In this letter, we present a high-entropy strong physically unclonable function (PUF) utilizing weak-inversion current mirrors implemented in a standard 65-nm CMOS technology. Each response bit of the proposed PUF relies on the threshold voltage differences of minimum-sized transistors arranged in a $32times 32$ matrix. The analog operating principle enables encoding at least three effective bits per transistor pair, significantly improving entropy density. Leveraging a bit-masking technique, the design achieves remarkable robustness, attaining a bit error rate (BER) as low as 0.22% even under substantial supply voltage and temperature variations, with less than 10% discarded bits. The presented architecture exhibits a record area-to-entropy ratio of $166~rm {F^{2}}$ /bit, confirming its suitability for highly secure, compact applications in hardware security.
{"title":"High-Entropy Analog-Based Strong Physical Unclonable Function With Area-to-Entropy-ratio of 166 F2/bit","authors":"Alessandro Catania;Sebastiano Strangio;Maksym Paliy;Christian Sbrana;Michele Bertozzi;Giuseppe Iannaccone","doi":"10.1109/LSSC.2025.3616263","DOIUrl":"https://doi.org/10.1109/LSSC.2025.3616263","url":null,"abstract":"In this letter, we present a high-entropy strong physically unclonable function (PUF) utilizing weak-inversion current mirrors implemented in a standard 65-nm CMOS technology. Each response bit of the proposed PUF relies on the threshold voltage differences of minimum-sized transistors arranged in a <inline-formula> <tex-math>$32times 32$ </tex-math></inline-formula> matrix. The analog operating principle enables encoding at least three effective bits per transistor pair, significantly improving entropy density. Leveraging a bit-masking technique, the design achieves remarkable robustness, attaining a bit error rate (BER) as low as 0.22% even under substantial supply voltage and temperature variations, with less than 10% discarded bits. The presented architecture exhibits a record area-to-entropy ratio of <inline-formula> <tex-math>$166~rm {F^{2}}$ </tex-math></inline-formula>/bit, confirming its suitability for highly secure, compact applications in hardware security.","PeriodicalId":13032,"journal":{"name":"IEEE Solid-State Circuits Letters","volume":"8 ","pages":"309-312"},"PeriodicalIF":2.0,"publicationDate":"2025-09-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145255900","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-09-29DOI: 10.1109/LSSC.2025.3615656
Jelle H. T. Bakker;Nimit Jain;Paul Klatser;Mark S. Oude Alink;Bram Nauta
We present a monolithically integrated (MI) dualjunction monitoring photodiode (PD) and transimpedance amplifier (TIA). The photocurrent originates from the deep Nwell (DNW)/P-type substrate (PSUB) $({lt }5~ mathrm {GHz})$ and the P-Well $(mathrm {PW}) / mathrm {DNW}({gt }1~ mathrm {GHz})$ junctions. The presented combination of bulk PD and 22 nm fully-depleted silicon-on-insulator (FDSOI) TIA (18-GHz bandwidth (BW), $17.8 ~mathrm {pA} / sqrt {mathrm {Hz}}$ noise level) advances the state-of-the-art in MI high-speed optical monitoring and reduces the inherent tradeoff in MI solutions regarding PD (responsivity & BW) and RF circuitry $(f_{t})$ performance.
{"title":"Dual-Junction Monolithically Integrated Monitoring Photodiode With a Two-Stage 18 GHz 18 pA/√Hz TIA in 22-nm FDSOI","authors":"Jelle H. T. Bakker;Nimit Jain;Paul Klatser;Mark S. Oude Alink;Bram Nauta","doi":"10.1109/LSSC.2025.3615656","DOIUrl":"https://doi.org/10.1109/LSSC.2025.3615656","url":null,"abstract":"We present a monolithically integrated (MI) dualjunction monitoring photodiode (PD) and transimpedance amplifier (TIA). The photocurrent originates from the deep Nwell (DNW)/P-type substrate (PSUB) <inline-formula> <tex-math>$({lt }5~ mathrm {GHz})$ </tex-math></inline-formula> and the P-Well <inline-formula> <tex-math>$(mathrm {PW}) / mathrm {DNW}({gt }1~ mathrm {GHz})$ </tex-math></inline-formula> junctions. The presented combination of bulk PD and 22 nm fully-depleted silicon-on-insulator (FDSOI) TIA (18-GHz bandwidth (BW), <inline-formula> <tex-math>$17.8 ~mathrm {pA} / sqrt {mathrm {Hz}}$ </tex-math></inline-formula> noise level) advances the state-of-the-art in MI high-speed optical monitoring and reduces the inherent tradeoff in MI solutions regarding PD (responsivity & BW) and RF circuitry <inline-formula> <tex-math>$(f_{t})$ </tex-math></inline-formula> performance.","PeriodicalId":13032,"journal":{"name":"IEEE Solid-State Circuits Letters","volume":"8 ","pages":"313-316"},"PeriodicalIF":2.0,"publicationDate":"2025-09-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145352047","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
This letter presents an RC oscillator featuring a mixed-signal compensation loop that simultaneously mitigates comparator offset, loop delay, switch on-resistance, and temperature dependency. The oscillator employs an auxiliary comparator, a charge pump, and a differential difference amplifier (DDA)-based main comparator to suppress ramping voltage overshoots caused by device and loop imperfections. Moreover, the auxiliary comparator employs chopper and digital demodulation techniques to suppress its own offset, further enhancing the accuracy of the calibration loop. By generating both ramping and reference voltages, the proportional-to-absolute-temperature (PTAT) core ensures that the temperature coefficient (TC) of the oscillation frequency primarily depends on passive RC components. Fabricated in a $0.18~mu $ m BCD process, the design achieves an average frequency TC of 42 ppm/°C from −20 °C to 125 °C across ten samples. Benefiting from the proposed architecture, the oscillator operates at 8.45 MHz with a fast startup calibration time of $50~mu $ s.
{"title":"An 8.5 MHz 42 ppm/°C Relaxation Oscillator With Charge-Pump Delay Cancellation and Digital Chopping Demodulation","authors":"Yongjia Li;Jianlin Xia;Feng Cheng;Yifan Cao;Jin Wu;Encheng Zhu;Xiaofeng Sun;Dejin Wang;Long Zhang;Zhongyuan Fang;Weifeng Sun","doi":"10.1109/LSSC.2025.3615833","DOIUrl":"https://doi.org/10.1109/LSSC.2025.3615833","url":null,"abstract":"This letter presents an RC oscillator featuring a mixed-signal compensation loop that simultaneously mitigates comparator offset, loop delay, switch on-resistance, and temperature dependency. The oscillator employs an auxiliary comparator, a charge pump, and a differential difference amplifier (DDA)-based main comparator to suppress ramping voltage overshoots caused by device and loop imperfections. Moreover, the auxiliary comparator employs chopper and digital demodulation techniques to suppress its own offset, further enhancing the accuracy of the calibration loop. By generating both ramping and reference voltages, the proportional-to-absolute-temperature (PTAT) core ensures that the temperature coefficient (TC) of the oscillation frequency primarily depends on passive RC components. Fabricated in a <inline-formula> <tex-math>$0.18~mu $ </tex-math></inline-formula>m BCD process, the design achieves an average frequency TC of 42 ppm/°C from −20 °C to 125 °C across ten samples. Benefiting from the proposed architecture, the oscillator operates at 8.45 MHz with a fast startup calibration time of <inline-formula> <tex-math>$50~mu $ </tex-math></inline-formula>s.","PeriodicalId":13032,"journal":{"name":"IEEE Solid-State Circuits Letters","volume":"8 ","pages":"333-336"},"PeriodicalIF":2.0,"publicationDate":"2025-09-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145351912","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
This letter presents a frequency quadrupler with 32% fractional bandwidth (66–92 GHz) and 5% peak power-added efficiency (PAE), capable of operating with an input power of 0 dBm. The quadrupler consisting of two cascaded frequency doublers uses a multiport driven push-push complementary architecture for the first stage to generate differential signals for the second doubler with high fundamental harmonic rejection. The second doubler based on the nMOS-based push-push architecture uses gain enhancement to achieve a maximum conversion gain of –4 dB for the quadrupler. The quadrupler with an output saturation power (P${}_{text {sat}}$ ) of –2.6 dBm achieves first- to third-harmonic rejections of more than 36 dBc across the 3-dB bandwidth. The compact quadrupler has a core area of 0.09 mm2, while consuming a DC power of 6.2 mW from a 0.8 V supply with an input power of 0 dBm at 20 GHz.
{"title":"A Compact Current-Reusing 6-mW 66–92 GHz Frequency Quadrupler With 5% Peak Power Added Efficiency and >36 dBc Harmonic Rejection in 22-nm FDSOI CMOS","authors":"Shankkar Balasubramanian;Kristof Vaesen;Piet Wambacq;Carsten Wulff","doi":"10.1109/LSSC.2025.3614381","DOIUrl":"https://doi.org/10.1109/LSSC.2025.3614381","url":null,"abstract":"This letter presents a frequency quadrupler with 32% fractional bandwidth (66–92 GHz) and 5% peak power-added efficiency (PAE), capable of operating with an input power of 0 dBm. The quadrupler consisting of two cascaded frequency doublers uses a multiport driven push-push complementary architecture for the first stage to generate differential signals for the second doubler with high fundamental harmonic rejection. The second doubler based on the nMOS-based push-push architecture uses gain enhancement to achieve a maximum conversion gain of –4 dB for the quadrupler. The quadrupler with an output saturation power (P<inline-formula> <tex-math>${}_{text {sat}}$ </tex-math></inline-formula>) of –2.6 dBm achieves first- to third-harmonic rejections of more than 36 dBc across the 3-dB bandwidth. The compact quadrupler has a core area of 0.09 mm2, while consuming a DC power of 6.2 mW from a 0.8 V supply with an input power of 0 dBm at 20 GHz.","PeriodicalId":13032,"journal":{"name":"IEEE Solid-State Circuits Letters","volume":"8 ","pages":"301-304"},"PeriodicalIF":2.0,"publicationDate":"2025-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11178244","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145255858","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
This letter presents a backscatter chip that features bidirectional communication with commodity bluetooth low-energy (BLE) transceivers. For uplink, the chip reflects a reverse-whitened BLE tone into single-sideband (SSB) GFSK-modulated BLE packets via a proposed replica VCO-based GFSK modulator and an inductor-free SSB reflector. For downlink, the BLE packets are frequency down-converted passively by utilizing a reverse-whitened BLE tone followed by a proposed self-calibrated GFSK demodulator to recover the downlink data at ultralow power with improved robustness. A dual-linearly polarized microstrip patch antenna (DPMPA) is integrated to enable concurrent RF energy harvesting and communication in a wearable form factor. Implemented in 65-nm CMOS, the chip consumes $1.4~mu $ W for downlink and $15.8~mu $ W for uplink. Wireless tests demonstrated a 50 cm downlink and >3 m uplink ranges at 20 dBm EIRP.
{"title":"A Battery-Free BLE Backscatter Communication Chip for Wearable Systems","authors":"Yongling Zhang;Ji Xiong;Junzai Chen;Xiaoyu Li;Jinrui Zuo;Yan Wang;Xiaoyi Wang;Miao Meng","doi":"10.1109/LSSC.2025.3612423","DOIUrl":"https://doi.org/10.1109/LSSC.2025.3612423","url":null,"abstract":"This letter presents a backscatter chip that features bidirectional communication with commodity bluetooth low-energy (BLE) transceivers. For uplink, the chip reflects a reverse-whitened BLE tone into single-sideband (SSB) GFSK-modulated BLE packets via a proposed replica VCO-based GFSK modulator and an inductor-free SSB reflector. For downlink, the BLE packets are frequency down-converted passively by utilizing a reverse-whitened BLE tone followed by a proposed self-calibrated GFSK demodulator to recover the downlink data at ultralow power with improved robustness. A dual-linearly polarized microstrip patch antenna (DPMPA) is integrated to enable concurrent RF energy harvesting and communication in a wearable form factor. Implemented in 65-nm CMOS, the chip consumes <inline-formula> <tex-math>$1.4~mu $ </tex-math></inline-formula>W for downlink and <inline-formula> <tex-math>$15.8~mu $ </tex-math></inline-formula>W for uplink. Wireless tests demonstrated a 50 cm downlink and >3 m uplink ranges at 20 dBm EIRP.","PeriodicalId":13032,"journal":{"name":"IEEE Solid-State Circuits Letters","volume":"8 ","pages":"297-300"},"PeriodicalIF":2.0,"publicationDate":"2025-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145223688","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Sparsity has recently attracted increased attention in the machine learning (ML) community due to its potential to improve performance and energy efficiency by eliminating ineffectual computations. As ML models evolve rapidly, reconfigurable architectures, such as coarse-grained reconfigurable arrays (CGRAs), are being explored to adapt to and accelerate emerging models. Previous CGRA designs have supported unstructured sparsity and reported promising speedups and energy savings for compute-intensive kernels. However, these approaches still face performance bottlenecks when accelerating entire sparse ML networks. In this letter, we identify the primary sources of inefficiency in prior CGRA-based approaches and present Opal, a CGRA SoC with three key contributions: 1) flexible dataflow architecture supporting Gustavson’s dataflow for sparse matrix multiplication; 2) high-throughput sparse hardware primitives; and 3) enhanced processing elements to support mapping all ML operations on the CGRA. As a result, Opal achieves a 66% to 79% reduction in runtime and energy consumption across our evaluated sparse graph neural network benchmarks compared to prior CGRA solutions which only target kernel acceleration.
{"title":"Opal: A 16-nm Coarse-Grained Reconfigurable Array SoC for Full Sparse Machine Learning Applications","authors":"Po-Han Chen;Bo Wun Cheng;Michael Oduoza;Zhouhua Xie;Rupert Lu;Sai Gautham Ravipati;Kalhan Koul;Alex Carsello;Yuchen Mei;Mark Horowitz;Priyanka Raina","doi":"10.1109/LSSC.2025.3613245","DOIUrl":"https://doi.org/10.1109/LSSC.2025.3613245","url":null,"abstract":"Sparsity has recently attracted increased attention in the machine learning (ML) community due to its potential to improve performance and energy efficiency by eliminating ineffectual computations. As ML models evolve rapidly, reconfigurable architectures, such as coarse-grained reconfigurable arrays (CGRAs), are being explored to adapt to and accelerate emerging models. Previous CGRA designs have supported unstructured sparsity and reported promising speedups and energy savings for compute-intensive kernels. However, these approaches still face performance bottlenecks when accelerating entire sparse ML networks. In this letter, we identify the primary sources of inefficiency in prior CGRA-based approaches and present Opal, a CGRA SoC with three key contributions: 1) flexible dataflow architecture supporting Gustavson’s dataflow for sparse matrix multiplication; 2) high-throughput sparse hardware primitives; and 3) enhanced processing elements to support mapping all ML operations on the CGRA. As a result, Opal achieves a 66% to 79% reduction in runtime and energy consumption across our evaluated sparse graph neural network benchmarks compared to prior CGRA solutions which only target kernel acceleration.","PeriodicalId":13032,"journal":{"name":"IEEE Solid-State Circuits Letters","volume":"8 ","pages":"293-296"},"PeriodicalIF":2.0,"publicationDate":"2025-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145223703","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Capacitive touch screens have become the dominant user interface over the past decade. Achieving high framerates with low power consumption remains a critical design goal for touch systems. The conventional charge-recycling technique reduces driving power by 64%, but it relies on off-chip capacitors. To address this issue, we propose a tri-level energy recycling scheme, in which energy released during the 2-to-1 transition is recycled to power the 0-to-1 transition on the complementary channel. This approach achieves a 25% power reduction using on-chip transmission gates. Additionally, a compressive sensing method is introduced to selectively process touched RX channels while bypassing the others, reducing the number of fine ADCs by a factor of four compared to conventional two-step sensing. The proposed techniques are implemented in a 65-nm CMOS process and integrated into a $32times 20$ channel prototype occupying 2.4 mm2. Measurement results show that the chip consumes only 2.6 mW at a framerate of 1513 Hz. The signal-to-noise ratio (SNR) reaches 49.7 dB for finger touch and 28.7 dB for a 1-mm $Phi $ stylus, resulting in an energy efficiency of 10.66 pJ/step.
{"title":"A Fully Dynamic Capacitive Touch Sensor With Tri-Level Energy Recycling and Compressive Sensing Technique","authors":"Xiangdong Feng;Zhiyu Wang;Haoyang Li;Jiaqing Li;Wei-Chin Lin;Xin Hu;Zhong Tang;Yuyan Liu;Qinwen Fan;Yuxuan Luo;Bo Zhao","doi":"10.1109/LSSC.2025.3612093","DOIUrl":"https://doi.org/10.1109/LSSC.2025.3612093","url":null,"abstract":"Capacitive touch screens have become the dominant user interface over the past decade. Achieving high framerates with low power consumption remains a critical design goal for touch systems. The conventional charge-recycling technique reduces driving power by 64%, but it relies on off-chip capacitors. To address this issue, we propose a tri-level energy recycling scheme, in which energy released during the 2-to-1 transition is recycled to power the 0-to-1 transition on the complementary channel. This approach achieves a 25% power reduction using on-chip transmission gates. Additionally, a compressive sensing method is introduced to selectively process touched RX channels while bypassing the others, reducing the number of fine ADCs by a factor of four compared to conventional two-step sensing. The proposed techniques are implemented in a 65-nm CMOS process and integrated into a <inline-formula> <tex-math>$32times 20$ </tex-math></inline-formula> channel prototype occupying 2.4 mm2. Measurement results show that the chip consumes only 2.6 mW at a framerate of 1513 Hz. The signal-to-noise ratio (SNR) reaches 49.7 dB for finger touch and 28.7 dB for a 1-mm <inline-formula> <tex-math>$Phi $ </tex-math></inline-formula> stylus, resulting in an energy efficiency of 10.66 pJ/step.","PeriodicalId":13032,"journal":{"name":"IEEE Solid-State Circuits Letters","volume":"8 ","pages":"337-340"},"PeriodicalIF":2.0,"publicationDate":"2025-09-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145405290","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-09-18DOI: 10.1109/LSSC.2025.3611484
Ronald Wijermars;Yi-Han Ou-Yang;Sijun Du;Dante G. Muratore
This letter describes a fast-settling active rectifier for a 40.68 MHz wireless power transfer receiver for implantable applications. Fast-settling and low power are achieved through a novel direct voltage-domain compensation technique. The rectifier maintains high efficiency during load and link variations required for downlink communication. The system was fabricated in 40nm CMOS and achieves a voltage conversion ratio of 93.9% and a simulated power conversion efficiency of 90.1% in a 0.19 mm2 area, resulting in a 118 mW/mm2 power density while integrating the resonance and filter capacitors. The worst-case settling of the ON- and OFF-delay compensation in the active rectifier is 200 ns, which is the fastest reported to date.
{"title":"A 40.68-MHz, 200-ns-Settling Active Rectifier for mm-Sized Implants","authors":"Ronald Wijermars;Yi-Han Ou-Yang;Sijun Du;Dante G. Muratore","doi":"10.1109/LSSC.2025.3611484","DOIUrl":"https://doi.org/10.1109/LSSC.2025.3611484","url":null,"abstract":"This letter describes a fast-settling active rectifier for a 40.68 MHz wireless power transfer receiver for implantable applications. Fast-settling and low power are achieved through a novel direct voltage-domain compensation technique. The rectifier maintains high efficiency during load and link variations required for downlink communication. The system was fabricated in 40nm CMOS and achieves a voltage conversion ratio of 93.9% and a simulated power conversion efficiency of 90.1% in a 0.19 mm2 area, resulting in a 118 mW/mm2 power density while integrating the resonance and filter capacitors. The worst-case settling of the ON- and OFF-delay compensation in the active rectifier is 200 ns, which is the fastest reported to date.","PeriodicalId":13032,"journal":{"name":"IEEE Solid-State Circuits Letters","volume":"8 ","pages":"305-308"},"PeriodicalIF":2.0,"publicationDate":"2025-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145255928","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A fully integrated galvanic isolator for gate drivers that supports high-speed, asynchronous, full-duplex communication is presented. Data transmission from the microcontroller to the power device is achieved using amplitude-shift keying (ASK) at 100 Mb/s, while simultaneous communication in the opposite direction is implemented using frequency-shift keying (FSK) at 167 Mb/s. A delay-locked loop (DLL)-based FSK demodulator enables robust operation in a completely asynchronous communication scenario. Prototypes were fabricated in a 0.13-$mu $ m HV CMOS technology, covering an area of 2.2 mm2. The system operates from a low 1.5-V supply with a total power consumption of 8.2 mW. Measured propagation delays are under 8 ns for ASK and below 4 ns for FSK at their respective maximum data rates.
{"title":"A Fully Integrated Galvanic Isolator for Gate Drivers With Asynchronous 100/167 Mb/s ASK/FSK Full-Duplex Communication","authors":"Lucrezia Navarin;Karl Norling;Marco Parenzan;Stefano Ruzzu;Andrea Neviani;Andrea Bevilacqua","doi":"10.1109/LSSC.2025.3611018","DOIUrl":"https://doi.org/10.1109/LSSC.2025.3611018","url":null,"abstract":"A fully integrated galvanic isolator for gate drivers that supports high-speed, asynchronous, full-duplex communication is presented. Data transmission from the microcontroller to the power device is achieved using amplitude-shift keying (ASK) at 100 Mb/s, while simultaneous communication in the opposite direction is implemented using frequency-shift keying (FSK) at 167 Mb/s. A delay-locked loop (DLL)-based FSK demodulator enables robust operation in a completely asynchronous communication scenario. Prototypes were fabricated in a 0.13-<inline-formula> <tex-math>$mu $ </tex-math></inline-formula>m HV CMOS technology, covering an area of 2.2 mm2. The system operates from a low 1.5-V supply with a total power consumption of 8.2 mW. Measured propagation delays are under 8 ns for ASK and below 4 ns for FSK at their respective maximum data rates.","PeriodicalId":13032,"journal":{"name":"IEEE Solid-State Circuits Letters","volume":"8 ","pages":"289-292"},"PeriodicalIF":2.0,"publicationDate":"2025-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145141620","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-09-17DOI: 10.1109/LSSC.2025.3610901
David Dolt;Samuel Palermo
This letter presents a radiation-hardened (rad-hard) subsampled phase-locked loop (SS-PLL) that achieves state-of-the-art jitter performance while incorporating radiation-hardened techniques to mitigate single-event-upsets (SEUs) present in the space environment. Furthermore, rad-hard techniques are incorporated in each core PLL subblock which include a rad-hard charge-pump Gm cell, a pulser circuit with triple modular redundancy (TMR), and a quad-core voltage-controlled oscillator (VCO) with varactor hardening and LC tail filters. Implemented in a 16-nm FinFET process, the PLL consumes 36.5 mW of power and achieves a jitter of 45.82 fs at 19.5 GHz. Testing at a cyclotron facility verifies robust SEU performance up to an LET of 55 MeV$cdot $ cm2/mg.
{"title":"A 19.5-GHz Radiation-Hardened Sub-Sampled PLL With Quad-Core VCO in 16-nm FinFET Achieving Sub-50 fs Jitter","authors":"David Dolt;Samuel Palermo","doi":"10.1109/LSSC.2025.3610901","DOIUrl":"https://doi.org/10.1109/LSSC.2025.3610901","url":null,"abstract":"This letter presents a radiation-hardened (rad-hard) subsampled phase-locked loop (SS-PLL) that achieves state-of-the-art jitter performance while incorporating radiation-hardened techniques to mitigate single-event-upsets (SEUs) present in the space environment. Furthermore, rad-hard techniques are incorporated in each core PLL subblock which include a rad-hard charge-pump Gm cell, a pulser circuit with triple modular redundancy (TMR), and a quad-core voltage-controlled oscillator (VCO) with varactor hardening and LC tail filters. Implemented in a 16-nm FinFET process, the PLL consumes 36.5 mW of power and achieves a jitter of 45.82 fs at 19.5 GHz. Testing at a cyclotron facility verifies robust SEU performance up to an LET of 55 MeV<inline-formula> <tex-math>$cdot $ </tex-math></inline-formula>cm2/mg.","PeriodicalId":13032,"journal":{"name":"IEEE Solid-State Circuits Letters","volume":"8 ","pages":"285-288"},"PeriodicalIF":2.0,"publicationDate":"2025-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145223694","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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