Pub Date : 2010-03-18DOI: 10.1109/ISSCC.2010.5433920
F. Clermidy, C. Bernard, R. Lemaire, Jérôme Martin, I. Panades, Y. Thonnart, P. Vivet, N. Wehn
Baseband processing for advanced Telecom applications have to face two contradictory issues [1]. The first one is the flexibility required, with the exploding number of modes for a single protocol (e.g. 63 for 3GPP-LTE), the number of protocols to be supported by a single chip (≫10 in 2010) and new applications requiring a handover between protocols. The second concern is related to performance and power consumption: performance demands are exploding (up to 100GOPS are now required) with decreasing power consumption constraints (roughly 500mW).
{"title":"A 477mW NoC-based digital baseband for MIMO 4G SDR","authors":"F. Clermidy, C. Bernard, R. Lemaire, Jérôme Martin, I. Panades, Y. Thonnart, P. Vivet, N. Wehn","doi":"10.1109/ISSCC.2010.5433920","DOIUrl":"https://doi.org/10.1109/ISSCC.2010.5433920","url":null,"abstract":"Baseband processing for advanced Telecom applications have to face two contradictory issues [1]. The first one is the flexibility required, with the exploding number of modes for a single protocol (e.g. 63 for 3GPP-LTE), the number of protocols to be supported by a single chip (≫10 in 2010) and new applications requiring a handover between protocols. The second concern is related to performance and power consumption: performance demands are exploding (up to 100GOPS are now required) with decreasing power consumption constraints (roughly 500mW).","PeriodicalId":6418,"journal":{"name":"2010 IEEE International Solid-State Circuits Conference - (ISSCC)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2010-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78976906","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-03-18DOI: 10.1109/ISSCC.2010.5433991
M. Meterelliyoz, A. Goel, J. Kulkarni, K. Roy
Accurate and fast measurement and characterization of random threshold voltage (Vth) fluctuations is crucial in process optimization and yield learning, particularly for matching critical transistors such as SRAMs, sense amplifiers, differential amplifiers, etc. Traditional methods in which multiplexed devices under test (DUTs) are characterized using accurate current measurements require extensive data analysis [1–3]. A sense-amplifier based measurement method presented in [4] provides limited statistical data since it can measure the mismatch between only two devices. Recently, a digital array based technique is proposed in [5] with limited sensitivity. Finally, a sub-threshold technique presented in [6] provides high sensitivity but lacks on-chip calibration. This paper presents a low voltage, high sensitivity random process variations sensor utilizing an on-chip calibration circuit for improved accuracy. Moreover, the proposed sensor features a replica bias circuit which compensates global process-voltage-temperature (PVT) variations and maintains sensitivity for robust operation.
{"title":"Accurate characterization of random process variations using a robust low-voltage high-sensitivity sensor featuring replica-bias circuit","authors":"M. Meterelliyoz, A. Goel, J. Kulkarni, K. Roy","doi":"10.1109/ISSCC.2010.5433991","DOIUrl":"https://doi.org/10.1109/ISSCC.2010.5433991","url":null,"abstract":"Accurate and fast measurement and characterization of random threshold voltage (Vth) fluctuations is crucial in process optimization and yield learning, particularly for matching critical transistors such as SRAMs, sense amplifiers, differential amplifiers, etc. Traditional methods in which multiplexed devices under test (DUTs) are characterized using accurate current measurements require extensive data analysis [1–3]. A sense-amplifier based measurement method presented in [4] provides limited statistical data since it can measure the mismatch between only two devices. Recently, a digital array based technique is proposed in [5] with limited sensitivity. Finally, a sub-threshold technique presented in [6] provides high sensitivity but lacks on-chip calibration. This paper presents a low voltage, high sensitivity random process variations sensor utilizing an on-chip calibration circuit for improved accuracy. Moreover, the proposed sensor features a replica bias circuit which compensates global process-voltage-temperature (PVT) variations and maintains sensitivity for robust operation.","PeriodicalId":6418,"journal":{"name":"2010 IEEE International Solid-State Circuits Conference - (ISSCC)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2010-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"72680324","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-03-18DOI: 10.1109/ISSCC.2010.5433842
Marco Zanuso, S. Levantino, C. Samori, A. Lacaita
Digital Fractional-N PLLs allows easy cancellation of ΔΣ quantization noise and spurs [1], [2]. However, the actual results depend dramatically on the linearity of the time-to-digital converter (TDC). This paper presents a 3MHz bandwidth fractional-N synthesizer, which combines a 4ps TDC with digital linearization algorithm and a feedback phase interpolator with mismatch cancellation algorithm. In contrast to other TDC linearization approaches [3], this structure allows multiplier-free computations, fast and accurate spur cancellation, as well as digital post-cancellation of phase errors induced by the phase interpolator mismatches, avoiding more complex calibration loops [4].
{"title":"A 3MHz-BW 3.6GHz digital fractional-N PLL with sub-gate-delay TDC, phase-interpolation divider, and digital mismatch cancellation","authors":"Marco Zanuso, S. Levantino, C. Samori, A. Lacaita","doi":"10.1109/ISSCC.2010.5433842","DOIUrl":"https://doi.org/10.1109/ISSCC.2010.5433842","url":null,"abstract":"Digital Fractional-N PLLs allows easy cancellation of ΔΣ quantization noise and spurs [1], [2]. However, the actual results depend dramatically on the linearity of the time-to-digital converter (TDC). This paper presents a 3MHz bandwidth fractional-N synthesizer, which combines a 4ps TDC with digital linearization algorithm and a feedback phase interpolator with mismatch cancellation algorithm. In contrast to other TDC linearization approaches [3], this structure allows multiplier-free computations, fast and accurate spur cancellation, as well as digital post-cancellation of phase errors induced by the phase interpolator mismatches, avoiding more complex calibration loops [4].","PeriodicalId":6418,"journal":{"name":"2010 IEEE International Solid-State Circuits Conference - (ISSCC)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2010-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88329696","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-03-18DOI: 10.1109/ISSCC.2010.5434030
Jinuk Luke Shin, K. Tam, Dawei Huang, B. Petrick, H. Pham, C. Hwang, H. Li, Alan P. Smith, Timothy Johnson, F. Schumacher, D. Greenhill, A. Leon, Allan Strong
This next generation of Chip Multithreaded (CMT) SPARC SoC processor, code named Rainbow Falls, doubles on-chip thread count over its predecessor the UltraSparc T2+. The chip offers high levels of integration and scalability with twice the number of cores, a larger L2 cache, and higher maximum I/O bandwidth, within the same power envelope. Sixteen 8-threaded enhanced SPARC cores (SPC) provide 128 threads in a single die, delivering the highest thread count for a general-purpose microprocessor. The new cache coherency further allows up to 4-way glueless systems with a total of 512 threads. Each core communicates with the unified 6MB L2 cache through a crossbar (CCX) delivering 461GB/s (Fig. 5.2.1). A gasket (CXG) is also introduced to manage the congestion and synchronization of the massive interconnect between the 16 cores and the crossbar. This facilitates a synchronized delay control between any core and any L2 bank for partial core product binning and testing.
{"title":"A 40nm 16-core 128-thread CMT SPARC SoC processor","authors":"Jinuk Luke Shin, K. Tam, Dawei Huang, B. Petrick, H. Pham, C. Hwang, H. Li, Alan P. Smith, Timothy Johnson, F. Schumacher, D. Greenhill, A. Leon, Allan Strong","doi":"10.1109/ISSCC.2010.5434030","DOIUrl":"https://doi.org/10.1109/ISSCC.2010.5434030","url":null,"abstract":"This next generation of Chip Multithreaded (CMT) SPARC SoC processor, code named Rainbow Falls, doubles on-chip thread count over its predecessor the UltraSparc T2+. The chip offers high levels of integration and scalability with twice the number of cores, a larger L2 cache, and higher maximum I/O bandwidth, within the same power envelope. Sixteen 8-threaded enhanced SPARC cores (SPC) provide 128 threads in a single die, delivering the highest thread count for a general-purpose microprocessor. The new cache coherency further allows up to 4-way glueless systems with a total of 512 threads. Each core communicates with the unified 6MB L2 cache through a crossbar (CCX) delivering 461GB/s (Fig. 5.2.1). A gasket (CXG) is also introduced to manage the congestion and synchronization of the massive interconnect between the 16 cores and the crossbar. This facilitates a synchronized delay control between any core and any L2 bank for partial core product binning and testing.","PeriodicalId":6418,"journal":{"name":"2010 IEEE International Solid-State Circuits Conference - (ISSCC)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2010-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91464924","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-03-18DOI: 10.1109/ISSCC.2010.5433986
Chen Zheng, D. Ma
Nowadays switching DC-DC converters have become indispensable in power-efficient VLSI systems. As operation frequency increases, load fluctuations in such a device require high switching frequencies in DC-DC converters for fast transient response. Meanwhile, as the switching frequency, fs, increases, sizes of inductors (Ls) and capacitors (Cs) decrease with fs, allowing the use of smaller off-chip or even on-chip Ls and Cs. This not only reduces cost and space, but also allows a larger or better battery to be used, which in turn, improves the system run-time and performance. However, as fs increases, power loss at the power stage will increase roughly with √fs [1]. The efficiency is thus sacrificed for high-frequency operations. For example, for a converter that achieves 90% efficiency at 1MHz, when fs is increased to 10 MHz, power loss goes up by √10 times, causing the efficiency to drop below 70% [1]. On the other hand, as semiconductor industry is facing unprecedented power crisis, numerous power-management techniques have been recently developed. One major technique is called dynamic voltage scaling (DVS), in which a variable-output DC-DC converter is usually adopted to adjust supply voltage and operation frequency, based on instantaneous workload. Buck converter topology has been widely used for these applications. However, because a non-inverting flyback converter can achieve both step-up and step-down conversions, such a structure is more desirable in DVS-based applications to maximize power saving with a wider supply range [2]. However, compared to buck or boost converters, a non-inverting flyback converter requires two additional switches. As a result, both switching and conduction loss are doubled. Furthermore, the converter efficiency is greatly degraded (as shown in Fig. 10.5.1). However, it exhibits an obvious advantage when Vout is close to Vg, where the buck or boost converter experiences a sharp increase in power loss. In addition, as the duty ratio approaches 100%, the discharge (charge) period for a buck (boost) converter becomes extremely short, forcing the inductor to be charged at a much higher current level. It thus leads to significant power loss and switching noise, and imposes severe design constraints on the transient responses of the controller and buffers.
{"title":"A 10MHz 92.1%-efficiency green-mode automatic reconfigurable switching converter with adaptively compensated single-bound hysteresis control","authors":"Chen Zheng, D. Ma","doi":"10.1109/ISSCC.2010.5433986","DOIUrl":"https://doi.org/10.1109/ISSCC.2010.5433986","url":null,"abstract":"Nowadays switching DC-DC converters have become indispensable in power-efficient VLSI systems. As operation frequency increases, load fluctuations in such a device require high switching frequencies in DC-DC converters for fast transient response. Meanwhile, as the switching frequency, fs, increases, sizes of inductors (Ls) and capacitors (Cs) decrease with fs, allowing the use of smaller off-chip or even on-chip Ls and Cs. This not only reduces cost and space, but also allows a larger or better battery to be used, which in turn, improves the system run-time and performance. However, as fs increases, power loss at the power stage will increase roughly with √fs [1]. The efficiency is thus sacrificed for high-frequency operations. For example, for a converter that achieves 90% efficiency at 1MHz, when fs is increased to 10 MHz, power loss goes up by √10 times, causing the efficiency to drop below 70% [1]. On the other hand, as semiconductor industry is facing unprecedented power crisis, numerous power-management techniques have been recently developed. One major technique is called dynamic voltage scaling (DVS), in which a variable-output DC-DC converter is usually adopted to adjust supply voltage and operation frequency, based on instantaneous workload. Buck converter topology has been widely used for these applications. However, because a non-inverting flyback converter can achieve both step-up and step-down conversions, such a structure is more desirable in DVS-based applications to maximize power saving with a wider supply range [2]. However, compared to buck or boost converters, a non-inverting flyback converter requires two additional switches. As a result, both switching and conduction loss are doubled. Furthermore, the converter efficiency is greatly degraded (as shown in Fig. 10.5.1). However, it exhibits an obvious advantage when Vout is close to Vg, where the buck or boost converter experiences a sharp increase in power loss. In addition, as the duty ratio approaches 100%, the discharge (charge) period for a buck (boost) converter becomes extremely short, forcing the inductor to be charged at a much higher current level. It thus leads to significant power loss and switching noise, and imposes severe design constraints on the transient responses of the controller and buffers.","PeriodicalId":6418,"journal":{"name":"2010 IEEE International Solid-State Circuits Conference - (ISSCC)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2010-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87151449","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-03-18DOI: 10.1109/ISSCC.2010.5433873
Maysam Ghovanloo, T. Denison
The terms “bionics” and “neuroprosthesis” understandably capture the engineers' imagination. Oftentimes, however, this fascination results more from science fiction than actual facts on the reality of unmet clinical needs and the real technical issues of designing a bionic system. Yet not all work in this field is sci-fi, and engineers working with clinical researchers and scientists have realized several milestones in the treatment of chronic diseases. Perhaps the most successful example of a bionic system is the cochlear prosthesis, which has helped restore a measure of hearing in over 150,000 patients, so far. Another active field is neuromodulation, where neurostimulators targeting specific neural circuits are being applied as a therapy for a variety of diseases including Parkinson's disease, incontinence, and obsessive compulsive disorder. Clearly, in the proper context, interfacing silicon circuits to the patients' neural circuits may achieve profound effects.
{"title":"ES6: Can we rebuild them? bionics beyond 2010","authors":"Maysam Ghovanloo, T. Denison","doi":"10.1109/ISSCC.2010.5433873","DOIUrl":"https://doi.org/10.1109/ISSCC.2010.5433873","url":null,"abstract":"The terms “bionics” and “neuroprosthesis” understandably capture the engineers' imagination. Oftentimes, however, this fascination results more from science fiction than actual facts on the reality of unmet clinical needs and the real technical issues of designing a bionic system. Yet not all work in this field is sci-fi, and engineers working with clinical researchers and scientists have realized several milestones in the treatment of chronic diseases. Perhaps the most successful example of a bionic system is the cochlear prosthesis, which has helped restore a measure of hearing in over 150,000 patients, so far. Another active field is neuromodulation, where neurostimulators targeting specific neural circuits are being applied as a therapy for a variety of diseases including Parkinson's disease, incontinence, and obsessive compulsive disorder. Clearly, in the proper context, interfacing silicon circuits to the patients' neural circuits may achieve profound effects.","PeriodicalId":6418,"journal":{"name":"2010 IEEE International Solid-State Circuits Conference - (ISSCC)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2010-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87565876","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-03-18DOI: 10.1109/ISSCC.2010.5433917
Y. Nishida, K. Kawai, K. Koike
The Internet has become an important tool to deliver services such as Voice over Internet Protocol (IP) and high-definition video. To enable the widespread use of these services, it is essential to ensure quality-of-service (QoS) and security protection in communication. In using consumer-oriented gateway equipment (GW) consisting of low-cost network processors (NPs), however, it is difficult to ensure QoS because the CPU load becomes 100% when packets are received at a traffic load of 1Gb/s. A packet engine (PE) achieving a throughput of 2Gb/s (i.e., bidirectional 1Gb/s communication) and offloading the network processing from CPUs solves the problem as shown in Fig. 15.4.1. The PE achieves a 2Gb/s throughput for all cases as shown in Fig. 15.4.2 as follows: (1) inline-type IPsec circuits whose transmitting/receiving blocks independently process enc/decryption, authentication, and encapsulation [1] achieve a total processing speed of 2Gb/s; (2) an IP-forwarding performance of 2Gb/s is achieved by adopting a high-speed, compact look-up circuit [1] that searches by providing an action rule from one memory read-out circuit to multiple comparators in an IP switch (IP-SW); and (3) a local-area-network switch (LAN-SW) achieves 5Gb/s forwarding by 5 parallel look-up engines and a high-speed internal packet buffer.
Internet已经成为提供诸如IP (Voice over Internet Protocol)和高清视频等服务的重要工具。为了使这些服务得到广泛使用，必须确保通信中的服务质量(QoS)和安全保护。然而，在使用由低成本网络处理器(NPs)组成的面向消费者的网关设备(GW)时，很难保证QoS，因为当流量负载为1Gb/s时，接收数据包的CPU负载变为100%。如图15.4.1所示，通过实现2Gb/s吞吐量(即双向1Gb/s通信)并将网络处理从cpu上卸载的分组引擎PE (packet engine)解决了这个问题。如图15.4.2所示，PE在所有情况下都实现了2Gb/s的吞吐量:(1)内联式IPsec电路，其发送/接收块独立处理加密/解密、认证和封装[1]，总处理速度为2Gb/s;(2)采用高速、紧凑的查找电路[1]实现2Gb/s的IP转发性能，该电路通过在IP交换机(IP- sw)中提供从一个存储器读出电路到多个比较器的操作规则进行搜索;(3)局域网交换机(LAN-SW)通过5个并行查找引擎和一个高速内部数据包缓冲区实现5Gb/s转发。
{"title":"A 2Gb/s network processor with a 24mW IPsec offload for residential gateways","authors":"Y. Nishida, K. Kawai, K. Koike","doi":"10.1109/ISSCC.2010.5433917","DOIUrl":"https://doi.org/10.1109/ISSCC.2010.5433917","url":null,"abstract":"The Internet has become an important tool to deliver services such as Voice over Internet Protocol (IP) and high-definition video. To enable the widespread use of these services, it is essential to ensure quality-of-service (QoS) and security protection in communication. In using consumer-oriented gateway equipment (GW) consisting of low-cost network processors (NPs), however, it is difficult to ensure QoS because the CPU load becomes 100% when packets are received at a traffic load of 1Gb/s. A packet engine (PE) achieving a throughput of 2Gb/s (i.e., bidirectional 1Gb/s communication) and offloading the network processing from CPUs solves the problem as shown in Fig. 15.4.1. The PE achieves a 2Gb/s throughput for all cases as shown in Fig. 15.4.2 as follows: (1) inline-type IPsec circuits whose transmitting/receiving blocks independently process enc/decryption, authentication, and encapsulation [1] achieve a total processing speed of 2Gb/s; (2) an IP-forwarding performance of 2Gb/s is achieved by adopting a high-speed, compact look-up circuit [1] that searches by providing an action rule from one memory read-out circuit to multiple comparators in an IP switch (IP-SW); and (3) a local-area-network switch (LAN-SW) achieves 5Gb/s forwarding by 5 parallel look-up engines and a high-speed internal packet buffer.","PeriodicalId":6418,"journal":{"name":"2010 IEEE International Solid-State Circuits Conference - (ISSCC)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2010-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73524606","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-03-18DOI: 10.1109/ISSCC.2010.5433856
D. Draper, F. Campi, R. Krishnamurthy, T. Miyamori, S. Morton, W. Sansen, V. Stojanović, J. Stonick
This Forum is directed toward researchers and designers working in advanced technologies over the next 3-5 years. They will be required to solve emerging issues of signal and power integrity in large, System-on-Chip applications which will raise issues of increasing difficulty. While struggling for higher performance, the designer must battle escalating noise and cross-talk. Interconnect delay and coupling will require new methods of routing and signal transmission. Supply-grid design will take increasing account of limited package and chip metalization through independent power domains, active and passive supply-noise cancellation, and voltage scaling. Increasingly- sensitive analog and RF circuit blocks must counter digital chip noise. Stringent clock-jitter and skew targets, and power-dissipation limitations will be addressed by independent clock domains, resonant clocking, and frequency scaling.
{"title":"F6: Signal and power integrity for SoCs","authors":"D. Draper, F. Campi, R. Krishnamurthy, T. Miyamori, S. Morton, W. Sansen, V. Stojanović, J. Stonick","doi":"10.1109/ISSCC.2010.5433856","DOIUrl":"https://doi.org/10.1109/ISSCC.2010.5433856","url":null,"abstract":"This Forum is directed toward researchers and designers working in advanced technologies over the next 3-5 years. They will be required to solve emerging issues of signal and power integrity in large, System-on-Chip applications which will raise issues of increasing difficulty. While struggling for higher performance, the designer must battle escalating noise and cross-talk. Interconnect delay and coupling will require new methods of routing and signal transmission. Supply-grid design will take increasing account of limited package and chip metalization through independent power domains, active and passive supply-noise cancellation, and voltage scaling. Increasingly- sensitive analog and RF circuit blocks must counter digital chip noise. Stringent clock-jitter and skew targets, and power-dissipation limitations will be addressed by independent clock domains, resonant clocking, and frequency scaling.","PeriodicalId":6418,"journal":{"name":"2010 IEEE International Solid-State Circuits Conference - (ISSCC)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2010-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84075320","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-03-18DOI: 10.1109/ISSCC.2010.5434004
Oleksiy Tyshchenko, A. Sheikholeslami, H. Tamura, Y. Tomita, H. Yamaguchi, M. Kibune, T. Yamamoto
ADC-based CDRs take digital samples of the received signal to recover the clock and data. Digital representation of the signal allows for extensive channel equalization in the digital domain. Recently-reported ADC-based CDRs sample the signal at 1× or 2× the baud rate. The 1× CDR aligns the sampling clock with the signal using a phase-tracking feedback loop [1–2], which requires a voltage-controlled oscillator or phase interpolator, both analog circuits, to adjust the phase of the sampling clock. To eliminate these analog circuits (and their phase control) in favor of an all-digital implementation, a blind-sampling ADC-based CDR (top of Fig. 8.6.1) samples the received signal at 2× without phase locking to the signal. The CDR then interpolates between the blind samples to obtain a new set of samples in order to recover the phase and data [3–4]. The doubling of the sampling rate, however, increases the ADC power consumption or, equivalently, reduces the maximum baud rate due to the conversion-rate limitations of ADCs.
{"title":"A fractional-sampling-rate ADC-based CDR with feedforward architecture in 65nm CMOS","authors":"Oleksiy Tyshchenko, A. Sheikholeslami, H. Tamura, Y. Tomita, H. Yamaguchi, M. Kibune, T. Yamamoto","doi":"10.1109/ISSCC.2010.5434004","DOIUrl":"https://doi.org/10.1109/ISSCC.2010.5434004","url":null,"abstract":"ADC-based CDRs take digital samples of the received signal to recover the clock and data. Digital representation of the signal allows for extensive channel equalization in the digital domain. Recently-reported ADC-based CDRs sample the signal at 1× or 2× the baud rate. The 1× CDR aligns the sampling clock with the signal using a phase-tracking feedback loop [1–2], which requires a voltage-controlled oscillator or phase interpolator, both analog circuits, to adjust the phase of the sampling clock. To eliminate these analog circuits (and their phase control) in favor of an all-digital implementation, a blind-sampling ADC-based CDR (top of Fig. 8.6.1) samples the received signal at 2× without phase locking to the signal. The CDR then interpolates between the blind samples to obtain a new set of samples in order to recover the phase and data [3–4]. The doubling of the sampling rate, however, increases the ADC power consumption or, equivalently, reduces the maximum baud rate due to the conversion-rate limitations of ADCs.","PeriodicalId":6418,"journal":{"name":"2010 IEEE International Solid-State Circuits Conference - (ISSCC)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2010-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86745899","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-03-18DOI: 10.1109/ISSCC.2010.5433851
Dan Sandström, M. Varonen, M. Kärkkäinen, K. Halonen
A W-band transmitter front-end has been implemented in 65 nm CMOS. The output power is higher than +4 dBm from 77 GHz to 94 GHz with an image rejection ratio from 15 dB to 25 dB. The highest 1 dB output compression point is +2.2 dBm with +6.6 dBm maximum power at 85 GHz. The transmitter draws 100 mA from a 1.2 V supply.
{"title":"A W-band 65nm CMOS transmitter front-end with 8GHz IF bandwidth and 20dB IR-ratio","authors":"Dan Sandström, M. Varonen, M. Kärkkäinen, K. Halonen","doi":"10.1109/ISSCC.2010.5433851","DOIUrl":"https://doi.org/10.1109/ISSCC.2010.5433851","url":null,"abstract":"A W-band transmitter front-end has been implemented in 65 nm CMOS. The output power is higher than +4 dBm from 77 GHz to 94 GHz with an image rejection ratio from 15 dB to 25 dB. The highest 1 dB output compression point is +2.2 dBm with +6.6 dBm maximum power at 85 GHz. The transmitter draws 100 mA from a 1.2 V supply.","PeriodicalId":6418,"journal":{"name":"2010 IEEE International Solid-State Circuits Conference - (ISSCC)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2010-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84141614","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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