Pub Date : 2018-09-01DOI: 10.1109/RADECS45761.2018.9328693
G. Protopopov, V. Anashin, N. Balykina, A. Repin, V. Denisova, A. V. Tsurgaev
Issues of electronic component flight test results usage are shown in the paper using onboard measurements of space radiation environments in different orbits.
通过对不同轨道空间辐射环境的机载测量，指出了电子元件飞行试验结果使用的问题。
{"title":"Issues and Special Aspects of Electronic Component Flight Test Results Usage for Radiation Hardness Confirmation","authors":"G. Protopopov, V. Anashin, N. Balykina, A. Repin, V. Denisova, A. V. Tsurgaev","doi":"10.1109/RADECS45761.2018.9328693","DOIUrl":"https://doi.org/10.1109/RADECS45761.2018.9328693","url":null,"abstract":"Issues of electronic component flight test results usage are shown in the paper using onboard measurements of space radiation environments in different orbits.","PeriodicalId":248855,"journal":{"name":"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"109 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114561914","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/radecs45761.2018.9328664
{"title":"RADECS 2018 Technical Program Chair Address","authors":"","doi":"10.1109/radecs45761.2018.9328664","DOIUrl":"https://doi.org/10.1109/radecs45761.2018.9328664","url":null,"abstract":"","PeriodicalId":248855,"journal":{"name":"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"78 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115019841","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/RADECS45761.2018.9328667
A. Pechenkin, A. A. Novikov, M. M. Novikova, D. Bobrovsky, G. Sorokoumov
SEL was observed along with SEFI in Kintex-7 under focused laser irradiation.
聚焦激光照射下观察Kintex-7的SEL和SEFI。
{"title":"SEL and SEFI discrimination in Kintex-7 using focused laser irradiation","authors":"A. Pechenkin, A. A. Novikov, M. M. Novikova, D. Bobrovsky, G. Sorokoumov","doi":"10.1109/RADECS45761.2018.9328667","DOIUrl":"https://doi.org/10.1109/RADECS45761.2018.9328667","url":null,"abstract":"SEL was observed along with SEFI in Kintex-7 under focused laser irradiation.","PeriodicalId":248855,"journal":{"name":"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127908493","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/radecs45761.2018.9328707
{"title":"2018 Conference Committee","authors":"","doi":"10.1109/radecs45761.2018.9328707","DOIUrl":"https://doi.org/10.1109/radecs45761.2018.9328707","url":null,"abstract":"","PeriodicalId":248855,"journal":{"name":"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127167706","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/RADECS45761.2018.9328652
F. Malatesta, M. Ottavi, G. Cardarilli, G. Furano, A. Menicucci, C. Cazzaniga, C. Andreani, R. Senesi, C. Scatigno
In this paper we report the measurement of the soft-error sensitivity of an ARM Cortex M0 core conducted at the ISIS ChipIR neutron irradiation facility. The test setup also included a CMOS camera sensor used for dosimetry estimation. The results provide the core memory and internal resources cross section thus giving useful information for developing ad-hoc fault tolerant techniques on sensitive parts.
{"title":"Neutron irradiation of an ARM Cortex-M0 Core","authors":"F. Malatesta, M. Ottavi, G. Cardarilli, G. Furano, A. Menicucci, C. Cazzaniga, C. Andreani, R. Senesi, C. Scatigno","doi":"10.1109/RADECS45761.2018.9328652","DOIUrl":"https://doi.org/10.1109/RADECS45761.2018.9328652","url":null,"abstract":"In this paper we report the measurement of the soft-error sensitivity of an ARM Cortex M0 core conducted at the ISIS ChipIR neutron irradiation facility. The test setup also included a CMOS camera sensor used for dosimetry estimation. The results provide the core memory and internal resources cross section thus giving useful information for developing ad-hoc fault tolerant techniques on sensitive parts.","PeriodicalId":248855,"journal":{"name":"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130550365","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/radecs45761.2018.9328709
{"title":"Title Page","authors":"","doi":"10.1109/radecs45761.2018.9328709","DOIUrl":"https://doi.org/10.1109/radecs45761.2018.9328709","url":null,"abstract":"","PeriodicalId":248855,"journal":{"name":"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"261 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133939183","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/RADECS45761.2018.9328676
P. Manzano, M. Álvarez, J. Manzano, M. Rivas, A. Martín-Ortega, N. Andrés
Proton latch-up test results are presented to complete the TID and heavy ion SEL tests performed previously on Microchip microcontroller to assess its suitability to be used in an instrument on board ExoMars 2020 mission.
{"title":"Proton SEL test on dsPIC microcontroller to be used in ExoMars 2020 mission","authors":"P. Manzano, M. Álvarez, J. Manzano, M. Rivas, A. Martín-Ortega, N. Andrés","doi":"10.1109/RADECS45761.2018.9328676","DOIUrl":"https://doi.org/10.1109/RADECS45761.2018.9328676","url":null,"abstract":"Proton latch-up test results are presented to complete the TID and heavy ion SEL tests performed previously on Microchip microcontroller to assess its suitability to be used in an instrument on board ExoMars 2020 mission.","PeriodicalId":248855,"journal":{"name":"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132190332","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/RADECS45761.2018.9328711
A. Kalashnikova, V. Anashin, P. Chubunov, A. Koziukov, S. Iakovlev, R. Mangushev, A. Nilov
The paper presents heavy-ion test results for a sample of amplifiers. Linear Energy Transfer (LET) thresholds for Single Event Upset (SEU) and Latchup (SEL) effects, as well as for Destructive Failure (DF), have been obtained during experiments. Additionally, for some amplifiers voltage Safe Operating Area (SOA) has been determined.
{"title":"Heavy-Ion SEE Test Results for Amplifiers","authors":"A. Kalashnikova, V. Anashin, P. Chubunov, A. Koziukov, S. Iakovlev, R. Mangushev, A. Nilov","doi":"10.1109/RADECS45761.2018.9328711","DOIUrl":"https://doi.org/10.1109/RADECS45761.2018.9328711","url":null,"abstract":"The paper presents heavy-ion test results for a sample of amplifiers. Linear Energy Transfer (LET) thresholds for Single Event Upset (SEU) and Latchup (SEL) effects, as well as for Destructive Failure (DF), have been obtained during experiments. Additionally, for some amplifiers voltage Safe Operating Area (SOA) has been determined.","PeriodicalId":248855,"journal":{"name":"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132458656","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/RADECS45761.2018.9328694
N. Trikoupis, J. Casas-Cubillos, S. Danzeca
In the context of implementing more control and data processing capabilities in new electronic cards at the European Organization for Nuclear Research (CERN), the Smartfusion2 Flash-based Reprogrammable Field Programmable Gate Array (FPGA) has been tested in the CHARM radiation facility at CERN. The CHARM facility was configured to offer a representative radiation environment of the CERN's Large Hardon Collider (LHC) accelerator. The FPGAs were tested during three irradiation campaigns. The observed radiation effects include Single Event Upsets (SEU), Single Event Transients (SET), Single Event Latch-ups (SEL), Single Event Functional Interrupts (SEFI) and failures due to Total Ionizing Radiation (TID). The use of this FPGA is linked to the implementation of appropriate Finite State Machine (FSM) encoding, Printed Circuit Board (PCB) design, and automated power cycling that are here discussed. The suitability of the FPGA in harsh environments and critical applications such as the cryogenics electronics infrastructure in the LHC tunnel is also discussed.
{"title":"Irradiation Test Results on Cryogenics Electronic Cards using the Smartfusion2 FPGA","authors":"N. Trikoupis, J. Casas-Cubillos, S. Danzeca","doi":"10.1109/RADECS45761.2018.9328694","DOIUrl":"https://doi.org/10.1109/RADECS45761.2018.9328694","url":null,"abstract":"In the context of implementing more control and data processing capabilities in new electronic cards at the European Organization for Nuclear Research (CERN), the Smartfusion2 Flash-based Reprogrammable Field Programmable Gate Array (FPGA) has been tested in the CHARM radiation facility at CERN. The CHARM facility was configured to offer a representative radiation environment of the CERN's Large Hardon Collider (LHC) accelerator. The FPGAs were tested during three irradiation campaigns. The observed radiation effects include Single Event Upsets (SEU), Single Event Transients (SET), Single Event Latch-ups (SEL), Single Event Functional Interrupts (SEFI) and failures due to Total Ionizing Radiation (TID). The use of this FPGA is linked to the implementation of appropriate Finite State Machine (FSM) encoding, Printed Circuit Board (PCB) design, and automated power cycling that are here discussed. The suitability of the FPGA in harsh environments and critical applications such as the cryogenics electronics infrastructure in the LHC tunnel is also discussed.","PeriodicalId":248855,"journal":{"name":"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130523602","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/RADECS45761.2018.9328729
P. Beck, M. Wind, M. Latocha, Christoph Tscherne
We discuss EN ISO/IEC 17025 accreditation requirements for the TEC-Laboratory with regard to ionizing radiation exposure of electronic components and systems at Seibersdorf Laboratories. We present investigations of the uniformity of the Cobalt-60 irradiation field as well as photon backscatter from the concrete walls and within a lead box.
{"title":"TEC-Laboratory - Accredited Ionizing Radiation Exposure of Electronic Components and Systems Compliant with EN ISO/IEC 17025","authors":"P. Beck, M. Wind, M. Latocha, Christoph Tscherne","doi":"10.1109/RADECS45761.2018.9328729","DOIUrl":"https://doi.org/10.1109/RADECS45761.2018.9328729","url":null,"abstract":"We discuss EN ISO/IEC 17025 accreditation requirements for the TEC-Laboratory with regard to ionizing radiation exposure of electronic components and systems at Seibersdorf Laboratories. We present investigations of the uniformity of the Cobalt-60 irradiation field as well as photon backscatter from the concrete walls and within a lead box.","PeriodicalId":248855,"journal":{"name":"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125808768","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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