Metamaterial absorbers (MMAs) are a class of artificially engineered materials designed to achieve highly efficient electromagnetic (EM) wave absorption, and a large number of MMAs have been proposed in recent years. However, various existing MMAs often suffer from a trade-off between absorption bandwidth and structural thickness, those capable of achieving ultra-wideband absorption with ultra-thin profiles remain very scarce. To address this bottleneck, this study proposes a dual-layer ultra-thin MMA comprising two layers of periodically patterned resistive films integrated into a grounded dual-layer dielectric substrate. Numerical simulations and experimental verifications demonstrate that the MMA can achieve over 90 % absorption across an ultra-wide frequency range covering C, X, Ku, and K bands under normal incidence of arbitrarily polarized waves, but its total thickness is merely 0.075λL (where λL denotes the wavelength at the lowest absorption frequency), thus yielding an exceptional bandwidth-to-thickness ratio (BTR) of 11.43—surpassing numerous previous designs reported in recent literature. In addition, the MMA can maintain over 95 % absorption for transverse-magnetic (TM) waves even at incident angles up to 60°. The absorption mechanism of the MMA is theoretically elucidated via interference theory, with results basically consistent with simulations and measurements. The combination of ultra-wideband, ultra-thin profile, polarization insensitivity, and wide-angle stability makes the MMA highly promising for applications in radar stealth and electromagnetic interference suppression.
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