首页 > 最新文献

Iet Circuits Devices & Systems最新文献

英文 中文
On the Telemedicine Microcontroller-Based ECG Security Using a Novel 4Wings-4D Chaotic Oscillator (N4W4DCO) 利用新型 4Wings-4D 混沌振荡器 (N4W4DCO) 实现基于远程医疗微控制器的心电图安全
IF 1 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2024-07-16 DOI: 10.1049/2024/7810041
Borel Dilane Banmene Lontsi, Gideon Pagnol Ayemtsa Kuete, Justin Roger Mboupda Pone

In this contribution, a chaos-based microcontroller electrocardiogram (ECG) signal acquisition-security-transmission system is proposed. It is designed based on a Novel 4Wings-4D Chaotic Oscillator (N4W4DCO) with a hyperbolic sine nonlinearity unbalanced. The classical nonlinear dynamics tools, such as 2D bifurcation and the highest Lyapunov exponent curves, basins of attraction, and power spectral density, help us see that the proposed chaotic oscillator generates periodic oscillations, intermittency + crisis routes to chaos, transient chaos, and the coexistence of 4/2 wings attractors just to name a few dynamics. The data generated using highly chaotic regime are tested using the well-known NIST TEST -800-22 Rev A and the results passed the test successfully. The N4W4DCO oscillator is embedded in an Arduino microcontroller where the discovered interesting dynamics are confirmed. A low-cost ECG acquisition circuit with an AD8232 ECG sensor is also designed and experimented. ECG signals are acquired and directly loaded into MATLAB-Simulink and are successfully encrypted with random data from the N4W4DCO in its chaos regime. The scrambled ECG signals from experiment are sent through an added white gaussian noise (AWGN) channel and thereafter received and decrypted. These results are promising and open the possibility of improving secure telemedicine transmission systems.

本文提出了一种基于混沌的微控制器心电图(ECG)信号采集-安全-传输系统。该系统是基于双曲正弦非线性不平衡的新型 4Wings-4D 混沌振荡器(N4W4DCO)设计的。经典的非线性动力学工具,如二维分岔和最高莱普诺夫指数曲线、吸引盆地和功率谱密度,帮助我们发现所提出的混沌振荡器会产生周期性振荡、间歇性+通向混沌的危机路径、瞬态混沌和 4/2 翼吸引子共存等动态。利用高度混沌机制生成的数据通过了著名的 NIST TEST -800-22 Rev A 测试,结果顺利通过测试。N4W4DCO 振荡器被嵌入到 Arduino 微控制器中,发现的有趣动态得到了证实。此外,还设计并实验了一个带有 AD8232 心电图传感器的低成本心电图采集电路。心电信号被采集并直接加载到 MATLAB-Simulink 中,并成功地用 N4W4DCO 在混沌状态下的随机数据进行了加密。实验中的加扰心电信号通过添加白高斯噪声(AWGN)信道发送,然后接收并解密。这些结果很有希望,为改进安全的远程医疗传输系统提供了可能。
{"title":"On the Telemedicine Microcontroller-Based ECG Security Using a Novel 4Wings-4D Chaotic Oscillator (N4W4DCO)","authors":"Borel Dilane Banmene Lontsi,&nbsp;Gideon Pagnol Ayemtsa Kuete,&nbsp;Justin Roger Mboupda Pone","doi":"10.1049/2024/7810041","DOIUrl":"https://doi.org/10.1049/2024/7810041","url":null,"abstract":"<div>\u0000 <p>In this contribution, a chaos-based microcontroller electrocardiogram (ECG) signal acquisition-security-transmission system is proposed. It is designed based on a Novel 4Wings-4D Chaotic Oscillator (N4W4DCO) with a hyperbolic sine nonlinearity unbalanced. The classical nonlinear dynamics tools, such as 2D bifurcation and the highest Lyapunov exponent curves, basins of attraction, and power spectral density, help us see that the proposed chaotic oscillator generates periodic oscillations, intermittency + crisis routes to chaos, transient chaos, and the coexistence of 4/2 wings attractors just to name a few dynamics. The data generated using highly chaotic regime are tested using the well-known NIST TEST -800-22 Rev A and the results passed the test successfully. The N4W4DCO oscillator is embedded in an Arduino microcontroller where the discovered interesting dynamics are confirmed. A low-cost ECG acquisition circuit with an AD8232 ECG sensor is also designed and experimented. ECG signals are acquired and directly loaded into MATLAB-Simulink and are successfully encrypted with random data from the N4W4DCO in its chaos regime. The scrambled ECG signals from experiment are sent through an added white gaussian noise (AWGN) channel and thereafter received and decrypted. These results are promising and open the possibility of improving secure telemedicine transmission systems.</p>\u0000 </div>","PeriodicalId":50386,"journal":{"name":"Iet Circuits Devices & Systems","volume":"2024 1","pages":""},"PeriodicalIF":1.0,"publicationDate":"2024-07-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.1049/2024/7810041","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141631157","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Performance Assessment of GaAs Pocket-Doped Dual-Material Gate-Oxide-Stack DG-TFET at Device and Circuit Level 器件和电路级掺砷化镓袖珍型双材料栅氧化物叠层 DG-TFET 性能评估
IF 1 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2024-07-02 DOI: 10.1049/2024/9925894
Km. Sucheta Singh, Satyendra Kumar, Saurabh Chaturvedi, Kapil Dev Tyagi, Vaibhav Bhushan Tyagi

This study explores the impact of integrating a gallium arsenide (GaAs) pocket at the source and drain in a dual-material gate-oxide-stack double-gate tunnel field-effect transistor (DMGOSDG-TFET). The performance of this DMGOSDG-TFET, employing work-function engineering and gate-oxide-stack techniques, is compared with a GaAs pocket-doped DMGOSDG-TFET. Using the Silvaco Technology Computer-Aided Design tool, the comparison covers DC characteristics, analog/RF behavior, and circuit-level assessments. The research introduces an optimized heterostructure pocket-doped DMGOSDG-TFET to enhance DC characteristics, analog/RF performance, and DC/transient analysis. This novel architecture effectively suppresses ambipolarity, making it more suitable for current conduction. The incorporation of work-function engineering and a gate-oxide-stack approach enhances the device’s current driving capability, while the use of a highly doped GaAs pocket at the source and drain virtually eliminates ambipolar current conduction. Simulation results indicate that the proposed heterostructure device exhibits a high ON-current and switching ratio. For analog/RF applications, the optimized heterostructure device outperforms conventional DMGOSDG-TFET, offering higher cutoff frequency, transconductance, and other analog/RF parameters. Circuit-level performance is assessed using HSPICE, with a focus on the implementation of a resistive-load inverter for both proposed and conventional device topologies through DC and transient evaluations.

本研究探讨了在双材料栅氧化物叠层双栅隧道场效应晶体管(DMGOSDG-TFET)的源极和漏极集成砷化镓(GaAs)口袋的影响。这种 DMGOSDG-TFET 采用了功函数工程和栅氧化物叠层技术,其性能与掺砷化镓口袋的 DMGOSDG-TFET 进行了比较。通过使用 Silvaco Technology 计算机辅助设计工具,比较涵盖了直流特性、模拟/射频行为和电路级评估。研究介绍了一种优化的异质结构袋式掺杂 DMGOSDG-TFET,以增强直流特性、模拟/射频性能和直流/瞬态分析。这种新颖的结构有效抑制了伏极性,使其更适合电流传导。功函数工程和栅氧化物堆叠方法的结合增强了器件的电流驱动能力,而在源极和漏极使用高掺杂砷化镓口袋几乎消除了伏极性电流传导。仿真结果表明,所提出的异质结构器件具有很高的导通电流和开关比。在模拟/射频应用方面,优化的异质结构器件优于传统的 DMGOSDG-TFET,具有更高的截止频率、跨导和其他模拟/射频参数。通过直流和瞬态评估,使用 HSPICE 对电路级性能进行了评估,重点评估了拟议器件拓扑和传统器件拓扑的阻性负载逆变器的实施情况。
{"title":"Performance Assessment of GaAs Pocket-Doped Dual-Material Gate-Oxide-Stack DG-TFET at Device and Circuit Level","authors":"Km. Sucheta Singh,&nbsp;Satyendra Kumar,&nbsp;Saurabh Chaturvedi,&nbsp;Kapil Dev Tyagi,&nbsp;Vaibhav Bhushan Tyagi","doi":"10.1049/2024/9925894","DOIUrl":"https://doi.org/10.1049/2024/9925894","url":null,"abstract":"<div>\u0000 <p>This study explores the impact of integrating a gallium arsenide (GaAs) pocket at the source and drain in a dual-material gate-oxide-stack double-gate tunnel field-effect transistor (DMGOSDG-TFET). The performance of this DMGOSDG-TFET, employing work-function engineering and gate-oxide-stack techniques, is compared with a GaAs pocket-doped DMGOSDG-TFET. Using the Silvaco Technology Computer-Aided Design tool, the comparison covers DC characteristics, analog/RF behavior, and circuit-level assessments. The research introduces an optimized heterostructure pocket-doped DMGOSDG-TFET to enhance DC characteristics, analog/RF performance, and DC/transient analysis. This novel architecture effectively suppresses ambipolarity, making it more suitable for current conduction. The incorporation of work-function engineering and a gate-oxide-stack approach enhances the device’s current driving capability, while the use of a highly doped GaAs pocket at the source and drain virtually eliminates ambipolar current conduction. Simulation results indicate that the proposed heterostructure device exhibits a high ON-current and switching ratio. For analog/RF applications, the optimized heterostructure device outperforms conventional DMGOSDG-TFET, offering higher cutoff frequency, transconductance, and other analog/RF parameters. Circuit-level performance is assessed using HSPICE, with a focus on the implementation of a resistive-load inverter for both proposed and conventional device topologies through DC and transient evaluations.</p>\u0000 </div>","PeriodicalId":50386,"journal":{"name":"Iet Circuits Devices & Systems","volume":"2024 1","pages":""},"PeriodicalIF":1.0,"publicationDate":"2024-07-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.1049/2024/9925894","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141536810","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Secured Routing Protocol for Improving the Energy Efficiency in WSN Applications 提高 WSN 应用能效的安全路由协议
IF 1.3 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2024-06-18 DOI: 10.1049/2024/6675822
Y. P. Makimaa, R. Sudarmani

A staggering number of applications rely on the network architecture to carry out their tasks, which has led to a fast growth in wireless sensor networks (WSN). The possibility of harmful activity and data theft is growing as a result of the growth in devices and data. Thus, the network’s regular users have an impact on legitimate data delivery, which lowers customer happiness and worsens network standards. The data have been saved using a variety of security procedures that have been developed in past research studies. However, harmful activity continues to engage in its illegal operations despite their efforts to safeguard data transmission in the network. As a result, a number of recent research projects have concentrated on predicting innovative techniques and processes to offer security in WSN. In comparison to existing methods, this work attempted to offer an effective tighter security for WSN and suggested an ML-Based Secured Routing Protocol (MLSRP) for WSN with improved energy efficiency and overall performance. Energy efficiency is the main requirement of WSNs, hence a clustered network is proposed where the data are routed through the cluster head nodes. In this paper, a multicriteria based decision-making (MCDM) model is used by the MLSRP to perform data routing, clustering, and cluster head election while also analyzing a number of network characteristics that might affect the quality of a node, route, and data. In NS2 software, the suggested framework is put into practice and simulated. The results are then validated to gauge performance. The observed quantitative results reveal that the proposed MLSRP method attains an improved network lifetime by 5% and network throughput of 6%. It reduces energy consumption by 40%, curtails overhead to 37%, and minimizes end-to-end delay by 30% than the other conventional methods. The suggested framework performs better than others when its total performance is compared to that of older methods.

大量应用依赖网络架构来执行任务,这导致无线传感器网络(WSN)迅速发展。随着设备和数据的增长,有害活动和数据被盗的可能性也在增加。因此,网络的普通用户会对合法数据传输造成影响,从而降低客户满意度,恶化网络标准。在过去的调查研究中,人们使用各种安全程序保存数据。然而,尽管他们努力保护网络中的数据传输,但有害活动仍在继续从事非法活动。因此,最近的一些研究项目都集中在预测创新技术和程序,以提供 WSN 的安全性。与现有方法相比,这项工作试图为 WSN 提供更有效、更严密的安全性,并为 WSN 提出了一种基于 ML 的安全路由协议(MLSRP),以提高能源效率和整体性能。能效是 WSN 的主要要求,因此提出了一种簇状网络,数据通过簇头节点路由。在本文中,MLSRP 使用基于多标准的决策(MCDM)模型来执行数据路由、聚类和簇头选举,同时还分析了可能影响节点、路由和数据质量的一系列网络特征。在 NS2 软件中,建议的框架得到了实践和模拟。然后对结果进行验证,以衡量性能。观察到的定量结果表明,建议的 MLSRP 方法将网络寿命提高了 5%,网络吞吐量提高了 6%。与其他传统方法相比,它减少了 40% 的能源消耗,开销减少了 37%,端到端延迟减少了 30%。与其他旧方法相比,建议的框架在总体性能方面表现更佳。
{"title":"Secured Routing Protocol for Improving the Energy Efficiency in WSN Applications","authors":"Y. P. Makimaa,&nbsp;R. Sudarmani","doi":"10.1049/2024/6675822","DOIUrl":"https://doi.org/10.1049/2024/6675822","url":null,"abstract":"<div>\u0000 <p>A staggering number of applications rely on the network architecture to carry out their tasks, which has led to a fast growth in wireless sensor networks (WSN). The possibility of harmful activity and data theft is growing as a result of the growth in devices and data. Thus, the network’s regular users have an impact on legitimate data delivery, which lowers customer happiness and worsens network standards. The data have been saved using a variety of security procedures that have been developed in past research studies. However, harmful activity continues to engage in its illegal operations despite their efforts to safeguard data transmission in the network. As a result, a number of recent research projects have concentrated on predicting innovative techniques and processes to offer security in WSN. In comparison to existing methods, this work attempted to offer an effective tighter security for WSN and suggested an ML-Based Secured Routing Protocol (MLSRP) for WSN with improved energy efficiency and overall performance. Energy efficiency is the main requirement of WSNs, hence a clustered network is proposed where the data are routed through the cluster head nodes. In this paper, a multicriteria based decision-making (MCDM) model is used by the MLSRP to perform data routing, clustering, and cluster head election while also analyzing a number of network characteristics that might affect the quality of a node, route, and data. In NS2 software, the suggested framework is put into practice and simulated. The results are then validated to gauge performance. The observed quantitative results reveal that the proposed MLSRP method attains an improved network lifetime by 5% and network throughput of 6%. It reduces energy consumption by 40%, curtails overhead to 37%, and minimizes end-to-end delay by 30% than the other conventional methods. The suggested framework performs better than others when its total performance is compared to that of older methods.</p>\u0000 </div>","PeriodicalId":50386,"journal":{"name":"Iet Circuits Devices & Systems","volume":"2024 1","pages":""},"PeriodicalIF":1.3,"publicationDate":"2024-06-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.1049/2024/6675822","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141424920","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Optimizing Metro Passenger Flow Prediction: Integrating Machine Learning and Time-Series Analysis with Multimodal Data Fusion 优化地铁客流预测:将机器学习和时间序列分析与多模式数据融合相结合
IF 1.3 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2024-04-26 DOI: 10.1049/2024/5259452
Li Wan, Wenzhi Cheng, Jie Yang

Accurate passenger flow forecasting is crucial in urban areas with growing transit demand. In this paper, we propose a method that combines advanced machine learning with rigorous time series analysis to improve prediction accuracy by integrating different datasets, providing a prescriptive example for passenger flow prediction in urban rail transit systems. The study employs advanced machine learning algorithms and proposes a novel prediction model that combines two-stage decomposition (seasonal and trend decomposition using LOESS–ensemble empirical mode decomposition (STL-EEMD)) and gated recurrent units. First, the STL decomposition algorithm is applied to break down the preprocessed data into trend terms, periodic terms, and irregular fluctuation terms. Then, the EEMD decomposition algorithm is employed to further decompose the irregular fluctuation terms, yielding multiple IMF components and residual residuals. Subsequently, the decomposed data from STL and EEMD are partitioned into training and test sets and normalized. The training set is utilized to train the model for optimal performance in predicting subway short-time passenger flow. The synthesis of these sophisticated methodologies serves to substantially enhance both the predictive precision and the broad applicability of the forecasting models. The efficacy of the proposed approach is rigorously evaluated through its application to empirical metro passenger flow datasets from diverse urban centers, demonstrating marked superiority in predictive performance over traditional forecasting methods. The insights gleaned from this study bear significant ramifications for the strategic planning and administration of public transportation infrastructures, potentially leading to more strategic resource allocation and an enhanced commuter experience.

在公交需求不断增长的城市地区,准确的客流预测至关重要。在本文中,我们提出了一种将先进的机器学习与严格的时间序列分析相结合的方法,通过整合不同的数据集来提高预测精度,为城市轨道交通系统的客流预测提供了一个规范性实例。该研究采用了先进的机器学习算法,并提出了一种结合两阶段分解(使用 LOESS-ensemble 经验模式分解(STL-EEMD)的季节和趋势分解)和门控循环单元的新型预测模型。首先,采用 STL 分解算法将预处理数据分解为趋势项、周期项和不规则波动项。然后,采用 EEMD 分解算法进一步分解不规则波动项,得到多个 IMF 分量和残余残差。随后,将 STL 和 EEMD 的分解数据划分为训练集和测试集,并进行归一化处理。利用训练集来训练模型,以获得预测地铁短时客流的最佳性能。这些复杂方法的综合运用大大提高了预测模型的预测精度和广泛适用性。通过对不同城市中心的地铁客流实证数据集的应用,对所提出方法的有效性进行了严格评估,结果表明其预测性能明显优于传统预测方法。本研究得出的见解对公共交通基础设施的战略规划和管理具有重要影响,有可能带来更具战略性的资源分配和更好的乘客体验。
{"title":"Optimizing Metro Passenger Flow Prediction: Integrating Machine Learning and Time-Series Analysis with Multimodal Data Fusion","authors":"Li Wan,&nbsp;Wenzhi Cheng,&nbsp;Jie Yang","doi":"10.1049/2024/5259452","DOIUrl":"https://doi.org/10.1049/2024/5259452","url":null,"abstract":"<div>\u0000 <p>Accurate passenger flow forecasting is crucial in urban areas with growing transit demand. In this paper, we propose a method that combines advanced machine learning with rigorous time series analysis to improve prediction accuracy by integrating different datasets, providing a prescriptive example for passenger flow prediction in urban rail transit systems. The study employs advanced machine learning algorithms and proposes a novel prediction model that combines two-stage decomposition (seasonal and trend decomposition using LOESS–ensemble empirical mode decomposition (STL-EEMD)) and gated recurrent units. First, the STL decomposition algorithm is applied to break down the preprocessed data into trend terms, periodic terms, and irregular fluctuation terms. Then, the EEMD decomposition algorithm is employed to further decompose the irregular fluctuation terms, yielding multiple IMF components and residual residuals. Subsequently, the decomposed data from STL and EEMD are partitioned into training and test sets and normalized. The training set is utilized to train the model for optimal performance in predicting subway short-time passenger flow. The synthesis of these sophisticated methodologies serves to substantially enhance both the predictive precision and the broad applicability of the forecasting models. The efficacy of the proposed approach is rigorously evaluated through its application to empirical metro passenger flow datasets from diverse urban centers, demonstrating marked superiority in predictive performance over traditional forecasting methods. The insights gleaned from this study bear significant ramifications for the strategic planning and administration of public transportation infrastructures, potentially leading to more strategic resource allocation and an enhanced commuter experience.</p>\u0000 </div>","PeriodicalId":50386,"journal":{"name":"Iet Circuits Devices & Systems","volume":"2024 1","pages":""},"PeriodicalIF":1.3,"publicationDate":"2024-04-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.1049/2024/5259452","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141096475","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An Area-Efficient Integrate-and-Fire Neuron Circuit with Enhanced Robustness against Synapse Variability in Hardware Neural Network 一种面积效率高的集成与发射神经元电路,可增强硬件神经网络中突触变异的鲁棒性
IF 1 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2023-12-26 DOI: 10.1049/2023/1052063
Arati Kumari Shah, Kannan Udaya Mohanan, Jisun Park, Hyungsoon Shin, Eou-Sik Cho, Seongjae Cho

Neuron circuits are the fundamental building blocks in the modern neuromorphic system. Designing compact and low-power neuron circuits can significantly improve the overall area and energy efficiencies of a neuromorphic chip architecture. Here, practical neuron circuits must overcome the variations arising from nonideal behaviors of synaptic devices, such as stuck-at-fault and conductance deviation. In this study, a compact leaky integrate-and-fire neuron circuit has been designed, with resilience to synaptic device state variations, for hardware implementation of spiking neural networks (SNNs). The proposed neuron circuit is simulated on the 0.35-μm Si complementary metal-oxide-semiconductor technology node by a series of circuit simulations based on HSPICE. The proposed circuit occupies a reduced area and exhibits low power consumption (14.7 µW per spike). Furthermore, the optimized circuit design results in a high degree of tolerance toward input-current variations arising from conductance-state variations in the synapse array. Hence, the proposed neuron circuit would be capable of substantially improving the area efficiency and reliability in the realization of the hardware-oriented SNN architectures.

神经元电路是现代神经形态系统的基本构件。设计紧凑、低功耗的神经元电路可以显著提高神经形态芯片架构的整体面积和能效。在此,实用神经元电路必须克服突触器件的非理想行为所带来的变化,如故障卡滞和电导偏差。本研究为尖峰神经网络(SNN)的硬件实现设计了一种紧凑型漏电积分发射神经元电路,该电路具有对突触设备状态变化的复原能力。通过一系列基于 HSPICE 的电路仿真,在 0.35μm 硅互补金属氧化物半导体技术节点上模拟了所提出的神经元电路。所提出的电路占地面积更小,功耗更低(每个尖峰 14.7 µW)。此外,优化的电路设计对突触阵列中电导状态变化引起的输入电流变化具有很高的耐受性。因此,在实现面向硬件的 SNN 架构时,所提出的神经元电路能够大幅提高面积效率和可靠性。
{"title":"An Area-Efficient Integrate-and-Fire Neuron Circuit with Enhanced Robustness against Synapse Variability in Hardware Neural Network","authors":"Arati Kumari Shah,&nbsp;Kannan Udaya Mohanan,&nbsp;Jisun Park,&nbsp;Hyungsoon Shin,&nbsp;Eou-Sik Cho,&nbsp;Seongjae Cho","doi":"10.1049/2023/1052063","DOIUrl":"10.1049/2023/1052063","url":null,"abstract":"<div>\u0000 <p>Neuron circuits are the fundamental building blocks in the modern neuromorphic system. Designing compact and low-power neuron circuits can significantly improve the overall area and energy efficiencies of a neuromorphic chip architecture. Here, practical neuron circuits must overcome the variations arising from nonideal behaviors of synaptic devices, such as stuck-at-fault and conductance deviation. In this study, a compact leaky integrate-and-fire neuron circuit has been designed, with resilience to synaptic device state variations, for hardware implementation of spiking neural networks (SNNs). The proposed neuron circuit is simulated on the 0.35-<i>μ</i>m Si complementary metal-oxide-semiconductor technology node by a series of circuit simulations based on HSPICE. The proposed circuit occupies a reduced area and exhibits low power consumption (14.7 <i>µ</i>W per spike). Furthermore, the optimized circuit design results in a high degree of tolerance toward input-current variations arising from conductance-state variations in the synapse array. Hence, the proposed neuron circuit would be capable of substantially improving the area efficiency and reliability in the realization of the hardware-oriented SNN architectures.</p>\u0000 </div>","PeriodicalId":50386,"journal":{"name":"Iet Circuits Devices & Systems","volume":"2023 1","pages":""},"PeriodicalIF":1.0,"publicationDate":"2023-12-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.1049/2023/1052063","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139156089","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Implementation of Image Enhancement and Edge Detection Algorithm on Diabetic Retinopathy (DR) Image Using FPGA 使用 FPGA 在糖尿病视网膜病变 (DR) 图像上实现图像增强和边缘检测算法
IF 1 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2023-12-11 DOI: 10.1049/2023/8820773
Mumtahina Orthy, Sheikh Md. Rabiul Islam, Faijah Rashid, Md. Asif Hasan

Diabetic retinopathy (DR) is an ocular ailment that may lead to loss of vision and eventual blindness among individuals diagnosed with diabetes. The blood vessels of the retina, a layer of light-sensitive tissue located at the posterior aspect of the ocular globe, are adversely impacted. The identification of DR entails the utilization of retinal fundus images. The detection of any form of abnormality in the eye through raw fundus images poses a significant challenge for medical practitioners. Hence, it is imperative to engage in the processing of fundus images. This paper delineates several image processing techniques for DR images, including but not limited to, manipulation of brightness levels, application of negative transformation, and utilization of threshold operations. It focuses on elucidating the enhancement techniques that pertain to DR images, which aim to optimize the visual quality of said images in order to facilitate more facile disease detection. The process of detecting edges within DR images is also executed by Sobel edge detection algorithm. In order to successfully execute the aforementioned algorithms, expedient and contemporaneous systems are favored to account for the intricacies of the image processing calculations. The exclusive utilization of software techniques in order to fulfill the prerequisites of advanced algorithms presents a significant challenge, owing to the multifarious processes that are involved in their computation, coupled with an exigent requirement for high processing speeds. The proposed model is utilized to articulate a proficient model for the design and execution of field programable gate array (FPGA)-based image enhancement processes along with the Sobel edge detection algorithm upon DR images. Finally, a Internet Protocol chip is developed that can combine multiple image enhancement operations into a single framework with less complexity.

糖尿病视网膜病变(DR)是一种眼部疾病,可能会导致糖尿病患者丧失视力并最终失明。视网膜是位于眼球后部的一层感光组织,其血管会受到不利影响。DR 的识别需要利用视网膜眼底图像。通过原始眼底图像检测眼部任何形式的异常都是对医疗从业人员的巨大挑战。因此,对眼底图像进行处理势在必行。本文阐述了 DR 图像的几种图像处理技术,包括但不限于亮度级别处理、负变换应用和阈值操作的利用。本文重点阐述了与 DR 图像有关的增强技术,这些技术旨在优化上述图像的视觉质量,以便更方便地检测疾病。在 DR 图像中检测边缘的过程也是通过 Sobel 边缘检测算法来执行的。为了成功地执行上述算法,需要使用先进的系统来处理复杂的图像处理计算。为了满足高级算法的先决条件,专门使用软件技术是一个巨大的挑战,因为这些算法的计算过程多种多样,而且对处理速度有极高的要求。我们利用所提出的模型,为设计和执行基于现场可编程门阵列(FPGA)的图像增强过程以及 DR 图像上的 Sobel 边缘检测算法建立了一个熟练的模型。最后,还开发了一种互联网协议芯片,可将多种图像增强操作合并到一个框架中,且复杂度较低。
{"title":"Implementation of Image Enhancement and Edge Detection Algorithm on Diabetic Retinopathy (DR) Image Using FPGA","authors":"Mumtahina Orthy,&nbsp;Sheikh Md. Rabiul Islam,&nbsp;Faijah Rashid,&nbsp;Md. Asif Hasan","doi":"10.1049/2023/8820773","DOIUrl":"10.1049/2023/8820773","url":null,"abstract":"<div>\u0000 <p>Diabetic retinopathy (DR) is an ocular ailment that may lead to loss of vision and eventual blindness among individuals diagnosed with diabetes. The blood vessels of the retina, a layer of light-sensitive tissue located at the posterior aspect of the ocular globe, are adversely impacted. The identification of DR entails the utilization of retinal fundus images. The detection of any form of abnormality in the eye through raw fundus images poses a significant challenge for medical practitioners. Hence, it is imperative to engage in the processing of fundus images. This paper delineates several image processing techniques for DR images, including but not limited to, manipulation of brightness levels, application of negative transformation, and utilization of threshold operations. It focuses on elucidating the enhancement techniques that pertain to DR images, which aim to optimize the visual quality of said images in order to facilitate more facile disease detection. The process of detecting edges within DR images is also executed by Sobel edge detection algorithm. In order to successfully execute the aforementioned algorithms, expedient and contemporaneous systems are favored to account for the intricacies of the image processing calculations. The exclusive utilization of software techniques in order to fulfill the prerequisites of advanced algorithms presents a significant challenge, owing to the multifarious processes that are involved in their computation, coupled with an exigent requirement for high processing speeds. The proposed model is utilized to articulate a proficient model for the design and execution of field programable gate array (FPGA)-based image enhancement processes along with the Sobel edge detection algorithm upon DR images. Finally, a Internet Protocol chip is developed that can combine multiple image enhancement operations into a single framework with less complexity.</p>\u0000 </div>","PeriodicalId":50386,"journal":{"name":"Iet Circuits Devices & Systems","volume":"2023 1","pages":""},"PeriodicalIF":1.0,"publicationDate":"2023-12-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.1049/2023/8820773","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139184064","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
System for PCB Defect Detection Using Visual Computing and Deep Learning for Production Optimization 基于视觉计算和深度学习的PCB缺陷检测系统
IF 1 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2023-11-03 DOI: 10.1049/2023/6681526
Gabriel Gomes de Oliveira, Gabriel Caumo Vaz, Marcos Antonio Andrade, Yuzo Iano, Leandro Ronchini Ximenes, Rangel Arthur

With the growing competition between the various manufacturers of electronic products, the quality of the products developed and the consequent confidence in the brand are fundamental factors for the survival of companies. To guarantee the quality of the products in the manufacturing process, it is crucial to identify defects during the production stage of an electronic device. This study presents a system based on traditional visual computing and new deep learning methods to detect defects in electronic devices during the manufacturing process. A prototype of the proposed system was developed and manufactured for direct use in the production line of electronic devices. Tests were performed using a particular smartphone model that had 22 critical components to inspect and the results showed that the proposed system achieved an average accuracy of more than 90% in defect detection when it was directly used in the operational production line. Other studies in this field perform measurements in controlled laboratory environments and identify fewer critical components. Therefore, the proposed method is a real-time high-performance system. Furthermore, the proposed system conforms with the Industry 4.0 goal that process system digitization is essential to improve indicators and optimize production.

随着各电子产品制造商之间的竞争日益激烈,所开发产品的质量以及由此产生的对品牌的信心是公司生存的根本因素。为了保证产品在制造过程中的质量,在电子设备的生产阶段对缺陷进行识别是至关重要的。本文提出了一种基于传统视觉计算和新型深度学习方法的电子器件制造过程缺陷检测系统。所提出的系统的原型被开发和制造,直接用于电子设备的生产线。使用特定的智能手机模型进行测试,该模型有22个关键部件需要检查,结果表明,当该系统直接用于运营生产线时,缺陷检测的平均准确率超过90%。该领域的其他研究在受控的实验室环境中进行测量,并确定较少的关键成分。因此,所提出的方法是一个实时的高性能系统。此外,所提出的系统符合工业4.0的目标,即过程系统数字化是提高指标和优化生产的关键。
{"title":"System for PCB Defect Detection Using Visual Computing and Deep Learning for Production Optimization","authors":"Gabriel Gomes de Oliveira,&nbsp;Gabriel Caumo Vaz,&nbsp;Marcos Antonio Andrade,&nbsp;Yuzo Iano,&nbsp;Leandro Ronchini Ximenes,&nbsp;Rangel Arthur","doi":"10.1049/2023/6681526","DOIUrl":"10.1049/2023/6681526","url":null,"abstract":"<div>\u0000 <p>With the growing competition between the various manufacturers of electronic products, the quality of the products developed and the consequent confidence in the brand are fundamental factors for the survival of companies. To guarantee the quality of the products in the manufacturing process, it is crucial to identify defects during the production stage of an electronic device. This study presents a system based on traditional visual computing and new deep learning methods to detect defects in electronic devices during the manufacturing process. A prototype of the proposed system was developed and manufactured for direct use in the production line of electronic devices. Tests were performed using a particular smartphone model that had 22 critical components to inspect and the results showed that the proposed system achieved an average accuracy of more than 90% in defect detection when it was directly used in the operational production line. Other studies in this field perform measurements in controlled laboratory environments and identify fewer critical components. Therefore, the proposed method is a real-time high-performance system. Furthermore, the proposed system conforms with the Industry 4.0 goal that process system digitization is essential to improve indicators and optimize production.</p>\u0000 </div>","PeriodicalId":50386,"journal":{"name":"Iet Circuits Devices & Systems","volume":"2023 1","pages":""},"PeriodicalIF":1.0,"publicationDate":"2023-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.1049/2023/6681526","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135818373","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A 7-nm-Based 5R4W High-Timing Reliability Regfile Circuit 一种基于7nm的5R4W高时序可靠性调档电路
IF 1 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2023-10-31 DOI: 10.1049/2023/1548352
Wanlong Zhao, Yuejun Zhang, Liang Wen, Pengjun Wang

Register file (Regfile), as the bottleneck circuit for processor data interaction, directly determines the computing performance of the system. To address the read/write conflict and timing error problems of register heap, this paper proposes a 5R4W high-timing reliability Regfile circuit design scheme. First, the scheme analyzed the principles of timing errors such as read/write conflicts, write errors, and read errors in the Regfile circuit; then adopted the timing separation method of independent control of the read/write process by clock double edges to solve multiport read/write conflicts, designed a mirror memory check circuit to avoid write errors caused by the word line delays, and used a phase-locked clock feedback structure to eliminate read errors caused by the data timing fluctuations; in the TSMC 7 nm FinFET process, a 64 × 74-bit 5R4W Regfile circuit was implemented using a fully customized layout. Experimental results show that the Regfile circuit has an area of 0.13 mm2 and consumes 5.541 mW. The circuit operates at a maximum frequency of 3.8 GHz at −40 to −125°C and 0.75 V, and is capable of detecting write errors caused by a clock jitter exceeding 30 ps or a frequency above 5 GHz.

寄存器文件(Regfile)作为处理器数据交互的瓶颈电路,直接决定了系统的计算性能。为了解决寄存器堆的读写冲突和时序错误问题,本文提出了一种5R4W高时序可靠性的Regfile电路设计方案。首先,该方案分析了Regfile电路中读写冲突、写错误和读错误等时序错误的原理;然后采用时钟双边独立控制读写过程的时序分离方法解决多端口读写冲突,设计镜像存储器校验电路避免字行延时导致的写入错误,采用锁相时钟反馈结构消除数据时序波动导致的读取错误;在台积电7nm FinFET工艺中,采用完全定制的布局实现了64 × 74位5R4W Regfile电路。实验结果表明,Regfile电路的面积为0.13 mm2,功耗为5.541 mW。该电路在−40 ~−125℃、0.75 V工作时的最大工作频率为3.8 GHz,能够检测时钟抖动超过30ps或频率高于5ghz所导致的写错误。
{"title":"A 7-nm-Based 5R4W High-Timing Reliability Regfile Circuit","authors":"Wanlong Zhao,&nbsp;Yuejun Zhang,&nbsp;Liang Wen,&nbsp;Pengjun Wang","doi":"10.1049/2023/1548352","DOIUrl":"10.1049/2023/1548352","url":null,"abstract":"<div>\u0000 <p>Register file (Regfile), as the bottleneck circuit for processor data interaction, directly determines the computing performance of the system. To address the read/write conflict and timing error problems of register heap, this paper proposes a 5R4W high-timing reliability Regfile circuit design scheme. First, the scheme analyzed the principles of timing errors such as read/write conflicts, write errors, and read errors in the Regfile circuit; then adopted the timing separation method of independent control of the read/write process by clock double edges to solve multiport read/write conflicts, designed a mirror memory check circuit to avoid write errors caused by the word line delays, and used a phase-locked clock feedback structure to eliminate read errors caused by the data timing fluctuations; in the TSMC 7 nm FinFET process, a 64 × 74-bit 5R4W Regfile circuit was implemented using a fully customized layout. Experimental results show that the Regfile circuit has an area of 0.13 mm<sup>2</sup> and consumes 5.541 mW. The circuit operates at a maximum frequency of 3.8 GHz at −40 to −125°C and 0.75 V, and is capable of detecting write errors caused by a clock jitter exceeding 30 ps or a frequency above 5 GHz.</p>\u0000 </div>","PeriodicalId":50386,"journal":{"name":"Iet Circuits Devices & Systems","volume":"2023 1","pages":""},"PeriodicalIF":1.0,"publicationDate":"2023-10-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.1049/2023/1548352","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135869961","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The Design and Process Reliability Analysis of Millimeter Wave CMOS Power Amplifier with a Cold Mode MOSFET Linearization 冷模MOSFET线性化毫米波CMOS功率放大器设计及工艺可靠性分析
IF 1 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2023-10-31 DOI: 10.1049/2023/2265697
N. A. Quadir, Amit Jain, S. Kashfi, Lutfi Albasha, Nasser Qaddoumi

A power amplifier design operating at 28 GHz for communication applications is presented in this paper. Analog predistorted technique is used to improve the linearity using a cold mode MOSFET linearizer. The paper reports +19.8 dBm of peak power at the output and power-added efficiency (PAE) of 17% is attained by the designed circuit. The 1-dB compression point linearity was +18.6 dBm. The adjacent channel power ratio (ACPR) simulations were performed for the different communication standards like 802_11n_40M, CDMA, IS-95, and 802_11n_20M. Design specification variations of the amplifier have been analyzed over five process corners and simulations were performed to validate compliance with standards and robustness of the designed circuit. Monte Carlo simulation were performed to assess the performance over statistical variability of PAE and power gain. It is believed that this linearization design and the verifications used are done for the first time on a 65-nm RFCMOS process.

本文介绍了一种用于通信应用的28ghz功率放大器的设计。采用模拟预失真技术,利用冷模MOSFET线性化器改善线性度。该电路的输出峰值功率为+19.8 dBm,功率附加效率(PAE)为17%。1db压缩点线性度为+18.6 dBm。对802_11n_40M、CDMA、IS-95和802_11n_20M等不同通信标准进行了相邻信道功率比(ACPR)仿真。分析了放大器在五个工艺角上的设计规范变化,并进行了仿真,以验证所设计电路的符合标准和鲁棒性。通过蒙特卡罗模拟来评估PAE和功率增益的统计变异性的性能。据信,这种线性化设计和所使用的验证是首次在65纳米RFCMOS工艺上完成的。
{"title":"The Design and Process Reliability Analysis of Millimeter Wave CMOS Power Amplifier with a Cold Mode MOSFET Linearization","authors":"N. A. Quadir,&nbsp;Amit Jain,&nbsp;S. Kashfi,&nbsp;Lutfi Albasha,&nbsp;Nasser Qaddoumi","doi":"10.1049/2023/2265697","DOIUrl":"10.1049/2023/2265697","url":null,"abstract":"<div>\u0000 <p>A power amplifier design operating at 28 GHz for communication applications is presented in this paper. Analog predistorted technique is used to improve the linearity using a cold mode MOSFET linearizer. The paper reports +19.8 dBm of peak power at the output and power-added efficiency (PAE) of 17% is attained by the designed circuit. The 1-dB compression point linearity was +18.6 dBm. The adjacent channel power ratio (ACPR) simulations were performed for the different communication standards like 802_11n_40M, CDMA, IS-95, and 802_11n_20M. Design specification variations of the amplifier have been analyzed over five process corners and simulations were performed to validate compliance with standards and robustness of the designed circuit. Monte Carlo simulation were performed to assess the performance over statistical variability of PAE and power gain. It is believed that this linearization design and the verifications used are done for the first time on a 65-nm RFCMOS process.</p>\u0000 </div>","PeriodicalId":50386,"journal":{"name":"Iet Circuits Devices & Systems","volume":"2023 1","pages":""},"PeriodicalIF":1.0,"publicationDate":"2023-10-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.1049/2023/2265697","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135872046","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Process Optimization Method of the Mini-LOCOS Field Plate Profile for Improving Electrical Characteristics of LDMOS Device 一种改善LDMOS器件电学特性的Mini-LOCOS场板廓形工艺优化方法
IF 1 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2023-10-31 DOI: 10.1049/2023/5298361
Shaoxin Yu, Weiheng Shao, Pei-Xiong Gao, Xiang Li, Rongsheng Chen, Bin Zhao

In this work, the effects of the mini-local oxidation of silicon (LOCOS) field plate’s bottom physical profile on the devices’ breakdown performance are analyzed through technology computer-aided design simulations. It is indicated that the “abrupt” bottom profile could certainly do with an optimization. This paper introduces an effective process improvement method by etching bias power adjustment and time reduction. The upgradation of the field plate physical profile has been proved by transmission electron microscope cross-section analysis. The angle for the bottom surface of mini-LOCOS field plate θ2 is improved from 11.9° to 12.6°, and the thickness ratio of Hup/Hbottom (field plate oxide thickness for the upper and bottom, respectively) is increased from 71.8% to 76.6%. Finally, the optimized laterally diffused metal oxide semiconductor devices have been fabricated, and both figure of merit curves and safe operation area curves are measured. The specific on-resistance Ron,sp could achieve as low as 11.3 mΩ mm2, while breakdown voltage BVds,max arrives at 37.4 V, which is nearly 19.3% improved.

本文通过计算机辅助设计模拟技术,分析了硅微局部氧化(LOCOS)场极板底部物理剖面对器件击穿性能的影响。指出“突兀”的底部轮廓肯定可以进行优化。本文介绍了一种有效的工艺改进方法,即蚀刻偏压功率调整和时间缩短。通过透射电镜的截面分析,证明了场板物理剖面的改进。mini-LOCOS场板θ2底表面角度由11.9°提高到12.6°,上、底场板氧化层厚度Hup/Hbottom比由71.8%提高到76.6%。最后,制作了优化后的横向扩散金属氧化物半导体器件,并测量了性能曲线和安全操作面积曲线。比导通电阻Ron,sp可低至11.3 mΩ mm2,击穿电压BVds,max可达37.4 V,提高近19.3%。
{"title":"A Process Optimization Method of the Mini-LOCOS Field Plate Profile for Improving Electrical Characteristics of LDMOS Device","authors":"Shaoxin Yu,&nbsp;Weiheng Shao,&nbsp;Pei-Xiong Gao,&nbsp;Xiang Li,&nbsp;Rongsheng Chen,&nbsp;Bin Zhao","doi":"10.1049/2023/5298361","DOIUrl":"10.1049/2023/5298361","url":null,"abstract":"<div>\u0000 <p>In this work, the effects of the mini-local oxidation of silicon (LOCOS) field plate’s bottom physical profile on the devices’ breakdown performance are analyzed through technology computer-aided design simulations. It is indicated that the “abrupt” bottom profile could certainly do with an optimization. This paper introduces an effective process improvement method by etching bias power adjustment and time reduction. The upgradation of the field plate physical profile has been proved by transmission electron microscope cross-section analysis. The angle for the bottom surface of mini-LOCOS field plate <i>θ</i><sub>2</sub> is improved from 11.9° to 12.6°, and the thickness ratio of <i>H</i><sub>up</sub>/<i>H</i><sub>bottom</sub> (field plate oxide thickness for the upper and bottom, respectively) is increased from 71.8% to 76.6%. Finally, the optimized laterally diffused metal oxide semiconductor devices have been fabricated, and both figure of merit curves and safe operation area curves are measured. The specific on-resistance <i>R</i><sub>on,sp</sub> could achieve as low as 11.3 m<i>Ω</i> mm<sup>2</sup>, while breakdown voltage <i>BV</i><sub>ds,max</sub> arrives at 37.4 V, which is nearly 19.3% improved.</p>\u0000 </div>","PeriodicalId":50386,"journal":{"name":"Iet Circuits Devices & Systems","volume":"2023 1","pages":""},"PeriodicalIF":1.0,"publicationDate":"2023-10-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.1049/2023/5298361","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135872636","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
期刊
Iet Circuits Devices & Systems
全部 Acc. Chem. Res. ACS Applied Bio Materials ACS Appl. Electron. Mater. ACS Appl. Energy Mater. ACS Appl. Mater. Interfaces ACS Appl. Nano Mater. ACS Appl. Polym. Mater. ACS BIOMATER-SCI ENG ACS Catal. ACS Cent. Sci. ACS Chem. Biol. ACS Chemical Health & Safety ACS Chem. Neurosci. ACS Comb. Sci. ACS Earth Space Chem. ACS Energy Lett. ACS Infect. Dis. ACS Macro Lett. ACS Mater. Lett. ACS Med. Chem. Lett. ACS Nano ACS Omega ACS Photonics ACS Sens. ACS Sustainable Chem. Eng. ACS Synth. Biol. Anal. Chem. BIOCHEMISTRY-US Bioconjugate Chem. BIOMACROMOLECULES Chem. Res. Toxicol. Chem. Rev. Chem. Mater. CRYST GROWTH DES ENERG FUEL Environ. Sci. Technol. Environ. Sci. Technol. Lett. Eur. J. Inorg. Chem. IND ENG CHEM RES Inorg. Chem. J. Agric. Food. Chem. J. Chem. Eng. Data J. Chem. Educ. J. Chem. Inf. Model. J. Chem. Theory Comput. J. Med. Chem. J. Nat. Prod. J PROTEOME RES J. Am. Chem. Soc. LANGMUIR MACROMOLECULES Mol. Pharmaceutics Nano Lett. Org. Lett. ORG PROCESS RES DEV ORGANOMETALLICS J. Org. Chem. J. Phys. Chem. J. Phys. Chem. A J. Phys. Chem. B J. Phys. Chem. C J. Phys. Chem. Lett. Analyst Anal. Methods Biomater. Sci. Catal. Sci. Technol. Chem. Commun. Chem. Soc. Rev. CHEM EDUC RES PRACT CRYSTENGCOMM Dalton Trans. Energy Environ. Sci. ENVIRON SCI-NANO ENVIRON SCI-PROC IMP ENVIRON SCI-WAT RES Faraday Discuss. Food Funct. Green Chem. Inorg. Chem. Front. Integr. Biol. J. Anal. At. Spectrom. J. Mater. Chem. A J. Mater. Chem. B J. Mater. Chem. C Lab Chip Mater. Chem. Front. Mater. Horiz. MEDCHEMCOMM Metallomics Mol. Biosyst. Mol. Syst. Des. Eng. Nanoscale Nanoscale Horiz. Nat. Prod. Rep. New J. Chem. Org. Biomol. Chem. Org. Chem. Front. PHOTOCH PHOTOBIO SCI PCCP Polym. Chem.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1