Pub Date : 2020-09-16DOI: 10.1109/ET50336.2020.9238223
P. Yakimov, K. Asparuhova, T. Grigorova, D. Shehova
The paper surveys the main factors supporting the implementation of the paradigm Industry 4.0. Their basic characteristics which represent challenges in front of the STEM education are considered. Some tasks faced by the industrial automation engineers are taken into account. A possible correspondence between the required skills and the taught subjects is presented.
{"title":"Industry 4.0 and the Challenges Faced by STEM Education","authors":"P. Yakimov, K. Asparuhova, T. Grigorova, D. Shehova","doi":"10.1109/ET50336.2020.9238223","DOIUrl":"https://doi.org/10.1109/ET50336.2020.9238223","url":null,"abstract":"The paper surveys the main factors supporting the implementation of the paradigm Industry 4.0. Their basic characteristics which represent challenges in front of the STEM education are considered. Some tasks faced by the industrial automation engineers are taken into account. A possible correspondence between the required skills and the taught subjects is presented.","PeriodicalId":178356,"journal":{"name":"2020 XXIX International Scientific Conference Electronics (ET)","volume":"409 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130941799","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-09-16DOI: 10.1109/ET50336.2020.9238168
M. Marinov
Fixed monitoring stations are mostly used for air quality monitoring. Unfortunately, they are very expensive both in terms of initial investment and maintenance. Low-cost air quality sensors have emerged as an alternative for measuring basic air quality parameters. They are based on technologies that allow for real-time measurements. However, their use poses some challenges, such as accuracy and longterm stability. The accuracy of these low-cost sensors can be difficult to guarantee as they are often in harsh environments and are more susceptible to environmental impacts than high-end measurement devices. Periodic calibration of sensors has proven to be an effective approach for improving the accuracy of low-cost sensor data and maintaining its reliability when used in sensor networks for long-term monitoring. This article explores approaches to calibrate low-cost sensors used in wireless network applications to measure fine particulate matter concentrations. Some research challenges and directions for future research are presented.
{"title":"In-situ Calibration of Networked Air-Quality Sensor Nodes","authors":"M. Marinov","doi":"10.1109/ET50336.2020.9238168","DOIUrl":"https://doi.org/10.1109/ET50336.2020.9238168","url":null,"abstract":"Fixed monitoring stations are mostly used for air quality monitoring. Unfortunately, they are very expensive both in terms of initial investment and maintenance. Low-cost air quality sensors have emerged as an alternative for measuring basic air quality parameters. They are based on technologies that allow for real-time measurements. However, their use poses some challenges, such as accuracy and longterm stability. The accuracy of these low-cost sensors can be difficult to guarantee as they are often in harsh environments and are more susceptible to environmental impacts than high-end measurement devices. Periodic calibration of sensors has proven to be an effective approach for improving the accuracy of low-cost sensor data and maintaining its reliability when used in sensor networks for long-term monitoring. This article explores approaches to calibrate low-cost sensors used in wireless network applications to measure fine particulate matter concentrations. Some research challenges and directions for future research are presented.","PeriodicalId":178356,"journal":{"name":"2020 XXIX International Scientific Conference Electronics (ET)","volume":"389 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133166854","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-09-16DOI: 10.1109/ET50336.2020.9238336
D. Nikolov
The paper presents an investigation of a typical ESD protection device with a photon emission microscope. The photon emissions from a normal and failed p-n junction with tunnelling breakdown are compared. The failure is caused by the ESD event. The comparison provides root cause analysis of the ESD failure, recognition of the physical mechanism to enable further analysis of ESD failures in integrated circuits.
{"title":"A case study of emission microscopy for ESD protection devices","authors":"D. Nikolov","doi":"10.1109/ET50336.2020.9238336","DOIUrl":"https://doi.org/10.1109/ET50336.2020.9238336","url":null,"abstract":"The paper presents an investigation of a typical ESD protection device with a photon emission microscope. The photon emissions from a normal and failed p-n junction with tunnelling breakdown are compared. The failure is caused by the ESD event. The comparison provides root cause analysis of the ESD failure, recognition of the physical mechanism to enable further analysis of ESD failures in integrated circuits.","PeriodicalId":178356,"journal":{"name":"2020 XXIX International Scientific Conference Electronics (ET)","volume":"110 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127977993","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-09-16DOI: 10.1109/ET50336.2020.9238153
V. Stefanova-Stoyanova, I. Stankov
Multi-Agent Systems (MAS) are a separate scientific field. The agent-oriented approach is widely applied in systems for distributed solutions of complex tasks in the simulation modeling of production processes, the organization of work of robotic systems, and in other industrial areas and the management of swarms. With the rapid development of IoT, the need for application solutions such as the use of Multi-Agent Systems (MAS) and the DSM model - Distributed Shared Memory (DSM) is causing widespread interest in its use in the field of IoT.
{"title":"Multi-agent systems (MAS) in the area of IoT and using a model with Distributed Shared Memory system (DSM)","authors":"V. Stefanova-Stoyanova, I. Stankov","doi":"10.1109/ET50336.2020.9238153","DOIUrl":"https://doi.org/10.1109/ET50336.2020.9238153","url":null,"abstract":"Multi-Agent Systems (MAS) are a separate scientific field. The agent-oriented approach is widely applied in systems for distributed solutions of complex tasks in the simulation modeling of production processes, the organization of work of robotic systems, and in other industrial areas and the management of swarms. With the rapid development of IoT, the need for application solutions such as the use of Multi-Agent Systems (MAS) and the DSM model - Distributed Shared Memory (DSM) is causing widespread interest in its use in the field of IoT.","PeriodicalId":178356,"journal":{"name":"2020 XXIX International Scientific Conference Electronics (ET)","volume":"62 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128002179","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-09-16DOI: 10.1109/ET50336.2020.9238264
J. Garipova, Toncho Papanchev, A. Georgiev
This paper is focused on the non-parametric reliability analysis of medical items by means of applying graphical methods to determination and assessment the survival function distribution of measuring items in medicine containing electronic elements. The analysis is based on Kaplan-Meier product limit estimation and fitting the survival function distribution using the linear transformation procedure. As a result, both the probability distribution and the survival probability estimation values regarding operational reliability indices valid for medical items under test are experimentally obtained.
{"title":"Non-Parametrical Approach for Operational Reliability Assessing Related to Medical Electronic Items","authors":"J. Garipova, Toncho Papanchev, A. Georgiev","doi":"10.1109/ET50336.2020.9238264","DOIUrl":"https://doi.org/10.1109/ET50336.2020.9238264","url":null,"abstract":"This paper is focused on the non-parametric reliability analysis of medical items by means of applying graphical methods to determination and assessment the survival function distribution of measuring items in medicine containing electronic elements. The analysis is based on Kaplan-Meier product limit estimation and fitting the survival function distribution using the linear transformation procedure. As a result, both the probability distribution and the survival probability estimation values regarding operational reliability indices valid for medical items under test are experimentally obtained.","PeriodicalId":178356,"journal":{"name":"2020 XXIX International Scientific Conference Electronics (ET)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126217105","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-09-16DOI: 10.1109/ET50336.2020.9238283
P. Pavlova, B. Pachedjieva
The methodology described below supports the time mutability method for estimating cloud drift velocity. A technique for determination numerical values of the contrast and impulse noise level in images of cloud fields is presented. The contrast for the entire image and the level of the impulse noise for the entire image and in addition -in angular directions have been calculated in accordance with the method for drift velocity estimation. The evaluations have been realized by special developed software modules.
{"title":"Methodology for numerical assessments of the quality of cloud fields images used in time mutability method","authors":"P. Pavlova, B. Pachedjieva","doi":"10.1109/ET50336.2020.9238283","DOIUrl":"https://doi.org/10.1109/ET50336.2020.9238283","url":null,"abstract":"The methodology described below supports the time mutability method for estimating cloud drift velocity. A technique for determination numerical values of the contrast and impulse noise level in images of cloud fields is presented. The contrast for the entire image and the level of the impulse noise for the entire image and in addition -in angular directions have been calculated in accordance with the method for drift velocity estimation. The evaluations have been realized by special developed software modules.","PeriodicalId":178356,"journal":{"name":"2020 XXIX International Scientific Conference Electronics (ET)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124877429","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-09-16DOI: 10.1109/ET50336.2020.9238231
D. Vasilev
The article explores the possibility of the usage of the Finch robot in a Python programming training. The hardware and software of the mobile robotic platform Finch are considered and the possibilities for its application in programming training are studied. An example of how to control the Finch robot in the Python programming language is given.
{"title":"Python programming training with the robot Finch","authors":"D. Vasilev","doi":"10.1109/ET50336.2020.9238231","DOIUrl":"https://doi.org/10.1109/ET50336.2020.9238231","url":null,"abstract":"The article explores the possibility of the usage of the Finch robot in a Python programming training. The hardware and software of the mobile robotic platform Finch are considered and the possibilities for its application in programming training are studied. An example of how to control the Finch robot in the Python programming language is given.","PeriodicalId":178356,"journal":{"name":"2020 XXIX International Scientific Conference Electronics (ET)","volume":"71 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132445529","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-09-16DOI: 10.1109/ET50336.2020.9238205
Alexandre Francisco, N. Lopes, L. Bento, C. Ferreira
This paper presents the design and development of a low-cost Electronic Control Unit (ECU), aimed for the application and control of Electric Utility Vehicles (EUV). The selection of components and features, as well the design and project of all the necessary hardware, was also carried out. The major features that overcome other available solutions are: multiple Controller Area Network (CAN) buses, electrical isolation of inputs, outputs, two CAN buses and serial interface, outputs with current feedback and its reduced overall cost. Validation tests were conducted in order to verify all functionalities. Moreover, an electric vehicle simulator was developed to assess the performance of the ECU in a real world working environment. The fully functional prototype of the ECU proved to be robust and experimental results fulfill the proposed objectives.
{"title":"Arduino based Open Source Electronic Control Unit for Electric Utility Vehicles","authors":"Alexandre Francisco, N. Lopes, L. Bento, C. Ferreira","doi":"10.1109/ET50336.2020.9238205","DOIUrl":"https://doi.org/10.1109/ET50336.2020.9238205","url":null,"abstract":"This paper presents the design and development of a low-cost Electronic Control Unit (ECU), aimed for the application and control of Electric Utility Vehicles (EUV). The selection of components and features, as well the design and project of all the necessary hardware, was also carried out. The major features that overcome other available solutions are: multiple Controller Area Network (CAN) buses, electrical isolation of inputs, outputs, two CAN buses and serial interface, outputs with current feedback and its reduced overall cost. Validation tests were conducted in order to verify all functionalities. Moreover, an electric vehicle simulator was developed to assess the performance of the ECU in a real world working environment. The fully functional prototype of the ECU proved to be robust and experimental results fulfill the proposed objectives.","PeriodicalId":178356,"journal":{"name":"2020 XXIX International Scientific Conference Electronics (ET)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115051667","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-09-16DOI: 10.1109/ET50336.2020.9238274
N. Shopov, A. Bosakova-Ardenska, Ivan Topalov, P. Panayotov, P. Boyanova
The current paper proposes a non-contact and nondestructive approach for characterization of Bulgarian white brined cheese produced of sheep and cow milk. The approach is based on usage of ultrasonic emitter and receiver which detect the reflected signals from the irradiated object. The result signals are processed by spectral analysis method through Discrete Wavelet Transform (DWT) of Haar implemented with fast conversion.
{"title":"Ultrasound method for classification of Bulgarian white brined sheep and cow cheese","authors":"N. Shopov, A. Bosakova-Ardenska, Ivan Topalov, P. Panayotov, P. Boyanova","doi":"10.1109/ET50336.2020.9238274","DOIUrl":"https://doi.org/10.1109/ET50336.2020.9238274","url":null,"abstract":"The current paper proposes a non-contact and nondestructive approach for characterization of Bulgarian white brined cheese produced of sheep and cow milk. The approach is based on usage of ultrasonic emitter and receiver which detect the reflected signals from the irradiated object. The result signals are processed by spectral analysis method through Discrete Wavelet Transform (DWT) of Haar implemented with fast conversion.","PeriodicalId":178356,"journal":{"name":"2020 XXIX International Scientific Conference Electronics (ET)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121613619","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-09-16DOI: 10.1109/ET50336.2020.9238213
V. Tsenev, V. Videkov
The report presents approach to reduce PCB distortion after heat treatment for soldering using a reflow process. The influence of the temperature profile at different heating of the lower side of the board has been studied and an optimal one has been established, in which the distortion of the boards is minimal and there is no danger of creating defects on the lower side. Conclusions are made when this approach can be used and how a secure temperature profile can be achieved for minimal board distortion after soldering with a reflow process.
{"title":"Approach to reduce PCB distortion after heat treatment for soldering with reflow process","authors":"V. Tsenev, V. Videkov","doi":"10.1109/ET50336.2020.9238213","DOIUrl":"https://doi.org/10.1109/ET50336.2020.9238213","url":null,"abstract":"The report presents approach to reduce PCB distortion after heat treatment for soldering using a reflow process. The influence of the temperature profile at different heating of the lower side of the board has been studied and an optimal one has been established, in which the distortion of the boards is minimal and there is no danger of creating defects on the lower side. Conclusions are made when this approach can be used and how a secure temperature profile can be achieved for minimal board distortion after soldering with a reflow process.","PeriodicalId":178356,"journal":{"name":"2020 XXIX International Scientific Conference Electronics (ET)","volume":"abs/1512.03088 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121522524","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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