In the characterization of perovskite failure, conventional techniques face considerable challenges in achieving multiphysics coupling, in situ, non-destructive, rapid assessment, and spatial resolution. This study proposes an experimental method based on grayscale evolution and digital image correlation (DIC). Using large-grained MAPbI₃ thin films as the research object, this method enables pixel-level tracking of degradation evolution under illumination, voltage, and deformation conditions using optical microscopy. Experimental results demonstrate a strong correlation among grayscale evolution, crystal phase changes, and optoelectronic performance. Tensile strain accelerates degradation and leads to an earlier onset; in this study (), the maximum degradation rate is approximately 1.5 times that of the strain-free condition. In addition, grain boundaries exhibit a certain hindering effect on strain transmission. Overall, this method provides an effective tool for investigating degradation under coupled multiphysics fields and for the rapid stability evaluation of perovskite materials.
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