Pub Date : 2013-03-31DOI: 10.4236/WJNSE.2013.31002
Mohammad Kazemi Pilehrood, P. Heikkilä, A. Harlin
Due to their unique structural features, electrospun membranes have gained considerable attention for use in applications where quality of depth filtration is a dominant performance factor. To elucidate the depth filtration phenomena it is important to quantify the intrinsic structural properties independent from the dynamics of transport media. Several methods have been proposed for structural characterization of such membranes. However, these methods do not meet the requirement for the quantification of intrinsic structural properties in depth filtration. This may be due to the complex influence of transport media dynamics and structural elements in the depth filtration process. In addition, the different morphological architectures of electrospun membranes present obstacles to precise quantification. This paper seeks to quantify the structural characteristics of electrospun membranes by introducing a robust image analysis technique and exploiting it to evaluate the permeation-filtration mechanism. To this end, a nanostructured fibrous network was simulated as an ideal membrane using adaptive local criteria in the image analysis. The reliability of the proposed approach was validated with measurements and comparison of structural characteristics in different morphological conditions. The results were found to be well compatible with empirical observations of perfect membrane structures. This approach, based on optimization of electrospinning parameters, may pave the way for producing optimal membrane structures for boosting the performance of electrospun membranes in end-use applications.
{"title":"Simulation of Structural Characteristics and Depth Filtration Elements in Interconnected Nanofibrous Membrane Based on Adaptive Image Analysis","authors":"Mohammad Kazemi Pilehrood, P. Heikkilä, A. Harlin","doi":"10.4236/WJNSE.2013.31002","DOIUrl":"https://doi.org/10.4236/WJNSE.2013.31002","url":null,"abstract":"Due to their unique structural features, electrospun membranes have gained considerable attention for use in applications where quality of depth filtration is a dominant performance factor. To elucidate the depth filtration phenomena it is important to quantify the intrinsic structural properties independent from the dynamics of transport media. Several methods have been proposed for structural characterization of such membranes. However, these methods do not meet the requirement for the quantification of intrinsic structural properties in depth filtration. This may be due to the complex influence of transport media dynamics and structural elements in the depth filtration process. In addition, the different morphological architectures of electrospun membranes present obstacles to precise quantification. This paper seeks to quantify the structural characteristics of electrospun membranes by introducing a robust image analysis technique and exploiting it to evaluate the permeation-filtration mechanism. To this end, a nanostructured fibrous network was simulated as an ideal membrane using adaptive local criteria in the image analysis. The reliability of the proposed approach was validated with measurements and comparison of structural characteristics in different morphological conditions. The results were found to be well compatible with empirical observations of perfect membrane structures. This approach, based on optimization of electrospinning parameters, may pave the way for producing optimal membrane structures for boosting the performance of electrospun membranes in end-use applications.","PeriodicalId":66816,"journal":{"name":"纳米科学与工程(英文)","volume":"3 1","pages":"6-16"},"PeriodicalIF":0.0,"publicationDate":"2013-03-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"70877366","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2013-03-31DOI: 10.4236/WJNSE.2013.31001
Bei Jin, Xiaosong Zhou, Xuyao Xu, Lin Ma, Zhijun Wu, Yingshan Huang
In this paper, preparation and characterization of C@Ag/TiO2 nanospheres compound photocatalysts was reported. C@Ag nanosphere was firstly synthesized via hydrothermal reaction, and followed by a sol-gel process to obtain the functionalized C@Ag/TiO2 nanosphere which has highly efficient visible light catalytic ability towards methyl orange (MO). The morphology of the obtained compound was characterized by scanning electron microscopy (SEM) and transmission electron microscopy (TEM) technologies. From which we can see that the as-prepared samples show a spherical structure with a diameter of approximately 200 nm, and the silver particle in core was about 10 nm. The catalytic ability of the synthesized photocatalysts under visible light irradiation shows that C@Ag/TiO2 possesses higher photocatalytic activity towards MO degradation than that of N-P25 (TiO2). Furthermore, the C@Ag/TiO2 photocatalysts exhibited excellent reusability with almost no change after five runs. Finally, the possible photocatalytic mechanism of catalyst under visible light was discussion and proposed.
{"title":"C@Ag/TiO 2 : A Highly Efficient and Stable Photocatalyst Active under Visible Light","authors":"Bei Jin, Xiaosong Zhou, Xuyao Xu, Lin Ma, Zhijun Wu, Yingshan Huang","doi":"10.4236/WJNSE.2013.31001","DOIUrl":"https://doi.org/10.4236/WJNSE.2013.31001","url":null,"abstract":"In this paper, preparation and characterization of C@Ag/TiO2 nanospheres compound photocatalysts was reported. C@Ag nanosphere was firstly synthesized via hydrothermal reaction, and followed by a sol-gel process to obtain the functionalized C@Ag/TiO2 nanosphere which has highly efficient visible light catalytic ability towards methyl orange (MO). The morphology of the obtained compound was characterized by scanning electron microscopy (SEM) and transmission electron microscopy (TEM) technologies. From which we can see that the as-prepared samples show a spherical structure with a diameter of approximately 200 nm, and the silver particle in core was about 10 nm. The catalytic ability of the synthesized photocatalysts under visible light irradiation shows that C@Ag/TiO2 possesses higher photocatalytic activity towards MO degradation than that of N-P25 (TiO2). Furthermore, the C@Ag/TiO2 photocatalysts exhibited excellent reusability with almost no change after five runs. Finally, the possible photocatalytic mechanism of catalyst under visible light was discussion and proposed.","PeriodicalId":66816,"journal":{"name":"纳米科学与工程(英文)","volume":"03 1","pages":"1-5"},"PeriodicalIF":0.0,"publicationDate":"2013-03-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"70876981","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-12-11DOI: 10.4236/WJNSE.2012.24023
A. Touati, S. Chatbouri, N. Sghaier, A. Kalboussi
Multi Tunnel Junctions (MTJs) have attracted much attention recently in the fields of Single-Electron Transistor (SET) and Single-Electron Memory (SEM). In this paper, we investigate a nano-device structure using a two one dimensional array MTJs connected to the basic Single Electron Circuits, in order to analyze the impact of physical parameters on the performances and application of this structure. The device generates can operate at room temperature. The simulation of single-electron circuit demonstrates with Monte Carlo simulator, SIMON.
{"title":"Study of Two One-Dimensional Multi Tunnel Junctions Arrays Structures by SIMON","authors":"A. Touati, S. Chatbouri, N. Sghaier, A. Kalboussi","doi":"10.4236/WJNSE.2012.24023","DOIUrl":"https://doi.org/10.4236/WJNSE.2012.24023","url":null,"abstract":"Multi Tunnel Junctions (MTJs) have attracted much attention recently in the fields of Single-Electron Transistor (SET) and Single-Electron Memory (SEM). In this paper, we investigate a nano-device structure using a two one dimensional array MTJs connected to the basic Single Electron Circuits, in order to analyze the impact of physical parameters on the performances and application of this structure. The device generates can operate at room temperature. The simulation of single-electron circuit demonstrates with Monte Carlo simulator, SIMON.","PeriodicalId":66816,"journal":{"name":"纳米科学与工程(英文)","volume":"02 1","pages":"176-180"},"PeriodicalIF":0.0,"publicationDate":"2012-12-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"70876817","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-12-11DOI: 10.4236/WJNSE.2012.24026
S. Behera, J. Patra, K. Pramanik, N. Panda, H. Thatoi
The iron oxide nanoparticles have been synthesized in co-precipitation method using aqueous solution of ferric and ferrous ions with sodium salt. The synthesis of iron-oxide nanoparticles were validated by UV-Visible spectroscopy which showed higher peak at 370 nm as valid standard reference. An average size of iron oxide nanoparticle found by Diffraction Light scattering (DLS) particle size analyser, ranges approximately between 10 nm to 120 nm with mean particle size of 66 nm. The X-ray power diffraction (XRD) analysis revealed the crystallographic structure of magnetic particles. Characterization of the mean particle size and morphology of iron oxide nanoparticles confirmed that the iron oxide nanoparticles are nearly spherical and crystalline in shape. Further the antibacterial effect of iron oxide nanoparticles was evaluated against ten pathogenic bacteria which showed that the nanoparticles have moderate antibacterial activity against both Gram positive and Gram negative pathogenic bacterial strains and retains potential application in pharmaceutical and biomedical industries.
{"title":"Characterization and Evaluation of Antibacterial Activities of Chemically Synthesized Iron Oxide Nanoparticles","authors":"S. Behera, J. Patra, K. Pramanik, N. Panda, H. Thatoi","doi":"10.4236/WJNSE.2012.24026","DOIUrl":"https://doi.org/10.4236/WJNSE.2012.24026","url":null,"abstract":"The iron oxide nanoparticles have been synthesized in co-precipitation method using aqueous solution of ferric and ferrous ions with sodium salt. The synthesis of iron-oxide nanoparticles were validated by UV-Visible spectroscopy which showed higher peak at 370 nm as valid standard reference. An average size of iron oxide nanoparticle found by Diffraction Light scattering (DLS) particle size analyser, ranges approximately between 10 nm to 120 nm with mean particle size of 66 nm. The X-ray power diffraction (XRD) analysis revealed the crystallographic structure of magnetic particles. Characterization of the mean particle size and morphology of iron oxide nanoparticles confirmed that the iron oxide nanoparticles are nearly spherical and crystalline in shape. Further the antibacterial effect of iron oxide nanoparticles was evaluated against ten pathogenic bacteria which showed that the nanoparticles have moderate antibacterial activity against both Gram positive and Gram negative pathogenic bacterial strains and retains potential application in pharmaceutical and biomedical industries.","PeriodicalId":66816,"journal":{"name":"纳米科学与工程(英文)","volume":"02 1","pages":"196-200"},"PeriodicalIF":0.0,"publicationDate":"2012-12-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"70876865","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-12-11DOI: 10.4236/WJNSE.2012.24025
T. Yamaguchi, K. Saitoh
Stress and strain in the structure of self-assembled quantum dots constructed in the Ge/Si(001) system is calculated by using molecular dynamics simulation. Pyramidal hut cluster composed of Ge crystal with {105} facets surfaces observed in the early growth stage are computationally modeled. We calculate atomic stress and strain in relaxed pyramidal structure. Atomic stress for triplet of atoms is approximately defined as an average value of pairwise (virial) quantity inside triplet, which is the product of vectors between each two atoms. Atomic strain by means of atomic strain measure (ASM) which is formulated on the Green’s definition of continuum strain. We find the stress (strain) relaxation in pyramidal structure and stress (strain) concentration in the edge of pyramidal structure. We discuss size dependency of stress and strain distribution in pyramidal structure. The relationship between hydrostatic stress and atomic volumetric strain is basically linear for all models, but for the surface of pyramidal structure and Ge-Si interface. This means that there is a reasonable correlation between atomic stress proposed in the present study and atomic strain measure, ASM.
{"title":"Molecular Dynamics Study on Mechanical Properties in the Structure of Self-Assembled Quantum Dot","authors":"T. Yamaguchi, K. Saitoh","doi":"10.4236/WJNSE.2012.24025","DOIUrl":"https://doi.org/10.4236/WJNSE.2012.24025","url":null,"abstract":"Stress and strain in the structure of self-assembled quantum dots constructed in the Ge/Si(001) system is calculated by using molecular dynamics simulation. Pyramidal hut cluster composed of Ge crystal with {105} facets surfaces observed in the early growth stage are computationally modeled. We calculate atomic stress and strain in relaxed pyramidal structure. Atomic stress for triplet of atoms is approximately defined as an average value of pairwise (virial) quantity inside triplet, which is the product of vectors between each two atoms. Atomic strain by means of atomic strain measure (ASM) which is formulated on the Green’s definition of continuum strain. We find the stress (strain) relaxation in pyramidal structure and stress (strain) concentration in the edge of pyramidal structure. We discuss size dependency of stress and strain distribution in pyramidal structure. The relationship between hydrostatic stress and atomic volumetric strain is basically linear for all models, but for the surface of pyramidal structure and Ge-Si interface. This means that there is a reasonable correlation between atomic stress proposed in the present study and atomic strain measure, ASM.","PeriodicalId":66816,"journal":{"name":"纳米科学与工程(英文)","volume":"02 1","pages":"189-195"},"PeriodicalIF":0.0,"publicationDate":"2012-12-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"70876857","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-12-11DOI: 10.4236/WJNSE.2012.24024
A. M. E. Sherbini, A. Aboulfotouh, F. F. Rashid, S. Allam, Ashraf El Dakrouri, T. E. Sherbini
In this article, we will report an experimental evidence of enhanced LIBS emission upon replacing a Bulk-Based ZnO target by the corresponding Nano-Based target. The plasma was initiated via interaction of a Nd:YAG laser at the fundamental wavelength with both targets in open air under the same experimental conditions. The measurements show an enhanced emission from the Zn I-lines at the wavelengths of 328.26, 330.29, 334.55, 468.06, 472.2, 481.01, 636.38 nm. The measurements were repeated at different delay times in the range from 1 to 5 μs at constant irradiation level and fixed gate time of 1 μs. The average enhancement over the different Zn I-lines was found increases exponentially up to 8-fold with delay time. The electron density to each plasma was measured utilizing the Hα-line appeared in the emitted spectra from each plasma and was found to give similar values. The electron temperatures were measured via Boltzmann plot method utilizing the relative intensities of the Zn I-lines and were found to give very close values. Moreover, the relative population density of the ground state of the zinc atoms (relative concentration) was measured spectroscopically utilizing the Boltzmann plot method and was found to increase in a very similar trend to that of enhancement. The results of the spectroscopic analysis conclude that these signal enhancements can be attributed to the higher concentration of neutral atoms in the Nano-Based material plasma with respect to the corresponding Bulk-based ZnO material.
{"title":"Observed Enhancement in LIBS Signals from Nano vs. Bulk ZnO Targets: Comparative Study of Plasma Parameters","authors":"A. M. E. Sherbini, A. Aboulfotouh, F. F. Rashid, S. Allam, Ashraf El Dakrouri, T. E. Sherbini","doi":"10.4236/WJNSE.2012.24024","DOIUrl":"https://doi.org/10.4236/WJNSE.2012.24024","url":null,"abstract":"In this article, we will report an experimental evidence of enhanced LIBS emission upon replacing a Bulk-Based ZnO target by the corresponding Nano-Based target. The plasma was initiated via interaction of a Nd:YAG laser at the fundamental wavelength with both targets in open air under the same experimental conditions. The measurements show an enhanced emission from the Zn I-lines at the wavelengths of 328.26, 330.29, 334.55, 468.06, 472.2, 481.01, 636.38 nm. The measurements were repeated at different delay times in the range from 1 to 5 μs at constant irradiation level and fixed gate time of 1 μs. The average enhancement over the different Zn I-lines was found increases exponentially up to 8-fold with delay time. The electron density to each plasma was measured utilizing the Hα-line appeared in the emitted spectra from each plasma and was found to give similar values. The electron temperatures were measured via Boltzmann plot method utilizing the relative intensities of the Zn I-lines and were found to give very close values. Moreover, the relative population density of the ground state of the zinc atoms (relative concentration) was measured spectroscopically utilizing the Boltzmann plot method and was found to increase in a very similar trend to that of enhancement. The results of the spectroscopic analysis conclude that these signal enhancements can be attributed to the higher concentration of neutral atoms in the Nano-Based material plasma with respect to the corresponding Bulk-based ZnO material.","PeriodicalId":66816,"journal":{"name":"纳米科学与工程(英文)","volume":"02 1","pages":"181-188"},"PeriodicalIF":0.0,"publicationDate":"2012-12-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.4236/WJNSE.2012.24024","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"70876849","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-12-11DOI: 10.4236/WJNSE.2012.24027
T. K. Srinivasan, B. Venkatraman, D. Ponraju, A. Arora
Oleic acid coated LaF3:Ce nanoparticles were synthesized and embedded in polyacrylamide through a two-step procedure. In the first step nanoparticles were synthesized by adopting co-precipitation technique and in the second step, nanoparticles were embedded in polyacrylamide (PAM) hydro-gel through the solution route. Nanoparticels were characterized for their crystal structure, particle size, organic coating and photoluminescence behavior using X-ray diffracttion, SEM, TEM, FTIR and photoluminescence spectroscopy. Size of nanoparticles was estimated using the Scherer formula. Polymer nano composite (PNC) material was synthesized with two different weight percent of the nano powder viz 1.634% (termed as NG1) and 0.1664% (termed as NG2). The nanoparticle-polymer composite exhibits emissions at 308 and 370 nm. A comparison of the emission spectrum of LaF3:Ce nano-powder pellet with that of the composite suggests a suppression of emission from the PAM host in the composite.
{"title":"Photoluminescence Properties of LaF 3 :Ce Nanoparticles Embedded in Polyacrylamide","authors":"T. K. Srinivasan, B. Venkatraman, D. Ponraju, A. Arora","doi":"10.4236/WJNSE.2012.24027","DOIUrl":"https://doi.org/10.4236/WJNSE.2012.24027","url":null,"abstract":"Oleic acid coated LaF3:Ce nanoparticles were synthesized and embedded in polyacrylamide through a two-step procedure. In the first step nanoparticles were synthesized by adopting co-precipitation technique and in the second step, nanoparticles were embedded in polyacrylamide (PAM) hydro-gel through the solution route. Nanoparticels were characterized for their crystal structure, particle size, organic coating and photoluminescence behavior using X-ray diffracttion, SEM, TEM, FTIR and photoluminescence spectroscopy. Size of nanoparticles was estimated using the Scherer formula. Polymer nano composite (PNC) material was synthesized with two different weight percent of the nano powder viz 1.634% (termed as NG1) and 0.1664% (termed as NG2). The nanoparticle-polymer composite exhibits emissions at 308 and 370 nm. A comparison of the emission spectrum of LaF3:Ce nano-powder pellet with that of the composite suggests a suppression of emission from the PAM host in the composite.","PeriodicalId":66816,"journal":{"name":"纳米科学与工程(英文)","volume":"2 1","pages":"201-205"},"PeriodicalIF":0.0,"publicationDate":"2012-12-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"70877028","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-12-11DOI: 10.4236/WJNSE.2012.24028
A. M. E. Sherbini, A. Aamer
The electron density and temperature of the laser induced silicon plasma were measured using two different methods. The plasma was produced via the interaction of high peak power Nd-YAG laser at the fundamental wavelength of 1064 nm with a plane solid iron target contain small traces of silicon as an element of minor concentration. The lines from the Si I at 288.15 nm and Si II-ionic lines at 413.08 and 634.71 nm were utilized to evaluate the plasma parameters. The reference plasma parameters were measured utilizing the Hα-line at 656.27 nm appeared in the spectra under the same condition. The electron density was measured utilizing the Stark broadening of the silicon lines and the temperature from the standard Saha-Boltzmann plot method. The comparison between electron densities from different silicon lines to that from the Hα-line reveals that the Si I-line at 288.15 nm contain some optical thickness while the Si II-ionic lines were found to be free from this effect. The measurements were repeated at different delay times between the laser and the camera in the range from 1 - 5 μsec. The electron density was found decreases from 2 × 1018 down to 4 × 1017 cm–3. After correcting the spectral intensity at the Si I-line at 288.15 nm, the temperatures evaluated from the different methods were found in an excellent agreement and decreases from 1.25 down to 0.95 eV with delay time.
{"title":"Measurement of Plasma Parameters in Laser-Induced Breakdown Spectroscopy Using Si-Lines","authors":"A. M. E. Sherbini, A. Aamer","doi":"10.4236/WJNSE.2012.24028","DOIUrl":"https://doi.org/10.4236/WJNSE.2012.24028","url":null,"abstract":"The electron density and temperature of the laser induced silicon plasma were measured using two different methods. The plasma was produced via the interaction of high peak power Nd-YAG laser at the fundamental wavelength of 1064 nm with a plane solid iron target contain small traces of silicon as an element of minor concentration. The lines from the Si I at 288.15 nm and Si II-ionic lines at 413.08 and 634.71 nm were utilized to evaluate the plasma parameters. The reference plasma parameters were measured utilizing the Hα-line at 656.27 nm appeared in the spectra under the same condition. The electron density was measured utilizing the Stark broadening of the silicon lines and the temperature from the standard Saha-Boltzmann plot method. The comparison between electron densities from different silicon lines to that from the Hα-line reveals that the Si I-line at 288.15 nm contain some optical thickness while the Si II-ionic lines were found to be free from this effect. The measurements were repeated at different delay times between the laser and the camera in the range from 1 - 5 μsec. The electron density was found decreases from 2 × 1018 down to 4 × 1017 cm–3. After correcting the spectral intensity at the Si I-line at 288.15 nm, the temperatures evaluated from the different methods were found in an excellent agreement and decreases from 1.25 down to 0.95 eV with delay time.","PeriodicalId":66816,"journal":{"name":"纳米科学与工程(英文)","volume":"02 1","pages":"206-212"},"PeriodicalIF":0.0,"publicationDate":"2012-12-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"70877038","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-12-11DOI: 10.4236/WJNSE.2012.24029
Jacobo Martínez-Reyes, L. D. Barriga-Arceo, L. Rendón-Vázquez, R. Martínez-Guerrero, N. Romero-Partida, E. Palacios-González, V. Garibay-Feblés, J. Ortiz-Lopez
In the present work the synthesis of C60 produced in a conventional microwave oven from the decomposition of camphor resin is reported. The polycrystalline structure of the sample was determined by X-Ray Diffraction (XRD), the sample showed several phases, the main phase corresponds to fullerene C60 ordered in a Face-Centered Cubic structure (FCC), with two more structures: one orthorhombic system and the other the monoclinic system coexisting also with graphite 2H phase. It was observed in a Scanning Electron Microscopy (SEM), that the sample formed thin films of stacked carbon. Whereas in a High Resolution Transmission Electron Microscopy (HRTEM), measurements in Bright Field mode revealed that the main phase of the material is C60 ordered in FCC structure and the elemental composition and atomic bonding state can be determined by analyzing the energy with the electron microscope by Elesctron Energy- Loss Spectroscopy (EELS), technique allowed confirm all the phase C60 established with XRD observations.
{"title":"Microstructural Characterization of Large Area C 60 Films Obtained by Conventional Microwave Oven Irradiation","authors":"Jacobo Martínez-Reyes, L. D. Barriga-Arceo, L. Rendón-Vázquez, R. Martínez-Guerrero, N. Romero-Partida, E. Palacios-González, V. Garibay-Feblés, J. Ortiz-Lopez","doi":"10.4236/WJNSE.2012.24029","DOIUrl":"https://doi.org/10.4236/WJNSE.2012.24029","url":null,"abstract":"In the present work the synthesis of C60 produced in a conventional microwave oven from the decomposition of camphor resin is reported. The polycrystalline structure of the sample was determined by X-Ray Diffraction (XRD), the sample showed several phases, the main phase corresponds to fullerene C60 ordered in a Face-Centered Cubic structure (FCC), with two more structures: one orthorhombic system and the other the monoclinic system coexisting also with graphite 2H phase. It was observed in a Scanning Electron Microscopy (SEM), that the sample formed thin films of stacked carbon. Whereas in a High Resolution Transmission Electron Microscopy (HRTEM), measurements in Bright Field mode revealed that the main phase of the material is C60 ordered in FCC structure and the elemental composition and atomic bonding state can be determined by analyzing the energy with the electron microscope by Elesctron Energy- Loss Spectroscopy (EELS), technique allowed confirm all the phase C60 established with XRD observations.","PeriodicalId":66816,"journal":{"name":"纳米科学与工程(英文)","volume":"2 1","pages":"213-218"},"PeriodicalIF":0.0,"publicationDate":"2012-12-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"70876913","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-12-11DOI: 10.4236/WJNSE.2012.24022
A. Touati, S. Chatbouri, N. Sghaier, A. Kalboussi
We propose a novel analytical model to describe the drain-source current as well as gate-source of single-electron transistors (SETs) at high temperature. Our model consists on summing the tunnel current and thermionic contribution. This model will be compared with another model.
{"title":"New Model for Drain and Gate Current of Single-Electron Transistor at High Temperature","authors":"A. Touati, S. Chatbouri, N. Sghaier, A. Kalboussi","doi":"10.4236/WJNSE.2012.24022","DOIUrl":"https://doi.org/10.4236/WJNSE.2012.24022","url":null,"abstract":"We propose a novel analytical model to describe the drain-source current as well as gate-source of single-electron transistors (SETs) at high temperature. Our model consists on summing the tunnel current and thermionic contribution. This model will be compared with another model.","PeriodicalId":66816,"journal":{"name":"纳米科学与工程(英文)","volume":"02 1","pages":"171-175"},"PeriodicalIF":0.0,"publicationDate":"2012-12-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"70876707","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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