths, air vent openings, and tolerance analysis are possible.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"49 1","pages":"44-51"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76793389","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-01-01DOI: 10.1109/ISEMC.1992.626096
L. Hemming
: The waveguide below cut-off principle is stated and then applied to a series of shielded enclosure applications. Included are the pipe penetration, honeycomb vent, an enclosure seam, a shielding tape, andadoorless entrance for shieldedenclosures that experience a large amount of traffic.
{"title":"Applying The Waveguide Below Cut-off Principle To Shielded Enclosure Design","authors":"L. Hemming","doi":"10.1109/ISEMC.1992.626096","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626096","url":null,"abstract":": The waveguide below cut-off principle is stated and then applied to a series of shielded enclosure applications. Included are the pipe penetration, honeycomb vent, an enclosure seam, a shielding tape, andadoorless entrance for shieldedenclosures that experience a large amount of traffic.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"1 1","pages":"287-289"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1109/ISEMC.1992.626096","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"72521285","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-01-01DOI: 10.1109/ISEMC.1992.626122
C. Dutcher
This paper reports the status of an ongoing research project being carried out on a new class of polymeric surge arresting material devices. They are based on inter-metallic quantum mechanical tunnelling, have demonstrated higher speeds than other types of devices, and have the potential for achieving high energy per volume capacity, while being conformably moldable. The latter can yield a high degree of flexibility in device design allowing the coverage of a wide range of applications. This paper describes their principles of operation, examines the theoretical limit for energy handling in an ideal device, gives status of current material development as well as three potential application examples and their generic considerations.
{"title":"Metallic Quantum Tunneling Surge arresting Materials Principles, Technology Status, And Potential Applications","authors":"C. Dutcher","doi":"10.1109/ISEMC.1992.626122","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626122","url":null,"abstract":"This paper reports the status of an ongoing research project being carried out on a new class of polymeric surge arresting material devices. They are based on inter-metallic quantum mechanical tunnelling, have demonstrated higher speeds than other types of devices, and have the potential for achieving high energy per volume capacity, while being conformably moldable. The latter can yield a high degree of flexibility in device design allowing the coverage of a wide range of applications. This paper describes their principles of operation, examines the theoretical limit for energy handling in an ideal device, gives status of current material development as well as three potential application examples and their generic considerations.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"8 1","pages":"384-392"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75671205","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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