C. Jiang, Weidong Yang, Lijuan Wang, Dawen Wang, C. Bai
Theoretical and experimental profiles of pregrooved cross-section in coated photoresist layers with a thickness of 470 nm and 150 nm on glass substrates are given. The experiment has been performed on the photoresist cutting machine using focused argon laser beam and AZ-1350 photoresist. The results from scanning tunneling microscope (STM) and scanning electron microscope (SEM) images are also discussed.
{"title":"Study of photoresist pregrooved structures","authors":"C. Jiang, Weidong Yang, Lijuan Wang, Dawen Wang, C. Bai","doi":"10.1117/12.150656","DOIUrl":"https://doi.org/10.1117/12.150656","url":null,"abstract":"Theoretical and experimental profiles of pregrooved cross-section in coated photoresist layers with a thickness of 470 nm and 150 nm on glass substrates are given. The experiment has been performed on the photoresist cutting machine using focused argon laser beam and AZ-1350 photoresist. The results from scanning tunneling microscope (STM) and scanning electron microscope (SEM) images are also discussed.","PeriodicalId":212484,"journal":{"name":"Optical Storage and Information Data Storage","volume":"198 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-08-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121887197","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A simple and precise mathematical model of critical-angle focus error detection method is proposed in this paper. Factors which affect the focus error signals are analyzed and the curve of focus error signals with different parameters are given. The improvement of optical gain is also discussed.
{"title":"Investigation of critical-angle focus-error detection","authors":"Song Shen, D. Cui, Xiong Qian, Yongming Shu","doi":"10.1117/12.150662","DOIUrl":"https://doi.org/10.1117/12.150662","url":null,"abstract":"A simple and precise mathematical model of critical-angle focus error detection method is proposed in this paper. Factors which affect the focus error signals are analyzed and the curve of focus error signals with different parameters are given. The improvement of optical gain is also discussed.","PeriodicalId":212484,"journal":{"name":"Optical Storage and Information Data Storage","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-08-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127603425","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Comparison of three common focus error detection methods is made on a unified theoretical background. New mathematical models are built up on physical optics. The compared items are theoretical optical gain, adjustment factors, etc., and the theoretical and experimental results are given.
{"title":"Theoretical models and comparison of three focus-error detection methods","authors":"Song Shen, D. Cui, Xiong Qian, Yongming Shu","doi":"10.1117/12.150660","DOIUrl":"https://doi.org/10.1117/12.150660","url":null,"abstract":"Comparison of three common focus error detection methods is made on a unified theoretical background. New mathematical models are built up on physical optics. The compared items are theoretical optical gain, adjustment factors, etc., and the theoretical and experimental results are given.","PeriodicalId":212484,"journal":{"name":"Optical Storage and Information Data Storage","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-08-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122098428","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A fast software algorithm is used to compute the remainder of interleaved Reed-Solomon ECC in order to get the error location of read data. By using the erasable-programmable-logic- device (EPLD) together with Winchester controller chips, we built a so-called optical/buffer controller. An algorithm may be introduced to solve the write-after-erase problem of MO disk drives.
{"title":"Controller for magneto-optical disk drives","authors":"Chunyi Wu, Maotai Hu","doi":"10.1117/12.150668","DOIUrl":"https://doi.org/10.1117/12.150668","url":null,"abstract":"A fast software algorithm is used to compute the remainder of interleaved Reed-Solomon ECC in order to get the error location of read data. By using the erasable-programmable-logic- device (EPLD) together with Winchester controller chips, we built a so-called optical/buffer controller. An algorithm may be introduced to solve the write-after-erase problem of MO disk drives.","PeriodicalId":212484,"journal":{"name":"Optical Storage and Information Data Storage","volume":"134 4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-08-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124255273","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Longfa Pan, Duanyi Xu, Mali Gong, Hao Yuan, Jing Pei
A real time non-contact dynamic testing method for an optical disk is proposed in this paper. The axial run-out and the tilt of the optical disk are measured by two quadrant detectors when the disk is turning at high speed in the drive. The analysis of the results is given with a brief discussion on the error in measurement.
{"title":"Testing of optical disk axial run-out and tilt","authors":"Longfa Pan, Duanyi Xu, Mali Gong, Hao Yuan, Jing Pei","doi":"10.1117/12.150664","DOIUrl":"https://doi.org/10.1117/12.150664","url":null,"abstract":"A real time non-contact dynamic testing method for an optical disk is proposed in this paper. The axial run-out and the tilt of the optical disk are measured by two quadrant detectors when the disk is turning at high speed in the drive. The analysis of the results is given with a brief discussion on the error in measurement.","PeriodicalId":212484,"journal":{"name":"Optical Storage and Information Data Storage","volume":"370 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-08-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115565966","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The microstructure of sputtered amorphous magneto-optic media TbFeCo is observed by self- designed scanning tunneling microscopy (STM), and tracks in phase-change media are recorded. GeSbTe is also investigated by atomic force microscopy.
{"title":"Microstructure of erasable optic disk thin film investigated by STM/AFM","authors":"Zhanghua Wu, F. Gan","doi":"10.1117/12.150649","DOIUrl":"https://doi.org/10.1117/12.150649","url":null,"abstract":"The microstructure of sputtered amorphous magneto-optic media TbFeCo is observed by self- designed scanning tunneling microscopy (STM), and tracks in phase-change media are recorded. GeSbTe is also investigated by atomic force microscopy.","PeriodicalId":212484,"journal":{"name":"Optical Storage and Information Data Storage","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-08-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121923579","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The exchange-coupled magnetic films of amorphous rare earth-transition metal alloys have large potentiality for improvement in the characteristics and the function of magneto-optical disks. The studies of the exchange-coupled magnetic films are reviewed and the recent progress in its technology are reported.
{"title":"Application of exchange-coupled magnetic thin films to magneto-optical recording","authors":"H. Sugahara, K. Tsutsumi","doi":"10.1117/12.150672","DOIUrl":"https://doi.org/10.1117/12.150672","url":null,"abstract":"The exchange-coupled magnetic films of amorphous rare earth-transition metal alloys have large potentiality for improvement in the characteristics and the function of magneto-optical disks. The studies of the exchange-coupled magnetic films are reviewed and the recent progress in its technology are reported.","PeriodicalId":212484,"journal":{"name":"Optical Storage and Information Data Storage","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-08-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123301532","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
An erasable and rewritable electron-trapping optical-storage material SrS:Eu, Sm was synthesized. Using the SrS:Eu, Sm-PMMA film, the image-recording experiment was performed. After the picture information is written on the film by the frequency doubled (532 nm) output of a Nd:YAG laser, a clearly discernible red image can be created by using 1.064 nm laser output of proper intensity (0.1 mJ/cm2) to irradiate the film. The written information can be maintained for tens of days in darkness, and one can write, read, and erase the information almost innumerable times.
{"title":"Optical-storage properties of SrS:Eu, Sm in PMMA film","authors":"Shuchun Chen, Changhong Qi, Fengmei Dai, F. Gan","doi":"10.1117/12.150654","DOIUrl":"https://doi.org/10.1117/12.150654","url":null,"abstract":"An erasable and rewritable electron-trapping optical-storage material SrS:Eu, Sm was synthesized. Using the SrS:Eu, Sm-PMMA film, the image-recording experiment was performed. After the picture information is written on the film by the frequency doubled (532 nm) output of a Nd:YAG laser, a clearly discernible red image can be created by using 1.064 nm laser output of proper intensity (0.1 mJ/cm2) to irradiate the film. The written information can be maintained for tens of days in darkness, and one can write, read, and erase the information almost innumerable times.","PeriodicalId":212484,"journal":{"name":"Optical Storage and Information Data Storage","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-08-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128895479","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
In stoichiometric GeTe-Sb2Te3 films, reversible phase change optical recording materials, Sb addition is used widely to improve the data retention time and the repetition cycles, but its mechanism is not clear. To clarify the effect of excess Sb, the effects of Te and Ge addition were also investigated in the compositions from the stoichiometry Ge2Sb2Te5 toward the vertices in the Ge-Te-Sb triangle. By DSC measurements, it was found that a retention ability for amorphous (`write') states related to the increase of repetition cycles is larger in the Sb addition than in the Te and Ge addition. By XRD measurements, it was understood that an optimum ratio of (Sb,Te)(beta) /GeTe(111), about 0.5 was necessary to static repetition cycles approximately 106 in the laser annealed film of 1000 angstroms thick.
{"title":"Doping effect on optical recording film with Ge2Sb2Te5 composition","authors":"T. Matsushita, A. Suzuki, T. Kamitani, M. Okuda","doi":"10.1117/12.150646","DOIUrl":"https://doi.org/10.1117/12.150646","url":null,"abstract":"In stoichiometric GeTe-Sb2Te3 films, reversible phase change optical recording materials, Sb addition is used widely to improve the data retention time and the repetition cycles, but its mechanism is not clear. To clarify the effect of excess Sb, the effects of Te and Ge addition were also investigated in the compositions from the stoichiometry Ge2Sb2Te5 toward the vertices in the Ge-Te-Sb triangle. By DSC measurements, it was found that a retention ability for amorphous (`write') states related to the increase of repetition cycles is larger in the Sb addition than in the Te and Ge addition. By XRD measurements, it was understood that an optimum ratio of (Sb,Te)(beta) /GeTe(111), about 0.5 was necessary to static repetition cycles approximately 106 in the laser annealed film of 1000 angstroms thick.","PeriodicalId":212484,"journal":{"name":"Optical Storage and Information Data Storage","volume":"68 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-08-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121150712","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Langmuir-Blodgett (LB) films of tetra-neopentoxy phthalocyanine zinc and tetra-nonyl phthalocyanine copper are prepared. Their structures, optical properties, and temperature dependencies are investigated. Static optical recording tests by He-Ne laser are done in these LB films and the experimental results demonstrate that phthalocyanine derivates are useful for phase change type erasable data storage media.
{"title":"Optical properties and recording characteristics of phthalocyanine-derivative LB films","authors":"F. Gan, T. Luo","doi":"10.1117/12.150651","DOIUrl":"https://doi.org/10.1117/12.150651","url":null,"abstract":"Langmuir-Blodgett (LB) films of tetra-neopentoxy phthalocyanine zinc and tetra-nonyl phthalocyanine copper are prepared. Their structures, optical properties, and temperature dependencies are investigated. Static optical recording tests by He-Ne laser are done in these LB films and the experimental results demonstrate that phthalocyanine derivates are useful for phase change type erasable data storage media.","PeriodicalId":212484,"journal":{"name":"Optical Storage and Information Data Storage","volume":"57 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-08-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128259219","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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