Pub Date : 2019-12-09DOI: 10.33180/infmidem2019.306
Matej Šadl, Urban Tomc, Uroš Prah, H. Uršič
: In this work the preparation of a protective insulating alumina coating on magnetocaloric gadolinium elements was investigated. In order to prepare a dense ceramic coating at room temperature the aerosol deposition technique was used. The study reveals that the powder morphology and particle size are important parameters that influence the deposition efficiency, powder packing and consequently also the density and functional properties of the alumina coating. The optimal powder pre-deposition treatment includes heating the powder to 1150 °C, followed by milling. The deposition of this powder resulted in the preparation of dense alumina coatings with a low specific electrical conductivity of 6.4∙10 −14 Ω −1 m −1 .
{"title":"Protective Alumina Coatings Prepared by Aerosol Deposition on Magnetocaloric Gadolinium Elements","authors":"Matej Šadl, Urban Tomc, Uroš Prah, H. Uršič","doi":"10.33180/infmidem2019.306","DOIUrl":"https://doi.org/10.33180/infmidem2019.306","url":null,"abstract":": In this work the preparation of a protective insulating alumina coating on magnetocaloric gadolinium elements was investigated. In order to prepare a dense ceramic coating at room temperature the aerosol deposition technique was used. The study reveals that the powder morphology and particle size are important parameters that influence the deposition efficiency, powder packing and consequently also the density and functional properties of the alumina coating. The optimal powder pre-deposition treatment includes heating the powder to 1150 °C, followed by milling. The deposition of this powder resulted in the preparation of dense alumina coatings with a low specific electrical conductivity of 6.4∙10 −14 Ω −1 m −1 .","PeriodicalId":56293,"journal":{"name":"Informacije Midem-Journal of Microelectronics Electronic Components and Materials","volume":"18 1","pages":""},"PeriodicalIF":1.2,"publicationDate":"2019-12-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84730571","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-12-09DOI: 10.33180/infmidem2019.304
V. Vukic
The aim of this paper was to determine the reasons for a complex radiation response of the commercial-off-the-shelf LM2940CT5 low-dropout voltage regulator. Examination of this circuit in a gamma-radiation environment disqualified its use when operated with relatively high output currents, while its radiation tolerance was satisfactory when load current was approximately one-tenth (or lower) of the nominal value. In order to obtain a more thorough insight into the radiation response of this integrated circuit, a detailed SPICE model was developed. This model enabled mutual comparison of the influence of serial and driver PNP power transistor parameters: forward emitter current gain, knee current and emitter resistance. The serial lateral PNP power transistor with round emitters was identified as the weakest element that crucially affected the entire circuit radiation tolerance. The effects of gamma-radiation were examined for total doses up to 500 Gy followed by three sequences of isothermal annealing. Detailed characteristics of Beta(Ic) were procured for four different kinds of bias and load conditions during irradiation. The emitter resistance increase of the serial power transistor was a primary reason for the low radiation tolerance of the entire voltage regulator; it was much more influential than the perceived decline of the PNP power transistor forward emitter current gain. The influence of bias and load conditions were analysed with buildup of interface traps and the oxide-trapped charge, which affected the radiation and post-irradiation response of the serial power transistor.
{"title":"An LTspice Simulation Model of Gamma-radiation Effects and Annealing in a Voltage Regulator With a Lateral Serial PNP Transistor With Round Emitters","authors":"V. Vukic","doi":"10.33180/infmidem2019.304","DOIUrl":"https://doi.org/10.33180/infmidem2019.304","url":null,"abstract":"The aim of this paper was to determine the reasons for a complex radiation response of the commercial-off-the-shelf LM2940CT5 low-dropout voltage regulator. Examination of this circuit in a gamma-radiation environment disqualified its use when operated with relatively high output currents, while its radiation tolerance was satisfactory when load current was approximately one-tenth (or lower) of the nominal value. In order to obtain a more thorough insight into the radiation response of this integrated circuit, a detailed SPICE model was developed. This model enabled mutual comparison of the influence of serial and driver PNP power transistor parameters: forward emitter current gain, knee current and emitter resistance. The serial lateral PNP power transistor with round emitters was identified as the weakest element that crucially affected the entire circuit radiation tolerance. The effects of gamma-radiation were examined for total doses up to 500 Gy followed by three sequences of isothermal annealing. Detailed characteristics of Beta(Ic) were procured for four different kinds of bias and load conditions during irradiation. The emitter resistance increase of the serial power transistor was a primary reason for the low radiation tolerance of the entire voltage regulator; it was much more influential than the perceived decline of the PNP power transistor forward emitter current gain. The influence of bias and load conditions were analysed with buildup of interface traps and the oxide-trapped charge, which affected the radiation and post-irradiation response of the serial power transistor.","PeriodicalId":56293,"journal":{"name":"Informacije Midem-Journal of Microelectronics Electronic Components and Materials","volume":"7 1","pages":"153-166"},"PeriodicalIF":1.2,"publicationDate":"2019-12-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79701248","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-12-09DOI: 10.33180/10.33180/infmidem2019.303
M. Kumngern
A new electronically tunable current-mode multifunction universal filter with three inputs and one output based on current-controlled current follower transconductance amplifier is presented. The proposed filter can realize low-pass, band-pass, high-pass, band-stop and all-pass filtering functions into single topology. For realize these filtering functions, no passive component-matching conditions, no inverting-type input signal requirements and high-output impedance are possessed. Also the proposed filter offers electronic control of the natural angular frequency, low active and passive sensitivities and use of grounded capacitors which is ideal for integrated circuit implementation. The proposed universal biquadratic filter has been used to realize sixth-order filters. PSPICE simulation results are used to confirm the presented theory.
{"title":"Electronically tunable current-mode multifunction filter using current-controlled current follower transconductance amplifier","authors":"M. Kumngern","doi":"10.33180/10.33180/infmidem2019.303","DOIUrl":"https://doi.org/10.33180/10.33180/infmidem2019.303","url":null,"abstract":"A new electronically tunable current-mode multifunction universal filter with three inputs and one output based on current-controlled current follower transconductance amplifier is presented. The proposed filter can realize low-pass, band-pass, high-pass, band-stop and all-pass filtering functions into single topology. For realize these filtering functions, no passive component-matching conditions, no inverting-type input signal requirements and high-output impedance are possessed. Also the proposed filter offers electronic control of the natural angular frequency, low active and passive sensitivities and use of grounded capacitors which is ideal for integrated circuit implementation. The proposed universal biquadratic filter has been used to realize sixth-order filters. PSPICE simulation results are used to confirm the presented theory.","PeriodicalId":56293,"journal":{"name":"Informacije Midem-Journal of Microelectronics Electronic Components and Materials","volume":"71 1","pages":""},"PeriodicalIF":1.2,"publicationDate":"2019-12-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84871146","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-12-09DOI: 10.33180/infmidem2019.305
Musa Ali Albrni, Mohammad Faseehuddin, J. Sampe, S. Ali
In this research a new highly versatile analog building block (ABB), the voltage differencing dual X current conveyor (VD-DXCC), is proposed. It is employed to synthesize a versatile dual mode biquadratic filter. The proposed filter uses canonical number of passive elements and has inbuilt tunability feature. In addition, the proposed filter can work as multi input single output (MISO) and single input multi output (SIMO) filter in current mode (CM) of operation. Furthermore, the quality factor and pole frequency of the filter can be set independently. The non-ideal gain analysis and sensitivity analysis of the filters is also carried out to study the effect of process variations and process spread on the filter response. The proposed designs are validated using 0.18um Silterra Malaysia process design kit (PDK) in Cadence Virtuoso design software. The parasitic extraction is carried out using Calibre tool from Mentor Graphics. The complete layout of the VD-DXCC is made and post layout simulation results are given for each design. The post layout results are in close agreement with the theoretical analysis.
{"title":"Novel Dual Mode Multifunction Filter Employing Highly Versatile VD-DXCC","authors":"Musa Ali Albrni, Mohammad Faseehuddin, J. Sampe, S. Ali","doi":"10.33180/infmidem2019.305","DOIUrl":"https://doi.org/10.33180/infmidem2019.305","url":null,"abstract":"In this research a new highly versatile analog building block (ABB), the voltage differencing dual X current conveyor (VD-DXCC), is proposed. It is employed to synthesize a versatile dual mode biquadratic filter. The proposed filter uses canonical number of passive elements and has inbuilt tunability feature. In addition, the proposed filter can work as multi input single output (MISO) and single input multi output (SIMO) filter in current mode (CM) of operation. Furthermore, the quality factor and pole frequency of the filter can be set independently. The non-ideal gain analysis and sensitivity analysis of the filters is also carried out to study the effect of process variations and process spread on the filter response. The proposed designs are validated using 0.18um Silterra Malaysia process design kit (PDK) in Cadence Virtuoso design software. The parasitic extraction is carried out using Calibre tool from Mentor Graphics. The complete layout of the VD-DXCC is made and post layout simulation results are given for each design. The post layout results are in close agreement with the theoretical analysis.","PeriodicalId":56293,"journal":{"name":"Informacije Midem-Journal of Microelectronics Electronic Components and Materials","volume":"30 5 1","pages":"167-176"},"PeriodicalIF":1.2,"publicationDate":"2019-12-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90209281","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-12-09DOI: 10.33180/infmidem2019.301
B. Poornima, A. Sumathi, Cyril Prasanna Raj Premkumar
This paper presents customized Systolic Array Architecture (SAA) design of Dual Tree Complex Wavelet (DTCWT) sub band computation based on multiplexed Distributive Arithmetic Algorithm (DAA). The proposed architecture is memory efficient and operates at frequencies greater than 300 MHz in decomposing 256 x 256 input images. Three architectures such as reduced order structure, multiplexed DA structure and zero pad structure are designed and evaluated for its performances for DTCWT computation minimizing arithmetic operations with improved latency. The proposed design is modeled in Verilog HDL and is implemented on Spartan-6 and Virtex-5 FPGA considering Xilinx ISE FPGA design flow. The latency of proposed architectures is evaluated to be 15 clock cycles and throughput is estimated to be 4 outputs for every 5 clock cycles. The SAA architecture occupies less than 12% of FPGA resources and consumes less than 10 mW of power on FPGA platform.
提出了基于多路分配算法(DAA)的对偶树复小波子带计算的自定义收缩阵列架构(SAA)设计。所提出的架构具有内存效率,并且在分解256 x 256输入图像时工作频率大于300 MHz。设计了三种结构,即降阶结构、多路数据处理结构和零pad结构,并对其在DTCWT计算中的性能进行了评估。该设计采用Verilog HDL进行建模,并考虑Xilinx ISE FPGA设计流程,在Spartan-6和Virtex-5 FPGA上实现。所建议架构的延迟被评估为15个时钟周期,吞吐量估计为每5个时钟周期有4个输出。SAA架构在FPGA平台上占用的FPGA资源不超过12%,功耗不超过10mw。
{"title":"Memory Efficient High Speed Systolic Array Architecture Design with Multiplexed Distributed Arithmetic for 2D DTCWT Computation on FPGA","authors":"B. Poornima, A. Sumathi, Cyril Prasanna Raj Premkumar","doi":"10.33180/infmidem2019.301","DOIUrl":"https://doi.org/10.33180/infmidem2019.301","url":null,"abstract":"This paper presents customized Systolic Array Architecture (SAA) design of Dual Tree Complex Wavelet (DTCWT) sub band computation based on multiplexed Distributive Arithmetic Algorithm (DAA). The proposed architecture is memory efficient and operates at frequencies greater than 300 MHz in decomposing 256 x 256 input images. Three architectures such as reduced order structure, multiplexed DA structure and zero pad structure are designed and evaluated for its performances for DTCWT computation minimizing arithmetic operations with improved latency. The proposed design is modeled in Verilog HDL and is implemented on Spartan-6 and Virtex-5 FPGA considering Xilinx ISE FPGA design flow. The latency of proposed architectures is evaluated to be 15 clock cycles and throughput is estimated to be 4 outputs for every 5 clock cycles. The SAA architecture occupies less than 12% of FPGA resources and consumes less than 10 mW of power on FPGA platform.","PeriodicalId":56293,"journal":{"name":"Informacije Midem-Journal of Microelectronics Electronic Components and Materials","volume":"11 1","pages":""},"PeriodicalIF":1.2,"publicationDate":"2019-12-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84317902","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-09-23DOI: 10.33180/infmidem2019.203
Xiaoguang Huang
Thermal fatigue failure of a microelectronic chip usually initiates from the interface between solder joint and substrate for the mismatch in coefficient of thermal expansion (CTE). Because of the viscoelastic creep properties of the solder, the interfacial stress-strain are, strongly, temperature and time dependent. Based on the established constitutive models of solder materials, the three-dimensional FEM analysis of the microelectronic chip undergoing power on-off thermal cycles is carried out. The time dependent stress-strain singular fields at the solder/substance interface are obtained, and the singular field parameters are quantitatively evaluated. Furthermore, the crack nucleation behavior of thermal fatigue failure are tested to verify the conclusion that singular stress-strain promote thermal fatigue failure from the solder/substance interface.
{"title":"Simulation on the Interfacial Singular Stress-strain Induced Cracking of Microelectronic Chip Under pPower On-off Cycles","authors":"Xiaoguang Huang","doi":"10.33180/infmidem2019.203","DOIUrl":"https://doi.org/10.33180/infmidem2019.203","url":null,"abstract":"Thermal fatigue failure of a microelectronic chip usually initiates from the interface between solder joint and substrate for the mismatch in coefficient of thermal expansion (CTE). Because of the viscoelastic creep properties of the solder, the interfacial stress-strain are, strongly, temperature and time dependent. Based on the established constitutive models of solder materials, the three-dimensional FEM analysis of the microelectronic chip undergoing power on-off thermal cycles is carried out. The time dependent stress-strain singular fields at the solder/substance interface are obtained, and the singular field parameters are quantitatively evaluated. Furthermore, the crack nucleation behavior of thermal fatigue failure are tested to verify the conclusion that singular stress-strain promote thermal fatigue failure from the solder/substance interface.","PeriodicalId":56293,"journal":{"name":"Informacije Midem-Journal of Microelectronics Electronic Components and Materials","volume":"11 1","pages":""},"PeriodicalIF":1.2,"publicationDate":"2019-09-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84292284","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-09-23DOI: 10.33180/infmidem2019.206
M. Mozek, B. Pecar
: High efficiency piezoelectric micropump driving module with programmable slew-rate and dead-time has been designed, implemented and characterized for driving custom made piezoelectric micropumps. Developed driver enables independent setting of several rectangular output signal parameters, such as frequency, positive and negative amplitudes, slew-rates, dead time, and modes of operation (pump/valve). Implemented driver can achieve amplitudes up to 250 VPP on a frequency range from DC to 1 kHz, slew-rate up to 18 V/µs at maximum power consumption 1.6 W (180 mA @ 9 V). In comparison with our previous driver with RC charge/discharge signal shape, presented version increases air flow capability of micropumps from 1.6 sccm to 4.2 sccm. It enables driving of 200 µm thick PZT actuators with 12 nF capacitance.
设计、实现并表征了用于驱动定制型压电微泵的具有可编程回转速率和死区时间的高效压电微泵驱动模块。开发的驱动器可以独立设置几个矩形输出信号参数,如频率,正负幅值,回转速率,死区时间和操作模式(泵/阀)。实现的驱动器可以在从DC到1 kHz的频率范围内实现高达250 VPP的幅值,在最大功耗1.6 W (180 mA @ 9 V)下,回转速率高达18 V/µs。与我们之前的RC充放电信号形状驱动器相比,本版本将微泵的空气流动能力从1.6 sccm增加到4.2 sccm。它可以驱动200 μ m厚的PZT致动器,电容为12 nF。
{"title":"Piezoelectric Micropump Driving Module with Programmable Slew-Rate and Dead-Time","authors":"M. Mozek, B. Pecar","doi":"10.33180/infmidem2019.206","DOIUrl":"https://doi.org/10.33180/infmidem2019.206","url":null,"abstract":": High efficiency piezoelectric micropump driving module with programmable slew-rate and dead-time has been designed, implemented and characterized for driving custom made piezoelectric micropumps. Developed driver enables independent setting of several rectangular output signal parameters, such as frequency, positive and negative amplitudes, slew-rates, dead time, and modes of operation (pump/valve). Implemented driver can achieve amplitudes up to 250 VPP on a frequency range from DC to 1 kHz, slew-rate up to 18 V/µs at maximum power consumption 1.6 W (180 mA @ 9 V). In comparison with our previous driver with RC charge/discharge signal shape, presented version increases air flow capability of micropumps from 1.6 sccm to 4.2 sccm. It enables driving of 200 µm thick PZT actuators with 12 nF capacitance.","PeriodicalId":56293,"journal":{"name":"Informacije Midem-Journal of Microelectronics Electronic Components and Materials","volume":"87 3 1","pages":""},"PeriodicalIF":1.2,"publicationDate":"2019-09-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77966793","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-09-23DOI: 10.33180/infmidem2019.205
Daosheng Cheng, Penghe Zhang, Fan Zhang, Jiayu Huang
The failure rate assessment of online metering equipment is significan t for power metering. For traditional methods, the performance of the model is not satisfactory especially in the case of small samples. In this paper, a n online power measuring equipment fault evaluation method based on Weibull parameter hierarchical Bayesian model is proposed. Firstly, the z-score method is used to eliminate outliers in the raw failure data. Then, a generalized linear function with variable intercept is established according to the characteristics of failure data. The information of each region is merged using the characteristics of multi-layer Bayesian network uncertainty reasoning. The model parameters are updated based on the Markov chain Monte Carlo method. Thereafter, the trend of failure rate is provided with time-dependent. Finally, the proposed method is verified by the failure samples of the online measurement equipment in three typical environmental areas. The accuracy and validity of the hierarchical Bayesian model is verified by a series of experiments
{"title":"\"Fault Prediction of Online Power Metering\u0000Equipment Based on Hierarchical Bayesian Network\"","authors":"Daosheng Cheng, Penghe Zhang, Fan Zhang, Jiayu Huang","doi":"10.33180/infmidem2019.205","DOIUrl":"https://doi.org/10.33180/infmidem2019.205","url":null,"abstract":"The failure rate assessment of online metering equipment is significan t for power metering. For traditional methods, the performance of the model is not satisfactory especially in the case of small samples. In this paper, a n online power measuring equipment fault evaluation method based on Weibull parameter hierarchical Bayesian model is proposed. Firstly, the z-score method is used to eliminate outliers in the raw failure data. Then, a generalized linear function with variable intercept is established according to the characteristics of failure data. The information of each region is merged using the characteristics of multi-layer Bayesian network uncertainty reasoning. The model parameters are updated based on the Markov chain Monte Carlo method. Thereafter, the trend of failure rate is provided with time-dependent. Finally, the proposed method is verified by the failure samples of the online measurement equipment in three typical environmental areas. The accuracy and validity of the hierarchical Bayesian model is verified by a series of experiments","PeriodicalId":56293,"journal":{"name":"Informacije Midem-Journal of Microelectronics Electronic Components and Materials","volume":"16 1","pages":""},"PeriodicalIF":1.2,"publicationDate":"2019-09-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87002187","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}