Maurice Wanitzek, Harishnarayan Ramachandra, Christian Spieth, Alwin Daus, Jörg Schulze, Michael Oehme
GeSn-on-Si avalanche photodiodes (APDs) are emerging as a promising solution for low-light detection in the short-wave infrared (SWIR) spectral range, including applications in imaging and telecommunications. In this work, key challenges such as high dark current and limited responsivity are addressed by demonstrating devices, which combine low noise with high signal amplification, while remaining compatible with silicon-based technology. GeSn-on-Si APDs with various Sn concentrations up to 1.9% are fabricated and characterized. The GeSn layers are grown pseudomorphically on Ge virtual substrates on Si wafers using molecular beam epitaxy. The devices comprise a double-mesa structure and exhibit a dark current dominated by a perimeter leakage path, independent of the Sn content. A dark current below 1 µA is maintained up to the onset of avalanche breakdown, marking a significant improvement compared to prior work. A record-high responsivity of 14.7 A W−1 is achieved at 1550 nm for the APD with 1.9% Sn. Through impulse response measurements, the 3-dB bandwidth is determined to 1.2 GHz on devices with an 80 µm diameter, resulting in a responsivity-bandwidth-product of 17.6 A W−1 GHz−1. These results highlight the potential of GeSn-on-Si APDs for high-performance, low-light applications in the SWIR range.
GeSn-on-Si雪崩光电二极管(apd)正在成为短波红外(SWIR)光谱范围内低光探测的一种有前途的解决方案,包括成像和电信应用。在这项工作中,通过展示将低噪声与高信号放大相结合的设备来解决诸如高暗电流和有限响应性等关键挑战,同时保持与硅基技术的兼容性。制备了Sn浓度高达1.9%的gsn -on- si apd并对其进行了表征。利用分子束外延技术在硅晶片上的Ge虚拟衬底上生长了GeSn层。该器件包括双台面结构,并表现出由周长泄漏路径主导的暗电流,与Sn含量无关。在雪崩击穿开始之前,保持低于1 μ A的暗电流,与之前的工作相比有了显着改进。对于含1.9% Sn的APD,在1550 nm处的响应率达到了创纪录的14.7 A W−1。通过脉冲响应测量,在直径为80µm的器件上,3db带宽被确定为1.2 GHz,从而得到17.6 a W−1 GHz−1的响应带宽积。这些结果突出了gsn -on- si apd在SWIR范围内高性能、低光应用的潜力。
{"title":"GeSn-on-Si Avalanche Photodiodes with High Responsivity and Low Dark Current","authors":"Maurice Wanitzek, Harishnarayan Ramachandra, Christian Spieth, Alwin Daus, Jörg Schulze, Michael Oehme","doi":"10.1002/aelm.202500495","DOIUrl":"10.1002/aelm.202500495","url":null,"abstract":"<p>GeSn-on-Si avalanche photodiodes (APDs) are emerging as a promising solution for low-light detection in the short-wave infrared (SWIR) spectral range, including applications in imaging and telecommunications. In this work, key challenges such as high dark current and limited responsivity are addressed by demonstrating devices, which combine low noise with high signal amplification, while remaining compatible with silicon-based technology. GeSn-on-Si APDs with various Sn concentrations up to 1.9% are fabricated and characterized. The GeSn layers are grown pseudomorphically on Ge virtual substrates on Si wafers using molecular beam epitaxy. The devices comprise a double-mesa structure and exhibit a dark current dominated by a perimeter leakage path, independent of the Sn content. A dark current below 1 µA is maintained up to the onset of avalanche breakdown, marking a significant improvement compared to prior work. A record-high responsivity of 14.7 A W<sup>−1</sup> is achieved at 1550 nm for the APD with 1.9% Sn. Through impulse response measurements, the 3-dB bandwidth is determined to 1.2 GHz on devices with an 80 µm diameter, resulting in a responsivity-bandwidth-product of 17.6 A W<sup>−1</sup> GHz<sup>−1</sup>. These results highlight the potential of GeSn-on-Si APDs for high-performance, low-light applications in the SWIR range.</p>","PeriodicalId":110,"journal":{"name":"Advanced Electronic Materials","volume":"11 21","pages":""},"PeriodicalIF":5.3,"publicationDate":"2025-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://advanced.onlinelibrary.wiley.com/doi/epdf/10.1002/aelm.202500495","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145664812","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Nikolas Franke, Luca Fabbri, Lorenzo Margotti, Jinhui Cho, Kristofer Paetow, Yang-Wen Chen, Agus Widjaja, Beatrice Fraboni, Tobias Cramer
Charge carrier transport in disordered semiconductors is critically influenced by the shape of the band tail in the density of states (DOS). To minimize energetic disorder and suppress band tails, deposition processes and post-treatment methods of semiconducting thin films must be carefully optimized. While capacitance–voltage (CV) measurements are routinely employed to extract doping densities and flatband voltages, no standardized procedure currently exists to quantitatively determine the DOS from such measurements. In this work, we address this gap by introducing a novel method to extract quantitative DOS information from CV data. Our approach relies on an analytical solution for charge accumulation in an exponential DOS distribution. We apply the method to Indium Gallium Zinc Oxide (IGZO) thin-film transistors and systematically investigate how measurement frequency and channel geometry affect the results. Comparison with alternative optical and electrical techniques confirms that CV measurements can provide reliable and straightforward access to DOS parameters, provided that the transistor channel dimensions exceed L × W = 20 µm × 100 µm. Additionally, CV measurements offer practical advantages, as they are fully compatible with standard transistor architectures, including encapsulation and light shielding commonly used in technological applications.
无序半导体中的载流子输运受到态密度(DOS)中带尾形状的严重影响。为了最大限度地减少能量紊乱和抑制带尾,必须仔细优化半导体薄膜的沉积工艺和后处理方法。虽然电容电压(CV)测量通常用于提取掺杂密度和平带电压,但目前还没有标准化的程序来从这些测量中定量确定DOS。在这项工作中,我们通过引入一种从CV数据中提取定量DOS信息的新方法来解决这一差距。我们的方法依赖于指数DOS分布中电荷积累的解析解。我们将该方法应用于铟镓锌氧化物(IGZO)薄膜晶体管,并系统地研究了测量频率和沟道几何形状如何影响结果。与其他光学和电气技术的比较证实,只要晶体管通道尺寸超过L × W = 20 μ m × 100 μ m, CV测量可以提供可靠和直接的DOS参数访问。此外,CV测量具有实用优势,因为它们与标准晶体管架构完全兼容,包括技术应用中常用的封装和光屏蔽。
{"title":"Probing the DOS Band Tail in Amorphous Thin-Film Transistors via Capacitance–Voltage Analysis","authors":"Nikolas Franke, Luca Fabbri, Lorenzo Margotti, Jinhui Cho, Kristofer Paetow, Yang-Wen Chen, Agus Widjaja, Beatrice Fraboni, Tobias Cramer","doi":"10.1002/aelm.202500527","DOIUrl":"10.1002/aelm.202500527","url":null,"abstract":"<p>Charge carrier transport in disordered semiconductors is critically influenced by the shape of the band tail in the density of states (DOS). To minimize energetic disorder and suppress band tails, deposition processes and post-treatment methods of semiconducting thin films must be carefully optimized. While capacitance–voltage (CV) measurements are routinely employed to extract doping densities and flatband voltages, no standardized procedure currently exists to quantitatively determine the DOS from such measurements. In this work, we address this gap by introducing a novel method to extract quantitative DOS information from CV data. Our approach relies on an analytical solution for charge accumulation in an exponential DOS distribution. We apply the method to Indium Gallium Zinc Oxide (IGZO) thin-film transistors and systematically investigate how measurement frequency and channel geometry affect the results. Comparison with alternative optical and electrical techniques confirms that CV measurements can provide reliable and straightforward access to DOS parameters, provided that the transistor channel dimensions exceed L × W = 20 µm × 100 µm. Additionally, CV measurements offer practical advantages, as they are fully compatible with standard transistor architectures, including encapsulation and light shielding commonly used in technological applications.</p>","PeriodicalId":110,"journal":{"name":"Advanced Electronic Materials","volume":"12 2","pages":""},"PeriodicalIF":5.3,"publicationDate":"2025-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://advanced.onlinelibrary.wiley.com/doi/epdf/10.1002/aelm.202500527","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145673726","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Tomas Vincze, Michal Hanic, Martin Berki, Martin Weis
Neuromorphic computing systems require artificial synaptic devices capable of emulating complex biological neural functions. This study presents a dinaphtho[2,3-b:2′,3′-f]thieno[3,2-b]thiophene (DNTT)-based organic field-effect transistor that demonstrates synaptic plasticity under optical stimulation at 200 K. The device exhibits a dual-mechanism synaptic behavior through charge separation and trapping, where photogenerated holes provide rapid transport while electrons are preferentially captured in deep trap states, creating persistent field modulation. Excitatory postsynaptic current measurements reveal characteristic three-phase temporal dynamics with rapid activation, exponential decay, and sustained enhancement lasting tens of minutes. Paired-pulse facilitation demonstrates short-term plasticity with dual exponential decay constants of 140 and 610 ms, while multi-pulse stimulation produces remarkable persistent current level enhancement exceeding 10 000% of the initial baseline, reflecting sequential filling of continuous trap state distributions. The device simultaneously implements both short-term and long-term plasticity mechanisms in a single component, enabling simultaneous working memory and persistent information storage functions. Neuromorphic functionality is demonstrated through simulated XOR logic operations, showing non-linearly separable computation capabilities. The 200 K operating temperature aligns favorably with Mars surface conditions, requiring minimal heating compared to terrestrial cooling requirements, making the device particularly promising for space-based neuromorphic systems where radiation-hard organic semiconductors provide additional advantages.
{"title":"Simultaneous Dual-Plasticity Organic Synaptic Transistor for Neuromorphic Computing","authors":"Tomas Vincze, Michal Hanic, Martin Berki, Martin Weis","doi":"10.1002/aelm.202500515","DOIUrl":"10.1002/aelm.202500515","url":null,"abstract":"<p>Neuromorphic computing systems require artificial synaptic devices capable of emulating complex biological neural functions. This study presents a dinaphtho[2,3-b:2′,3′-f]thieno[3,2-b]thiophene (DNTT)-based organic field-effect transistor that demonstrates synaptic plasticity under optical stimulation at 200 K. The device exhibits a dual-mechanism synaptic behavior through charge separation and trapping, where photogenerated holes provide rapid transport while electrons are preferentially captured in deep trap states, creating persistent field modulation. Excitatory postsynaptic current measurements reveal characteristic three-phase temporal dynamics with rapid activation, exponential decay, and sustained enhancement lasting tens of minutes. Paired-pulse facilitation demonstrates short-term plasticity with dual exponential decay constants of 140 and 610 ms, while multi-pulse stimulation produces remarkable persistent current level enhancement exceeding 10 000% of the initial baseline, reflecting sequential filling of continuous trap state distributions. The device simultaneously implements both short-term and long-term plasticity mechanisms in a single component, enabling simultaneous working memory and persistent information storage functions. Neuromorphic functionality is demonstrated through simulated XOR logic operations, showing non-linearly separable computation capabilities. The 200 K operating temperature aligns favorably with Mars surface conditions, requiring minimal heating compared to terrestrial cooling requirements, making the device particularly promising for space-based neuromorphic systems where radiation-hard organic semiconductors provide additional advantages.</p>","PeriodicalId":110,"journal":{"name":"Advanced Electronic Materials","volume":"12 1","pages":""},"PeriodicalIF":5.3,"publicationDate":"2025-12-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://advanced.onlinelibrary.wiley.com/doi/epdf/10.1002/aelm.202500515","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145657186","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Stephan Menzel, Benedikt Kersting, Rana Walied Ahmad, Abu Sebastian, Ghazi Sarwat Syed
In this work, a compact model for mushroom-type phase-change memory devices is introduced that incorporates the shape and size of the amorphous mark under different programming conditions, and is applicable to both projecting and non-projecting devices. The model includes analytical equations for the amorphous and crystalline regions and uniquely features a current leakage path that injects current at the outer edge of the electrodes. The results demonstrate that accurately modeling the size and shape of the phase configurations is crucial for predicting the full-span of the RESET and SET programming, including the characteristics of threshold switching. Additionally, the model effectively captures read-out behaviors, including the dependence of resistance drift and bipolar current asymmetry behaviours on the phase configurations. The compact model is also provided in Verilog–A format, so it can be easily used in standard circuit-level simulation tools.
{"title":"A Device-Level Compact Model for Mushroom-Type Phase Change Memory","authors":"Stephan Menzel, Benedikt Kersting, Rana Walied Ahmad, Abu Sebastian, Ghazi Sarwat Syed","doi":"10.1002/aelm.202500496","DOIUrl":"10.1002/aelm.202500496","url":null,"abstract":"<p>In this work, a compact model for mushroom-type phase-change memory devices is introduced that incorporates the shape and size of the amorphous mark under different programming conditions, and is applicable to both projecting and non-projecting devices. The model includes analytical equations for the amorphous and crystalline regions and uniquely features a current leakage path that injects current at the outer edge of the electrodes. The results demonstrate that accurately modeling the size and shape of the phase configurations is crucial for predicting the full-span of the RESET and SET programming, including the characteristics of threshold switching. Additionally, the model effectively captures read-out behaviors, including the dependence of resistance drift and bipolar current asymmetry behaviours on the phase configurations. The compact model is also provided in Verilog–A format, so it can be easily used in standard circuit-level simulation tools.</p>","PeriodicalId":110,"journal":{"name":"Advanced Electronic Materials","volume":"12 1","pages":""},"PeriodicalIF":5.3,"publicationDate":"2025-12-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://advanced.onlinelibrary.wiley.com/doi/epdf/10.1002/aelm.202500496","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145657187","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
June Soo Kim, Da Ye Kim, Noah Jang, Hyunjun Kim, Dong Geon Jung, Daewoong Jung, Soon Yeol Kwon, Seong Ho Kong
In-sensor reservoir computing offers a promising paradigm for signal analysis by embedding sensing and computation within a single platform. However, it remains challenging to realize both dynamic temporal processing and long-term memory using a single device. Here, we report a multi-modal and reconfigurable oxide-based memristive device that enables both volatile and nonvolatile switching modes in a unified architecture. By precisely tuning the crystallinity of the TiO2 layer and adjusting the compliance current, we modulate the conductive filament dynamics to switch between volatile and nonvolatile behavior, and multi-modal switching is verified based on nucleation theory. The volatile mode enables fading memory and nonlinearity required for high-dimensional temporal encoding, while the nonvolatile mode provides robust analog weight storage with 5-bit resolution and retention exceeding 10⁵ s. These dual functions are integrated into a neuromorphic in-sensor reservoir computing system. The system accurately reconstructs ECG waveforms (NRMSE = 0.010) and achieves multi-step prediction of pH time-series (accuracy = 98.2%), while reducing energy consumption by over five-fold compared to conventional echo state networks. We demonstrate a scalable and energy-efficient approach toward intelligent biochemical sensing, highlighting how material-level configurability in memristive devices can unlock new directions for on-sensor neuromorphic hardware.
{"title":"Crystallinity-Programmed Memristive Devices Enable Reconfigurable Neuromorphic Sensing With Hardware VMM Readout","authors":"June Soo Kim, Da Ye Kim, Noah Jang, Hyunjun Kim, Dong Geon Jung, Daewoong Jung, Soon Yeol Kwon, Seong Ho Kong","doi":"10.1002/aelm.202500626","DOIUrl":"10.1002/aelm.202500626","url":null,"abstract":"<p>In-sensor reservoir computing offers a promising paradigm for signal analysis by embedding sensing and computation within a single platform. However, it remains challenging to realize both dynamic temporal processing and long-term memory using a single device. Here, we report a multi-modal and reconfigurable oxide-based memristive device that enables both volatile and nonvolatile switching modes in a unified architecture. By precisely tuning the crystallinity of the TiO<sub>2</sub> layer and adjusting the compliance current, we modulate the conductive filament dynamics to switch between volatile and nonvolatile behavior, and multi-modal switching is verified based on nucleation theory. The volatile mode enables fading memory and nonlinearity required for high-dimensional temporal encoding, while the nonvolatile mode provides robust analog weight storage with 5-bit resolution and retention exceeding 10⁵ s. These dual functions are integrated into a neuromorphic in-sensor reservoir computing system. The system accurately reconstructs ECG waveforms (NRMSE = 0.010) and achieves multi-step prediction of pH time-series (accuracy = 98.2%), while reducing energy consumption by over five-fold compared to conventional echo state networks. We demonstrate a scalable and energy-efficient approach toward intelligent biochemical sensing, highlighting how material-level configurability in memristive devices can unlock new directions for on-sensor neuromorphic hardware.</p>","PeriodicalId":110,"journal":{"name":"Advanced Electronic Materials","volume":"11 21","pages":""},"PeriodicalIF":5.3,"publicationDate":"2025-12-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://advanced.onlinelibrary.wiley.com/doi/epdf/10.1002/aelm.202500626","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145664815","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Minjeong Ryu, Jae Seung Woo, Yeonwoo Kim, Joo Hyeon Jeon, Sung In Cho, Woo Young Choi
Ferroelectric Memcapacitors
In their Research Article (10.1002/aelm.202500421), Woo Young Choi and co-workers propose and demonstrate a novel capacitive time-domain (TD) content-addressable memory (CAM) based on a single ambipolar ferroelectric memcapacitor (1C) exhibiting band-reject-filter-shaped capacitance-voltage characteristics. The proposed 1C TD CAM performs linear Hamming distance computation through propagation delay modulation, enabling high-density associative memory and highly reliable in-memory nearest-neighbor search for one-shot learning.