Pub Date : 2018-09-01DOI: 10.1109/RADECS45761.2018.9328695
Sergeh Vartanian, G. Allen, F. Irom, L. Scheick
We present SEE test results for the Cobham Space Wire transceiver after dosing the device to 300 krad(Si). We performed SEU characterization with variable data rates and patterns. Events resembling SEFIs were also observed and recorded.
我们介绍了在将设备添加到300克拉(Si)后，Cobham Space Wire收发器的SEE测试结果。我们使用可变数据速率和模式进行了SEU表征。类似sefi的事件也被观察和记录。
{"title":"Single Event Effects Characterization of Dosed UT200Sp WPHY01 SpaceWire Physical Layer Transceiver","authors":"Sergeh Vartanian, G. Allen, F. Irom, L. Scheick","doi":"10.1109/RADECS45761.2018.9328695","DOIUrl":"https://doi.org/10.1109/RADECS45761.2018.9328695","url":null,"abstract":"We present SEE test results for the Cobham Space Wire transceiver after dosing the device to 300 krad(Si). We performed SEU characterization with variable data rates and patterns. Events resembling SEFIs were also observed and recorded.","PeriodicalId":248855,"journal":{"name":"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"415 17","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133351809","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/RADECS45761.2018.9328691
Li Huang, Tianyang Zhang, Bo Li, Yu Zhang, Yuhong Zhao, Houfang Liu, Yan Cui, Zhengsheng Han, Xiufeng Han
To evaluate the potential of a low-cost magnetometers system based on tunneling magnetoresistancesensor in harsh radiation environment, the irradiation behaviors were obtained and discussed with respect to the performances degradation incritical modules.
{"title":"The total ionizing dose effect of magnetometers system based on tunneling magnetoresistance sensor","authors":"Li Huang, Tianyang Zhang, Bo Li, Yu Zhang, Yuhong Zhao, Houfang Liu, Yan Cui, Zhengsheng Han, Xiufeng Han","doi":"10.1109/RADECS45761.2018.9328691","DOIUrl":"https://doi.org/10.1109/RADECS45761.2018.9328691","url":null,"abstract":"To evaluate the potential of a low-cost magnetometers system based on tunneling magnetoresistancesensor in harsh radiation environment, the irradiation behaviors were obtained and discussed with respect to the performances degradation incritical modules.","PeriodicalId":248855,"journal":{"name":"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"102 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133414667","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/RADECS45761.2018.9328713
R. Khasanshin, A. N. Galygin
Features of formation of electric discharges, changes of surface structure, optical properties of samples of cover glass and thermal control coating of geostationary satellites irradiated by electrons and the effect of outgassed products of EKOM-1 polymeric composite have been investigated. It was shown that the successive and combined action of electrons and outgassed products makes the reflectance of thermal control coating to decrease several times as compared with the electron irradiation alone.
{"title":"Influence of radiation-induced discharges on K-208 glass properties","authors":"R. Khasanshin, A. N. Galygin","doi":"10.1109/RADECS45761.2018.9328713","DOIUrl":"https://doi.org/10.1109/RADECS45761.2018.9328713","url":null,"abstract":"Features of formation of electric discharges, changes of surface structure, optical properties of samples of cover glass and thermal control coating of geostationary satellites irradiated by electrons and the effect of outgassed products of EKOM-1 polymeric composite have been investigated. It was shown that the successive and combined action of electrons and outgassed products makes the reflectance of thermal control coating to decrease several times as compared with the electron irradiation alone.","PeriodicalId":248855,"journal":{"name":"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"107 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117282894","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/radecs45761.2018.9328655
P. Kohler, V. Pouget, F. Saigné, J. Boch, T. Maraine, P. Wang, M. Vassal
This paper presents an analysis of the TID sensitivity of Commercial Off-the-Shelf (COTS) DDR3 memories. Experimental setup and results following 60CO and X-ray characterization campaigns using dynamic test methods are described. Parametric drifts and functional failures, including data retention time test, are observed and discussed. An additional 60CO test campaign, using static test method highlights the impact of the applied biasing mode during gamma ray irradiation. As energy saving has become increasingly a key driver of the DRAMs evolution, manufacturers has developed operating low power modes, that can be activated while the component is idle, reducing its power consumption. This paper experimentally reveals a TID-induced higher sensitivity of those low power modes.
{"title":"Total Ionizing Dose effects in DDR3 SDRAMs under Co-60 and X-ray irradiation","authors":"P. Kohler, V. Pouget, F. Saigné, J. Boch, T. Maraine, P. Wang, M. Vassal","doi":"10.1109/radecs45761.2018.9328655","DOIUrl":"https://doi.org/10.1109/radecs45761.2018.9328655","url":null,"abstract":"This paper presents an analysis of the TID sensitivity of Commercial Off-the-Shelf (COTS) DDR3 memories. Experimental setup and results following 60CO and X-ray characterization campaigns using dynamic test methods are described. Parametric drifts and functional failures, including data retention time test, are observed and discussed. An additional 60CO test campaign, using static test method highlights the impact of the applied biasing mode during gamma ray irradiation. As energy saving has become increasingly a key driver of the DRAMs evolution, manufacturers has developed operating low power modes, that can be activated while the component is idle, reducing its power consumption. This paper experimentally reveals a TID-induced higher sensitivity of those low power modes.","PeriodicalId":248855,"journal":{"name":"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131409196","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/RADECS45761.2018.9328680
A. Floriduz, J. Devine
An irradiation campaign was conducted to provide guidance in the selection of materials and components for the radiation hardening of LED lights for use in CERN accelerator tunnels. This work describes the effects of gamma-rays on commercial-grade borosilicate, fused quartz, polymethylmethacrylate, and polycarbonate samples up to doses of 100 kGy, to qualify their use as optical materials in rad-hard LED-based luminaires. In addition, a Si bridge rectifier and a SiC Junction Barrier Schottky diode for use in power supplies of rad-hard LED lighting systems are tested using 24 GeV/c protons. The physical degradation mechanisms are discussed for each element.
{"title":"Radiation Testing of Optical and Semiconductor Components for Radiation-Tolerant LED Luminaires","authors":"A. Floriduz, J. Devine","doi":"10.1109/RADECS45761.2018.9328680","DOIUrl":"https://doi.org/10.1109/RADECS45761.2018.9328680","url":null,"abstract":"An irradiation campaign was conducted to provide guidance in the selection of materials and components for the radiation hardening of LED lights for use in CERN accelerator tunnels. This work describes the effects of gamma-rays on commercial-grade borosilicate, fused quartz, polymethylmethacrylate, and polycarbonate samples up to doses of 100 kGy, to qualify their use as optical materials in rad-hard LED-based luminaires. In addition, a Si bridge rectifier and a SiC Junction Barrier Schottky diode for use in power supplies of rad-hard LED lighting systems are tested using 24 GeV/c protons. The physical degradation mechanisms are discussed for each element.","PeriodicalId":248855,"journal":{"name":"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115849163","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/radecs45761.2018.9328686
{"title":"Technical Sessions and Sessions Chairpersons","authors":"","doi":"10.1109/radecs45761.2018.9328686","DOIUrl":"https://doi.org/10.1109/radecs45761.2018.9328686","url":null,"abstract":"","PeriodicalId":248855,"journal":{"name":"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131877268","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/RADECS45761.2018.9328705
A. Smolin, A. Sogoyan, A. Chumakov
The applicability of the IRPP method of SER estimation is limited for modern CMOS devices due to a number of issues. In the paper we propose a new approach to SER estimation that requires no additional information about the device other than experimental cross-section curves and can serve as a replacement for the IRPP method. The proposed approach is based on diffusion approximation of the charge collection from a particle track. The developed cross-section model contains only two parameters determined from test data. The same values of parameters are used to predict SEE cross-section in isotropic particle field., thus., enabling a simple approach to SER estimation in real operating conditions.
{"title":"Two-Parameter Model for SEE Rate Estimation","authors":"A. Smolin, A. Sogoyan, A. Chumakov","doi":"10.1109/RADECS45761.2018.9328705","DOIUrl":"https://doi.org/10.1109/RADECS45761.2018.9328705","url":null,"abstract":"The applicability of the IRPP method of SER estimation is limited for modern CMOS devices due to a number of issues. In the paper we propose a new approach to SER estimation that requires no additional information about the device other than experimental cross-section curves and can serve as a replacement for the IRPP method. The proposed approach is based on diffusion approximation of the charge collection from a particle track. The developed cross-section model contains only two parameters determined from test data. The same values of parameters are used to predict SEE cross-section in isotropic particle field., thus., enabling a simple approach to SER estimation in real operating conditions.","PeriodicalId":248855,"journal":{"name":"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128126758","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/RADECS45761.2018.9328717
Xiaoming Jin, Chao Qi, Shanchao Yang, Ruibin Li, Xiaoyan Bai, Junlin Li, Chenhui Wang, Yan Liu
Experimental results of neutron-induced single event upset (SEU) in SRAM devices were introduced. The SEU sensitivity of SRAM devices with eight distinct technology nodes was studied at 14 MeV neutron, 2.5 MeV neutron and reactor neutron irradiation environments respectively. The experimental results indicate that neutron-induced SEU cross-section in SRAM devices is strongly dependent with the technology nodes, the incident neutron energy and the power supply voltage of the devices. However, both the neutron fluence rate and the byte pattern in SRAM devices have little impact on the neutron-induced SEU cross-section.
{"title":"SEU in SRAMs due to 2.5 MeV, 14 MeV and reactor neutrons","authors":"Xiaoming Jin, Chao Qi, Shanchao Yang, Ruibin Li, Xiaoyan Bai, Junlin Li, Chenhui Wang, Yan Liu","doi":"10.1109/RADECS45761.2018.9328717","DOIUrl":"https://doi.org/10.1109/RADECS45761.2018.9328717","url":null,"abstract":"Experimental results of neutron-induced single event upset (SEU) in SRAM devices were introduced. The SEU sensitivity of SRAM devices with eight distinct technology nodes was studied at 14 MeV neutron, 2.5 MeV neutron and reactor neutron irradiation environments respectively. The experimental results indicate that neutron-induced SEU cross-section in SRAM devices is strongly dependent with the technology nodes, the incident neutron energy and the power supply voltage of the devices. However, both the neutron fluence rate and the byte pattern in SRAM devices have little impact on the neutron-induced SEU cross-section.","PeriodicalId":248855,"journal":{"name":"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132219402","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/RADECS45761.2018.9328661
D. Lambert, O. Riant, D. Thouvenot, E. Feuilloley, T. Colladant
An Evaluation of the Displacement Damage Equivalent Fluence is presented for different neutron and proton facilities and devices.
对不同的中子和质子设施和装置进行了位移损伤等效通量的评估。
{"title":"Evaluation of the Displacement Damage Equivalent Fluence from different facilities and devices","authors":"D. Lambert, O. Riant, D. Thouvenot, E. Feuilloley, T. Colladant","doi":"10.1109/RADECS45761.2018.9328661","DOIUrl":"https://doi.org/10.1109/RADECS45761.2018.9328661","url":null,"abstract":"An Evaluation of the Displacement Damage Equivalent Fluence is presented for different neutron and proton facilities and devices.","PeriodicalId":248855,"journal":{"name":"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"70 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132474096","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/RADECS45761.2018.9328690
C. Inquimbert, T. Nuns
The Non Ionizing Energy Loss (NIEL) is the metric conventionally used to scale displacement damage degradation mechanisms. The degradation of many electrical parameters are scaled according to the NIEL. But along the years, some deviations were observed between the experimentally measured damage factors and the NIEL. This has been especially observed for high energy protons (>30 MeV in GaAs), for which measurements have been demonstrated to follow the “Coulombian” part of the NIEL preferably than the total NIEL. Up to now no clear understanding of this mechanism has been given. This paper proposes to interpret these discrepancies as a statistical bias induced by the nature of the deposition of the displacement damage dose. The reliability of the NIEL is discussed as a function of the deposited fluence.
{"title":"About the scatter of displacement damage and its consequence on the NIEL scaling approach","authors":"C. Inquimbert, T. Nuns","doi":"10.1109/RADECS45761.2018.9328690","DOIUrl":"https://doi.org/10.1109/RADECS45761.2018.9328690","url":null,"abstract":"The Non Ionizing Energy Loss (NIEL) is the metric conventionally used to scale displacement damage degradation mechanisms. The degradation of many electrical parameters are scaled according to the NIEL. But along the years, some deviations were observed between the experimentally measured damage factors and the NIEL. This has been especially observed for high energy protons (>30 MeV in GaAs), for which measurements have been demonstrated to follow the “Coulombian” part of the NIEL preferably than the total NIEL. Up to now no clear understanding of this mechanism has been given. This paper proposes to interpret these discrepancies as a statistical bias induced by the nature of the deposition of the displacement damage dose. The reliability of the NIEL is discussed as a function of the deposited fluence.","PeriodicalId":248855,"journal":{"name":"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130407600","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
扫码关注我们
求助内容：
应助结果提醒方式：