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Elastic strain mapping of plastically deformed materials by TEM 利用 TEM 绘制塑性变形材料的弹性应变图
IF 2.1 3区 工程技术 Q2 MICROSCOPY Pub Date : 2024-07-07 DOI: 10.1016/j.ultramic.2024.114010
Arthur Després , Salomé Parent , Muriel Véron , Edgar F. Rauch , Anne Joulain , Hadi Bahsoun , Christophe Tromas

A method for mapping elastic strains by TEM in plastically deformed materials is presented. A characteristic feature of plastically deformed materials, which cannot be handled by standard strain measurement method, is the presence of orientation gradients. To circumvent this issue, we couple orientation and strain maps obtained from scanning precession electron diffraction datasets. More specifically, orientation gradients are taken into account by 1) identifying the diffraction spot positions in a reference pattern, 2) measuring the disorientation between the diffraction patterns in the map and the reference pattern, 3) rotating the coordinate system following the measured disorientation at each position in the map, 4) calculating strains in the rotated coordinate system. At present, only azimuthal rotations of the crystal are handled. The method is illustrated on a Cr2AlC monocrystal micropilar deformed in near simple flexion during a nanomechanical test. After plastic deformation, the sample contains dislocations arranged in pile-ups and walls. The strain-field around each dislocation is consistent with theory, and a clear difference is observed between the strain fields around pile-ups and walls. It is further remarked that strain maps allow for the orientation of the Burgers vector to be identified. Since the loading undergone by the sample is known, this also allows for the position of the dislocation sources to be estimated. Perspectives for the study of deformed materials are finally discussed.

本文介绍了一种利用 TEM 测绘塑性变形材料弹性应变的方法。标准应变测量方法无法处理塑性变形材料的一个特征,即存在取向梯度。为了解决这个问题,我们将从扫描前驱电子衍射数据集中获得的取向图和应变图结合起来。更具体地说,考虑方位梯度的方法是:1)确定参考图案中的衍射光点位置;2)测量图中衍射图案与参考图案之间的方位偏差;3)根据图中每个位置测得的方位偏差旋转坐标系;4)计算旋转坐标系中的应变。目前只处理晶体的方位旋转。在纳米力学测试过程中,该方法在一个近似简单弯曲变形的 Cr2AlC 单晶微柱上进行了说明。塑性变形后,样品中的位错呈堆积和壁状排列。每个位错周围的应变场与理论相一致,并且观察到堆积和墙壁周围的应变场存在明显差异。此外,应变图还能确定伯格斯矢量的方向。由于样品所承受的载荷是已知的,因此还可以估计位错源的位置。最后讨论了研究变形材料的前景。
{"title":"Elastic strain mapping of plastically deformed materials by TEM","authors":"Arthur Després ,&nbsp;Salomé Parent ,&nbsp;Muriel Véron ,&nbsp;Edgar F. Rauch ,&nbsp;Anne Joulain ,&nbsp;Hadi Bahsoun ,&nbsp;Christophe Tromas","doi":"10.1016/j.ultramic.2024.114010","DOIUrl":"https://doi.org/10.1016/j.ultramic.2024.114010","url":null,"abstract":"<div><p>A method for mapping elastic strains by TEM in plastically deformed materials is presented. A characteristic feature of plastically deformed materials, which cannot be handled by standard strain measurement method, is the presence of orientation gradients. To circumvent this issue, we couple orientation and strain maps obtained from scanning precession electron diffraction datasets. More specifically, orientation gradients are taken into account by 1) identifying the diffraction spot positions in a reference pattern, 2) measuring the disorientation between the diffraction patterns in the map and the reference pattern, 3) rotating the coordinate system following the measured disorientation at each position in the map, 4) calculating strains in the rotated coordinate system. At present, only azimuthal rotations of the crystal are handled. The method is illustrated on a Cr<sub>2</sub>AlC monocrystal micropilar deformed in near simple flexion during a nanomechanical test. After plastic deformation, the sample contains dislocations arranged in pile-ups and walls. The strain-field around each dislocation is consistent with theory, and a clear difference is observed between the strain fields around pile-ups and walls. It is further remarked that strain maps allow for the orientation of the Burgers vector to be identified. Since the loading undergone by the sample is known, this also allows for the position of the dislocation sources to be estimated. Perspectives for the study of deformed materials are finally discussed.</p></div>","PeriodicalId":23439,"journal":{"name":"Ultramicroscopy","volume":"265 ","pages":"Article 114010"},"PeriodicalIF":2.1,"publicationDate":"2024-07-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S0304399124000895/pdfft?md5=aa6e2c1c7c0d811d16c0306cbb906d6f&pid=1-s2.0-S0304399124000895-main.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141594744","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Robust methodology for the EBSD local misorientation analysis of surface cold work 表面冷加工 EBSD 局部错向分析的稳健方法学
IF 2.1 3区 工程技术 Q2 MICROSCOPY Pub Date : 2024-06-27 DOI: 10.1016/j.ultramic.2024.114007
Ivan Bogachev , Kevin M. Knowles , Grant J. Gibson

The amount of cold work induced by a surface hardening technique and the depth to which it is produced within a metallic material are both important parameters within the field of surface engineering. In this paper a methodology of establishing reliable estimates of the depth and magnitude of cold work in surface hardened nickel-based superalloy single crystals from a dataset (map) of electron backscattered diffraction images through the analysis of local misorientations is described in detail. The impact of varying a number of acquisition parameters within the scanning electron microscope and the impact of the various post-acquisition analysis parameters on the outcome of the analysis are both described and discussed in detail. The Python script used to perform this analysis is published in full. The principles and processes underlying this methodology, as well as the published script, can be readily adapted for the analysis of datasets of electron backscattered diffraction images from other surface hardening techniques and other surface-hardened materials.

表面硬化技术引起的冷加工量以及在金属材料中产生冷加工的深度都是表面工程领域的重要参数。本文详细介绍了一种通过分析局部错位,从电子反向散射衍射图像数据集(图)中对表面硬化镍基超合金单晶冷加工深度和规模进行可靠估算的方法。详细描述和讨论了改变扫描电子显微镜中的一些采集参数的影响,以及各种采集后分析参数对分析结果的影响。用于执行该分析的 Python 脚本全文公布。该方法的基本原理和过程以及已发布的脚本可随时用于分析其他表面硬化技术和其他表面硬化材料的电子反向散射衍射图像数据集。
{"title":"Robust methodology for the EBSD local misorientation analysis of surface cold work","authors":"Ivan Bogachev ,&nbsp;Kevin M. Knowles ,&nbsp;Grant J. Gibson","doi":"10.1016/j.ultramic.2024.114007","DOIUrl":"10.1016/j.ultramic.2024.114007","url":null,"abstract":"<div><p>The amount of cold work induced by a surface hardening technique and the depth to which it is produced within a metallic material are both important parameters within the field of surface engineering. In this paper a methodology of establishing reliable estimates of the depth and magnitude of cold work in surface hardened nickel-based superalloy single crystals from a dataset (map) of electron backscattered diffraction images through the analysis of local misorientations is described in detail. The impact of varying a number of acquisition parameters within the scanning electron microscope and the impact of the various post-acquisition analysis parameters on the outcome of the analysis are both described and discussed in detail. The Python script used to perform this analysis is published in full. The principles and processes underlying this methodology, as well as the published script, can be readily adapted for the analysis of datasets of electron backscattered diffraction images from other surface hardening techniques and other surface-hardened materials.</p></div>","PeriodicalId":23439,"journal":{"name":"Ultramicroscopy","volume":"266 ","pages":"Article 114007"},"PeriodicalIF":2.1,"publicationDate":"2024-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S030439912400086X/pdfft?md5=a067032221c7c6a345e9c1eae3016ca7&pid=1-s2.0-S030439912400086X-main.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141964464","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Angular momentum transfer from swift electrons to non-spherical nanoparticles within the dipolar approximation 在双极近似条件下从快速电子到非球形纳米粒子的角动量传递
IF 2.2 3区 工程技术 Q2 MICROSCOPY Pub Date : 2024-06-11 DOI: 10.1016/j.ultramic.2024.114005
Jorge Luis Briseño-Gómez , Atzin López-Tercero , José Ángel Castellanos-Reyes , Alejandro Reyes-Coronado

In this work, we study the angular momentum transfer from a single swift electron to non-spherical metallic nanoparticles, specifically investigating spheroidal and polyhedral (Platonic Solids) shapes. While previous research has predominantly focused on spherical nanoparticles, our work expands the knowledge by exploring various geometries. Employing classical electrodynamics and the small particle limit, we calculate the angular momentum transfer by integrating the spectral density, ensuring causality through Fourier-transform analysis. Our findings demonstrate that prolate spheroidal nanoparticles exhibit a single blueshifted plasmonic resonance, compared to spherical nanoparticles of equivalent volume, resulting in lower angular momentum transfer. Conversely, oblate nanoparticles display two resonances — one blueshifted and one redshifted — resulting in a higher angular momentum transfer than their spherical counterparts. Additionally, Platonic Solids with fewer faces exhibit significant redshifts in plasmonic resonances, leading to higher angular momentum transfer due to edge effects. We also observe resonances and angular momentum transfers with similar characteristics in specific pairs of Platonic Solids, known as duals. These results highlight promising applications, particularly in electron tweezers technology.

在这项工作中,我们研究了从单个快速电子到非球形金属纳米粒子的角动量传递,特别是研究了球形和多面体(柏拉图实体)形状。以往的研究主要集中在球形纳米粒子上,而我们的研究则通过探索各种几何形状来扩展知识。利用经典电动力学和小粒子极限,我们通过积分谱密度计算角动量传递,并通过傅立叶变换分析确保因果关系。我们的研究结果表明,与同等体积的球形纳米粒子相比,长球形纳米粒子表现出单一的蓝移质子共振,从而导致较低的角动量传递。相反,扁球形纳米粒子显示出两个共振--一个蓝移,一个红移--导致角动量传递高于球形纳米粒子。此外,面数较少的柏拉图固体在质子共振中表现出明显的红移,从而在边缘效应的作用下产生更高的角动量传递。我们还在特定的柏拉图固体对(称为对偶)中观察到具有类似特征的共振和角动量传递。这些结果凸显了其广阔的应用前景,尤其是在电子镊子技术方面。
{"title":"Angular momentum transfer from swift electrons to non-spherical nanoparticles within the dipolar approximation","authors":"Jorge Luis Briseño-Gómez ,&nbsp;Atzin López-Tercero ,&nbsp;José Ángel Castellanos-Reyes ,&nbsp;Alejandro Reyes-Coronado","doi":"10.1016/j.ultramic.2024.114005","DOIUrl":"https://doi.org/10.1016/j.ultramic.2024.114005","url":null,"abstract":"<div><p>In this work, we study the angular momentum transfer from a single swift electron to non-spherical metallic nanoparticles, specifically investigating spheroidal and polyhedral (Platonic Solids) shapes. While previous research has predominantly focused on spherical nanoparticles, our work expands the knowledge by exploring various geometries. Employing classical electrodynamics and the small particle limit, we calculate the angular momentum transfer by integrating the spectral density, ensuring causality through Fourier-transform analysis. Our findings demonstrate that prolate spheroidal nanoparticles exhibit a single blueshifted plasmonic resonance, compared to spherical nanoparticles of equivalent volume, resulting in lower angular momentum transfer. Conversely, oblate nanoparticles display two resonances — one blueshifted and one redshifted — resulting in a higher angular momentum transfer than their spherical counterparts. Additionally, Platonic Solids with fewer faces exhibit significant redshifts in plasmonic resonances, leading to higher angular momentum transfer due to edge effects. We also observe resonances and angular momentum transfers with similar characteristics in specific pairs of Platonic Solids, known as duals. These results highlight promising applications, particularly in electron tweezers technology.</p></div>","PeriodicalId":23439,"journal":{"name":"Ultramicroscopy","volume":"264 ","pages":"Article 114005"},"PeriodicalIF":2.2,"publicationDate":"2024-06-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S0304399124000846/pdfft?md5=7e92976a208ff09f81d90142535741c9&pid=1-s2.0-S0304399124000846-main.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141428727","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Origin of giant enhancement of phase contrast in electron holography of modulation-doped n-type GaN 调制掺杂 n 型氮化镓电子全息图中相位对比巨幅增强的起源
IF 2.2 3区 工程技术 Q2 MICROSCOPY Pub Date : 2024-06-09 DOI: 10.1016/j.ultramic.2024.114006
K. Ji , M. Schnedler , Q. Lan , J.-F. Carlin , R. Butté , N. Grandjean , R.E. Dunin-Borkowski , Ph. Ebert

The electron optical phase contrast probed by electron holography at n-n+ GaN doping steps is found to exhibit a giant enhancement, in sharp contrast to the always smaller than expected phase contrast reported for p-n junctions. We unravel the physical origin of the giant enhancement by combining off-axis electron holography data with self-consistent electrostatic potential calculations. The predominant contribution to the phase contrast is shown to arise from the doping dependent screening length of the surface Fermi-level pinning, which is induced by FIB-implanted carbon point defects below the outer amorphous shell. The contribution of the built-in potential is negligible for modulation doping and only relevant for large built-in potentials at e.g. p-n junctions. This work provides a quantitative approach to so-called dead layers at TEM lamellas.

在 n-n+ GaN 掺杂阶跃中,通过电子全息技术探测到的电子光学相位对比显示出巨大的增强,这与 p-n 结报告的相位对比总是小于预期形成了鲜明对比。我们将离轴电子全息数据与自洽静电势计算相结合,揭示了巨幅增强的物理根源。结果表明,对相位对比的主要贡献来自与掺杂相关的表面费米级针销的屏蔽长度,它是由外层非晶壳下面的 FIB 植入碳点缺陷引起的。对于调制掺杂来说,内置电势的贡献可以忽略不计,只有在 p-n 结等处的大内置电势才与之相关。这项工作为 TEM 薄片上的所谓死层提供了一种定量方法。
{"title":"Origin of giant enhancement of phase contrast in electron holography of modulation-doped n-type GaN","authors":"K. Ji ,&nbsp;M. Schnedler ,&nbsp;Q. Lan ,&nbsp;J.-F. Carlin ,&nbsp;R. Butté ,&nbsp;N. Grandjean ,&nbsp;R.E. Dunin-Borkowski ,&nbsp;Ph. Ebert","doi":"10.1016/j.ultramic.2024.114006","DOIUrl":"https://doi.org/10.1016/j.ultramic.2024.114006","url":null,"abstract":"<div><p>The electron optical phase contrast probed by electron holography at <span><math><mi>n</mi></math></span>-<span><math><msup><mrow><mi>n</mi></mrow><mrow><mo>+</mo></mrow></msup></math></span> GaN doping steps is found to exhibit a giant enhancement, in sharp contrast to the always smaller than expected phase contrast reported for <span><math><mi>p</mi></math></span>-<span><math><mi>n</mi></math></span> junctions. We unravel the physical origin of the giant enhancement by combining off-axis electron holography data with self-consistent electrostatic potential calculations. The predominant contribution to the phase contrast is shown to arise from the doping dependent screening length of the surface Fermi-level pinning, which is induced by FIB-implanted carbon point defects below the outer amorphous shell. The contribution of the built-in potential is negligible for modulation doping and only relevant for large built-in potentials at e.g. <span><math><mi>p</mi></math></span>-<span><math><mi>n</mi></math></span> junctions. This work provides a quantitative approach to so-called dead layers at TEM lamellas.</p></div>","PeriodicalId":23439,"journal":{"name":"Ultramicroscopy","volume":"264 ","pages":"Article 114006"},"PeriodicalIF":2.2,"publicationDate":"2024-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S0304399124000858/pdfft?md5=03c404a6f50a5b309404ae6f59a44c1b&pid=1-s2.0-S0304399124000858-main.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141324064","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
New Poisson denoising method for pulse-count STEM imaging 用于脉冲计数 STEM 成像的泊松去噪新方法
IF 2.2 3区 工程技术 Q2 MICROSCOPY Pub Date : 2024-05-27 DOI: 10.1016/j.ultramic.2024.113996
Taichi Kusumi , Shun Katakami , Ryo Ishikawa , Kazuaki Kawahara , Tiarnan Mullarkey , Julie Marie Bekkevold , Jonathan J.P. Peters , Lewys Jones , Naoya Shibata , Masato Okada

With the recent progress in the development of detectors in electron microscopy, it has become possible to directly count the number of electrons per pixel, even with a scintillator-type detector, by incorporating a pulse-counting module. To optimize a denoising method for electron counting imaging, in this study, we propose a Poisson denoising method for atomic-resolution scanning transmission electron microscopy images. Our method is based on the Markov random field model and Bayesian inference, and we can reduce the electron dose by a factor of about 15 times or further below. Moreover, we showed that the method of reconstruction from multiple images without integrating them performs better than that from an integrated image.

随着近年来电子显微镜探测器的发展,即使是闪烁体型的探测器,也可以通过加入脉冲计数模块来直接计算每个像素的电子数。为了优化电子计数成像的去噪方法,我们在本研究中提出了一种用于原子分辨率扫描透射电子显微镜图像的泊松去噪方法。我们的方法基于马尔可夫随机场模型和贝叶斯推理,可将电子剂量降低约 15 倍或更低。此外,我们还证明了不整合多幅图像的重建方法比整合一幅图像的重建方法效果更好。
{"title":"New Poisson denoising method for pulse-count STEM imaging","authors":"Taichi Kusumi ,&nbsp;Shun Katakami ,&nbsp;Ryo Ishikawa ,&nbsp;Kazuaki Kawahara ,&nbsp;Tiarnan Mullarkey ,&nbsp;Julie Marie Bekkevold ,&nbsp;Jonathan J.P. Peters ,&nbsp;Lewys Jones ,&nbsp;Naoya Shibata ,&nbsp;Masato Okada","doi":"10.1016/j.ultramic.2024.113996","DOIUrl":"https://doi.org/10.1016/j.ultramic.2024.113996","url":null,"abstract":"<div><p>With the recent progress in the development of detectors in electron microscopy, it has become possible to directly count the number of electrons per pixel, even with a scintillator-type detector, by incorporating a pulse-counting module. To optimize a denoising method for electron counting imaging, in this study, we propose a Poisson denoising method for atomic-resolution scanning transmission electron microscopy images. Our method is based on the Markov random field model and Bayesian inference, and we can reduce the electron dose by a factor of about 15 times or further below. Moreover, we showed that the method of reconstruction from multiple images without integrating them performs better than that from an integrated image.</p></div>","PeriodicalId":23439,"journal":{"name":"Ultramicroscopy","volume":"264 ","pages":"Article 113996"},"PeriodicalIF":2.2,"publicationDate":"2024-05-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141333178","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Interpretability of high-resolution transmission electron microscopy images 高分辨率透射电子显微镜图像的可解读性。
IF 2.2 3区 工程技术 Q2 MICROSCOPY Pub Date : 2024-05-27 DOI: 10.1016/j.ultramic.2024.113997
William Bang Lomholdt , Matthew Helmi Leth Larsen , Cuauhtemoc Nuñez Valencia , Jakob Schiøtz , Thomas Willum Hansen

High-resolution electron microscopy is a well-suited tool for characterizing the nanoscale structure of materials. However, the interaction of the sample and the high-energy electrons of the beam can often have a detrimental impact on the sample structure. This effect can only be alleviated by decreasing the number of electrons to which the sample is exposed but will come at the cost of a decreased signal-to-noise ratio in the resulting image. Images with low signal to noise ratios are often challenging to interpret as parts of the sample with a low interaction with the electron beam are reproduced with very low contrast. Here we suggest simple measures as alternatives to the conventional signal-to-noise ratio and investigate how these can be used to predict the interpretability of the electron microscopy images. We test the models on a sample consisting of gold nanoparticles supported on a cerium dioxide substrate. The models are evaluated based on series of images acquired at varying electron dose.

高分辨率电子显微镜是表征材料纳米级结构的理想工具。然而,样品与高能电子束的相互作用往往会对样品结构产生不利影响。这种影响只能通过减少样品所接触的电子数量来缓解,但代价是所生成图像的信噪比降低。信噪比低的图像往往难以解读,因为样品中与电子束相互作用较少的部分会以极低的对比度再现。在此,我们提出了一些简单的方法来替代传统的信噪比,并研究了如何利用这些方法来预测电子显微镜图像的可解释性。我们在一个由支撑在二氧化铈基底上的金纳米粒子组成的样品上测试了这些模型。我们根据在不同电子剂量下获取的一系列图像对模型进行了评估。
{"title":"Interpretability of high-resolution transmission electron microscopy images","authors":"William Bang Lomholdt ,&nbsp;Matthew Helmi Leth Larsen ,&nbsp;Cuauhtemoc Nuñez Valencia ,&nbsp;Jakob Schiøtz ,&nbsp;Thomas Willum Hansen","doi":"10.1016/j.ultramic.2024.113997","DOIUrl":"10.1016/j.ultramic.2024.113997","url":null,"abstract":"<div><p>High-resolution electron microscopy is a well-suited tool for characterizing the nanoscale structure of materials. However, the interaction of the sample and the high-energy electrons of the beam can often have a detrimental impact on the sample structure. This effect can only be alleviated by decreasing the number of electrons to which the sample is exposed but will come at the cost of a decreased signal-to-noise ratio in the resulting image. Images with low signal to noise ratios are often challenging to interpret as parts of the sample with a low interaction with the electron beam are reproduced with very low contrast. Here we suggest simple measures as alternatives to the conventional signal-to-noise ratio and investigate how these can be used to predict the interpretability of the electron microscopy images. We test the models on a sample consisting of gold nanoparticles supported on a cerium dioxide substrate. The models are evaluated based on series of images acquired at varying electron dose.</p></div>","PeriodicalId":23439,"journal":{"name":"Ultramicroscopy","volume":"263 ","pages":"Article 113997"},"PeriodicalIF":2.2,"publicationDate":"2024-05-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S0304399124000767/pdfft?md5=984e6740155e565050b5a2415524a89c&pid=1-s2.0-S0304399124000767-main.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141184736","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Reaction-diffusion study of electron-beam-induced contamination growth 电子束诱导污染生长的反应扩散研究。
IF 2.2 3区 工程技术 Q2 MICROSCOPY Pub Date : 2024-05-27 DOI: 10.1016/j.ultramic.2024.113995
Erich Müller , Katharina Adrion , Milena Hugenschmidt , Dagmar Gerthsen

A time-dependent reaction-diffusion model was elaborated to better understand the dynamical growth of contamination on surfaces illuminated by an electron beam. The goal of this work was to fully describe the flow of hydrocarbon molecules, denoted as contaminants, and their polymerization in the irradiated area with the number of parameters reduced to a minimum necessary. It was considered that the diffusion process of contaminants is driven by the gradient of their surface density generated by the impact of a circular homogeneous electron beam. The contribution of the residual gas atmosphere in the instrument was described by the tendency to reestablish the initial equilibrium surface density of contaminants before irradiation. The four unknown parameters of the model, the electron interaction cross-section, the diffusion coefficient, the initial surface density of contaminants, and the frequency of the supply of contaminants from the residual gas atmosphere were determined by comparing the modeled contamination growth with experimental results. The experiments were designed such that the influence of the single parameters could be unequivocally separated. To follow the dynamical evolution of the system and to generate time-resolved distinct experimental data, successive contamination measurements were performed at short time intervals up to 20 min. The local height and shape of the grown contamination were quantified by evaluating high-angle annular dark-field (HAADF) scanning-transmission- electron-microcopy (STEM) image intensities and corresponding Monte-Carlo simulations. Our model also applies to nonhomogeneous initial conditions like the reduced local surface density of contaminants after previous beam-showering. The dynamic analyses of this process might provide hints regarding the relative size of the contaminant molecules and also indicate some measures for the reduction of contamination growth.

为了更好地理解在电子束照射下表面污染物的动态生长过程,我们建立了一个随时间变化的反应扩散模型。这项工作的目标是全面描述碳氢化合物分子(称为污染物)在辐照区域的流动及其聚合过程,并将参数数量减少到必要的最低水平。研究认为,污染物的扩散过程是由圆形均质电子束撞击产生的表面密度梯度驱动的。仪器中的残余气体环境的作用是重建辐照前污染物初始平衡表面密度的趋势。模型的四个未知参数,即电子相互作用截面、扩散系数、污染物的初始表面密度以及残余气体环境中污染物的供应频率,是通过比较污染增长模型和实验结果确定的。实验设计的目的是明确区分单个参数的影响。为了跟踪系统的动态演变并生成时间分辨的实验数据,在最长 20 分钟的短时间间隔内连续进行了污染测量。通过评估高角度环形暗场(HAADF)扫描-透射-电子显微镜(STEM)图像强度和相应的蒙特卡洛模拟,量化了生长污染的局部高度和形状。我们的模型还适用于非均质初始条件,如先前光束喷射后污染物的局部表面密度降低。对这一过程的动态分析可能会为污染物分子的相对大小提供提示,并指出一些减少污染物增长的措施。
{"title":"Reaction-diffusion study of electron-beam-induced contamination growth","authors":"Erich Müller ,&nbsp;Katharina Adrion ,&nbsp;Milena Hugenschmidt ,&nbsp;Dagmar Gerthsen","doi":"10.1016/j.ultramic.2024.113995","DOIUrl":"10.1016/j.ultramic.2024.113995","url":null,"abstract":"<div><p>A time-dependent reaction-diffusion model was elaborated to better understand the dynamical growth of contamination on surfaces illuminated by an electron beam. The goal of this work was to fully describe the flow of hydrocarbon molecules, denoted as contaminants, and their polymerization in the irradiated area with the number of parameters reduced to a minimum necessary. It was considered that the diffusion process of contaminants is driven by the gradient of their surface density generated by the impact of a circular homogeneous electron beam. The contribution of the residual gas atmosphere in the instrument was described by the tendency to reestablish the initial equilibrium surface density of contaminants before irradiation. The four unknown parameters of the model, the electron interaction cross-section, the diffusion coefficient, the initial surface density of contaminants, and the frequency of the supply of contaminants from the residual gas atmosphere were determined by comparing the modeled contamination growth with experimental results. The experiments were designed such that the influence of the single parameters could be unequivocally separated. To follow the dynamical evolution of the system and to generate time-resolved distinct experimental data, successive contamination measurements were performed at short time intervals up to 20 min. The local height and shape of the grown contamination were quantified by evaluating high-angle annular dark-field (HAADF) scanning-transmission- electron-microcopy (STEM) image intensities and corresponding Monte-Carlo simulations. Our model also applies to nonhomogeneous initial conditions like the reduced local surface density of contaminants after previous beam-showering. The dynamic analyses of this process might provide hints regarding the relative size of the contaminant molecules and also indicate some measures for the reduction of contamination growth.</p></div>","PeriodicalId":23439,"journal":{"name":"Ultramicroscopy","volume":"264 ","pages":"Article 113995"},"PeriodicalIF":2.2,"publicationDate":"2024-05-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S0304399124000743/pdfft?md5=b52e487c25a3a15e9b96b35b77c28a8c&pid=1-s2.0-S0304399124000743-main.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141293738","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Direct investigations of interactions between nucleolins and aptamers on pancreatic cancer and normal cells by atomic force microscopy 利用原子力显微镜直接研究胰腺癌细胞和正常细胞中核蛋白与适配体之间的相互作用。
IF 2.2 3区 工程技术 Q2 MICROSCOPY Pub Date : 2024-05-15 DOI: 10.1016/j.ultramic.2024.113986
Xinyu Li , Longyun Chen , Sudong Kong , Haijian Zhong , Feng Jiang , Weidong Zhao

Nucleolin is overexpressed on the surface of pancreatic cancer cells and are regarded as the remarkable therapeutic target. Aptamers are capable of binding the external domain of nucleolin on the cell surface with high affinity and specificity. But nucleolin has not been localized on pancreatic cancer cells at very high spatial resolution, and the interactions between nucleolin and aptamers have not been investigated at very high force resolution level. In this work, nucleolin was localized on pancreatic cancer and normal cells by aptamers (9FU-AS1411-NH2, AS1411-NH2 and CRONH2) in Single Molecule Recognition Imaging mode of Atomic Force Microscopy. There are plenty of nucleolin on the surfaces of pancreatic cancer cells (area percentage about 5 %), while there are little nucleolin on the surfaces of normal cells. The interactions between three types of aptamers and nucleolins on the surfaces of pancreatic cancer cells were investigated by Single Molecule Force Spectroscopy. The unbinding forces of nucleolins-(9FU-AS1411-NH2) are larger than nucleolins-(AS1411-NH2). The dissociation activation energy on nucleolin-(9FU-AS1411-NH2) is higher than nucleolin-(AS1411-NH2), which indicates that the former complex is more stable and harder to dissociate than the later complex. There are no unbinding forces between nucleolin and CRONH2. All these demonstrate that nucleolin was localized on pancreatic cancer and normal cells at single molecule level quantitatively, and the interactions (unbinding forces and kinetics) between nucleolin and aptamers were studied at picoNewton level. The approaches and results of this work will pave new ways in the investigations of nucleolin and aptamers, and will also be useful in the studies on other proteins and their corresponding aptamers.

核苷酸在胰腺癌细胞表面过度表达,被视为重要的治疗靶点。Aptamers能以高亲和力和特异性结合细胞表面的核素蛋白外部结构域。但目前还没有以极高的空间分辨率对胰腺癌细胞上的核素蛋白进行定位,也没有以极高的力分辨率研究核素蛋白与适配体之间的相互作用。本研究在原子力显微镜的单分子识别成像模式下,用适配体(9FU-AS1411-NH2、AS1411-NH2 和 CRONH2)定位了胰腺癌细胞和正常细胞上的核素。胰腺癌细胞表面有大量的核素蛋白(面积百分比约为 5%),而正常细胞表面的核素蛋白很少。单分子力谱法研究了胰腺癌细胞表面三种类型的适配体与核素的相互作用。核素-(9FU-AS1411-NH2)的解结合力大于核素-(AS1411-NH2)。核素-(9FU-AS1411-NH2)的解离活化能高于核素-(AS1411-NH2),这表明前者比后者更稳定,更难解离。核素与 CRONH2 之间没有解结合力。所有这些都表明,核素蛋白在单分子水平上定量定位在胰腺癌细胞和正常细胞上,并在皮牛顿水平上研究了核素蛋白与适配体之间的相互作用(解结合力和动力学)。这项工作的方法和结果将为核素和适配体的研究铺平新的道路,也将有助于对其他蛋白质及其相应适配体的研究。
{"title":"Direct investigations of interactions between nucleolins and aptamers on pancreatic cancer and normal cells by atomic force microscopy","authors":"Xinyu Li ,&nbsp;Longyun Chen ,&nbsp;Sudong Kong ,&nbsp;Haijian Zhong ,&nbsp;Feng Jiang ,&nbsp;Weidong Zhao","doi":"10.1016/j.ultramic.2024.113986","DOIUrl":"10.1016/j.ultramic.2024.113986","url":null,"abstract":"<div><p>Nucleolin is overexpressed on the surface of pancreatic cancer cells and are regarded as the remarkable therapeutic target. Aptamers are capable of binding the external domain of nucleolin on the cell surface with high affinity and specificity. But nucleolin has not been localized on pancreatic cancer cells at very high spatial resolution, and the interactions between nucleolin and aptamers have not been investigated at very high force resolution level. In this work, nucleolin was localized on pancreatic cancer and normal cells by aptamers (9FU-AS1411-NH<sub>2</sub>, AS1411-NH<sub>2</sub> and CRO<img>NH<sub>2</sub>) in Single Molecule Recognition Imaging mode of Atomic Force Microscopy. There are plenty of nucleolin on the surfaces of pancreatic cancer cells (area percentage about 5 %), while there are little nucleolin on the surfaces of normal cells. The interactions between three types of aptamers and nucleolins on the surfaces of pancreatic cancer cells were investigated by Single Molecule Force Spectroscopy. The unbinding forces of nucleolins-(9FU-AS1411-NH<sub>2</sub>) are larger than nucleolins-(AS1411-NH<sub>2</sub>). The dissociation activation energy on nucleolin-(9FU-AS1411-NH<sub>2</sub>) is higher than nucleolin-(AS1411-NH<sub>2</sub>), which indicates that the former complex is more stable and harder to dissociate than the later complex. There are no unbinding forces between nucleolin and CRO<img>NH<sub>2</sub>. All these demonstrate that nucleolin was localized on pancreatic cancer and normal cells at single molecule level quantitatively, and the interactions (unbinding forces and kinetics) between nucleolin and aptamers were studied at picoNewton level. The approaches and results of this work will pave new ways in the investigations of nucleolin and aptamers, and will also be useful in the studies on other proteins and their corresponding aptamers.</p></div>","PeriodicalId":23439,"journal":{"name":"Ultramicroscopy","volume":"263 ","pages":"Article 113986"},"PeriodicalIF":2.2,"publicationDate":"2024-05-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141065776","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Fourier transform-based post-processing drift compensation and calibration method for scanning probe microscopy 基于傅立叶变换的扫描探针显微镜后处理漂移补偿和校准方法
IF 2.2 3区 工程技术 Q2 MICROSCOPY Pub Date : 2024-05-09 DOI: 10.1016/j.ultramic.2024.113984
M. Le Ster, S. Pawłowski, I. Lutsyk, P.J. Kowalczyk

Scanning probe microscopy (SPM) is ubiquitous in nanoscale science allowing the observation of features in real space down to the angstrom resolution. The scanning nature of SPM, wherein a sharp tip rasters the surface during which a physical setpoint is maintained via a control feedback loop, often implies that the image is subject to drift effects, leading to distortion of the resulting image. While there are in-operando methods to compensate for the drift, correcting the residual linear drift in obtained images is often neglected. In this paper, we present a reciprocal space-based technique to compensate the linear drift in atomically-resolved scanning probe microscopy images without distinction of the fast and slow scanning directions; furthermore this method does not require the set of SPM images obtained for the different scanning directions. Instead, the compensation is made possible by the a priori knowledge of the lattice parameters. The method can also be used to characterize and calibrate the SPM instrument.

扫描探针显微镜(SPM)在纳米科学中无处不在,它可以观察真实空间中的特征,分辨率可达埃级。扫描探针显微镜的扫描性质是用一个尖锐的探针在表面上进行光栅扫描,其间通过控制反馈回路保持一个物理设定点,这通常意味着图像会受到漂移效应的影响,导致生成的图像失真。虽然有操作中补偿漂移的方法,但校正所获图像中的残余线性漂移往往被忽视。在本文中,我们提出了一种基于倒易空间的技术,用于补偿原子分辨扫描探针显微镜图像中的线性漂移,而无需区分快速和慢速扫描方向;此外,这种方法不需要针对不同扫描方向获得的一组 SPM 图像。相反,晶格参数的先验知识使补偿成为可能。该方法还可用于鉴定和校准 SPM 仪器。
{"title":"Fourier transform-based post-processing drift compensation and calibration method for scanning probe microscopy","authors":"M. Le Ster,&nbsp;S. Pawłowski,&nbsp;I. Lutsyk,&nbsp;P.J. Kowalczyk","doi":"10.1016/j.ultramic.2024.113984","DOIUrl":"https://doi.org/10.1016/j.ultramic.2024.113984","url":null,"abstract":"<div><p>Scanning probe microscopy (SPM) is ubiquitous in nanoscale science allowing the observation of features in real space down to the angstrom resolution. The scanning nature of SPM, wherein a sharp tip rasters the surface during which a physical setpoint is maintained via a control feedback loop, often implies that the image is subject to drift effects, leading to distortion of the resulting image. While there are <em>in-operando</em> methods to compensate for the drift, correcting the residual linear drift in obtained images is often neglected. In this paper, we present a reciprocal space-based technique to compensate the linear drift in atomically-resolved scanning probe microscopy images without distinction of the fast and slow scanning directions; furthermore this method does not require the set of SPM images obtained for the different scanning directions. Instead, the compensation is made possible by the a priori knowledge of the lattice parameters. The method can also be used to characterize and calibrate the SPM instrument.</p></div>","PeriodicalId":23439,"journal":{"name":"Ultramicroscopy","volume":"263 ","pages":"Article 113984"},"PeriodicalIF":2.2,"publicationDate":"2024-05-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S0304399124000639/pdfft?md5=d7b623a058150a9edba27b104bf57fbf&pid=1-s2.0-S0304399124000639-main.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140918485","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A novel STM for quality atomic resolution with piezoelectric motor of high compactness and simplicity 采用压电电机的新型原子分辨质量 STM 结构紧凑、操作简单。
IF 2.2 3区 工程技术 Q2 MICROSCOPY Pub Date : 2024-05-08 DOI: 10.1016/j.ultramic.2024.113983
Muhammad Touqeer , Behnam Esmaeilzadeh , Wenjie Meng , Jihao Wang , Syed Asad Maqbool , Shaofeng Zheng , Liu Junwei , Yubin Hou , Qingyou Lu

Scanning tunneling microscope (STM) is a renowned scientific tool for obtaining high-resolution atomic images of materials. Herein, we present an innovative design of the scanning unit with a compact yet powerful inertial piezoelectric motor inspired by the Spider Drive motor principle. The scanning unit mainly consists of a small 9 mm long piezoelectric tube scanner (PTS), one end of which is coaxially connected to the main sapphire body of the STM. Of particular emphasis in this design is the piezoelectric shaft (PS), constructed from piezoelectric material instead of conventional metallic or zirconium materials. The PS is a rectangular piezoelectric stack composed of two piezoelectric plates, which are elastically clamped on the inner wall of the PTS via a spring strip. The PTS and PS expand and contract independently with each other to improve the inertial force and reduce the threshold voltage. To ensure the stability of the PS and balance the stepping performance of the inertial motor, a counterweight, and a matching conical spring are fixed at the tail of the PS. This innovative design allows for the assessment of scanning unit performance by applying a driving signal, threshold voltage is 50 V at room temperature. Step sizes vary from 0.1 to 1 µm by changing the driving signal at room temperature. Furthermore, we successfully obtained atomic-resolution images of a highly oriented pyrolytic graphite (HOPG) sample and low drift rates of 23.4 pm/min and 34.6 pm/min in X-Y plane and Z direction, respectively, under ambient conditions. This small, compact STM unit has the potential for the development of a rotatable STM for use in cryogen-free magnets, and superconducting magnets.

扫描隧道显微镜(STM)是获取材料高分辨率原子图像的著名科学工具。在此,我们受蜘蛛驱动电机原理的启发,提出了一种扫描装置的创新设计,该装置配备了一个小巧但功能强大的惯性压电电机。扫描单元主要由一个 9 毫米长的小型压电管扫描器(PTS)组成,其一端与 STM 的蓝宝石主体同轴连接。该设计的重点是压电轴(PS),它由压电材料而非传统的金属或锆材料制成。压电轴是由两块压电板组成的矩形压电叠层,两块压电板通过弹簧条弹性地夹在 PTS 的内壁上。PTS 和 PS 相互独立地膨胀和收缩,以提高惯性力并降低阈值电压。为确保 PS 的稳定性并平衡惯性电机的步进性能,在 PS 尾部固定了一个配重和一个匹配的锥形弹簧。这种创新设计允许通过施加驱动信号(室温下阈值电压为 50 V)来评估扫描单元的性能。通过在室温下改变驱动信号,步长从 0.1 微米到 1 微米不等。此外,我们还成功获得了高取向热解石墨(HOPG)样品的原子分辨率图像,并在环境条件下实现了 X-Y 平面和 Z 方向分别为 23.4 pm/min 和 34.6 pm/min 的低漂移率。这种体积小、结构紧凑的 STM 装置具有开发用于无低温磁体和超导磁体的可旋转 STM 的潜力。
{"title":"A novel STM for quality atomic resolution with piezoelectric motor of high compactness and simplicity","authors":"Muhammad Touqeer ,&nbsp;Behnam Esmaeilzadeh ,&nbsp;Wenjie Meng ,&nbsp;Jihao Wang ,&nbsp;Syed Asad Maqbool ,&nbsp;Shaofeng Zheng ,&nbsp;Liu Junwei ,&nbsp;Yubin Hou ,&nbsp;Qingyou Lu","doi":"10.1016/j.ultramic.2024.113983","DOIUrl":"10.1016/j.ultramic.2024.113983","url":null,"abstract":"<div><p>Scanning tunneling microscope (STM) is a renowned scientific tool for obtaining high-resolution atomic images of materials. Herein, we present an innovative design of the scanning unit with a compact yet powerful inertial piezoelectric motor inspired by the Spider Drive motor principle. The scanning unit mainly consists of a small 9 mm long piezoelectric tube scanner (PTS), one end of which is coaxially connected to the main sapphire body of the STM. Of particular emphasis in this design is the piezoelectric shaft (PS), constructed from piezoelectric material instead of conventional metallic or zirconium materials. The PS is a rectangular piezoelectric stack composed of two piezoelectric plates, which are elastically clamped on the inner wall of the PTS via a spring strip. The PTS and PS expand and contract independently with each other to improve the inertial force and reduce the threshold voltage. To ensure the stability of the PS and balance the stepping performance of the inertial motor, a counterweight, and a matching conical spring are fixed at the tail of the PS. This innovative design allows for the assessment of scanning unit performance by applying a driving signal, threshold voltage is 50 V at room temperature. Step sizes vary from 0.1 to 1 µm by changing the driving signal at room temperature. Furthermore, we successfully obtained atomic-resolution images of a highly oriented pyrolytic graphite (HOPG) sample and low drift rates of 23.4 pm/min and 34.6 pm/min in X-Y plane and Z direction, respectively, under ambient conditions. This small, compact STM unit has the potential for the development of a rotatable STM for use in cryogen-free magnets, and superconducting magnets.</p></div>","PeriodicalId":23439,"journal":{"name":"Ultramicroscopy","volume":"263 ","pages":"Article 113983"},"PeriodicalIF":2.2,"publicationDate":"2024-05-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140946052","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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