Pub Date : 2022-05-11DOI: 10.1186/s42649-022-00073-2
Ki Woo Kim
{"title":"Biological applications of the NanoSuit for electron imaging and X-microanalysis of insulating specimens","authors":"Ki Woo Kim","doi":"10.1186/s42649-022-00073-2","DOIUrl":"https://doi.org/10.1186/s42649-022-00073-2","url":null,"abstract":"","PeriodicalId":470,"journal":{"name":"Applied Microscopy","volume":"4 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-05-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87526930","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-05-11DOI: 10.1186/s42649-022-00073-2
Ki Woo Kim
Field emission scanning electron microscopy (FESEM) is an essential tool for observing surface details of specimens in a high vacuum. A series of specimen procedures precludes the observations of living organisms, resulting in artifacts. To overcome these problems, Takahiko Hariyama and his colleagues proposed the concept of the “nanosuit” later referred to as “NanoSuit”, describing a thin polymer layer placed on organisms to protect them in a high vacuum in 2013. The NanoSuit is formed rapidly by (i) electron beam irradiation, (ii) plasma irradiation, (iii) Tween 20 solution immersion, and (iv) surface shield enhancer (SSE) solution immersion. Without chemical fixation and metal coating, the NanoSuit-formed specimens allowed structural preservation and accurate element detection of insulating, wet specimens at high spatial resolution. NanoSuit-formed larvae were able to resume normal growth following FESEM observation. The method has been employed to observe unfixed and uncoated bacteria, multicellular organisms, and paraffin sections. These results suggest that the NanoSuit can be applied to prolong life in vacuo and overcome the limit of dead imaging of electron microscopy.
{"title":"Biological applications of the NanoSuit for electron imaging and X-microanalysis of insulating specimens","authors":"Ki Woo Kim","doi":"10.1186/s42649-022-00073-2","DOIUrl":"10.1186/s42649-022-00073-2","url":null,"abstract":"<div><p>Field emission scanning electron microscopy (FESEM) is an essential tool for observing surface details of specimens in a high vacuum. A series of specimen procedures precludes the observations of living organisms, resulting in artifacts. To overcome these problems, Takahiko Hariyama and his colleagues proposed the concept of the “nanosuit” later referred to as “NanoSuit”, describing a thin polymer layer placed on organisms to protect them in a high vacuum in 2013. The NanoSuit is formed rapidly by (i) electron beam irradiation, (ii) plasma irradiation, (iii) Tween 20 solution immersion, and (iv) surface shield enhancer (SSE) solution immersion. Without chemical fixation and metal coating, the NanoSuit-formed specimens allowed structural preservation and accurate element detection of insulating, wet specimens at high spatial resolution. NanoSuit-formed larvae were able to resume normal growth following FESEM observation. The method has been employed to observe unfixed and uncoated bacteria, multicellular organisms, and paraffin sections. These results suggest that the NanoSuit can be applied to prolong life in vacuo and overcome the limit of dead imaging of electron microscopy.</p></div>","PeriodicalId":470,"journal":{"name":"Applied Microscopy","volume":"52 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-05-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://appmicro.springeropen.com/counter/pdf/10.1186/s42649-022-00073-2","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120170088","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-04-11DOI: 10.1186/s42649-022-00072-3
Hyun Sook Jin, Byung Soo Chang
Our purpose in this study is to analyze the microstructural characteristics and constituent elements of inorganic substances added to the yellow ink and red ink pigments used in permanent makeup. We observed the microstructural properties of inorganic pigments added to the ink using a scanning electron microscopy (SEM) and analyzed the constituent elements of the inorganic pigment particles using an energy dispersive X-ray spectroscopy (EDX). In red wine-colored ink, cubic titanium dioxide with a diameter of 110 to 200 nm was the major component, and rod-shaped iron oxide was rarely observed. Most of the ingredients of taupe yellow ink were rod-shaped yellow iron oxide, and a small amount of cubic titanium dioxide was observed. Red wine-colored ink and taupe yellow ink contained lumps composed of titanium dioxide particles. In red wine-colored ink, lumps were formed by agglomeration. However, we observed that the surface of the lump composed of titanium dioxide in the taupe yellow ink had a smooth surface caused by external physical compression. The titanium dioxide particle mass which found in taupe yellow ink in this study is an artificial product. When this mass accumulates in the dermis, it may cause a color mismatch. Therefore, permanent makeup using fine pigments should be free of foreign substances that may cause trouble in the skin. In addition, there is a need to improve the quality of the ink so that the required color can be safe and long lasting in the dermis.
{"title":"Analysis of microstructural characteristics and components of red and yellow ink pigments used in permanent makeup","authors":"Hyun Sook Jin, Byung Soo Chang","doi":"10.1186/s42649-022-00072-3","DOIUrl":"10.1186/s42649-022-00072-3","url":null,"abstract":"<div><p>Our purpose in this study is to analyze the microstructural characteristics and constituent elements of inorganic substances added to the yellow ink and red ink pigments used in permanent makeup. We observed the microstructural properties of inorganic pigments added to the ink using a scanning electron microscopy (SEM) and analyzed the constituent elements of the inorganic pigment particles using an energy dispersive X-ray spectroscopy (EDX). In red wine-colored ink, cubic titanium dioxide with a diameter of 110 to 200 nm was the major component, and rod-shaped iron oxide was rarely observed. Most of the ingredients of taupe yellow ink were rod-shaped yellow iron oxide, and a small amount of cubic titanium dioxide was observed. Red wine-colored ink and taupe yellow ink contained lumps composed of titanium dioxide particles. In red wine-colored ink, lumps were formed by agglomeration. However, we observed that the surface of the lump composed of titanium dioxide in the taupe yellow ink had a smooth surface caused by external physical compression. The titanium dioxide particle mass which found in taupe yellow ink in this study is an artificial product. When this mass accumulates in the dermis, it may cause a color mismatch. Therefore, permanent makeup using fine pigments should be free of foreign substances that may cause trouble in the skin. In addition, there is a need to improve the quality of the ink so that the required color can be safe and long lasting in the dermis.</p></div>","PeriodicalId":470,"journal":{"name":"Applied Microscopy","volume":"52 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-04-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://appmicro.springeropen.com/counter/pdf/10.1186/s42649-022-00072-3","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"4445519","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-03-28DOI: 10.1186/s42649-022-00071-4
Myeongjin Kim, Hyun Soon Park
With the lightening of the mobile devices, thinning of electrolytic copper foil, which is mainly used as an anode collection of lithium secondary batteries, is needed. As the copper foil becomes ultrathin, mechanical properties such as deterioration of elongation rate and tear phenomenon are occurring, which is closely related to microstructure. However, there is a problem that it is not easy to prepare and observe specimens in the analysis of the microstructure of ultrathin copper foil. In this study, electron backscatter diffraction (EBSD) specimens were fabricated using only mechanical polishing to analyze the microstructure of 8 μm thick electrolytic copper foil in plane view. In addition, EBSD maps and transmission electron microscopy (TEM) images were compared and analyzed to find the optimal cleanup technique for properly correcting errors in EBSD maps.
{"title":"Microstructure analysis of 8 μm electrolytic Cu foil in plane view using EBSD and TEM","authors":"Myeongjin Kim, Hyun Soon Park","doi":"10.1186/s42649-022-00071-4","DOIUrl":"10.1186/s42649-022-00071-4","url":null,"abstract":"<div><p>With the lightening of the mobile devices, thinning of electrolytic copper foil, which is mainly used as an anode collection of lithium secondary batteries, is needed. As the copper foil becomes ultrathin, mechanical properties such as deterioration of elongation rate and tear phenomenon are occurring, which is closely related to microstructure. However, there is a problem that it is not easy to prepare and observe specimens in the analysis of the microstructure of ultrathin copper foil. In this study, electron backscatter diffraction (EBSD) specimens were fabricated using only mechanical polishing to analyze the microstructure of 8 μm thick electrolytic copper foil in plane view. In addition, EBSD maps and transmission electron microscopy (TEM) images were compared and analyzed to find the optimal cleanup technique for properly correcting errors in EBSD maps.</p></div>","PeriodicalId":470,"journal":{"name":"Applied Microscopy","volume":"52 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-03-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://appmicro.springeropen.com/counter/pdf/10.1186/s42649-022-00071-4","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"5093326","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
As semiconductor device architecture develops, from planar field-effect transistors (FET) to FinFET and gate-all-around (GAA), there is an increased need to measure 3D structure sidewalls precisely. Here, we present a 3-Dimensional Atomic Force Microscope (3D-AFM), a powerful 3D metrology tool to measure the sidewall roughness (SWR) of vertical and undercut structures. First, we measured three different dies repeatedly to calculate reproducibility in die level. Reproducible results were derived with a relative standard deviation under 2%. Second, we measured 13 different dies, including the center and edge of the wafer, to analyze SWR distribution in wafer level and reliable results were measured. All analysis was performed using a novel algorithm, including auto flattening, sidewall detection, and SWR calculation. In addition, SWR automatic analysis software was implemented to reduce analysis time and to provide standard analysis. The results suggest that our 3D-AFM, based on the tilted Z scanner, will enable an advanced methodology for automated 3D measurement and analysis.
{"title":"Automated measurement and analysis of sidewall roughness using three-dimensional atomic force microscopy","authors":"Su-Been Yoo, Seong-Hun Yun, Ah-Jin Jo, Sang-Joon Cho, Haneol Cho, Jun-Ho Lee, Byoung-Woon Ahn","doi":"10.1186/s42649-022-00070-5","DOIUrl":"10.1186/s42649-022-00070-5","url":null,"abstract":"<div><p>As semiconductor device architecture develops, from planar field-effect transistors (FET) to FinFET and gate-all-around (GAA), there is an increased need to measure 3D structure sidewalls precisely. Here, we present a 3-Dimensional Atomic Force Microscope (3D-AFM), a powerful 3D metrology tool to measure the sidewall roughness (SWR) of vertical and undercut structures. First, we measured three different dies repeatedly to calculate reproducibility in die level. Reproducible results were derived with a relative standard deviation under 2%. Second, we measured 13 different dies, including the center and edge of the wafer, to analyze SWR distribution in wafer level and reliable results were measured. All analysis was performed using a novel algorithm, including auto flattening, sidewall detection, and SWR calculation. In addition, SWR automatic analysis software was implemented to reduce analysis time and to provide standard analysis. The results suggest that our 3D-AFM, based on the tilted Z scanner, will enable an advanced methodology for automated 3D measurement and analysis.</p></div>","PeriodicalId":470,"journal":{"name":"Applied Microscopy","volume":"52 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-03-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://appmicro.springeropen.com/counter/pdf/10.1186/s42649-022-00070-5","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"4351753","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-12-29DOI: 10.1186/s42649-021-00069-4
Ritika Singh, Ayushi Jain, Jayanth Kumar Palanichamy, T. C. Nag, Sameer Bakhshi, Archna Singh
We explored the link between mitochondrial biogenesis and mitochondrial morphology using transmission electron microscopy (TEM) in lymphoblasts of pediatric acute lymphoblastic leukemia (ALL) patients and compared these characteristics between tumors and control samples. Gene expression of mitochondrial biogenesis markers was analysed in 23 ALL patients and 18 controls and TEM for morphology analysis was done in 15 ALL patients and 9 healthy controls. The area occupied by mitochondria per cell and the cristae cross-sectional area was observed to be significantly higher in patients than in controls (p-value = 0.0468 and p-value< 0.0001, respectively). The mtDNA copy numbers, TFAM, POLG, and c-myc gene expression were significantly higher in ALL patients than controls (all p-values< 0.01). Gene Expression of PGC-1α was higher in tumor samples. The analysis of the correlation between PGC-1α expression and morphology parameters i.e., both M/C ratio and cristae cross-sectional area revealed a positive trend (r = 0.3, p = 0.1). The increased area occupied by mitochondria and increased cristae area support the occurrence of cristae remodelling in ALL. These changes might reflect alterations in cristae dynamics to support the metabolic state of the cells by forming a more condensed network. Ultrastructural imaging can be useful for affirming changes occurring at a subcellular organellar level.
{"title":"Ultrastructural changes in cristae of lymphoblasts in acute lymphoblastic leukemia parallel alterations in biogenesis markers","authors":"Ritika Singh, Ayushi Jain, Jayanth Kumar Palanichamy, T. C. Nag, Sameer Bakhshi, Archna Singh","doi":"10.1186/s42649-021-00069-4","DOIUrl":"10.1186/s42649-021-00069-4","url":null,"abstract":"<div><p>We explored the link between mitochondrial biogenesis and mitochondrial morphology using transmission electron microscopy (TEM) in lymphoblasts of pediatric acute lymphoblastic leukemia (ALL) patients and compared these characteristics between tumors and control samples. Gene expression of mitochondrial biogenesis markers was analysed in 23 ALL patients and 18 controls and TEM for morphology analysis was done in 15 ALL patients and 9 healthy controls. The area occupied by mitochondria per cell and the cristae cross-sectional area was observed to be significantly higher in patients than in controls (<i>p</i>-value = 0.0468 and <i>p</i>-value< 0.0001, respectively). The mtDNA copy numbers, <i>TFAM</i>, <i>POLG,</i> and <i>c-myc</i> gene expression were significantly higher in ALL patients than controls (all <i>p</i>-values< 0.01). Gene Expression of <i>PGC-1α</i> was higher in tumor samples. The analysis of the correlation between <i>PGC-1α</i> expression and morphology parameters i.e., both M/C ratio and cristae cross-sectional area revealed a positive trend (<i>r</i> = 0.3, <i>p</i> = 0.1). The increased area occupied by mitochondria and increased cristae area support the occurrence of cristae remodelling in ALL. These changes might reflect alterations in cristae dynamics to support the metabolic state of the cells by forming a more condensed network. Ultrastructural imaging can be useful for affirming changes occurring at a subcellular organellar level.</p></div>","PeriodicalId":470,"journal":{"name":"Applied Microscopy","volume":"51 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2021-12-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8716663/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"39770402","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-12-23DOI: 10.1186/s42649-021-00068-5
Jung Sik Park, Yoon-Jung Kang, Sun Eui Choi, Yong Nam Jo
The main purpose of this paper is the preparation of transmission electron microscopy (TEM) samples from the microsized powders of lithium-ion secondary batteries. To avoid artefacts during TEM sample preparation, the use of ion slicer milling for thinning and maintaining the intrinsic structure is described. Argon-ion milling techniques have been widely examined to make optimal specimens, thereby making TEM analysis more reliable. In the past few years, the correction of spherical aberration (Cs) in scanning transmission electron microscopy (STEM) has been developing rapidly, which results in direct observation at an atomic level resolution not only at a high acceleration voltage but also at a deaccelerated voltage. In particular, low-kV application has markedly increased, which requires a sufficiently transparent specimen without structural distortion during the sample preparation process. In this study, sample preparation for high-resolution STEM observation is accomplished, and investigations on the crystal integrity are carried out by Cs-corrected STEM.
本文的主要目的是利用锂离子二次电池的微小粉末制备透射电子显微镜(TEM)样品。为了避免 TEM 样品制备过程中产生人工痕迹,本文介绍了使用离子切片机铣削来减薄和保持固有结构的方法。氩离子铣削技术已被广泛用于制作最佳试样,从而使 TEM 分析更加可靠。在过去的几年中,扫描透射电子显微镜(STEM)中的球差(Cs)校正技术发展迅速,不仅在高加速电压下,而且在去加速电压下都能直接观察到原子级分辨率。尤其是低 kV 的应用显著增加,这就要求在样品制备过程中,试样具有足够的透明度,且不发生结构变形。本研究完成了用于高分辨率 STEM 观察的样品制备,并通过铯校正 STEM 对晶体完整性进行了研究。
{"title":"TEM sample preparation of microsized LiMn2O4 powder using an ion slicer","authors":"Jung Sik Park, Yoon-Jung Kang, Sun Eui Choi, Yong Nam Jo","doi":"10.1186/s42649-021-00068-5","DOIUrl":"10.1186/s42649-021-00068-5","url":null,"abstract":"<div><p>The main purpose of this paper is the preparation of transmission electron microscopy (TEM) samples from the microsized powders of lithium-ion secondary batteries. To avoid artefacts during TEM sample preparation, the use of ion slicer milling for thinning and maintaining the intrinsic structure is described. Argon-ion milling techniques have been widely examined to make optimal specimens, thereby making TEM analysis more reliable. In the past few years, the correction of spherical aberration (Cs) in scanning transmission electron microscopy (STEM) has been developing rapidly, which results in direct observation at an atomic level resolution not only at a high acceleration voltage but also at a deaccelerated voltage. In particular, low-kV application has markedly increased, which requires a sufficiently transparent specimen without structural distortion during the sample preparation process. In this study, sample preparation for high-resolution STEM observation is accomplished, and investigations on the crystal integrity are carried out by Cs-corrected STEM.</p></div>","PeriodicalId":470,"journal":{"name":"Applied Microscopy","volume":"51 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2021-12-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8702600/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"39628306","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Hair, having distinct stages of growth, is a dynamic component of the integumentary system. Nonetheless, derangement in its structure and growth pattern often provides vital clues for the diagnosis of systemic diseases. Assessment of the hair structure by various microscopy techniques is, hence, a valuable tool for the diagnosis of several systemic and cutaneous disorders. Systemic illnesses like Comel-Netherton syndrome, Griscelli syndrome, Chediak Higashi syndrome, and Menkes disease display pathognomonic findings on hair microscopy which, consequently, provide crucial evidence for disease diagnosis. With minimal training, light microscopy of the hair can easily be performed even by clinicians and other health care providers which can, thus, serve as a useful tool for disease diagnosis at the patient’s bedside. This is especially true for resource-constrained settings where access and availability of advanced investigations (like molecular diagnostics) is a major constraint. Despite its immense clinical utility and non-invasive nature, hair microscopy seems to be an underutilized diagnostic modality. Lack of awareness regarding the important findings on hair microscopy may be one of the crucial reasons for its underutilization. Herein, we, therefore, present a comprehensive overview of the available methods for hair microscopy and the pertinent findings that can be observed in various diseases.
{"title":"Hair microscopy: an easy adjunct to diagnosis of systemic diseases in children","authors":"Dharmagat Bhattarai, Aaqib Zaffar Banday, Rohit Sadanand, Kanika Arora, Gurjit Kaur, Satish Sharma, Amit Rawat","doi":"10.1186/s42649-021-00067-6","DOIUrl":"10.1186/s42649-021-00067-6","url":null,"abstract":"<div><p>Hair, having distinct stages of growth, is a dynamic component of the integumentary system. Nonetheless, derangement in its structure and growth pattern often provides vital clues for the diagnosis of systemic diseases. Assessment of the hair structure by various microscopy techniques is, hence, a valuable tool for the diagnosis of several systemic and cutaneous disorders. Systemic illnesses like Comel-Netherton syndrome, Griscelli syndrome, Chediak Higashi syndrome, and Menkes disease display pathognomonic findings on hair microscopy which, consequently, provide crucial evidence for disease diagnosis. With minimal training, light microscopy of the hair can easily be performed even by clinicians and other health care providers which can, thus, serve as a useful tool for disease diagnosis at the patient’s bedside. This is especially true for resource-constrained settings where access and availability of advanced investigations (like molecular diagnostics) is a major constraint. Despite its immense clinical utility and non-invasive nature, hair microscopy seems to be an underutilized diagnostic modality. Lack of awareness regarding the important findings on hair microscopy may be one of the crucial reasons for its underutilization. Herein, we, therefore, present a comprehensive overview of the available methods for hair microscopy and the pertinent findings that can be observed in various diseases.</p></div>","PeriodicalId":470,"journal":{"name":"Applied Microscopy","volume":"51 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2021-11-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8630179/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"39675441","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-11-11DOI: 10.1186/s42649-021-00066-7
Renukaradhya K. Math, Nagakumar Bharatham, Palaksha K. Javaregowda, Han Dae Yun
Our previous study on the binding activity between Cel5H and clay minerals showed highest binding efficiency among other cellulase enzymes cloned. Here, based on previous studies, we hypothesized that the positive amino acids on the surface of Cel5H protein may play an important role in binding to clay surfaces. To examine this, protein sequences of Bacillus licheniformis Cel5H (BlCel5H) and Paenibacillus polymyxa Cel5A (PpCel5A) were analyzed and then selected amino acids were mutated. These mutated proteins were investigated for binding activity and force measurement via atomic force microscopy (AFM). A total of seven amino acids which are only present in BlCel5H but not in PpCel5A were selected for mutational studies and the positive residues which are present in both were omitted. Of the seven selected surface lysine residues, only three mutants K196A(M2), K54A(M3) and K157T(M4) showed 12%, 7% and 8% less clay mineral binding ability, respectively compared with wild-type. The probable reason why other mutants did not show altered binding efficiency might be due to relative location of amino acids on the protein surface. Meanwhile, measurement of adhesion forces on mica sheets showed a well-defined maximum at 69 ± 19 pN for wild-type, 58 ± 19 pN for M2, 53 ± 19 pN for M3, and 49 ± 19 pN for M4 proteins. Hence, our results demonstrated that relative location of surface amino acids of Cel5H protein especially positive charged amino acids are important in the process of clay mineral-protein binding interaction through electrostatic exchange of charges.
{"title":"Role of Cel5H protein surface amino acids in binding with clay minerals and measurements of its forces","authors":"Renukaradhya K. Math, Nagakumar Bharatham, Palaksha K. Javaregowda, Han Dae Yun","doi":"10.1186/s42649-021-00066-7","DOIUrl":"10.1186/s42649-021-00066-7","url":null,"abstract":"<div><p>Our previous study on the binding activity between Cel5H and clay minerals showed highest binding efficiency among other cellulase enzymes cloned. Here, based on previous studies, we hypothesized that the positive amino acids on the surface of Cel5H protein may play an important role in binding to clay surfaces. To examine this, protein sequences of <i>Bacillus licheniformis</i> Cel5H (<i>Bl</i>Cel5H) and <i>Paenibacillus polymyxa</i> Cel5A (<i>Pp</i>Cel5A) were analyzed and then selected amino acids were mutated. These mutated proteins were investigated for binding activity and force measurement via atomic force microscopy (AFM). A total of seven amino acids which are only present in <i>Bl</i>Cel5H but not in <i>Pp</i>Cel5A were selected for mutational studies and the positive residues which are present in both were omitted. Of the seven selected surface lysine residues, only three mutants K196A(M2), K54A(M3) and K157T(M4) showed 12%, 7% and 8% less clay mineral binding ability, respectively compared with wild-type. The probable reason why other mutants did not show altered binding efficiency might be due to relative location of amino acids on the protein surface. Meanwhile, measurement of adhesion forces on mica sheets showed a well-defined maximum at 69 ± 19 pN for wild-type, 58 ± 19 pN for M2, 53 ± 19 pN for M3, and 49 ± 19 pN for M4 proteins. Hence, our results demonstrated that relative location of surface amino acids of Cel5H protein especially positive charged amino acids are important in the process of clay mineral-protein binding interaction through electrostatic exchange of charges.</p></div>","PeriodicalId":470,"journal":{"name":"Applied Microscopy","volume":"51 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2021-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8586110/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"39611173","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-11-04DOI: 10.1186/s42649-021-00065-8
Ki Woo Kim
Electron microscopy (EM) is an essential imaging method in biological sciences. Since biological specimens are exposed to radiation and vacuum conditions during EM observations, they die due to chemical bond breakage and desiccation. However, some organisms belonging to the taxa of bacteria, fungi, plants, and animals (including beetles, ticks, and tardigrades) have been reported to survive hostile scanning EM (SEM) conditions since the onset of EM. The surviving organisms were observed (i) without chemical fixation, (ii) after mounting to a precooled cold stage, (iii) using cryo-SEM, or (iv) after coating with a thin polymer layer, respectively. Combined use of these techniques may provide a better condition for preservation and live imaging of multicellular organisms for a long time beyond live-cell EM.
{"title":"Some living eukaryotes during and after scanning electron microscopy","authors":"Ki Woo Kim","doi":"10.1186/s42649-021-00065-8","DOIUrl":"10.1186/s42649-021-00065-8","url":null,"abstract":"<div><p>Electron microscopy (EM) is an essential imaging method in biological sciences. Since biological specimens are exposed to radiation and vacuum conditions during EM observations, they die due to chemical bond breakage and desiccation. However, some organisms belonging to the taxa of bacteria, fungi, plants, and animals (including beetles, ticks, and tardigrades) have been reported to survive hostile scanning EM (SEM) conditions since the onset of EM. The surviving organisms were observed (i) without chemical fixation, (ii) after mounting to a precooled cold stage, (iii) using cryo-SEM, or (iv) after coating with a thin polymer layer, respectively. Combined use of these techniques may provide a better condition for preservation and live imaging of multicellular organisms for a long time beyond live-cell EM.</p></div>","PeriodicalId":470,"journal":{"name":"Applied Microscopy","volume":"51 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2021-11-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8569123/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"39843291","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}