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1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers最新文献

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Technology for data transport in an office environment 办公环境中的数据传输技术
Pub Date : 1900-01-01 DOI: 10.1109/ISSCC.1984.1156613
H. Mussman, M. Foster
The volume of data to be transported in an office environment is growing as more terminals are required to realize office automation systems. Such data can be transported by Private Branch Exchanges (PBX) and/or by Local Area Networks (LANs) . . . With PBX, data from each terminal are typically carried to the PBX on a Digital Subscriber Loop (DSL). With an LSN, data from each terminal are typically carried on a passive bus after being formatted by an interface circuit. . . Initially, panelists will review the present and future technologies available to implement a DSL for a PBX using the 'ping-pong' method of continuous full duplex transmission, an interface circuit for an LAN using a base-band coaxial cable bus, an interface circuit for an LAN using a broadband coaxial cable bus, and an interface circuit for an LAN using an optical fiber bus...In conclusion, the panelists will compare these technologies for availability and costs.
随着办公自动化系统的实现,办公环境中需要传输的数据量越来越大。这些数据可以通过专用交换机(PBX)和/或局域网(LANs)传输…使用PBX时,每个终端的数据通常通过数字用户环路(DSL)传送到PBX。使用LSN,来自每个终端的数据通常在由接口电路格式化后在无源总线上进行…首先,小组成员将回顾目前和未来可用于实现PBX的DSL的技术,使用连续全双工传输的“乒乓”方法,使用基带同轴电缆总线的局域网接口电路,使用宽带同轴电缆总线的局域网接口电路,以及使用光纤总线的局域网接口电路……最后,小组成员将比较这些技术的可用性和成本。
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引用次数: 0
Use of E-beam for random access read and write of digital test signals 使用电子束随机存取读写数字测试信号
Pub Date : 1900-01-01 DOI: 10.1109/ISSCC.1984.1156632
J. Jensen, K. Martin
An E-beam that was used both to inject and read digital signals for diagnostic test of NMOS and CMOS ICs will be discussed. E-beam programmable master-slave flip-flops, which add less than 0.25pF circuit load, were included for signal injection purposes.
本文将讨论用于NMOS和CMOS集成电路诊断测试的电子束注入和读取数字信号的方法。电子束可编程主从触发器增加的电路负载小于0.25pF,用于信号注入。
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引用次数: 0
A monolithic programmable speech synthesizer with voice recognition 具有语音识别功能的单片可编程语音合成器
Pub Date : 1900-01-01 DOI: 10.1109/ISSCC.1984.1156714
T. Yoshino, T. Takamizawa, A. Henderson, S. Abiko, M. Hashizume, T. Satoh, K. Katoh
A speech synthesizer which contains an 8b microprocessor, 65Kbits of ROM, an LPC-10 filter, 256bits of RAM and an ADC, will be described. Algorithms for both speech synthesis using linear prediction and speaker independent voice recognition can be implemented.
一个语音合成器包含一个8b微处理器,65kbit的ROM, LPC-10滤波器,256bit的RAM和ADC,将被描述。使用线性预测的语音合成算法和独立于说话人的语音识别算法都可以实现。
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引用次数: 0
A 25/50MHz dual-mode parallel multiplier/accumulator 25/50MHz双模并行乘法器/累加器
Pub Date : 1900-01-01 DOI: 10.1109/ISSCC.1984.1156650
F. Welten, J. Lohstroh, A. Linssen
A 12 × 12 parallel multiplier/accumulator using standard 3μm bipolar oxide-isolated ISL technology will be described. A gated pipeline-register which can be bypassed allows the chip to be used in a direct mode at a 25MHz rate or in a pipeline mode at a 50MHz clock rate. Power dissipation is 900mW.
采用标准3μm双极氧化物隔离ISL技术的12 × 12并联倍增器/蓄电池将被描述。可以绕过的门控管道寄存器允许芯片以25MHz的速率在直接模式下或以50MHz的时钟速率在管道模式下使用。功耗900mW。
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引用次数: 0
Stability and soft error rates of SRAM cells SRAM单元的稳定性和软错误率
Pub Date : 1900-01-01 DOI: 10.1109/ISSCC.1984.1156666
B. Chappell, S. Schuster, G. Sai-Halasz
Graphical techniques for analyzing the impact of device sizes, threshold tracking, load resistor values and other design parameters on the stability and soft error rate of SRAMs, illustrated via applicat)ons to a high-speed 64K RAM, will be presented.
图形技术分析器件尺寸,阈值跟踪,负载电阻值和其他设计参数对sram的稳定性和软错误率的影响,并通过对高速64K RAM的应用进行说明。
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引用次数: 4
A 3456-element CCD sensor with serpentine shift registers 带有蛇形移位寄存器的3456元件CCD传感器
Pub Date : 1900-01-01 DOI: 10.1109/ISSCC.1984.1156590
S. Onishi, D. Wen, D. Reaves, J. Pendelton
An image sensor incorporating a serpentine shift register structure that allows a 7μm pitch, using a 2-poly, 2-metal process, will be reported.
将报道一种采用2-poly, 2-metal工艺,采用蛇形移位寄存器结构,允许7μm间距的图像传感器。
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引用次数: 3
A pipelined 32b NMOS microprocessor 一个流水线的32b NMOS微处理器
Pub Date : 1900-01-01 DOI: 10.1109/ISSCC.1984.1156607
C. Rowen, S. Przbylski, N. Jouppi, T. Gross, J. Shott, J. Hennessy
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引用次数: 12
A 1K-gate GaAs gate array 一种k栅极砷化镓栅极阵列
Pub Date : 1900-01-01 DOI: 10.1109/isscc.1984.1156640
Y. Ikawa, N. Toyoda, M. Mochisuki, T. Terada, K. Kanazawa, M. Hirose, T. Mizoguchi, A. Hojo
A 1050-gate GaAs gate array connected as a 6 × 6b parallel multiplier, which exhibits a multiplication time of 10.6ns and 350mW power dissipation, will be covered.
将介绍一种连接为6 × 6b并联乘法器的1050门GaAs门阵列,其倍增时间为10.6ns,功耗为350mW。
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引用次数: 18
A 28ns CMOS SRAM with bipolar sense amplifiers 带有双极感测放大器的28ns CMOS SRAM
Pub Date : 1900-01-01 DOI: 10.1109/ISSCC.1984.1156709
J. Miyamoto, S. Saitoh, H. Momose, H. Shibata, K. Kanzaki, T. Iizuka
This report will discuss a 64K×1 SRAM with bipolar sense amplifiers, utilizing both CMOS and bipolar devices with double poly 1.2μm MoSi processing. The SRAM typically accesses in 28ns and has a 20nA standby mode.
本报告将讨论一个64K×1 SRAM与双极感测放大器,利用CMOS和双极器件与双聚1.2μm MoSi工艺。SRAM通常在28ns访问,并具有20nA待机模式。
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引用次数: 12
An 8b 100MS/s flash ADC 8b 100MS/s闪存ADC
Pub Date : 1900-01-01 DOI: 10.1109/ISSCC.1984.1156644
Y. Yoshii, K. Asano, M. Nakamura, C. Yamada
This paper will describe an 8b flash ADC which achieves a conversion rate of 100MHz arid an input bandwidth of 30MHz at a power dissipation of 1200mW. The circuit is realized in an epitaxial-LOCOS process with a minimum line width of 2.5μm and a transistor fTof 4GHz at 45μA collector current.
本文将介绍一种8b闪存ADC,其转换速率为100MHz,输入带宽为30MHz,功耗为1200mW。该电路采用外延- locos工艺实现,最小线宽为2.5μm,集电极电流为45μA,晶体管fto为4GHz。
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引用次数: 6
期刊
1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers
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