Pub Date : 2019-10-25DOI: 10.1186/s42649-019-0011-7
Anahita Vispi Bharda, Hyun Suk Jung
Contemporary microscopic imaging at near-atomic resolution of diverse embodiments in liquid environment has gained keen interest. In particular, Electron Microscopy (EM) can provide comprehensive framework on the structural and functional characterization of samples in liquid phase. In the past few decades, liquid based electron microscopic modalities have developed tremendously to provide insights into various backgrounds like biological, chemical, nanoparticle and material researches. It serves to be a promising analytical tool in deciphering unique insights from solvated systems. Here, the basics of liquid electron microscopy with few examples of its applications are summarized in brief. The technical developments made so far and its preference over other approaches is shortly presented. Finally, the experimental limitations and an outlook on the future technical advancement for liquid EM have been discussed.
{"title":"Liquid electron microscopy: then, now and future","authors":"Anahita Vispi Bharda, Hyun Suk Jung","doi":"10.1186/s42649-019-0011-7","DOIUrl":"https://doi.org/10.1186/s42649-019-0011-7","url":null,"abstract":"<p>Contemporary microscopic imaging at near-atomic resolution of diverse embodiments in liquid environment has gained keen interest. In particular, Electron Microscopy (EM) can provide comprehensive framework on the structural and functional characterization of samples in liquid phase. In the past few decades, liquid based electron microscopic modalities have developed tremendously to provide insights into various backgrounds like biological, chemical, nanoparticle and material researches. It serves to be a promising analytical tool in deciphering unique insights from solvated systems. Here, the basics of liquid electron microscopy with few examples of its applications are summarized in brief. The technical developments made so far and its preference over other approaches is shortly presented. Finally, the experimental limitations and an outlook on the future technical advancement for liquid EM have been discussed.</p>","PeriodicalId":470,"journal":{"name":"Applied Microscopy","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2019-10-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1186/s42649-019-0011-7","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"4983191","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-08-20DOI: 10.1186/s42649-019-0010-8
Byung Soo Chang, Eun-Kyung Choi, Hyun-Wook Kim, Dong Heui Kim
We examined the morphology and ultrastructures of fertilized egg envelopes of glowlight tetra (Hemigrammus erythrozonus) belong to Characidae using light and electron microscopes.
The fertilized eggs were spherical, transparent, demersal, adhesive, and have no oil droplet. The perivitelline space was well-developed and the micropyle was surrounded by 15–20 uplifted lines of egg envelope in a spoke like pattern. The outer surface of egg envelope was rough side with grooves. Also, the total thickness of the fertilized egg envelope was about 2.1–2.3?μm, and the fertilized egg envelope consisted of two layers, an outer adhesive electron-dense layer with grooves and three feather-like lamellae layers. Collectively, these morphological characteristics of fertilized egg and micropyle with spoke-like structure showed family Characidae specificity, and ultrastructures of outer surface and section of fertilized egg envelope showed species specificity.
{"title":"Ultrastructure of the fertilized egg envelopes in Hemigrammus erythrozonus, Characidae, Teleostei","authors":"Byung Soo Chang, Eun-Kyung Choi, Hyun-Wook Kim, Dong Heui Kim","doi":"10.1186/s42649-019-0010-8","DOIUrl":"https://doi.org/10.1186/s42649-019-0010-8","url":null,"abstract":"<p>We examined the morphology and ultrastructures of fertilized egg envelopes of glowlight tetra (<i>Hemigrammus erythrozonus</i>) belong to Characidae using light and electron microscopes.</p><p>The fertilized eggs were spherical, transparent, demersal, adhesive, and have no oil droplet. The perivitelline space was well-developed and the micropyle was surrounded by 15–20 uplifted lines of egg envelope in a spoke like pattern. The outer surface of egg envelope was rough side with grooves. Also, the total thickness of the fertilized egg envelope was about 2.1–2.3?μm, and the fertilized egg envelope consisted of two layers, an outer adhesive electron-dense layer with grooves and three feather-like lamellae layers. Collectively, these morphological characteristics of fertilized egg and micropyle with spoke-like structure showed family Characidae specificity, and ultrastructures of outer surface and section of fertilized egg envelope showed species specificity.</p>","PeriodicalId":470,"journal":{"name":"Applied Microscopy","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2019-08-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1186/s42649-019-0010-8","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"4779730","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-08-13DOI: 10.1186/s42649-019-0009-1
Otto Grosshardt, Boldizsár Árpád Nagy, Anette Laetsch
The present paper gives an overview of surface failures, internal nonconformities and solders joint failures detected by microscopic analysis of electronic assemblies. Optical microscopy (stereomicroscopy) and Fourier-Transform-Infrared (FTIR) microscopy is used for documentation and failure localization on electronic samples surface. For internal observable conditions a metallographic cross-section analysis of the sample is required. The aim of this work is to present some internal and external observable nonconformities which frequently appear in electronic assemblies. In order to detect these nonconformities, optical microscopy, cross section analysis, FTIR-microscopy and scanning electron microscopy with energy dispersive spectrometry (SEM-EDS) were used as analytical techniques.
{"title":"Applying microscopic analytic techniques for failure analysis in electronic assemblies","authors":"Otto Grosshardt, Boldizsár Árpád Nagy, Anette Laetsch","doi":"10.1186/s42649-019-0009-1","DOIUrl":"https://doi.org/10.1186/s42649-019-0009-1","url":null,"abstract":"<p>The present paper gives an overview of surface failures, internal nonconformities and solders joint failures detected by microscopic analysis of electronic assemblies. Optical microscopy (stereomicroscopy) and Fourier-Transform-Infrared (FTIR) microscopy is used for documentation and failure localization on electronic samples surface. For internal observable conditions a metallographic cross-section analysis of the sample is required. The aim of this work is to present some internal and external observable nonconformities which frequently appear in electronic assemblies. In order to detect these nonconformities, optical microscopy, cross section analysis, FTIR-microscopy and scanning electron microscopy with energy dispersive spectrometry (SEM-EDS) were used as analytical techniques.</p>","PeriodicalId":470,"journal":{"name":"Applied Microscopy","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2019-08-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1186/s42649-019-0009-1","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"4521808","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-07-18DOI: 10.1186/s42649-019-0008-2
Byeong-Seon An, Yena Kwon, Jin-Su Oh, Yeon-Ju Shin, Jae-seon Ju, Cheol-Woong Yang
Focused ion beam method, which has excellent capabilities such as local deposition and selective etching, is widely used for micro-electromechanical system (MEMS)-based in situ transmission electron microscopy (TEM) sample fabrication. Among the MEMS chips in which one can apply various external stimuli, the electrical MEMS chips require connection between the TEM sample and the electrodes in MEMS chip, and a connected deposition material with low electrical resistance is required to apply the electrical signal. Therefore, in this study, we introduce an optimized condition by comparing the electrical resistance for C-, Pt-, and W- ion beam induced deposition (IBID) at 30?kV and electron beam induced deposition (EBID) at 1 and 5?kV. The W-IBID at 30?kV with the lowest electrical resistance of about 30?Ω shows better electrical properties than C- and Pt-IBID electrodes. The W-EBID at 1?kV has lower electrical resistance than that at 5?kV; thus, confirming its potential as an electrode. Therefore, for the materials that are susceptible to ion beam damage, it is recommended to fabricate electrical connections using W-EBID at 1?kV.
{"title":"Evaluation of ion/electron beam induced deposition for electrical connection using a modern focused ion beam system","authors":"Byeong-Seon An, Yena Kwon, Jin-Su Oh, Yeon-Ju Shin, Jae-seon Ju, Cheol-Woong Yang","doi":"10.1186/s42649-019-0008-2","DOIUrl":"https://doi.org/10.1186/s42649-019-0008-2","url":null,"abstract":"<p>Focused ion beam method, which has excellent capabilities such as local deposition and selective etching, is widely used for micro-electromechanical system (MEMS)-based in situ transmission electron microscopy (TEM) sample fabrication. Among the MEMS chips in which one can apply various external stimuli, the electrical MEMS chips require connection between the TEM sample and the electrodes in MEMS chip, and a connected deposition material with low electrical resistance is required to apply the electrical signal. Therefore, in this study, we introduce an optimized condition by comparing the electrical resistance for C-, Pt-, and W- ion beam induced deposition (IBID) at 30?kV and electron beam induced deposition (EBID) at 1 and 5?kV. The W-IBID at 30?kV with the lowest electrical resistance of about 30?Ω shows better electrical properties than C- and Pt-IBID electrodes. The W-EBID at 1?kV has lower electrical resistance than that at 5?kV; thus, confirming its potential as an electrode. Therefore, for the materials that are susceptible to ion beam damage, it is recommended to fabricate electrical connections using W-EBID at 1?kV.</p>","PeriodicalId":470,"journal":{"name":"Applied Microscopy","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2019-07-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1186/s42649-019-0008-2","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"4719410","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-07-01DOI: 10.1186/s42649-019-0007-3
Im Joo Rhyu
The detailed morphology of Bergam glial cell was observed in single field of view during observation of Golgi stained mouse cerebellar cortex under the high voltage electron microscopy. The 3-dimensional organization of Bergman glial cell fully demonstrated with 8-degree stereo-paired images. The morphology of Bergman glial fiber and its appendages forming microdomains connected to other glial fiber are clearly presented in this image. This image provides a valuable insight for understanding morphology of Bergman glial cell.
{"title":"Bergman glial cell morphology under the high voltage Electron microscope","authors":"Im Joo Rhyu","doi":"10.1186/s42649-019-0007-3","DOIUrl":"https://doi.org/10.1186/s42649-019-0007-3","url":null,"abstract":"<p>The detailed morphology of Bergam glial cell was observed in single field of view during observation of Golgi stained mouse cerebellar cortex under the high voltage electron microscopy. The 3-dimensional organization of Bergman glial cell fully demonstrated with 8-degree stereo-paired images. The morphology of Bergman glial fiber and its appendages forming microdomains connected to other glial fiber are clearly presented in this image. This image provides a valuable insight for understanding morphology of Bergman glial cell.</p>","PeriodicalId":470,"journal":{"name":"Applied Microscopy","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1186/s42649-019-0007-3","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"4030150","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-04-29DOI: 10.1007/s42649-019-0006-4
Haneul Choi, Young Woo Jeong, Hye Jung Chang
We applied the advanced bitmap-assisted patterning function of focused ion beam to fabricate microscale sculpture of the ‘BangTanSoNyeonDan’ known as BTS members, the world-wide famous K-pop boyband. With the help of an electron microscope, you can carve your idols on your accessories at micro scale. Fun applications of electron microscopes are not limited to science.
{"title":"Microscale BTS sculptured by electron beam","authors":"Haneul Choi, Young Woo Jeong, Hye Jung Chang","doi":"10.1007/s42649-019-0006-4","DOIUrl":"https://doi.org/10.1007/s42649-019-0006-4","url":null,"abstract":"<p>We applied the advanced bitmap-assisted patterning function of focused ion beam to fabricate microscale sculpture of the ‘BangTanSoNyeonDan’ known as BTS members, the world-wide famous K-pop boyband. With the help of an electron microscope, you can carve your idols on your accessories at micro scale. Fun applications of electron microscopes are not limited to science.</p>","PeriodicalId":470,"journal":{"name":"Applied Microscopy","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2019-04-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1007/s42649-019-0006-4","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"5104640","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Joints of three-dimensional (3D) rutile-type (r) tin dioxide (SnO2) nanowire networks, produced by the flame transport synthesis (FTS), are formed by coherent twin boundaries at (101)r serving for the interpenetration of the nanowires. Transmission electron microscopy (TEM) methods, i.e. high resolution and (precession) electron diffraction (PED), were utilized to collect information of the atomic interface structure along the edge-on zone axes [010]r, [111]r and superposition directions [001]r, [101]r. A model of the twin boundary is generated by a supercell approach, serving as base for simulations of all given real and reciprocal space data as for the elaboration of three-dimensional, i.e. relrod and higher order Laue zones (HOLZ), contributions to the intensity distribution of PED patterns. Confirmed by the comparison of simulated and experimental findings, details of the structural distortion at the twin boundary can be demonstrated.
{"title":"Atomic structure and crystallography of joints in SnO2 nanowire networks","authors":"Viktor Hrkac, Niklas Wolff, Viola Duppel, Ingo Paulowicz, Rainer Adelung, Yogendra Kumar Mishra, Lorenz Kienle","doi":"10.1007/s42649-019-0003-7","DOIUrl":"https://doi.org/10.1007/s42649-019-0003-7","url":null,"abstract":"<p>Joints of three-dimensional (3D) rutile-type (r) tin dioxide (SnO<sub>2</sub>) nanowire networks, produced by the flame transport synthesis (FTS), are formed by coherent twin boundaries at (101)<sup>r</sup> serving for the interpenetration of the nanowires. Transmission electron microscopy (TEM) methods, i.e. high resolution and (precession) electron diffraction (PED), were utilized to collect information of the atomic interface structure along the edge-on zone axes [010]<sup>r</sup>, [111]<sup>r</sup> and superposition directions [001]<sup>r</sup>, [101]<sup>r</sup>. A model of the twin boundary is generated by a supercell approach, serving as base for simulations of all given real and reciprocal space data as for the elaboration of three-dimensional, i.e. relrod and higher order Laue zones (HOLZ), contributions to the intensity distribution of PED patterns. Confirmed by the comparison of simulated and experimental findings, details of the structural distortion at the twin boundary can be demonstrated.</p>","PeriodicalId":470,"journal":{"name":"Applied Microscopy","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2019-04-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1007/s42649-019-0003-7","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"5100811","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-04-29DOI: 10.1007/s42649-019-0004-6
Amall Ramanathan
Nanomaterials (NMs) find widespread use in different industries that range from agriculture, food, medicine, pharmaceuticals, and electronics to cosmetics. It is the exceptional properties of these materials at the nanoscale, which make them successful as growth promoters, drug carriers, catalysts, filters and fillers, but a price must be paid via the potential toxity of these materials. The harmful effects of nanoparticles (NPs) to environment, human and animal health needs to be investigated and critically examined, to find appropriate solutions and lower the risks involved in the manufacture and use of these exotic materials.
The vast number and complex interaction of NM/NPs with different biological systems implies that there is no universal toxicity mechanism or assessment method. The various challenges need to be overcome and a number of research studies have been conducted during the past decade on different NMs to explore the possible mechanisms of uptake, concentrations/dosage and toxicity levels. This review article examines critically the recent reports in this field to summarize and present opportunities for safer design using case studies from published literature.
{"title":"Toxicity of nanoparticles_ challenges and opportunities","authors":"Amall Ramanathan","doi":"10.1007/s42649-019-0004-6","DOIUrl":"https://doi.org/10.1007/s42649-019-0004-6","url":null,"abstract":"<p>Nanomaterials (NMs) find widespread use in different industries that range from agriculture, food, medicine, pharmaceuticals, and electronics to cosmetics. It is the exceptional properties of these materials at the nanoscale, which make them successful as growth promoters, drug carriers, catalysts, filters and fillers, but a price must be paid via the potential toxity of these materials. The harmful effects of nanoparticles (NPs) to environment, human and animal health needs to be investigated and critically examined, to find appropriate solutions and lower the risks involved in the manufacture and use of these exotic materials.</p><p>The vast number and complex interaction of NM/NPs with different biological systems implies that there is no universal toxicity mechanism or assessment method. The various challenges need to be overcome and a number of research studies have been conducted during the past decade on different NMs to explore the possible mechanisms of uptake, concentrations/dosage and toxicity levels. This review article examines critically the recent reports in this field to summarize and present opportunities for safer design using case studies from published literature.</p>","PeriodicalId":470,"journal":{"name":"Applied Microscopy","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2019-04-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1007/s42649-019-0004-6","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"5104646","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-04-29DOI: 10.1007/s42649-019-0005-5
Kangsik Kim, Jong Chan Yoon, Jaemin Kim, Jung Hwa Kim, Suk Woo Lee, Aram Yoon, Zonghoon Lee
Graphene, which is one of the most promising materials for its state-of-the-art applications, has received extensive attention because of its superior mechanical properties. However, there is little experimental evidence related to the mechanical properties of graphene at the atomic level because of the challenges associated with transferring atomically-thin two-dimensional (2D) materials onto microelectromechanical systems (MEMS) devices. In this study, we show successful dry transfer with a gel material of a stable, clean, and free-standing exfoliated graphene film onto a push-to-pull (PTP) device, which is a MEMS device used for uniaxial tensile testing in in situ transmission electron microscopy (TEM). Through the results of optical microscopy, Raman spectroscopy, and TEM, we demonstrate high quality exfoliated graphene on the PTP device. Finally, the stress–strain results corresponding to propagating cracks in folded graphene were simultaneously obtained during the tensile tests in TEM. The zigzag and armchair edges of graphene confirmed that the fracture occurred in association with the hexagonal lattice structure of graphene while the tensile testing. In the wake of the results, we envision the dedicated preparation and in situ TEM tensile experiments advance the understanding of the relationship between the mechanical properties and structural characteristics of 2D materials.
{"title":"Dedicated preparation for in situ transmission electron microscope tensile testing of exfoliated graphene","authors":"Kangsik Kim, Jong Chan Yoon, Jaemin Kim, Jung Hwa Kim, Suk Woo Lee, Aram Yoon, Zonghoon Lee","doi":"10.1007/s42649-019-0005-5","DOIUrl":"https://doi.org/10.1007/s42649-019-0005-5","url":null,"abstract":"<p>Graphene, which is one of the most promising materials for its state-of-the-art applications, has received extensive attention because of its superior mechanical properties. However, there is little experimental evidence related to the mechanical properties of graphene at the atomic level because of the challenges associated with transferring atomically-thin two-dimensional (2D) materials onto microelectromechanical systems (MEMS) devices. In this study, we show successful dry transfer with a gel material of a stable, clean, and free-standing exfoliated graphene film onto a push-to-pull (PTP) device, which is a MEMS device used for uniaxial tensile testing in in situ transmission electron microscopy (TEM). Through the results of optical microscopy, Raman spectroscopy, and TEM, we demonstrate high quality exfoliated graphene on the PTP device. Finally, the stress–strain results corresponding to propagating cracks in folded graphene were simultaneously obtained during the tensile tests in TEM. The zigzag and armchair edges of graphene confirmed that the fracture occurred in association with the hexagonal lattice structure of graphene while the tensile testing. In the wake of the results, we envision the dedicated preparation and in situ TEM tensile experiments advance the understanding of the relationship between the mechanical properties and structural characteristics of 2D materials.</p>","PeriodicalId":470,"journal":{"name":"Applied Microscopy","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2019-04-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1007/s42649-019-0005-5","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"5100810","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-12-28DOI: 10.9729/AM.2018.48.4.122
Byeong-Seon An, Yeon-Ju Shin, Jae-seon Ju, Cheol‐Woong Yang
material and SiO 2 ). On the other hand, FIB has been extensively used in the semiconductor industry and field of materials science because the specimen preparation is facile without any of the restrictions The focused ion beam (FIB) method is widely used to prepare specimens for observation by transmission electron microscopy (TEM), which offers a wide variety of imaging and analytical techniques. TEM has played a significant role in material investigation. However, the FIB method induces amorphization due to bombardment with the high-energy gallium (Ga + ) ion beam. To solve this problem, electron beam induced deposition (EBID) is used to form a protective layer to prevent damage to the specimen surface. In this study, we introduce an optimized TEM specimen preparation procedure by comparing the EBID of carbon and tungsten as protective layers in FIB. The selection of appropriate EBID conditions for preparing specimens for TEM analysis is described in detail.
{"title":"Transmission Electron Microscopy Specimen Preparation for Two Dimensional Material Using Electron Beam Induced Deposition of a Protective Layer in the Focused Ion Beam Method","authors":"Byeong-Seon An, Yeon-Ju Shin, Jae-seon Ju, Cheol‐Woong Yang","doi":"10.9729/AM.2018.48.4.122","DOIUrl":"https://doi.org/10.9729/AM.2018.48.4.122","url":null,"abstract":"material and SiO 2 ). On the other hand, FIB has been extensively used in the semiconductor industry and field of materials science because the specimen preparation is facile without any of the restrictions The focused ion beam (FIB) method is widely used to prepare specimens for observation by transmission electron microscopy (TEM), which offers a wide variety of imaging and analytical techniques. TEM has played a significant role in material investigation. However, the FIB method induces amorphization due to bombardment with the high-energy gallium (Ga + ) ion beam. To solve this problem, electron beam induced deposition (EBID) is used to form a protective layer to prevent damage to the specimen surface. In this study, we introduce an optimized TEM specimen preparation procedure by comparing the EBID of carbon and tungsten as protective layers in FIB. The selection of appropriate EBID conditions for preparing specimens for TEM analysis is described in detail.","PeriodicalId":470,"journal":{"name":"Applied Microscopy","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-12-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78859642","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}