This study presents the design and dielectric characterization of an advanced ceramic material derived from mullite-modified bentonite, developed for next-generation electronic components and high-performance electrical insulation systems. A comprehensive structural and microstructural analysis was carried out using X-ray diffraction (XRD), X-ray fluorescence (XRF), field-emission scanning electron microscopy (FE-SEM), and Fourier-transform infrared spectroscopy (FT-IR), enabling a detailed assessment of phase composition, chemical structure, and morphology. Electronic and dielectric properties are central to understanding the functional behavior of insulating ceramics and to predicting their performance across different geometries and operating conditions. Our work adopts a robust methodological framework based on Nyquist and Bode representations, allowing a detailed examination of the complex impedance (Z*), electric modulus (M*), and permittivity (ε*) formalisms. Impedance measurements were conducted over a broad frequency range (0.1 Hz–10 MHz) and at elevated temperatures (400–850 °C), enabling a thorough exploration of the relaxation dynamics and conduction mechanisms governing the material’s dielectric behavior. The dielectric response and AC conductivity were extensively evaluated across the same frequency and temperature ranges. The results demonstrate a pronounced enhancement of both the real (ε′) and imaginary (ε′′) components of permittivity at 850 °C, particularly at low frequencies (0.1 Hz–1 kHz), highlighting the significant contribution of interfacial and space-charge polarization at high temperatures. Moreover, the frequency-dependent conductivity follows Jonscher’s universal power law, indicating that charge transport occurs predominantly through thermally activated hopping mechanisms involving both grains and grain boundaries. This finding underscores the complex, heterogeneous nature of the conduction pathways within the mullite-based ceramic matrix.
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