Pub Date : 2018-09-01DOI: 10.1109/RADECS45761.2018.9328715
F. Irom, G. Allen, L. Edmonds, B. Rax
This paper reports proton damage in the Micropac 66183–300 optocoupler and investigates the radiation degradation of the optocoupler current transfer ratio (CTR) and transistor gain, HFE. We present statistical analysis using a one-sided tolerance method on the optocoupler CTR data.
{"title":"Proton Damage in Micropac 66183-300 Optocoupler","authors":"F. Irom, G. Allen, L. Edmonds, B. Rax","doi":"10.1109/RADECS45761.2018.9328715","DOIUrl":"https://doi.org/10.1109/RADECS45761.2018.9328715","url":null,"abstract":"This paper reports proton damage in the Micropac 66183–300 optocoupler and investigates the radiation degradation of the optocoupler current transfer ratio (CTR) and transistor gain, HFE. We present statistical analysis using a one-sided tolerance method on the optocoupler CTR data.","PeriodicalId":248855,"journal":{"name":"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"62 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121917093","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/RADECS45761.2018.9328683
Á. B. de Oliveira, F. Benevenuti, L. A. C. Benites, G. Rodrigues, F. Kastensmidt, N. Added, V. Aguiar, N. Medina, M. Silveira, Cédric Debarge
This work investigates the influence of using the built-in configuration memory scrubber and triple modular hardware redundancy in the cross section of a radiation-hardened SRAM-based FPGA from NanoXplore. Different designs versions are investigated under heavy ions for the occurrence of transient errors, failures, and timeouts. The calculated dynamic cross-sections are in agreement with the expected order of magnitude of radiation hardened SRAM-based FPGAs. Results show that the most reliable configuration is using DSPs for the operational logic and applying full design redundancy combined with scrubbing.
{"title":"Analyzing the Influence of using Reconfiguration Memory Scrubber and Hardware Redundancy in a Radiation Hardened FPGA under Heavy Ions","authors":"Á. B. de Oliveira, F. Benevenuti, L. A. C. Benites, G. Rodrigues, F. Kastensmidt, N. Added, V. Aguiar, N. Medina, M. Silveira, Cédric Debarge","doi":"10.1109/RADECS45761.2018.9328683","DOIUrl":"https://doi.org/10.1109/RADECS45761.2018.9328683","url":null,"abstract":"This work investigates the influence of using the built-in configuration memory scrubber and triple modular hardware redundancy in the cross section of a radiation-hardened SRAM-based FPGA from NanoXplore. Different designs versions are investigated under heavy ions for the occurrence of transient errors, failures, and timeouts. The calculated dynamic cross-sections are in agreement with the expected order of magnitude of radiation hardened SRAM-based FPGAs. Results show that the most reliable configuration is using DSPs for the operational logic and applying full design redundancy combined with scrubbing.","PeriodicalId":248855,"journal":{"name":"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125330878","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/RADECS45761.2018.9328729
P. Beck, M. Wind, M. Latocha, Christoph Tscherne
We discuss EN ISO/IEC 17025 accreditation requirements for the TEC-Laboratory with regard to ionizing radiation exposure of electronic components and systems at Seibersdorf Laboratories. We present investigations of the uniformity of the Cobalt-60 irradiation field as well as photon backscatter from the concrete walls and within a lead box.
{"title":"TEC-Laboratory - Accredited Ionizing Radiation Exposure of Electronic Components and Systems Compliant with EN ISO/IEC 17025","authors":"P. Beck, M. Wind, M. Latocha, Christoph Tscherne","doi":"10.1109/RADECS45761.2018.9328729","DOIUrl":"https://doi.org/10.1109/RADECS45761.2018.9328729","url":null,"abstract":"We discuss EN ISO/IEC 17025 accreditation requirements for the TEC-Laboratory with regard to ionizing radiation exposure of electronic components and systems at Seibersdorf Laboratories. We present investigations of the uniformity of the Cobalt-60 irradiation field as well as photon backscatter from the concrete walls and within a lead box.","PeriodicalId":248855,"journal":{"name":"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125808768","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/radecs45761.2018.9328719
{"title":"Tables of RADECS 2018 papers","authors":"","doi":"10.1109/radecs45761.2018.9328719","DOIUrl":"https://doi.org/10.1109/radecs45761.2018.9328719","url":null,"abstract":"","PeriodicalId":248855,"journal":{"name":"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127382108","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/RADECS45761.2018.9328731
L. Obermueller, C. Cazzaniga, S. Kulmiya, C. Frost
A fast neutron monitor based on Single Event Upsets in SRAM devices has been designed and tested for use on atmospheric neutron beamlines. Boards with a total memory capacity of up to 16 Mbit are irradiated, and the total number of bit-flips in the memory caused by fast neutron radiation effects is directly proportional to the neutron beam fluence. This system provides a count rate of 0.242 cps/Mbit. A scan of the beam was possible using this monitor, demonstrating that the beam profile is square and uniform.
{"title":"A Fast Neutron Monitor Based on Single Event Effects in SRAMs Using Commercial off-the-Shelf Components","authors":"L. Obermueller, C. Cazzaniga, S. Kulmiya, C. Frost","doi":"10.1109/RADECS45761.2018.9328731","DOIUrl":"https://doi.org/10.1109/RADECS45761.2018.9328731","url":null,"abstract":"A fast neutron monitor based on Single Event Upsets in SRAM devices has been designed and tested for use on atmospheric neutron beamlines. Boards with a total memory capacity of up to 16 Mbit are irradiated, and the total number of bit-flips in the memory caused by fast neutron radiation effects is directly proportional to the neutron beam fluence. This system provides a count rate of 0.242 cps/Mbit. A scan of the beam was possible using this monitor, demonstrating that the beam profile is square and uniform.","PeriodicalId":248855,"journal":{"name":"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126567980","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/radecs45761.2018.9328659
Yu-Mi Kim, S. Yun, Seung-Hyun Lee, H. Kwon, Kyeryung Kim, Yong-sub Cho
Korea Multi-purpose Accelerator Complex (KOMAC) has been operating 20 MeV and 100 MeV proton beam lines to provide proton beams for various applications since 2013. A new beam line with low flux proton has been constructed for simulation of the space radiation-like environment in 2016 and commissioning has been completed in 2017. In this work, we introduced the new proton beam line and reported the results of preliminary proton beam characterization test. As the results, we concluded the new beam line can provide as low as flux of 105 #/cm2/pulse, good uniformity within ± 10% and large beam area with wide range of proton energies.
{"title":"Investigation of Low Flux Proton Beam at KOMAC for Space Applications","authors":"Yu-Mi Kim, S. Yun, Seung-Hyun Lee, H. Kwon, Kyeryung Kim, Yong-sub Cho","doi":"10.1109/radecs45761.2018.9328659","DOIUrl":"https://doi.org/10.1109/radecs45761.2018.9328659","url":null,"abstract":"Korea Multi-purpose Accelerator Complex (KOMAC) has been operating 20 MeV and 100 MeV proton beam lines to provide proton beams for various applications since 2013. A new beam line with low flux proton has been constructed for simulation of the space radiation-like environment in 2016 and commissioning has been completed in 2017. In this work, we introduced the new proton beam line and reported the results of preliminary proton beam characterization test. As the results, we concluded the new beam line can provide as low as flux of 105 #/cm2/pulse, good uniformity within ± 10% and large beam area with wide range of proton energies.","PeriodicalId":248855,"journal":{"name":"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131090420","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/RADECS45761.2018.9328703
B. Fox, K. Simmons-Potter
Fibers doped with Yb3+ serve as optical amplification elements in many high-power amplification systems, and there is an interest in significantly extending the capabilities of rare-earth doped fiber amplifiers to space-based systems. We investigate the effects of gamma-radiation-induced photodarkening on the performance of such fibers, both for passive as well as active configurations. With an emphasis on low total ionizing doses, passive irradiations were found to show increased absorption across the visible and IR spectrum. Furthermore, continuous-pumping of an Yb3+ -doped fiber amplifier in a gamma radiation environment was found to exhibit significantly greater degradation than a similar intermittently-pumped irradiated amplifier for low total ionizing doses of under 10 krad(Si) [100 Gy(Si)]. We discuss the implications of the data which provide insight into energy-transfer mechanisms in the fibers and the relationship of gamma-radiation-induced photodarkening and pump-radiation-induced photodarkening associated with the observed fiber degradation.
{"title":"Effect of Ionizing Radiation on Optical Transmission of Actively Pumped Yb- Doped Fiber Amplifiers","authors":"B. Fox, K. Simmons-Potter","doi":"10.1109/RADECS45761.2018.9328703","DOIUrl":"https://doi.org/10.1109/RADECS45761.2018.9328703","url":null,"abstract":"Fibers doped with Yb3+ serve as optical amplification elements in many high-power amplification systems, and there is an interest in significantly extending the capabilities of rare-earth doped fiber amplifiers to space-based systems. We investigate the effects of gamma-radiation-induced photodarkening on the performance of such fibers, both for passive as well as active configurations. With an emphasis on low total ionizing doses, passive irradiations were found to show increased absorption across the visible and IR spectrum. Furthermore, continuous-pumping of an Yb3+ -doped fiber amplifier in a gamma radiation environment was found to exhibit significantly greater degradation than a similar intermittently-pumped irradiated amplifier for low total ionizing doses of under 10 krad(Si) [100 Gy(Si)]. We discuss the implications of the data which provide insight into energy-transfer mechanisms in the fibers and the relationship of gamma-radiation-induced photodarkening and pump-radiation-induced photodarkening associated with the observed fiber degradation.","PeriodicalId":248855,"journal":{"name":"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127840232","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/radecs45761.2018.9328671
{"title":"The RADECS 2018 Technical Program Committee","authors":"","doi":"10.1109/radecs45761.2018.9328671","DOIUrl":"https://doi.org/10.1109/radecs45761.2018.9328671","url":null,"abstract":"","PeriodicalId":248855,"journal":{"name":"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129365320","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/RADECS45761.2018.9328684
M. Cherniak, R. Mozhaev, A. Pechenkin, D. Boychenko, A. Nikiforov
The presented experimental results reflect the ionizing breakdown effect in CCD sensor under the fluence of heavy charged particles confirmed on a simulating laser facility. The effect primary analysis has been carried out, the critical parts have been highlighted.
{"title":"Investigation of SEE Breakdown in CCD Image Sensor","authors":"M. Cherniak, R. Mozhaev, A. Pechenkin, D. Boychenko, A. Nikiforov","doi":"10.1109/RADECS45761.2018.9328684","DOIUrl":"https://doi.org/10.1109/RADECS45761.2018.9328684","url":null,"abstract":"The presented experimental results reflect the ionizing breakdown effect in CCD sensor under the fluence of heavy charged particles confirmed on a simulating laser facility. The effect primary analysis has been carried out, the critical parts have been highlighted.","PeriodicalId":248855,"journal":{"name":"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"87 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129179452","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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