Fault diagnosis in analog and digital Very Large Scale Integration (VLSI) circuits is essential for ensuring reliable operation and performance. These circuits are increasingly complex due to miniaturization and high integration levels. Advanced circuits are susceptible to various faults including transient, permanent and intermittent types. Detecting and accurately diagnosing these faults remains major challenge due to signal complexity and noise. Therefore, this research proposes a novel model of Advanced Fault Diagnosis in Analog and Digital VLSI Circuits utilizing Optimized Multi-Anchor Space-Aware Temporal Convolutional Neural Network for Efficient Circuit Reliability Assessment (FDAD-VLSI- MSTCNN). The objective is to accurately detect and locate faults in analog and digital VLSI circuits to ensure reliable circuit performance. It aims to enhance circuit functionality by enabling optimal recovery of faulty designs. The proposed process begins with collecting input signals with frequency responses. The collected input signal is given to pre-processing using Robust Maximum Correntropy Kalman Filter (RMCKF) to remove noise. The Multidimensional Empirical Mode Decomposition (MEMD) is applied to decompose complex, non-stationary, nonlinear signals into simpler intrinsic mode functions (IMFs). These components undergo feature extraction using the Lifted Euler Characteristic Transform (LECT) extract mean, Standard Deviation (SD), kurtosis, skewness, Relative Entropy (RE), and minimum and maximum values features. Then, the extracted feature is given to Multi-Anchor Space-Aware Temporal Convolutional Neural Network (MSTCNN)to identify the fault locations for diagnosing fault in analog and digital VLSI circuits. The Divine Religions Algorithm (DRA) to recover the faulty circuit and restore normal circuit operation. Then the proposed FDAD-VLSI-MSTCNN is examined using performance metrics like Accuracy, Precision, Recall, F1-Score, Specificity, Receiver Operating Characteristic Curve (ROC), Computational Time and Execution Time. The proposed FDAD-VLSI-MSTCNN method provides 99.42 % higher accuracy, 98.34 % higher precision and 98.88 % higher recall while compared with existing methods like Soft fault detection in analog circuits using voltage feature extraction and supervised learning (SFDAC-VFE-SL), an investigation of extreme learning machine-based fault diagnosis to identify faulty components in analog circuits (FD-IFCAC-ELM) and detecting and classifying parametric faults in analog circuits using optimized attention neural networks (DCPF-AC-ANN) respectively.
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