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IEEE Solid-State Circuits Letters最新文献
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A Fully Integrated 5510-μm² Process Monitor and Threshold Voltage Extractor Circuit in 28 nm
28 纳米全集成 5510-μm² 工艺监控器和阈值电压提取电路
IF 2.2
Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
IEEE Solid-State Circuits Letters
Pub Date : 2024-09-11
DOI: 10.1109/LSSC.2024.3457768
Ido Shpernat;Asaf Feldman;Joseph Shor
A new architecture of an on-die process monitor circuit is demonstrated in 28 nm. The proposed circuit can extract the threshold voltage,
$V_{mathrm { TH,}}$