Pub Date : 2024-09-04DOI: 10.1109/tvlsi.2024.3448503
Riccardo Della Sala, Davide Bellizia, Giuseppe Scotti
{"title":"Unveiling the True Power of the Latched Ring Oscillator for a Unified PUF and TRNG Architecture","authors":"Riccardo Della Sala, Davide Bellizia, Giuseppe Scotti","doi":"10.1109/tvlsi.2024.3448503","DOIUrl":"https://doi.org/10.1109/tvlsi.2024.3448503","url":null,"abstract":"","PeriodicalId":13425,"journal":{"name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","volume":null,"pages":null},"PeriodicalIF":2.8,"publicationDate":"2024-09-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142194476","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-09-04DOI: 10.1109/tvlsi.2024.3446235
Pedro T. L. Pereira, Patrícia Ucker L. Costa, Eduardo da Costa, Paulo Flores, Sergio Bampi
{"title":"ReAdapt-II: Energy-Quality Optimizations for VLSI Adaptive Filters Through Automatic Reconfiguration and Built-In Iterative Dividers","authors":"Pedro T. L. Pereira, Patrícia Ucker L. Costa, Eduardo da Costa, Paulo Flores, Sergio Bampi","doi":"10.1109/tvlsi.2024.3446235","DOIUrl":"https://doi.org/10.1109/tvlsi.2024.3446235","url":null,"abstract":"","PeriodicalId":13425,"journal":{"name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","volume":null,"pages":null},"PeriodicalIF":2.8,"publicationDate":"2024-09-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142194478","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-08-30DOI: 10.1109/TVLSI.2024.3447740
Yang Zhou;Wenjie Wang;Longbin Zhu;Zhengtao Zhu;Risheng Su;Jianan Zheng;Siyuan Xie;Jihong Li;Fanyi Meng;Zhijun Zhou;Keping Wang
This brief proposes a parallel multiresidual (PMR) integrator to enhance the noise-shaping (NS) effect for successive approximation register (SAR) analog-to-digital converter (ADC). The PMR employs passive integrators in parallel to simultaneously integrate the average result of the multiple sequential residual voltages. The proposed PMR technique provides an alternative scheme to enhance the NS rather than increasing the order of the integrator to suppress the instability and power. A prototype 7-bit second-order NS-SAR ADC is designed and simulated in a 130-nm CMOS process. PMR increases the effective number of bits (ENOBs) to 10.6 bit, which enhances the NS effect of 3.6 bit. It achieves a peak signal-to-noise and distortion ratio (SNDR) of 65.84 dB over a bandwidth of 1.3 kHz at the oversampling ratio (OSR) of 16.
{"title":"A Second-Order Noise Shaping SAR ADC With Parallel Multiresidual Integrator","authors":"Yang Zhou;Wenjie Wang;Longbin Zhu;Zhengtao Zhu;Risheng Su;Jianan Zheng;Siyuan Xie;Jihong Li;Fanyi Meng;Zhijun Zhou;Keping Wang","doi":"10.1109/TVLSI.2024.3447740","DOIUrl":"10.1109/TVLSI.2024.3447740","url":null,"abstract":"This brief proposes a parallel multiresidual (PMR) integrator to enhance the noise-shaping (NS) effect for successive approximation register (SAR) analog-to-digital converter (ADC). The PMR employs passive integrators in parallel to simultaneously integrate the average result of the multiple sequential residual voltages. The proposed PMR technique provides an alternative scheme to enhance the NS rather than increasing the order of the integrator to suppress the instability and power. A prototype 7-bit second-order NS-SAR ADC is designed and simulated in a 130-nm CMOS process. PMR increases the effective number of bits (ENOBs) to 10.6 bit, which enhances the NS effect of 3.6 bit. It achieves a peak signal-to-noise and distortion ratio (SNDR) of 65.84 dB over a bandwidth of 1.3 kHz at the oversampling ratio (OSR) of 16.","PeriodicalId":13425,"journal":{"name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","volume":null,"pages":null},"PeriodicalIF":2.8,"publicationDate":"2024-08-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142194477","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-08-30DOI: 10.1109/tvlsi.2024.3447111
Haiyue Yan, Yan Ye, Wenjia Li, Xuefei Bai
{"title":"A 0.05–1.5-GHz PVT-Insensitive Digital-to-Time Converter for QKD Applications","authors":"Haiyue Yan, Yan Ye, Wenjia Li, Xuefei Bai","doi":"10.1109/tvlsi.2024.3447111","DOIUrl":"https://doi.org/10.1109/tvlsi.2024.3447111","url":null,"abstract":"","PeriodicalId":13425,"journal":{"name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","volume":null,"pages":null},"PeriodicalIF":2.8,"publicationDate":"2024-08-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142194474","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-08-30DOI: 10.1109/TVLSI.2024.3447903
Vassilis Alimisis;Emmanouil Anastasios Serlis;Andreas Papathanasiou;Nikolaos P. Eleftheriou;Paul P. Sotiriadis
This study introduces a design methodology pertaining to analog hardware architecture for the implementation of the learning vector quantization (LVQ) algorithm. It consists of three main approaches that are separated based on the distance calculation circuit (DCC) and, more specifically; Euclidean distance, Sigmoid function, and Squarer circuits. The main building blocks of each approach are the DCC and the current comparator (CC). The operational principles of the architecture are extensively elucidated and put into practice through a power-efficient configuration (operating less than 650 nW) within a low-voltage setup (0.6 V). Each specific implementation is tested on a brain tumor classification task achieving more than 96.00% classification accuracy. The designs are realized using a 90-nm CMOS process and developed utilizing the Cadence IC Suite for both schematic and physical design. Through a comparative analysis of postlayout simulation outcomes with an equivalent software-based classifier and related works, the accuracy of the applied modeling and design methodologies is validated.
本研究介绍了实现学习矢量量化（LVQ）算法的模拟硬件架构设计方法。它包括基于距离计算电路 (DCC) 的三种主要方法，更具体地说，包括欧氏距离、西格莫函数和 Squarer 电路。每种方法的主要构件是 DCC 和电流比较器 (CC)。通过低电压设置（0.6 V）中的高能效配置（运行功耗小于 650 nW），该架构的运行原理得到了广泛阐释并付诸实践。每个具体实现都在脑肿瘤分类任务中进行了测试，分类准确率超过 96.00%。这些设计采用 90 纳米 CMOS 工艺实现，并利用 Cadence IC Suite 进行原理图和物理设计。通过将布局后仿真结果与基于软件的等效分类器和相关作品进行比较分析，验证了应用建模和设计方法的准确性。
{"title":"Power-Efficient Analog Hardware Architecture of the Learning Vector Quantization Algorithm for Brain Tumor Classification","authors":"Vassilis Alimisis;Emmanouil Anastasios Serlis;Andreas Papathanasiou;Nikolaos P. Eleftheriou;Paul P. Sotiriadis","doi":"10.1109/TVLSI.2024.3447903","DOIUrl":"10.1109/TVLSI.2024.3447903","url":null,"abstract":"This study introduces a design methodology pertaining to analog hardware architecture for the implementation of the learning vector quantization (LVQ) algorithm. It consists of three main approaches that are separated based on the distance calculation circuit (DCC) and, more specifically; Euclidean distance, Sigmoid function, and Squarer circuits. The main building blocks of each approach are the DCC and the current comparator (CC). The operational principles of the architecture are extensively elucidated and put into practice through a power-efficient configuration (operating less than 650 nW) within a low-voltage setup (0.6 V). Each specific implementation is tested on a brain tumor classification task achieving more than 96.00% classification accuracy. The designs are realized using a 90-nm CMOS process and developed utilizing the Cadence IC Suite for both schematic and physical design. Through a comparative analysis of postlayout simulation outcomes with an equivalent software-based classifier and related works, the accuracy of the applied modeling and design methodologies is validated.","PeriodicalId":13425,"journal":{"name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","volume":null,"pages":null},"PeriodicalIF":2.8,"publicationDate":"2024-08-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142194475","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-08-29DOI: 10.1109/TVLSI.2024.3445108
Jafar Vafaei;Omid Akbari
For critical applications that require a higher level of reliability, the triple modular redundancy (TMR) scheme is usually employed to implement fault-tolerant arithmetic units. However, this method imposes a significant area and power/energy overhead. Also, the majority-based voter in the typical TMR designs is highly sensitive to soft errors and the design diversity of the triplicated module, which may result in an error for a small difference between the output of the TMR modules. However, a wide range of applications deployed in critical systems are inherently error-resilient, that is, they can tolerate some inexact results at their output while having a given level of reliability. In this article, we propose a high precision redundancy multiplier (HPR-Mul) that relies on the principles of approximate computing to achieve higher energy efficiency and lower area, as well as resolve the aforementioned challenges of the typical TMR schemes, while retaining the required level of reliability. The HPR-Mul is composed of full precision (FP) and two reduced precision (RP) multipliers, along with a simple voter to determine the output. Unlike the state-of-the-art RP redundancy multipliers (RPR-Muls) that require a complex voter, the voter of the proposed HPR-Mul is designed based on mathematical formulas resulting in a simpler structure. Furthermore, we use the intermediate signals of the FP multiplier as the inputs of the RP multipliers, which significantly enhance the accuracy of the HPR-Mul. The efficiency of the proposed HPR-Mul is evaluated in a 15-nm FinFET technology, where the results show up to 70% and 69% lower power consumption and area, respectively, compared to the typical TMR-based multipliers. Also, the HPR-Mul outperforms the state-of-the-art RPR-Mul by achieving up to 84% higher soft error tolerance. Moreover, by employing the HPR-Mul in different image processing applications, up to 13% higher output image quality is achieved in comparison with the state-of-the-art RPR multipliers.
{"title":"HPR-Mul: An Area and Energy-Efficient High-Precision Redundancy Multiplier by Approximate Computing","authors":"Jafar Vafaei;Omid Akbari","doi":"10.1109/TVLSI.2024.3445108","DOIUrl":"10.1109/TVLSI.2024.3445108","url":null,"abstract":"For critical applications that require a higher level of reliability, the triple modular redundancy (TMR) scheme is usually employed to implement fault-tolerant arithmetic units. However, this method imposes a significant area and power/energy overhead. Also, the majority-based voter in the typical TMR designs is highly sensitive to soft errors and the design diversity of the triplicated module, which may result in an error for a small difference between the output of the TMR modules. However, a wide range of applications deployed in critical systems are inherently error-resilient, that is, they can tolerate some inexact results at their output while having a given level of reliability. In this article, we propose a high precision redundancy multiplier (HPR-Mul) that relies on the principles of approximate computing to achieve higher energy efficiency and lower area, as well as resolve the aforementioned challenges of the typical TMR schemes, while retaining the required level of reliability. The HPR-Mul is composed of full precision (FP) and two reduced precision (RP) multipliers, along with a simple voter to determine the output. Unlike the state-of-the-art RP redundancy multipliers (RPR-Muls) that require a complex voter, the voter of the proposed HPR-Mul is designed based on mathematical formulas resulting in a simpler structure. Furthermore, we use the intermediate signals of the FP multiplier as the inputs of the RP multipliers, which significantly enhance the accuracy of the HPR-Mul. The efficiency of the proposed HPR-Mul is evaluated in a 15-nm FinFET technology, where the results show up to 70% and 69% lower power consumption and area, respectively, compared to the typical TMR-based multipliers. Also, the HPR-Mul outperforms the state-of-the-art RPR-Mul by achieving up to 84% higher soft error tolerance. Moreover, by employing the HPR-Mul in different image processing applications, up to 13% higher output image quality is achieved in comparison with the state-of-the-art RPR multipliers.","PeriodicalId":13425,"journal":{"name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","volume":null,"pages":null},"PeriodicalIF":2.8,"publicationDate":"2024-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142194479","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-08-27DOI: 10.1109/tvlsi.2024.3447164
Yao Li, Junfeng Geng, Mao Ye, Jiaji He, Xiaoxiao Zheng, Qiuwei Wang, Yiqiang Zhao
{"title":"A CMOS Readout Circuit for Resistive Tactile Sensor Array Using Crosstalk Suppression and Nonuniformity Compensation Techniques","authors":"Yao Li, Junfeng Geng, Mao Ye, Jiaji He, Xiaoxiao Zheng, Qiuwei Wang, Yiqiang Zhao","doi":"10.1109/tvlsi.2024.3447164","DOIUrl":"https://doi.org/10.1109/tvlsi.2024.3447164","url":null,"abstract":"","PeriodicalId":13425,"journal":{"name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","volume":null,"pages":null},"PeriodicalIF":2.8,"publicationDate":"2024-08-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142194481","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-08-26DOI: 10.1109/TVLSI.2024.3422690
{"title":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems Publication Information","authors":"","doi":"10.1109/TVLSI.2024.3422690","DOIUrl":"https://doi.org/10.1109/TVLSI.2024.3422690","url":null,"abstract":"","PeriodicalId":13425,"journal":{"name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","volume":null,"pages":null},"PeriodicalIF":2.8,"publicationDate":"2024-08-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10648914","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142077671","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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