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2006 IEEE Conference on Emerging Technologies - Nanoelectronics最新文献

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Piezoresistivity (with uniaxial strain) in nanocrystalline films of rare-earth manganites 稀土锰纳米晶膜的压阻性(单轴应变)
Pub Date : 2006-03-27 DOI: 10.1109/NANOEL.2006.1609751
J. Sarkar, A. Raychaudhuri
We present a study of the piezoresistivity in nanostructured polycrystalline films of La0.67Ca0.33MnO3and La0.67Sr0.33MnO3grown on oxidized Si
本文研究了la0.67 ca0.33 mno3和la0.67 sr0.33 mno3在氧化硅上生长的纳米结构多晶薄膜的压阻性
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引用次数: 0
Microwave Properties of Fe-based Nanocrystalline Alloy Particles 铁基纳米晶合金颗粒的微波特性
Pub Date : 2006-03-27 DOI: 10.1109/NANOEL.2006.1609702
P. Zhou, L. Deng, J.L. Xie, Y.Q. Liu
Microwave properties of Fe-based nanocrystalline alloy particles mainly depend on the crystal structure and particle morphology. It’s difficult to build up their relationship directly, so magnetic properties are introduced as intermediaries. In this paper, nanocrystalline Fe73.5Cu1Nb3Si13.5B7alloy powders were prepared and tested by the structural, magnetic and microwave measurement. It’s found that besides particle size, the structural properties such as grain size or lattice constant have important influence on the sample’s static magnetic properties, and such influence effectively extends to its complex permeability. Moreover, the exchange coupling and surface-effect were discussed in this issue.
铁基纳米晶合金颗粒的微波性能主要取决于其晶体结构和颗粒形貌。直接建立它们之间的关系是很困难的,所以就引入了磁性作为中介。本文制备了纳米晶fe73.5 cu1nb3si13 . 5b7合金粉末,并对其进行了结构、磁性和微波测试。发现除粒径外,晶粒尺寸或晶格常数等结构性能对样品的静态磁性能也有重要影响,并且这种影响有效地延伸到样品的复磁导率。并对交换耦合和表面效应进行了讨论。
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引用次数: 1
Growth and Characterization of Carbon Nanotubes on Porous Silicon 多孔硅上碳纳米管的生长与表征
Pub Date : 2006-03-27 DOI: 10.1109/NANOEL.2006.1609753
Zhiwei Zhao, L. Pan, B. Tay, Changqing Sun
Carbon nanotubes (CNTs) have been synthesized on porous silicon (PS) substrates by catalytic pyrolysis of acetylene at 823, 873 and 973 K, respectively. Scanning electron microscopy, Raman spectroscopy, X-ray photoelectron spectroscopy, and Field emission measurements have been used to characterize the structures, compositions and electron emission properties of the CNTs, respectively. The results reveal that the diameters of CNTs increase with the growth temperatures as well as the intensities of D and G peaks in Raman spectra. Besides, the carbon content increases as increasing the temperature, whereas the concentrations of oxygen and silicon decrease. Field emission properties for CNTs grown at various temperatures follow exponential increase with the increase of electric field.
采用乙炔在823、873和973 K下催化热解的方法,在多孔硅(PS)衬底上合成了碳纳米管(CNTs)。利用扫描电子显微镜、拉曼光谱、x射线光电子能谱和场发射测量分别表征了CNTs的结构、组成和电子发射性能。结果表明,随着生长温度的升高,碳纳米管的直径增大,拉曼光谱中D峰和G峰的强度增大;碳含量随温度升高而升高,氧和硅的浓度则随温度升高而降低。在不同温度下生长的CNTs的场发射性能随电场的增大呈指数增长。
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引用次数: 0
Commercialization of Nanotechnology - Taiwan Experiences 纳米科技商业化-台湾经验
Pub Date : 2006-03-27 DOI: 10.1109/NANOEL.2006.1609684
T. Su
Taiwan National Nanoscience & Nanotechnology Program started in 2003. The budget is about US$ 600 million for six years. Compared to some countries, this is not a big number. Our strategy is to focus on industrilization. 65% of the budget was for industrialization nanotechnology. Our National Program is an industrialization driven program. Stumbling blocks to commercializing nanotechnology and Taiwan strategic initiatives to industrializing nanotechnology will be described in this paper. The stumbling blocks will be analyzed in two different phases. The first one is from science to industry. The other one is from nanoproducts to users. Taiwan strategy initiatives including government commitment, positioning of different players and infrastructure built for nanotechnology will be discussed in this paper. To industrialize nanotechnology, linking nano novel properties to applications is essential. The first approach to be presented is novel material-driven approach, which is to derive application concepts from the unique properties of a novel material. Carbon nanocapsule and tetrapod-like zinc oxide will be used as examples to illustrate our experiences. The other approach is need-driven approach. To maintain competitiveness in some products, nanotechnology could be quite helpful. Several examples, including CNT-backlight unit (BLU) and nanoclay in PU synthetic leather will be described. Nanotechnology is a hot R& D area globally. Differentiation strategy is very important. Self-cleaning paint is cited as an example to be differentiated from others. Through nanotechnology development, we believe that our daily life will be improved dramatically.
台湾国家奈米科学暨奈米科技计划于2003年启动。预算约为6亿美元,为期六年。与一些国家相比,这不是一个大数字。我们的战略是以工业化为重点。65%的预算用于产业化纳米技术。我们的国家规划是一个工业化驱动的规划。本文将描述纳米技术商业化的绊脚石,以及台湾在纳米技术产业化方面的战略举措。绊脚石将分两个阶段进行分析。第一个是从科学到工业。另一个是从纳米产品到用户。本文将讨论台湾的策略倡议,包括政府承诺、不同参与者的定位和纳米技术的基础设施建设。为了使纳米技术工业化,将纳米新特性与应用联系起来是必不可少的。提出的第一种方法是新材料驱动方法,即从新材料的独特性质中派生应用概念。以碳纳米胶囊和四足类氧化锌为例说明我们的经验。另一种方法是需求驱动方法。为了保持某些产品的竞争力,纳米技术可能会很有帮助。几个例子,包括碳纳米管背光单元(BLU)和纳米粘土在PU合成革将被描述。纳米技术是全球范围内的一个热点研究领域。差异化战略非常重要。以自洁涂料为例,区别于其他涂料。通过纳米技术的发展,我们相信我们的日常生活将得到极大的改善。
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引用次数: 3
Programming Efficiency of Stacked-Gate Flash Memories with High-κ Dielectrics 高- 954堆叠门闪存的编程效率电介质
Pub Date : 2006-03-27 DOI: 10.1109/NANOEL.2006.1609734
Y. Chen, C. Chien, K. Kin, J. Lou
The programming efficiency of high-permittivity (κ) inter-poly dielectrics (IPDs) and tunnel dielectrics (TDs) on the stacked-gate flash memory performance is evaluated. By 2D MEDICI simulation, stacked-gate flash memories with high-κ IPDs clearly exhibited significant improvement in operation speed over those with conventional oxide/nitride/oxide IPD programmed with either channel Fowler-Nordheim (CFN) or channel hot electron (CHE) injection. Choosing HfO2as the IPD and using CFN programming scheme, the operating voltage can be reduced by more than 48% under a typical 10μs programming time. However, the effect of high-κ TDs was quite different when compared with high-κ IPDs. High-κ TDs were only beneficial for memories programmed with CHE injection instead of CFN tunneling. The operating voltage can be reduced by more than 27% under 10μs programming time by choosing HfO2as both the IPD and TD with CHE programming scheme. Due to the contrary improvement in programming schemes, high-κ IPDs and TDs were suitable for next-generation NAND- and NOR-type stacked-gate flash memories, respectively.
研究了高介电常数(κ)多间电介质(IPDs)和隧道电介质(td)的编程效率对堆叠栅极闪存性能的影响。通过二维MEDICI模拟,具有高κ IPD的堆叠栅极闪存的运行速度明显优于具有传统氧化物/氮化物/氧化物IPD的堆叠栅极闪存,这些IPD分别由通道富勒-诺德海姆(CFN)或通道热电子(CHE)注入编程。选择hfo2作为IPD,采用CFN编程方案,在典型的10μs编程时间下,工作电压可降低48%以上。然而,与高κ IPDs相比,高κ TDs的作用有很大差异。高κ td只对CHE注入编程的记忆有益,而对CFN隧道没有作用。采用CHE编程方案,选择hfo2作为IPD和TD,在10μs编程时间内,工作电压降低27%以上。由于编程方案的相反改进,高κ ipd和TDs分别适用于下一代NAND和no型堆叠门闪存。
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引用次数: 3
Stable and High-Volume Electroosmotic Transport for Microfluidic Chip 微流控芯片的稳定大容量电渗透传输
Pub Date : 2006-03-27 DOI: 10.1109/NANOEL.2006.1609720
T. Duong, H. N. Cheang, D. Ghista, A. Liu
A microfluidic chip which has the potential to rapidly detect malaria by detecting fluorescence-labelled parasites in red blood cells is proposed. The heart of this system is the electrokinetic manipulation of fluid to transport cells in microchannel. In this paper, the use of Micro Particle Image Velocimetry to characterise the electroosmotic flow in PDMS microchannel is reported. The effect of pressure-driven backflow is discussed and modifications of channel design to enhance pressure resistance were proposed and experimentally verified.
提出了一种通过检测红细胞中荧光标记的寄生虫来快速检测疟疾的微流控芯片。该系统的核心是在微通道中通过电动操纵液体来运输细胞。本文报道了利用微粒子图像测速技术表征PDMS微通道内的电渗透流动。讨论了压力驱动回流的影响,提出了改进通道设计以增强耐压性的方法,并进行了实验验证。
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引用次数: 2
Ballistic electron microscopy of a metal molecule interface 金属分子界面的弹道电子显微镜
Pub Date : 2006-03-27 DOI: 10.1109/NANOEL.2006.1609710
L. Kunardi, Zheng Yi, C. Troadec, Ma Han Thu Lwin, W. Knoll, N. Chandrasekhar
We present studies on a Ag/ HS–(CH2)4–T3–H (T3C4SH)/ Au diode using nanometer scale resolution, ballistic electron emission microscopy (BEEM). Images show spatially non-uniform carrier injection. A WKB calculation is carried out and compared with the experimental data. The results indicate that molecular levels are being accessed in the BEEM experiment, since the measured currents are larger than purely tunneling contribution. Our results are consistent with previously published results on a similar molecule [ 1]. Physical origins of the non-uniform carrier injection and its implications are discussed.
本文采用纳米尺度分辨率的弹道电子发射显微镜(BEEM)研究了Ag/ HS - (CH2) 4-T3-H (T3C4SH)/ Au二极管。图像显示空间上不均匀的载流子注入。进行了WKB计算,并与实验数据进行了比较。结果表明,在BEEM实验中,由于测量电流比纯隧道贡献大,因此可以达到分子水平。我们的结果与先前发表的类似分子的结果一致[1]。讨论了非均匀载流子注入的物理根源及其意义。
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引用次数: 0
Estimation of Device Parameters and C-V Modeling of Pulsed Laser Deposited Phosphorus Doped Carbon/p-Silicon Heterostructure 脉冲激光沉积磷掺杂碳/p-硅异质结构的器件参数估计及C-V建模
Pub Date : 2006-03-27 DOI: 10.1109/NANOEL.2006.1609736
M.Z. Islam, S. M. Mominuzzaman
A heterostructure, fabricated by depositing phosphorus (P) doped carbon thin film, thickness of which is about 200 nm, on boron doped crystalline silicon (Si) substrate by pulsed laser deposition (PLD) technique, is studied in terms of its opto-electronic characteristics. Optical transmittance-reflectance measurements, temperature dependent conductivity data and the current density-voltage (J-V) characteristics of the heterostructure are analyzed to estimate device parameters, such as built-in potential, reverse saturation current density, intrinsic carrier concentration and donor concentration in the carbon side of the device for different P content in the target material for carbon. The estimated device parameters are seen to improve with the increase in P content in the target for up to 5% of P. But for 7% of P in the target, the device performance deteriorates. Using these device parameters, capacitance-voltage (C-V) characteristics of the device is simulated. The results are then compared with the experimentally obtained C-V characteristics. The detailed analyses suggests diffusion of P atoms from the film into the Si region during the film deposition by pulsed laser ablation and thus the formation of a P-I-N device rather than a simple P-N junction device. The width of the I region and diffusion co-efficient of P into the Si are estimated and the values are found to be in the acceptable range.
采用脉冲激光沉积(PLD)技术在掺硼晶体硅(Si)衬底上沉积了厚度约200 nm的掺磷碳薄膜,研究了其光电特性。通过光学透射-反射率测量、温度相关电导率数据和异质结构的电流密度-电压(J-V)特性进行分析,以估计器件参数,如内置电位、反向饱和电流密度、器件碳侧的本征载流子浓度和给体浓度等。随着目标中磷含量的增加,估计的设备参数得到改善,但当目标中磷含量达到7%时,设备性能就会恶化。利用这些器件参数,模拟了器件的电容-电压特性。然后将结果与实验得到的C-V特性进行了比较。详细分析表明,在脉冲激光烧蚀沉积过程中,P原子从薄膜扩散到Si区,从而形成了P- i - n器件,而不是简单的P- n结器件。估计了I区的宽度和P向Si的扩散系数,发现这些值在可接受的范围内。
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引用次数: 0
Identification and rapid screen based on immune sensor 基于免疫传感器的识别与快速筛选
Pub Date : 2006-03-27 DOI: 10.1109/NANOEL.2006.1609715
Ching-Jui Shih, Nai-Hao Kuo, Hung-Hsin Tsai, Wei-Chih Lin, C. Lieu
The object of this paper is that the immobilization technology for antibodies onto silicon-based chip. The active site of an IgG, the paratope, in many cases does not interact with the solid matrix and is, therefore, available for antibody-antigen complex formation. Due to △S > 0, the spontaneity activation of the Sulfur-Au bond is successfully forming and the target protein binding region was chemically modified to introduce aldehyde group. We also demonstrated the more linkers, the more antibodies onto the surface. And than we use fluorescence substrate, Rodamine, conjugate the antibodies in order to observe the amount of antiboies. In our studies, we also demanded that our methodology is still good to antibodies immobilization without any impair the antibodies. Although there is still non-specific binding of Ab on the modify chip, we can observe the antibodies (Green flourescence) on the measure of areas which is the metal, Au deposited on modify chip.
本文的目的是研究抗体在硅片上的固定化技术。在许多情况下,IgG的活性位点,即伞盖,不与固体基质相互作用,因此可用于抗体-抗原复合物的形成。由于△S > 0,硫金键自发活化成功形成,靶蛋白结合区被化学修饰引入醛基。我们还证明了连接体越多,表面上的抗体就越多。然后我们用荧光底物罗丹明将抗体偶联以观察抗体的数量。在我们的研究中,我们还要求我们的方法在不损害抗体的情况下仍能很好地固定抗体。虽然修饰芯片上仍存在Ab的非特异性结合,但在修饰芯片上沉积金属Au的测量区域上可以观察到抗体(绿色荧光)。
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引用次数: 1
HfO2Nano-thin Films Grown by Laser MBE for Gate Dielectric Application 激光MBE生长用于栅极介质的hfo2纳米薄膜
Pub Date : 2006-03-27 DOI: 10.1109/NANOEL.2006.1609728
Y.K. Lu, W. Zhu, Y. Zhang, H. Lu, R. Gopalkrishnan
High-k hafnium oxide thin films with equivalent of thickness (EOT) to SiO2of about 1 – 2 nm were deposited on p-type
在p型表面沉积了厚度约为1 ~ 2 nm的高钾氧化铪薄膜
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引用次数: 3
期刊
2006 IEEE Conference on Emerging Technologies - Nanoelectronics
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