Lodging is a complex trait that limits wheat (Triticum aestivum L.) yield potential, and no single trait can fully capture lodging resistance. Identifying key traits and developing reliable, field-applicable indicators are crucial for breeding lodging-resistant cultivars. In this study, lodging resistance was systematically assessed in 274 wheat varieties across three consecutive growing seasons (2022–2024). Genotype, growing season, growth stage, and their interactions significantly affected lodging-associated traits, with a clear temporal alignment between meteorological conditions and lodging events. Comparative analysis between lodged and non-lodged plants revealed that lodging negatively influenced spike and kernel traits. Multivariate analyses indicated that height-related traits accounted for nearly 50 % of the phenotypic variance related to lodging resistance and showed negative correlations, while traits related to stem weight and fullness explained 24 % and 8 %, respectively. Among these, stem wall thickness (SWT), second basal internode fullness (SBF), single stem elasticity (SSE), and stem strength (SS) emerged as key positive contributors, whereas plant height (PH), center of gravity height (CGH), and basal internode lengths were negatively associated. Stepwise regression and path analyses further identified SWT and SBF as primary determinants of SS, while CGH was the key factor influencing SSE. Structural equation modeling demonstrated that height-related traits exerted significant negative effects on stem anatomical structure, mechanical traits, and lodging index. Furthermore, a novel lodging index, defined as the SSE-to-CGH ratio, was proposed. It exhibited a strong correlation with the comprehensive lodging score (D value) and high consistency with clustering results, providing a practical assessment tool. These findings provide valuable insights for assessing lodging resistance and guiding strong-stem breeding strategies in wheat.
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