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Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)最新文献

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Seppen-Katamuki analysis of electron emission from chemical vapor deposited multiwall carbon nanotubes with and without laser irradiation 激光辐照前后化学气相沉积多壁碳纳米管电子发射的Seppen-Katamuki分析
Y. Gotoh, Y. Kawamura, K. Ishizu, H. Tsuji, J. Ishikawa, S. Nakata, S. Okuda
Electron emission property of the CNTs was investigated with and without laser irradiation, in order to investigate the mechanism of alteration of emission properties due to laser irradiation. Analysis was made with an aid of S-K analysis.
研究了激光辐照和不辐照下CNTs的电子发射性能,探讨激光辐照改变其发射性能的机理。采用S-K分析法进行分析。
{"title":"Seppen-Katamuki analysis of electron emission from chemical vapor deposited multiwall carbon nanotubes with and without laser irradiation","authors":"Y. Gotoh, Y. Kawamura, K. Ishizu, H. Tsuji, J. Ishikawa, S. Nakata, S. Okuda","doi":"10.1109/IVNC.2004.1354889","DOIUrl":"https://doi.org/10.1109/IVNC.2004.1354889","url":null,"abstract":"Electron emission property of the CNTs was investigated with and without laser irradiation, in order to investigate the mechanism of alteration of emission properties due to laser irradiation. Analysis was made with an aid of S-K analysis.","PeriodicalId":137345,"journal":{"name":"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)","volume":"138 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134358575","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Study of the driving performances with different structures of field emission displays 场致发射显示器不同结构驱动性能的研究
Zhang Yuning, Lei Wei, Zhang Xiaobing, Liu Ao, Zong Geng, M. Xiaoyan, W. Qilong
In this paper, some optimum field emission displays (FEDs) elements are proposed using numerical analyses to improve the emission performances, to decrease the driving voltage and to improve other driving performances of these devices with different structures like diode structure, normal-gate structure, and under-gate structure.
本文通过数值分析,提出了几种最优场发射显示器元件,以改善二极管结构、正栅极结构和栅极下结构等不同结构器件的发射性能、降低驱动电压和其他驱动性能。
{"title":"Study of the driving performances with different structures of field emission displays","authors":"Zhang Yuning, Lei Wei, Zhang Xiaobing, Liu Ao, Zong Geng, M. Xiaoyan, W. Qilong","doi":"10.1109/IVNC.2004.1354915","DOIUrl":"https://doi.org/10.1109/IVNC.2004.1354915","url":null,"abstract":"In this paper, some optimum field emission displays (FEDs) elements are proposed using numerical analyses to improve the emission performances, to decrease the driving voltage and to improve other driving performances of these devices with different structures like diode structure, normal-gate structure, and under-gate structure.","PeriodicalId":137345,"journal":{"name":"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)","volume":"136 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133355108","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Field emission-from arrays of free-standing carbon nanotubes grown by ICP-CVD 由ICP-CVD生长的独立碳纳米管阵列的场发射
S. Tseng, S. Tsai, B. Yao, Y.K. Lee, K. Leou, C. Tsai
Carbon nanotubes (CNTs) have been considered as a prime candidate material of cold cathode emitter for field emission (FE) application. No matter whether the cathode assembly is fabricated by screen printing or in-situ chemical vapor deposition (CVD), the strict requirement of high emission uniformity on a large area display panel still remains a great challenge. There have been a large amount of publications demonstrating the ability of growing large area patterned well-aligned multi-walled carbon nanotubes with uniform diameter and height by thermal CVD. The field emission performance however was hampered due to high carbon nanotube density (> 10/sup 8/ cm/sup -2/) and low emission density (/spl sim/10/sup 4/ cm/sup -2/), which is not attributed solely to the electrical field screening effect. In this report, we used electron beam lithography (EBL) followed by metal deposition/lift-off to define the position and size of nickel catalyst and grew CNTs using inductively-coupled plasma (ICP) CVD. The EBL has been proven to be a straight forward method to define an array of catalyst metal dots with designated size and inter-distance. The ICP-CVD has been shown to grow free-standing vertically-aligned CNTs with uniform diameter and height. And then a gripper-type nano-object manipulation assembly inside a scanning electron microscope (SEM) was utilized to measure the field emission from individual carbon nanotube.
碳纳米管(CNTs)已被认为是场发射(FE)冷阴极发射材料的主要候选材料。无论阴极组件是采用丝网印刷还是原位化学气相沉积(CVD)制造,对大面积显示面板的高发射均匀性的严格要求仍然是一个巨大的挑战。已经有大量的出版物证明了热气相沉积法可以生长具有均匀直径和高度的大面积图案排列良好的多壁碳纳米管。然而,高碳纳米管密度(> 10/sup 8/ cm/sup -2/)和低碳纳米管密度(/spl sim/10/sup 4/ cm/sup -2/)阻碍了场发射性能,而这不仅仅是电场屏蔽效应造成的。在本报告中,我们使用电子束光刻(EBL),然后金属沉积/升空来确定镍催化剂的位置和尺寸,并使用电感耦合等离子体(ICP) CVD生长碳纳米管。EBL已被证明是一种直接的方法来定义具有指定尺寸和间距的催化剂金属点阵列。ICP-CVD已被证明可以生长出具有均匀直径和高度的独立垂直排列的CNTs。然后利用扫描电子显微镜(SEM)内的夹持式纳米物体操纵组件测量单个碳纳米管的场发射。
{"title":"Field emission-from arrays of free-standing carbon nanotubes grown by ICP-CVD","authors":"S. Tseng, S. Tsai, B. Yao, Y.K. Lee, K. Leou, C. Tsai","doi":"10.1109/IVNC.2004.1354911","DOIUrl":"https://doi.org/10.1109/IVNC.2004.1354911","url":null,"abstract":"Carbon nanotubes (CNTs) have been considered as a prime candidate material of cold cathode emitter for field emission (FE) application. No matter whether the cathode assembly is fabricated by screen printing or in-situ chemical vapor deposition (CVD), the strict requirement of high emission uniformity on a large area display panel still remains a great challenge. There have been a large amount of publications demonstrating the ability of growing large area patterned well-aligned multi-walled carbon nanotubes with uniform diameter and height by thermal CVD. The field emission performance however was hampered due to high carbon nanotube density (> 10/sup 8/ cm/sup -2/) and low emission density (/spl sim/10/sup 4/ cm/sup -2/), which is not attributed solely to the electrical field screening effect. In this report, we used electron beam lithography (EBL) followed by metal deposition/lift-off to define the position and size of nickel catalyst and grew CNTs using inductively-coupled plasma (ICP) CVD. The EBL has been proven to be a straight forward method to define an array of catalyst metal dots with designated size and inter-distance. The ICP-CVD has been shown to grow free-standing vertically-aligned CNTs with uniform diameter and height. And then a gripper-type nano-object manipulation assembly inside a scanning electron microscope (SEM) was utilized to measure the field emission from individual carbon nanotube.","PeriodicalId":137345,"journal":{"name":"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133520640","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Preparation of aligned Cu/sub 2/S nanowire arrays and their field emission properties Cu/sub /S纳米线阵列的制备及其场发射性能
Q.B. Wu, S. Ren, S. Deng, Jun Chen, N. Xu
Large-area and well-aligned Cu/sub 2/S nanowire arrays were fabricated by gas-solid reaction. X-ray diffraction and scanning-electron microscopy (SEM) were employed to characterize the nanowire arrays. The Cu/sub 2/S nanowire arrays grown on copper film were 50-200 nm in diameter and several micrometers long. Also, the field emission characteristics of the nanowires were studied in this work.
采用气固反应制备了大面积排列良好的Cu/sub 2/S纳米线阵列。采用x射线衍射和扫描电镜(SEM)对纳米线阵列进行了表征。在铜膜上生长的Cu/sub 2/S纳米线阵列直径为50 ~ 200 nm,长度为几微米。同时对纳米线的场发射特性进行了研究。
{"title":"Preparation of aligned Cu/sub 2/S nanowire arrays and their field emission properties","authors":"Q.B. Wu, S. Ren, S. Deng, Jun Chen, N. Xu","doi":"10.1109/IVNC.2004.1354951","DOIUrl":"https://doi.org/10.1109/IVNC.2004.1354951","url":null,"abstract":"Large-area and well-aligned Cu/sub 2/S nanowire arrays were fabricated by gas-solid reaction. X-ray diffraction and scanning-electron microscopy (SEM) were employed to characterize the nanowire arrays. The Cu/sub 2/S nanowire arrays grown on copper film were 50-200 nm in diameter and several micrometers long. Also, the field emission characteristics of the nanowires were studied in this work.","PeriodicalId":137345,"journal":{"name":"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128686058","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Double-gated silicon field emission arrays: fabrication and characterization 双门控硅场发射阵列:制造与表征
L. Chen, A. Akinwande
In this work, the gate field factor and focus field factor were examined in the double-gated field emission array (FEA) and were shown to have strong influence on the initial beam spread. The optical measurement verified that the device with the tip below the gate aperture provides a small beam spread.
本文研究了双门场发射阵列(FEA)中栅极场因子和聚焦场因子对光束初始扩散的影响。光学测量证实,器件的尖端低于栅极孔径提供了一个小的光束传播。
{"title":"Double-gated silicon field emission arrays: fabrication and characterization","authors":"L. Chen, A. Akinwande","doi":"10.1109/IVNC.2004.1354971","DOIUrl":"https://doi.org/10.1109/IVNC.2004.1354971","url":null,"abstract":"In this work, the gate field factor and focus field factor were examined in the double-gated field emission array (FEA) and were shown to have strong influence on the initial beam spread. The optical measurement verified that the device with the tip below the gate aperture provides a small beam spread.","PeriodicalId":137345,"journal":{"name":"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132878173","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Influence of image force potential on the shot noise properties of field emitters 像力势对场发射体散粒噪声特性的影响
K. Rangaswamy, M. Cahay, K. Jensen
A quantum-mechanical wave impedance approach is used to calculate the shot noise power spectrum of the emission current from planar metallic cathodes starting with the Landauer-Buttiker formalism. The formalism takes into account the effects of the image force potential in front of the cathode. For metals with low work-function, the Fano factor which characterizes the reduction of the shot noise power below the Schottky result is calculated as a function of the applied external electric field. Simple analytical expressions for the Fano factor are derived for the cathode operated in the thermionic (Richardson) and tunneling regimes (Fowler-Nordheim approximation). The value of the Fano factor is found to be reduced substantially below the value calculated when the effects of the image charge potential are neglected. The approach can be readily extended to include space-charge effects in the vacuum gap.
从Landauer-Buttiker形式出发,采用量子力学波阻抗法计算了平面金属阴极发射电流的散粒噪声功率谱。该公式考虑了阴极前像力势的影响。对于功函数较低的金属,表征弹射噪声功率降至肖特基结果以下的Fano因子作为外加电场的函数来计算。对于在热离子(Richardson)和隧道(Fowler-Nordheim近似)下工作的阴极,导出了Fano因子的简单解析表达式。当忽略像电荷势的影响时,发现Fano因子的值大大降低,低于计算值。该方法可以很容易地扩展到包括真空间隙中的空间电荷效应。
{"title":"Influence of image force potential on the shot noise properties of field emitters","authors":"K. Rangaswamy, M. Cahay, K. Jensen","doi":"10.1109/IVNC.2004.1354907","DOIUrl":"https://doi.org/10.1109/IVNC.2004.1354907","url":null,"abstract":"A quantum-mechanical wave impedance approach is used to calculate the shot noise power spectrum of the emission current from planar metallic cathodes starting with the Landauer-Buttiker formalism. The formalism takes into account the effects of the image force potential in front of the cathode. For metals with low work-function, the Fano factor which characterizes the reduction of the shot noise power below the Schottky result is calculated as a function of the applied external electric field. Simple analytical expressions for the Fano factor are derived for the cathode operated in the thermionic (Richardson) and tunneling regimes (Fowler-Nordheim approximation). The value of the Fano factor is found to be reduced substantially below the value calculated when the effects of the image charge potential are neglected. The approach can be readily extended to include space-charge effects in the vacuum gap.","PeriodicalId":137345,"journal":{"name":"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125712277","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Field emission from teepee-shaped carbon nanotube bundles 锥形碳纳米管束的场发射
H. Busta, Z. Toit, J. Montgomery, A. Feinerman
Carbon nanotubes were fabricated close together so that their separation is smaller than their height and field enhancement effects at the apexes of the tubes are diminished due to electrostatic shielding. Bundling was achieved by embedding the tubes into a PCVD silicon dioxide, followed by HF etching, water rinsing, and nitrogen drying. Emission measurements were performed in a vacuum system at a pressure of 4 /spl times/ 10/sup -9/ Torr. Current-voltage characteristics were obtained at room temperature, 120 /spl deg/C and 170 /spl deg/C. Macroscopic current densities of /sup 2/0 mA/cm/sup 2/ were obtained with a 0.5 mm diameter tungsten anode. The turn-on fields are about 15 V//spl mu/m.
碳纳米管被紧密地组装在一起,使得它们的间距小于它们的高度,并且由于静电屏蔽而减弱了碳纳米管顶端的场增强效应。捆扎是通过将管嵌入PCVD二氧化硅中,然后进行HF蚀刻,水冲洗和氮干燥来实现的。发射测量在真空系统中进行,压力为4 /spl倍/ 10/sup -9/ Torr。在室温、120 /spl°C和170 /spl°C下获得了电流-电压特性。在直径为0.5 mm的钨阳极上,获得了/sup 2/0 mA/cm/sup 2/的宏观电流密度。导通场约为15v //spl mu/m。
{"title":"Field emission from teepee-shaped carbon nanotube bundles","authors":"H. Busta, Z. Toit, J. Montgomery, A. Feinerman","doi":"10.1116/1.1885009","DOIUrl":"https://doi.org/10.1116/1.1885009","url":null,"abstract":"Carbon nanotubes were fabricated close together so that their separation is smaller than their height and field enhancement effects at the apexes of the tubes are diminished due to electrostatic shielding. Bundling was achieved by embedding the tubes into a PCVD silicon dioxide, followed by HF etching, water rinsing, and nitrogen drying. Emission measurements were performed in a vacuum system at a pressure of 4 /spl times/ 10/sup -9/ Torr. Current-voltage characteristics were obtained at room temperature, 120 /spl deg/C and 170 /spl deg/C. Macroscopic current densities of /sup 2/0 mA/cm/sup 2/ were obtained with a 0.5 mm diameter tungsten anode. The turn-on fields are about 15 V//spl mu/m.","PeriodicalId":137345,"journal":{"name":"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126296145","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Field emission properties of selectively grown carbon nanotubes for electron emitters in microwave power amplifier 微波功率放大器中选择性生长碳纳米管电子发射体的场发射特性
Jae-Hee Han, S. Lee, A. Berdinsky, J. Yoo, Chong-Yun Park, J. J. Choi, T. Jung, I. Han, J. M. Kim
We have directly grown CNTs on the metal substrates by direct-current plasma-enhanced chemical-vapor deposition (DC-PECVD) using a gas mixture of C/sub 2/H/sub 2/ and NH/sub 3/ at relatively low temperature (550 /spl deg/C). In this study, we report field emission properties of CNTs depending on pattern sizes and spacings. Field-emission characteristic of CNTs was evaluated in a vacuum of 10/sup -6/ Torr in a parallel diode configuration. It is found that there is a correlation between pattern morphologies (such as window area, spacing, and dimension of window edge, etc.) and the field-emission properties. Furthermore, we found that the contact resistance between CNTs and substrate is a crucial factor for the saturation of field emission from CNTs.
我们使用C/sub 2/H/sub 2/和NH/sub 3/的混合气体,在相对较低的温度(550 /spl℃)下,通过直流等离子体增强化学气相沉积(DC-PECVD)在金属衬底上直接生长了碳纳米管。在这项研究中,我们报道了碳纳米管的场发射特性取决于图案尺寸和间距。在并联二极管结构中,在10/sup -6/ Torr的真空中评估了CNTs的场发射特性。结果表明,窗口面积、窗口间距、窗口边缘尺寸等图形形态与场发射特性之间存在一定的相关性。此外,我们发现碳纳米管与衬底之间的接触电阻是碳纳米管场发射饱和的关键因素。
{"title":"Field emission properties of selectively grown carbon nanotubes for electron emitters in microwave power amplifier","authors":"Jae-Hee Han, S. Lee, A. Berdinsky, J. Yoo, Chong-Yun Park, J. J. Choi, T. Jung, I. Han, J. M. Kim","doi":"10.1109/IVNC.2004.1354890","DOIUrl":"https://doi.org/10.1109/IVNC.2004.1354890","url":null,"abstract":"We have directly grown CNTs on the metal substrates by direct-current plasma-enhanced chemical-vapor deposition (DC-PECVD) using a gas mixture of C/sub 2/H/sub 2/ and NH/sub 3/ at relatively low temperature (550 /spl deg/C). In this study, we report field emission properties of CNTs depending on pattern sizes and spacings. Field-emission characteristic of CNTs was evaluated in a vacuum of 10/sup -6/ Torr in a parallel diode configuration. It is found that there is a correlation between pattern morphologies (such as window area, spacing, and dimension of window edge, etc.) and the field-emission properties. Furthermore, we found that the contact resistance between CNTs and substrate is a crucial factor for the saturation of field emission from CNTs.","PeriodicalId":137345,"journal":{"name":"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127658501","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Calculations of enhanced field electron emission at the triple junction 三结处增强场电子发射的计算
M. Chung, T. S. Choi, P. H. Cutler, N. Miskovsky
Numerical calculations of the field enhancement were carried out for a finite geometry of triple junction which consists of a half space of metal, a quarter space of dielectric and a quarter space of vacuum. The electric field F was analytically obtained as a function of geometry and dielectric constant. It was found that the enhancement factor is approximately 50 and 20 in the vacuum and the dielectric regions, respectively. It was also found that the metallic size and dielectric constant only determines the field intensity but not the enhancement of the field. Taking into account the space charge effect produced by strong field, the enhancement of field emission becomes larger.
对由半金属空间、四分之一介电空间和四分之一真空空间组成的有限几何三结进行了场增强的数值计算。电场F是几何和介电常数的函数。结果表明,真空区和介电区的增强系数分别约为50和20。还发现金属尺寸和介电常数只决定场强度,而不决定场的增强。考虑到强场产生的空间电荷效应,场发射的增强更大。
{"title":"Calculations of enhanced field electron emission at the triple junction","authors":"M. Chung, T. S. Choi, P. H. Cutler, N. Miskovsky","doi":"10.1109/IVNC.2004.1354962","DOIUrl":"https://doi.org/10.1109/IVNC.2004.1354962","url":null,"abstract":"Numerical calculations of the field enhancement were carried out for a finite geometry of triple junction which consists of a half space of metal, a quarter space of dielectric and a quarter space of vacuum. The electric field F was analytically obtained as a function of geometry and dielectric constant. It was found that the enhancement factor is approximately 50 and 20 in the vacuum and the dielectric regions, respectively. It was also found that the metallic size and dielectric constant only determines the field intensity but not the enhancement of the field. Taking into account the space charge effect produced by strong field, the enhancement of field emission becomes larger.","PeriodicalId":137345,"journal":{"name":"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)","volume":"115 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124564172","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Ring-shaped images as a result of non-uniform field emission from capped carbon nanotubes 碳纳米管非均匀场发射的环形图像
L. Filip, D. Nicolaescu, S. Kanemaru, J. Itoh
Ring-shaped images may appear under high field emission conditions for very thin carbon nanotubes (CNTs). Such image patterns cannot be explained by the corresponding field enhancement only. A model for electron field emission from the CNT is developed. The model refers to a capped nanotube (with cylindrical body and hemispherical cap). It is assumed that for high emission currents/high local temperatures, part of the electrons behave as quasi-free. As a result, the spatial confinement quantization of their states appears. The Schrodinger equation for the single electron can be solved separately on the cylindrical and spherical parts of the structure and the corresponding solutions can be connected smoothly at the circular intersection of the two regions. Many electronic states that are possible on the two regions separately turn out to be forbidden for the capped nanotube. The selection of the possible electronic states under the aforementioned complex conditions is determined by the geometric parameters of the tube, namely the ratio between its length and diameter. The occupation of the allowed one- electron states is considered as governed by the usual Fermi statistics. Together with the quantum probability of finding an electron in some specified area of the surface, this gives the electron distribution on the tube, which is one of the key factors determining the electron field emission from the CNT. Another key factor is the applied extraction field. The extraction field has been numerically computed using Simion nanotube-on-post diode configuration.
对于非常薄的碳纳米管(CNTs),在高场发射条件下会出现环状图像。这样的图像模式不能仅仅通过相应的场增强来解释。建立了碳纳米管的电子场发射模型。模型为带帽纳米管(体为圆柱形,帽为半球形)。假设在高发射电流/高局部温度下,部分电子表现为准自由状态。结果,它们的状态出现了空间约束量子化。单电子的薛定谔方程可以在结构的圆柱部分和球面部分分别求解,对应的解可以在两个区域的圆形交叉处平滑连接。在这两个区域上可能存在的许多电子态,在被封顶的纳米管上是被禁止的。在上述复杂条件下可能的电子态的选择取决于电子管的几何参数,即电子管的长径比。允许的单电子态的占据被认为是由通常的费米统计控制的。结合在表面某一特定区域找到电子的量子概率,给出了电子管上的电子分布,这是决定碳纳米管电子场发射的关键因素之一。另一个关键因素是应用的提取领域。采用Simion纳米管-柱上二极管结构对萃取场进行了数值计算。
{"title":"Ring-shaped images as a result of non-uniform field emission from capped carbon nanotubes","authors":"L. Filip, D. Nicolaescu, S. Kanemaru, J. Itoh","doi":"10.1116/1.1864059","DOIUrl":"https://doi.org/10.1116/1.1864059","url":null,"abstract":"Ring-shaped images may appear under high field emission conditions for very thin carbon nanotubes (CNTs). Such image patterns cannot be explained by the corresponding field enhancement only. A model for electron field emission from the CNT is developed. The model refers to a capped nanotube (with cylindrical body and hemispherical cap). It is assumed that for high emission currents/high local temperatures, part of the electrons behave as quasi-free. As a result, the spatial confinement quantization of their states appears. The Schrodinger equation for the single electron can be solved separately on the cylindrical and spherical parts of the structure and the corresponding solutions can be connected smoothly at the circular intersection of the two regions. Many electronic states that are possible on the two regions separately turn out to be forbidden for the capped nanotube. The selection of the possible electronic states under the aforementioned complex conditions is determined by the geometric parameters of the tube, namely the ratio between its length and diameter. The occupation of the allowed one- electron states is considered as governed by the usual Fermi statistics. Together with the quantum probability of finding an electron in some specified area of the surface, this gives the electron distribution on the tube, which is one of the key factors determining the electron field emission from the CNT. Another key factor is the applied extraction field. The extraction field has been numerically computed using Simion nanotube-on-post diode configuration.","PeriodicalId":137345,"journal":{"name":"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121074270","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
期刊
Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)
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