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2008 IEEE/LEOS International Conference on Optical MEMs and Nanophotonics最新文献

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Bandgap tuning of photonic crystals by polymer swelling 聚合物膨胀光子晶体的带隙调谐
Pub Date : 2008-08-26 DOI: 10.1109/OMEMS.2008.4607891
W. Monch, P. Waibel, H. Zappe
Polymer swelling is studied as a novel method for bandgap tuning of photonic crystals (PCs). Crosslinked polymers swell in the presence of solvents, thereby increasing their volume and changing their refractive index. Consequently, the lattice constant and the refractive index of a polymer PC is modified by swelling and leads to a shift of the optical bandgap.We present experimental studies of swelling of one-dimensional PCs and theoretical calculations of swelling of three-dimensional PCs. It is shown that the frequencies of the optical bandgap of a polymer PC is shifted by about 10% when exposed to a solvent-nitrogen gas mixture at 80% of the solvent saturation pressure.
聚合物膨胀是光子晶体带隙调谐的一种新方法。交联聚合物在溶剂的存在下膨胀,从而增加了它们的体积并改变了它们的折射率。因此,聚合物PC的晶格常数和折射率会因膨胀而改变,并导致光学带隙的移位。本文介绍了一维pc膨胀的实验研究和三维pc膨胀的理论计算。结果表明,在80%的溶剂饱和压力下,暴露于溶剂-氮气混合物中,聚合物PC的光学带隙频率偏移约10%。
{"title":"Bandgap tuning of photonic crystals by polymer swelling","authors":"W. Monch, P. Waibel, H. Zappe","doi":"10.1109/OMEMS.2008.4607891","DOIUrl":"https://doi.org/10.1109/OMEMS.2008.4607891","url":null,"abstract":"Polymer swelling is studied as a novel method for bandgap tuning of photonic crystals (PCs). Crosslinked polymers swell in the presence of solvents, thereby increasing their volume and changing their refractive index. Consequently, the lattice constant and the refractive index of a polymer PC is modified by swelling and leads to a shift of the optical bandgap.We present experimental studies of swelling of one-dimensional PCs and theoretical calculations of swelling of three-dimensional PCs. It is shown that the frequencies of the optical bandgap of a polymer PC is shifted by about 10% when exposed to a solvent-nitrogen gas mixture at 80% of the solvent saturation pressure.","PeriodicalId":402931,"journal":{"name":"2008 IEEE/LEOS International Conference on Optical MEMs and Nanophotonics","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-08-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114948913","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Conductive pattern forming method on vertical wall using spray coating and angled exposure technologies 利用喷涂和角度暴露技术在垂直壁面上形成导电图案的方法
Pub Date : 2008-08-26 DOI: 10.1109/OMEMS.2008.4607876
H. Morii, F. Oohira, M. Sasaki, T. Ochi, A. Yuzuriha
A novel conductive pattern forming method on the vertical wall using a resist spray coating and an angled exposure technologies is proposed. This method makes it possible to decrease the chip package size. The spray coating and the angled exposure technologies enable the uniform resist coating and the patterning the resist on the vertical wall of 600 mum height. Then a conductive pattern layers are sputtered and electroless plated. As the result, the conductive patterns of 200 mum width and 300 mum spacing is successfully formed on the vertical walls.
提出了一种利用抗蚀剂喷涂和角度暴露技术在垂直壁上形成导电图案的新方法。这种方法使减小芯片封装尺寸成为可能。所述喷涂和角度暴露技术使抗蚀剂涂层均匀,并使抗蚀剂在600 mm高度的垂直壁上形成图案。然后溅射导电图案层并进行化学镀。结果表明,在垂直壁面上成功地形成了宽度为200 μ m、间距为300 μ m的导电图案。
{"title":"Conductive pattern forming method on vertical wall using spray coating and angled exposure technologies","authors":"H. Morii, F. Oohira, M. Sasaki, T. Ochi, A. Yuzuriha","doi":"10.1109/OMEMS.2008.4607876","DOIUrl":"https://doi.org/10.1109/OMEMS.2008.4607876","url":null,"abstract":"A novel conductive pattern forming method on the vertical wall using a resist spray coating and an angled exposure technologies is proposed. This method makes it possible to decrease the chip package size. The spray coating and the angled exposure technologies enable the uniform resist coating and the patterning the resist on the vertical wall of 600 mum height. Then a conductive pattern layers are sputtered and electroless plated. As the result, the conductive patterns of 200 mum width and 300 mum spacing is successfully formed on the vertical walls.","PeriodicalId":402931,"journal":{"name":"2008 IEEE/LEOS International Conference on Optical MEMs and Nanophotonics","volume":"125 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-08-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114730055","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Fast and high-precision 3D tracking and position measurement with MEMS micromirrors 利用MEMS微镜进行快速、高精度的3D跟踪和位置测量
Pub Date : 2008-08-26 DOI: 10.1109/OMEMS.2008.4607834
V. Milanovic, W. K. Lo
We demonstrate real-time fast-motion tracking of an object in a 3D volume, while obtaining its precise XYZ co-ordinates. Two separate scanning MEMS micromirror sub-systems track the object in a 20 kHz closed-loop. A demonstration system capable of tracking full-speed human hand motion provides position information at up to 5 m distance with 16-bit precision, or < = 20 mum precision on the X and Y axes (up/down, left/right,) and precision on the depth (Z-axis) from 10 mum to 1.5 mm, depending on distance.
我们演示了三维体中对象的实时快速运动跟踪,同时获得其精确的XYZ坐标。两个独立的扫描MEMS微镜子系统以20 kHz的闭环跟踪对象。一个能够跟踪全速人手运动的演示系统提供5米距离的位置信息,精度为16位,或者在X和Y轴上(上/下,左/右)的精度< = 20 μ m,深度(z轴)的精度从10 μ m到1.5 mm,具体取决于距离。
{"title":"Fast and high-precision 3D tracking and position measurement with MEMS micromirrors","authors":"V. Milanovic, W. K. Lo","doi":"10.1109/OMEMS.2008.4607834","DOIUrl":"https://doi.org/10.1109/OMEMS.2008.4607834","url":null,"abstract":"We demonstrate real-time fast-motion tracking of an object in a 3D volume, while obtaining its precise XYZ co-ordinates. Two separate scanning MEMS micromirror sub-systems track the object in a 20 kHz closed-loop. A demonstration system capable of tracking full-speed human hand motion provides position information at up to 5 m distance with 16-bit precision, or < = 20 mum precision on the X and Y axes (up/down, left/right,) and precision on the depth (Z-axis) from 10 mum to 1.5 mm, depending on distance.","PeriodicalId":402931,"journal":{"name":"2008 IEEE/LEOS International Conference on Optical MEMs and Nanophotonics","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-08-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122115902","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 19
Formation of a nitrified hafnium oxide buffer layer on silicon substrate and GaN quantum well crystal growth for GaN-Si hybrid optical MEMS 氮化氧化铪缓冲层在硅衬底上的形成及GaN- si混合光学MEMS中GaN量子阱晶体的生长
Pub Date : 2008-08-26 DOI: 10.1109/OMEMS.2008.4607892
H. Sameshima, M. Wakui, R. Ito, F. Hu, K. Hane
We study the growth of GaN crystal on Si substrate by molecular beam epitaxy (MBE), in order to integrate GaN light source and MEMS monolithically Since the lattice constant of HfN is close to that of GaN (only 0.35% mismatch), the crystal growth of GaN on HfN film is superior. On the other hand, HfO2 film is a good candidate for waveguide, dielectric and sacrificial layer. In this study, HfO2 film is surface-nitrified by a rf nitrogen plasma source of MBE to generate HfN layer. The morphology of the grown GaN crystal was better on the nitrified HfO2 layer. The photoluminescence (PL) efficiency of GaN quantum well grown on the nitrified HfO2 layer was better than that on Si substrate. As a simple hybrid lighting device structure, GaN grating on Si substrate was fabricated and the PL intensity from GaN diffraction grating was measured.
为了实现GaN光源与MEMS的单片集成,我们采用分子束外延(MBE)技术在Si衬底上生长GaN晶体。由于HfN的晶格常数与GaN的晶格常数接近(只有0.35%的失配),因此在HfN薄膜上生长GaN晶体具有优势。另一方面,HfO2薄膜是波导、介电层和牺牲层的良好候选材料。本研究采用MBE射频氮等离子体源对HfO2膜进行表面硝化生成HfN层。氮化HfO2层上生长的GaN晶体形貌较好。氮化HfO2层上生长的GaN量子阱的光致发光效率优于在Si衬底上生长的量子阱。作为一种简单的混合照明器件结构,在Si衬底上制作了GaN光栅,并测量了GaN衍射光栅的发光强度。
{"title":"Formation of a nitrified hafnium oxide buffer layer on silicon substrate and GaN quantum well crystal growth for GaN-Si hybrid optical MEMS","authors":"H. Sameshima, M. Wakui, R. Ito, F. Hu, K. Hane","doi":"10.1109/OMEMS.2008.4607892","DOIUrl":"https://doi.org/10.1109/OMEMS.2008.4607892","url":null,"abstract":"We study the growth of GaN crystal on Si substrate by molecular beam epitaxy (MBE), in order to integrate GaN light source and MEMS monolithically Since the lattice constant of HfN is close to that of GaN (only 0.35% mismatch), the crystal growth of GaN on HfN film is superior. On the other hand, HfO2 film is a good candidate for waveguide, dielectric and sacrificial layer. In this study, HfO2 film is surface-nitrified by a rf nitrogen plasma source of MBE to generate HfN layer. The morphology of the grown GaN crystal was better on the nitrified HfO2 layer. The photoluminescence (PL) efficiency of GaN quantum well grown on the nitrified HfO2 layer was better than that on Si substrate. As a simple hybrid lighting device structure, GaN grating on Si substrate was fabricated and the PL intensity from GaN diffraction grating was measured.","PeriodicalId":402931,"journal":{"name":"2008 IEEE/LEOS International Conference on Optical MEMs and Nanophotonics","volume":"60 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-08-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124645711","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Mechanically coupled comb drive MEMS stages 机械耦合梳状驱动MEMS级
Pub Date : 2008-08-26 DOI: 10.1109/OMEMS.2008.4607868
A. Arslan, Ç. Ataman, S. Holmstrom, K. Hedsten, H. Rahmi Seren, H. Urey, P. Enoksson
An electrostatic large clear-aperture in-plane scanner with a novel actuation principle is presented for fast and large stroke scanning applications 9 mum resonant deflection at 11.51 KHz with 100 Vpp excitation is observed.
提出了一种具有新颖驱动原理的静电大孔径平面内扫描仪,用于快速和大行程扫描。在11.51 KHz下,在100 Vpp激励下,观察到共振偏转。
{"title":"Mechanically coupled comb drive MEMS stages","authors":"A. Arslan, Ç. Ataman, S. Holmstrom, K. Hedsten, H. Rahmi Seren, H. Urey, P. Enoksson","doi":"10.1109/OMEMS.2008.4607868","DOIUrl":"https://doi.org/10.1109/OMEMS.2008.4607868","url":null,"abstract":"An electrostatic large clear-aperture in-plane scanner with a novel actuation principle is presented for fast and large stroke scanning applications 9 mum resonant deflection at 11.51 KHz with 100 Vpp excitation is observed.","PeriodicalId":402931,"journal":{"name":"2008 IEEE/LEOS International Conference on Optical MEMs and Nanophotonics","volume":"57 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-08-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129712457","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Fabrication of sub-micrometer Si spheres with atomic-scale surface smoothness using homogenized KrF excimer laser reformation system 利用均匀化KrF准分子激光重整系统制备亚微米级表面光滑的硅球
Pub Date : 2008-08-26 DOI: 10.1109/OMEMS.2008.4607860
S. Hung, S. Shiu, C. Chao, Ching-Fuh Lin
In this paper, a novel technique using the homogenized KrF excimer laser reformation is presented as an alternative method for fabricating Si spheres.
本文提出了一种利用均匀化KrF准分子激光重组制备硅球的新方法。
{"title":"Fabrication of sub-micrometer Si spheres with atomic-scale surface smoothness using homogenized KrF excimer laser reformation system","authors":"S. Hung, S. Shiu, C. Chao, Ching-Fuh Lin","doi":"10.1109/OMEMS.2008.4607860","DOIUrl":"https://doi.org/10.1109/OMEMS.2008.4607860","url":null,"abstract":"In this paper, a novel technique using the homogenized KrF excimer laser reformation is presented as an alternative method for fabricating Si spheres.","PeriodicalId":402931,"journal":{"name":"2008 IEEE/LEOS International Conference on Optical MEMs and Nanophotonics","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-08-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125686917","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Widely tunable Fabry-Perot optical filter using fixed-fixed beam actuators 广泛可调的法布里-珀罗光学滤波器使用固定固定光束驱动器
Pub Date : 2008-08-26 DOI: 10.1109/OMEMS.2008.4607831
J. Milne, J. Dell, A. Keating, L. Schuler, L. Faraone
Wide spectral tuning from 1620 nm to 2425 nm has been achieved in a MEMS-based tunable Fabry-Perot filter. Fixed-fixed beam actuators were used to extend the tuning beyond the inherent limit of a parallel plate actuator.
在基于mems的可调谐Fabry-Perot滤波器中实现了从1620 nm到2425 nm的宽光谱调谐。采用固定-固定梁作动器扩展了平行板作动器固有的调谐极限。
{"title":"Widely tunable Fabry-Perot optical filter using fixed-fixed beam actuators","authors":"J. Milne, J. Dell, A. Keating, L. Schuler, L. Faraone","doi":"10.1109/OMEMS.2008.4607831","DOIUrl":"https://doi.org/10.1109/OMEMS.2008.4607831","url":null,"abstract":"Wide spectral tuning from 1620 nm to 2425 nm has been achieved in a MEMS-based tunable Fabry-Perot filter. Fixed-fixed beam actuators were used to extend the tuning beyond the inherent limit of a parallel plate actuator.","PeriodicalId":402931,"journal":{"name":"2008 IEEE/LEOS International Conference on Optical MEMs and Nanophotonics","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-08-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114265358","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
3D modeling of photonic devices using dynamic thermal electron quantum medium finite-different time-domain (DTEQM-FDTD) method 利用动态热电子量子介质有限不同时域(DTEQM-FDTD)方法对光子器件进行三维建模
Pub Date : 2008-08-26 DOI: 10.1109/OMEMS.2008.4607863
E. H. Khoo, S. Ho, I. Ahmed, E. Li, Y. Huang
This paper reports on the modeling of the semiconductor photonic devices using 3D DTEQM-FDTD. The model includes the physics of Pauli Exclusion principle, Fermi-Dirac thermalization and state filling to describe the complex electron dynamics in semiconductor media to realize the full potential of FDTD. The carrier intraband and interband transition dynamics, energy band filling and thermal equilibrium are demonstrated in the model. The DTEQM-FDTD model includes the essential physics of complex dynamical media and yet computational efficient. It is applicable to a wide range of atomic and molecular media by applying the appropriate rate equations and energy level structure.
本文报道了利用三维DTEQM-FDTD对半导体光子器件进行建模的方法。该模型包括泡利不相容原理、费米-狄拉克热化和状态填充等物理特性,描述了半导体介质中复杂的电子动力学,充分发挥了时域有限差分的潜力。该模型演示了载流子带内和带间跃迁动力学、能带填充和热平衡。DTEQM-FDTD模型既包含了复杂动态介质的基本物理特性,又具有计算效率。通过采用适当的速率方程和能级结构,它适用于广泛的原子和分子介质。
{"title":"3D modeling of photonic devices using dynamic thermal electron quantum medium finite-different time-domain (DTEQM-FDTD) method","authors":"E. H. Khoo, S. Ho, I. Ahmed, E. Li, Y. Huang","doi":"10.1109/OMEMS.2008.4607863","DOIUrl":"https://doi.org/10.1109/OMEMS.2008.4607863","url":null,"abstract":"This paper reports on the modeling of the semiconductor photonic devices using 3D DTEQM-FDTD. The model includes the physics of Pauli Exclusion principle, Fermi-Dirac thermalization and state filling to describe the complex electron dynamics in semiconductor media to realize the full potential of FDTD. The carrier intraband and interband transition dynamics, energy band filling and thermal equilibrium are demonstrated in the model. The DTEQM-FDTD model includes the essential physics of complex dynamical media and yet computational efficient. It is applicable to a wide range of atomic and molecular media by applying the appropriate rate equations and energy level structure.","PeriodicalId":402931,"journal":{"name":"2008 IEEE/LEOS International Conference on Optical MEMs and Nanophotonics","volume":"159 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-08-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123050253","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Near-field scanning nanophotonic microscopy 近场扫描纳米光子显微镜
Pub Date : 2008-08-26 DOI: 10.1109/OMEMS.2008.4607888
John X.J. Zhang, Kazunori Hoshino, A. Gopal
We fabricated nanoscale light emitting diodes (NANO-LED) at the tip of silicon probes. Simultaneous optical and topographical images were acquired using the probes with the nano-LED in a standard near-field scanning optical microscope.
我们在硅探针的尖端制造了纳米级发光二极管。探针与纳米led在标准近场扫描光学显微镜下同时获得光学和地形图像。
{"title":"Near-field scanning nanophotonic microscopy","authors":"John X.J. Zhang, Kazunori Hoshino, A. Gopal","doi":"10.1109/OMEMS.2008.4607888","DOIUrl":"https://doi.org/10.1109/OMEMS.2008.4607888","url":null,"abstract":"We fabricated nanoscale light emitting diodes (NANO-LED) at the tip of silicon probes. Simultaneous optical and topographical images were acquired using the probes with the nano-LED in a standard near-field scanning optical microscope.","PeriodicalId":402931,"journal":{"name":"2008 IEEE/LEOS International Conference on Optical MEMs and Nanophotonics","volume":"11 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-08-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121219103","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Evaluation of X-ray reflectivity of a MEMS X-ray optic MEMS x射线光学系统的x射线反射率评估
Pub Date : 2008-08-26 DOI: 10.1109/OMEMS.2008.4607850
I. Mitsuishi, Y. Ezoe, M. Koshiishi, M. Mita, Y. Maeda, N. Yamasaki, K. Mitsuda, T. Shirata, T. Hayashi, T. Takano, R. Maeda
X-ray reflectivity of an ultra light-weight X-ray optic using MEMS technologies was measured in two different energies (0.28 keV and 1.49 keV). The obtained reflectivities can be understood by considering the mirror surface structures.
在0.28 keV和1.49 keV两种不同能量下,测量了采用MEMS技术的超轻型x射线光学器件的x射线反射率。得到的反射率可以通过考虑镜面结构来理解。
{"title":"Evaluation of X-ray reflectivity of a MEMS X-ray optic","authors":"I. Mitsuishi, Y. Ezoe, M. Koshiishi, M. Mita, Y. Maeda, N. Yamasaki, K. Mitsuda, T. Shirata, T. Hayashi, T. Takano, R. Maeda","doi":"10.1109/OMEMS.2008.4607850","DOIUrl":"https://doi.org/10.1109/OMEMS.2008.4607850","url":null,"abstract":"X-ray reflectivity of an ultra light-weight X-ray optic using MEMS technologies was measured in two different energies (0.28 keV and 1.49 keV). The obtained reflectivities can be understood by considering the mirror surface structures.","PeriodicalId":402931,"journal":{"name":"2008 IEEE/LEOS International Conference on Optical MEMs and Nanophotonics","volume":"86 1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-08-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128855754","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
期刊
2008 IEEE/LEOS International Conference on Optical MEMs and Nanophotonics
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