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Liquid electron microscopy: then, now and future 液体电子显微镜:过去,现在和未来
Q3 Immunology and Microbiology Pub Date : 2019-10-25 DOI: 10.1186/s42649-019-0011-7
Anahita Vispi Bharda, Hyun Suk Jung

Contemporary microscopic imaging at near-atomic resolution of diverse embodiments in liquid environment has gained keen interest. In particular, Electron Microscopy (EM) can provide comprehensive framework on the structural and functional characterization of samples in liquid phase. In the past few decades, liquid based electron microscopic modalities have developed tremendously to provide insights into various backgrounds like biological, chemical, nanoparticle and material researches. It serves to be a promising analytical tool in deciphering unique insights from solvated systems. Here, the basics of liquid electron microscopy with few examples of its applications are summarized in brief. The technical developments made so far and its preference over other approaches is shortly presented. Finally, the experimental limitations and an outlook on the future technical advancement for liquid EM have been discussed.

当代液体环境中不同表现形式的近原子分辨率显微成像已经引起了人们的极大兴趣。特别是,电子显微镜(EM)可以提供液相样品结构和功能表征的全面框架。在过去的几十年里,基于液体的电子显微镜模式得到了巨大的发展,为生物、化学、纳米颗粒和材料研究等各种背景提供了见解。它是一个有前途的分析工具,在破译独特的见解,从溶剂化系统。本文简要介绍了液体电子显微镜的基本原理及其应用实例。本文将简要介绍迄今为止所取得的技术发展及其相对于其他方法的优越性。最后,讨论了液体电磁的实验局限性和对未来技术发展的展望。
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引用次数: 3
Ultrastructure of the fertilized egg envelopes in Hemigrammus erythrozonus, Characidae, Teleostei 红带赤眼虫,特征科,Teleostei受精卵包膜的超微结构
Q3 Immunology and Microbiology Pub Date : 2019-08-20 DOI: 10.1186/s42649-019-0010-8
Byung Soo Chang, Eun-Kyung Choi, Hyun-Wook Kim, Dong Heui Kim

We examined the morphology and ultrastructures of fertilized egg envelopes of glowlight tetra (Hemigrammus erythrozonus) belong to Characidae using light and electron microscopes.

The fertilized eggs were spherical, transparent, demersal, adhesive, and have no oil droplet. The perivitelline space was well-developed and the micropyle was surrounded by 15–20 uplifted lines of egg envelope in a spoke like pattern. The outer surface of egg envelope was rough side with grooves. Also, the total thickness of the fertilized egg envelope was about 2.1–2.3?μm, and the fertilized egg envelope consisted of two layers, an outer adhesive electron-dense layer with grooves and three feather-like lamellae layers. Collectively, these morphological characteristics of fertilized egg and micropyle with spoke-like structure showed family Characidae specificity, and ultrastructures of outer surface and section of fertilized egg envelope showed species specificity.

用光镜和电镜观察了红斑赤眼蜂(Hemigrammus erythrozonus)受精卵包膜的形态和超微结构。受精卵球形、透明、凹陷、粘连,无油滴。卵周空间发育良好,微孔周围有15 ~ 20条凸起的卵包膜,呈辐条状。卵包膜外表面粗糙,有沟槽。受精卵包膜总厚度约为2.1 ~ 2.3?受精卵包膜由两层组成,一层是带凹槽的黏附电子致密层,另一层是3层羽毛状片层。综上所述,受精卵和具有辐状结构的微孔的形态特征具有科特异性,受精卵外表面和包膜切片的超微结构具有种特异性。
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引用次数: 3
Applying microscopic analytic techniques for failure analysis in electronic assemblies 应用微观分析技术进行电子组件失效分析
Q3 Immunology and Microbiology Pub Date : 2019-08-13 DOI: 10.1186/s42649-019-0009-1
Otto Grosshardt, Boldizsár Árpád Nagy, Anette Laetsch

The present paper gives an overview of surface failures, internal nonconformities and solders joint failures detected by microscopic analysis of electronic assemblies. Optical microscopy (stereomicroscopy) and Fourier-Transform-Infrared (FTIR) microscopy is used for documentation and failure localization on electronic samples surface. For internal observable conditions a metallographic cross-section analysis of the sample is required. The aim of this work is to present some internal and external observable nonconformities which frequently appear in electronic assemblies. In order to detect these nonconformities, optical microscopy, cross section analysis, FTIR-microscopy and scanning electron microscopy with energy dispersive spectrometry (SEM-EDS) were used as analytical techniques.

本文综述了电子组件表面缺陷、内部缺陷和焊点缺陷的显微分析方法。光学显微镜(体视显微镜)和傅里叶变换红外(FTIR)显微镜用于电子样品表面的记录和故障定位。对于内部可观察的条件,需要对样品进行金相截面分析。这项工作的目的是提出一些内部和外部可观察到的不符合,经常出现在电子组件。为了检测这些不合格,使用了光学显微镜、截面分析、傅里叶红外显微镜和扫描电子显微镜与能量色散光谱(SEM-EDS)作为分析技术。
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引用次数: 2
Evaluation of ion/electron beam induced deposition for electrical connection using a modern focused ion beam system 用现代聚焦离子束系统评价离子/电子束诱导电连接沉积
Q3 Immunology and Microbiology Pub Date : 2019-07-18 DOI: 10.1186/s42649-019-0008-2
Byeong-Seon An, Yena Kwon, Jin-Su Oh, Yeon-Ju Shin, Jae-seon Ju, Cheol-Woong Yang

Focused ion beam method, which has excellent capabilities such as local deposition and selective etching, is widely used for micro-electromechanical system (MEMS)-based in situ transmission electron microscopy (TEM) sample fabrication. Among the MEMS chips in which one can apply various external stimuli, the electrical MEMS chips require connection between the TEM sample and the electrodes in MEMS chip, and a connected deposition material with low electrical resistance is required to apply the electrical signal. Therefore, in this study, we introduce an optimized condition by comparing the electrical resistance for C-, Pt-, and W- ion beam induced deposition (IBID) at 30?kV and electron beam induced deposition (EBID) at 1 and 5?kV. The W-IBID at 30?kV with the lowest electrical resistance of about 30?Ω shows better electrical properties than C- and Pt-IBID electrodes. The W-EBID at 1?kV has lower electrical resistance than that at 5?kV; thus, confirming its potential as an electrode. Therefore, for the materials that are susceptible to ion beam damage, it is recommended to fabricate electrical connections using W-EBID at 1?kV.

聚焦离子束法以其优异的局部沉积和选择性刻蚀等性能,被广泛应用于基于微机电系统(MEMS)的原位透射电子显微镜(TEM)样品制备。在可以施加各种外部刺激的MEMS芯片中,电子MEMS芯片需要将TEM样品与MEMS芯片中的电极连接起来,并且需要一种连接的低电阻沉积材料来施加电信号。因此,在本研究中,我们通过比较C-, Pt-和W-离子束诱导沉积(IBID)在30?1 kV和5 kV的电子束诱导沉积(EBID)。W-IBID是30?kV,最低电阻约30?Ω表现出比C-和Pt-IBID电极更好的电学性能。W-EBID在1?kV时电阻比5kv时低;因此,确认了它作为电极的电位。因此,对于易受离子束损伤的材料,建议使用1kv的W-EBID进行电气连接。
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引用次数: 6
Bergman glial cell morphology under the high voltage Electron microscope 高压电子显微镜下的伯格曼胶质细胞形态
Q3 Immunology and Microbiology Pub Date : 2019-07-01 DOI: 10.1186/s42649-019-0007-3
Im Joo Rhyu

The detailed morphology of Bergam glial cell was observed in single field of view during observation of Golgi stained mouse cerebellar cortex under the high voltage electron microscopy. The 3-dimensional organization of Bergman glial cell fully demonstrated with 8-degree stereo-paired images. The morphology of Bergman glial fiber and its appendages forming microdomains connected to other glial fiber are clearly presented in this image. This image provides a valuable insight for understanding morphology of Bergman glial cell.

在高压电镜下观察高尔基染色小鼠小脑皮层,单视场观察到Bergam胶质细胞的详细形态。8度立体配对图像充分展示了伯格曼胶质细胞的三维组织。伯格曼胶质纤维的形态和它的附属物形成与其他胶质纤维连接的微结构域。该图像为了解伯格曼胶质细胞的形态提供了有价值的见解。
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引用次数: 0
Microscale BTS sculptured by electron beam 电子束雕刻的微型防弹少年团
Q3 Immunology and Microbiology Pub Date : 2019-04-29 DOI: 10.1007/s42649-019-0006-4
Haneul Choi, Young Woo Jeong, Hye Jung Chang

We applied the advanced bitmap-assisted patterning function of focused ion beam to fabricate microscale sculpture of the ‘BangTanSoNyeonDan’ known as BTS members, the world-wide famous K-pop boyband. With the help of an electron microscope, you can carve your idols on your accessories at micro scale. Fun applications of electron microscopes are not limited to science.

我们利用聚焦离子束的先进位图辅助图案功能,制作了世界著名的K-pop男子组合BTS成员“BangTanSoNyeonDan”的微型雕塑。在电子显微镜的帮助下,你可以把你的偶像雕刻在你的饰品上。电子显微镜有趣的应用并不局限于科学。
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引用次数: 0
Atomic structure and crystallography of joints in SnO2 nanowire networks SnO2纳米线网络中节点的原子结构和晶体学
Q3 Immunology and Microbiology Pub Date : 2019-04-29 DOI: 10.1007/s42649-019-0003-7
Viktor Hrkac, Niklas Wolff, Viola Duppel, Ingo Paulowicz, Rainer Adelung, Yogendra Kumar Mishra, Lorenz Kienle

Joints of three-dimensional (3D) rutile-type (r) tin dioxide (SnO2) nanowire networks, produced by the flame transport synthesis (FTS), are formed by coherent twin boundaries at (101)r serving for the interpenetration of the nanowires. Transmission electron microscopy (TEM) methods, i.e. high resolution and (precession) electron diffraction (PED), were utilized to collect information of the atomic interface structure along the edge-on zone axes [010]r, [111]r and superposition directions [001]r, [101]r. A model of the twin boundary is generated by a supercell approach, serving as base for simulations of all given real and reciprocal space data as for the elaboration of three-dimensional, i.e. relrod and higher order Laue zones (HOLZ), contributions to the intensity distribution of PED patterns. Confirmed by the comparison of simulated and experimental findings, details of the structural distortion at the twin boundary can be demonstrated.

采用火焰传递合成(FTS)法制备了三维金红石型(r)二氧化锡(SnO2)纳米线网络,该网络在(101)r处由相干孪晶界形成,用于纳米线的互穿。利用高分辨率透射电子显微镜(TEM)和(进动)电子衍射(PED)方法,沿边区轴[010]r、[111]r和叠加方向[001]r、[101]r收集了原子界面结构信息。通过超级单体方法生成了孪生边界模型,作为模拟所有给定实空间和互易空间数据的基础,以详细说明三维,即低阶和高阶劳厄带(HOLZ)对PED模式强度分布的贡献。通过模拟结果和实验结果的比较,可以证明孪晶界处结构畸变的细节。
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引用次数: 7
Toxicity of nanoparticles_ challenges and opportunities 纳米粒子的毒性——挑战与机遇
Q3 Immunology and Microbiology Pub Date : 2019-04-29 DOI: 10.1007/s42649-019-0004-6
Amall Ramanathan

Nanomaterials (NMs) find widespread use in different industries that range from agriculture, food, medicine, pharmaceuticals, and electronics to cosmetics. It is the exceptional properties of these materials at the nanoscale, which make them successful as growth promoters, drug carriers, catalysts, filters and fillers, but a price must be paid via the potential toxity of these materials. The harmful effects of nanoparticles (NPs) to environment, human and animal health needs to be investigated and critically examined, to find appropriate solutions and lower the risks involved in the manufacture and use of these exotic materials.

The vast number and complex interaction of NM/NPs with different biological systems implies that there is no universal toxicity mechanism or assessment method. The various challenges need to be overcome and a number of research studies have been conducted during the past decade on different NMs to explore the possible mechanisms of uptake, concentrations/dosage and toxicity levels. This review article examines critically the recent reports in this field to summarize and present opportunities for safer design using case studies from published literature.

纳米材料(NMs)广泛应用于从农业、食品、医药、制药、电子到化妆品等不同行业。正是这些材料在纳米尺度上的特殊性能,使它们成功地作为生长促进剂、药物载体、催化剂、过滤器和填料,但必须付出代价,即这些材料的潜在毒性。需要对纳米粒子对环境、人类和动物健康的有害影响进行调查和严格审查,以找到适当的解决办法,并降低制造和使用这些外来材料所涉及的风险。NM/NPs与不同生物系统的相互作用数量庞大且复杂,这意味着没有通用的毒性机制或评估方法。需要克服各种挑战,在过去十年中对不同的纳米颗粒进行了许多研究,以探索可能的吸收机制、浓度/剂量和毒性水平。这篇综述文章批判性地审查了该领域最近的报告,总结并提出了使用已发表文献中的案例研究进行更安全设计的机会。
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引用次数: 14
Dedicated preparation for in situ transmission electron microscope tensile testing of exfoliated graphene 专用于制备剥离石墨烯的原位透射电子显微镜拉伸测试
Q3 Immunology and Microbiology Pub Date : 2019-04-29 DOI: 10.1007/s42649-019-0005-5
Kangsik Kim, Jong Chan Yoon, Jaemin Kim, Jung Hwa Kim, Suk Woo Lee, Aram Yoon, Zonghoon Lee

Graphene, which is one of the most promising materials for its state-of-the-art applications, has received extensive attention because of its superior mechanical properties. However, there is little experimental evidence related to the mechanical properties of graphene at the atomic level because of the challenges associated with transferring atomically-thin two-dimensional (2D) materials onto microelectromechanical systems (MEMS) devices. In this study, we show successful dry transfer with a gel material of a stable, clean, and free-standing exfoliated graphene film onto a push-to-pull (PTP) device, which is a MEMS device used for uniaxial tensile testing in in situ transmission electron microscopy (TEM). Through the results of optical microscopy, Raman spectroscopy, and TEM, we demonstrate high quality exfoliated graphene on the PTP device. Finally, the stress–strain results corresponding to propagating cracks in folded graphene were simultaneously obtained during the tensile tests in TEM. The zigzag and armchair edges of graphene confirmed that the fracture occurred in association with the hexagonal lattice structure of graphene while the tensile testing. In the wake of the results, we envision the dedicated preparation and in situ TEM tensile experiments advance the understanding of the relationship between the mechanical properties and structural characteristics of 2D materials.

石墨烯因其优异的机械性能而受到广泛关注,是目前应用前景最广阔的材料之一。然而,由于将原子薄的二维(2D)材料转移到微机电系统(MEMS)器件上的挑战,很少有与石墨烯在原子水平上的机械性能相关的实验证据。在这项研究中,我们成功地将稳定、清洁、独立的剥离石墨烯薄膜凝胶材料干燥转移到推拉(PTP)装置上,该装置是一种用于原位透射电子显微镜(TEM)单轴拉伸测试的MEMS装置。通过光学显微镜,拉曼光谱和透射电镜的结果,我们证明了PTP器件上高质量的剥落石墨烯。最后,在TEM中同时获得了折叠石墨烯中裂纹扩展的应力应变结果。在拉伸试验中,石墨烯的锯齿形和扶手椅形边缘证实了断裂与石墨烯的六边形晶格结构有关。在研究结果之后,我们设想专门的制备和原位TEM拉伸实验促进了对二维材料力学性能和结构特征之间关系的理解。
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引用次数: 4
Transmission Electron Microscopy Specimen Preparation for Two Dimensional Material Using Electron Beam Induced Deposition of a Protective Layer in the Focused Ion Beam Method 聚焦离子束方法中电子束诱导沉积保护层制备二维材料的透射电镜样品
Q3 Immunology and Microbiology Pub Date : 2018-12-28 DOI: 10.9729/AM.2018.48.4.122
Byeong-Seon An, Yeon-Ju Shin, Jae-seon Ju, Cheol‐Woong Yang
material and SiO 2 ). On the other hand, FIB has been extensively used in the semiconductor industry and field of materials science because the specimen preparation is facile without any of the restrictions The focused ion beam (FIB) method is widely used to prepare specimens for observation by transmission electron microscopy (TEM), which offers a wide variety of imaging and analytical techniques. TEM has played a significant role in material investigation. However, the FIB method induces amorphization due to bombardment with the high-energy gallium (Ga + ) ion beam. To solve this problem, electron beam induced deposition (EBID) is used to form a protective layer to prevent damage to the specimen surface. In this study, we introduce an optimized TEM specimen preparation procedure by comparing the EBID of carbon and tungsten as protective layers in FIB. The selection of appropriate EBID conditions for preparing specimens for TEM analysis is described in detail.
材料和sio2)。聚焦离子束(FIB)方法被广泛用于制备用于透射电子显微镜(TEM)观察的样品,该方法提供了多种成像和分析技术。瞬变电磁法在材料调查中发挥了重要作用。然而,FIB方法由于高能镓(Ga +)离子束的轰击而导致非晶化。为了解决这一问题,采用电子束诱导沉积(EBID)形成保护层以防止试样表面受到损伤。在本研究中,我们通过比较碳和钨作为FIB保护层的EBID,介绍了一种优化的TEM样品制备工艺。详细描述了制备TEM分析样品的适当EBID条件的选择。
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引用次数: 2
期刊
Applied Microscopy
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